SANS 216-4-1-2009 Specification for radio disturbance and immunity measuring apparatus and methods Part 4-1 Uncertainties statistics and limit modelling - Uncertainties in standard.pdf

1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-22804-0 SANS 216-4-1:2009Edition 2CISPR/TR 16-4-1:2009Edition 2SOUTH AFRICAN NATIONAL STANDARD Specification for radio disturbance and imm

4、unity measuring apparatus and methods Part 4-1: Uncertainties, statistics and limit modelling Uncertainties in standardized EMC tests This national standard is the identical implementation of CISPR/TR 16-4-1:2009 and is adopted with the permission of the International Electrotechnical Commission (In

5、ternational Special Committee on Radio Interference). Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 216-4-1:2009 Edition 2 CISPR/TR 16-4-1:2009 Edition 2 Table of changes Change No. D

6、ate Scope National foreword This South African standard was approved by National Committee SABS TC 73, Electromagnetic compatibility, in accordance with procedures of the SABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in September 2009.

7、 This SANS document supersedes SANS 216-4-1:2005 (edition 1.1 as modified by CISPR amdt 2:2007). CISPR/TR 16-4-1Edition 2.0 2009-02TECHNICAL REPORT Specification for radio disturbance and immunity measuring apparatus and methods Part 4-1: Uncertainties, statistics and limit modelling Uncertainties i

8、n standardized EMC tests INTERNATIONAL ELECTROTECHNICAL COMMISSION XEICS 33.100.10; 33.100.20 PRICE CODEISBN 2-8318-1032-4INTERNATIONAL SPECIAL COMMITTEE ON RADIO INTERFERENCE Registered trademark of the International Electrotechnical Commission SANS 216-4-1:2009This s tandard may only be used and p

9、rinted by approved subscription and freemailing clients of the SABS . 2 TR CISPR 16-4-1 IEC:2009(E) CONTENTS FOREWORD.7 INTRODUCTION.9 1 Scope.10 2 Normative references .10 3 Terms, definitions, and abbreviations .11 3.1 Terms and definitions 12 3.2 Abbreviations 15 4 Basic considerations on uncerta

10、inties in emission measurements.15 4.1 Introductory remarks .15 4.2 Types of uncertainties in emission measurements .17 4.2.1 General .17 4.2.2 Purpose of uncertainty considerations .18 4.2.3 Categories of uncertainty sources19 4.2.4 Summary of types of uncertainties.22 4.2.5 Influence quantities .2

11、2 4.2.6 The measurand and the intrinsic uncertainty23 4.3 Relation between standards compliance uncertainty and interference probability .25 4.3.1 General .25 4.3.2 The measurand and the associated limit25 4.3.3 Process of determination and application of uncertainties26 4.4 Assessment of uncertaint

12、ies in a standardised emission measurement .27 4.4.1 The process of uncertainty estimation27 4.4.2 Step 1: Definition of the purpose of the uncertainty consideration27 4.4.3 Step 2: Identifying the measurand, its uncertainty sources and influence quantities28 4.4.4 Step 3: Evaluate the standard unce

13、rtainty of each relevant influence quantity .29 4.4.5 Step 4: Calculation of the combined and expanded uncertainty .30 4.5 Verification of the uncertainty budget 31 4.5.1 Introductory remarks31 4.5.2 Test laboratory comparison and the measurement compatibility requirement .32 4.5.3 Interlaboratory c

14、omparison and statistical evaluation.34 4.5.4 Application of a calculable EUT .35 4.5.5 Application of a reference EUT 35 4.6 Reporting of the uncertainty 35 4.6.1 General .35 4.6.2 Reporting results of uncertainty assessments36 4.6.3 Uncertainty statements in routine compliance measurement results.

15、36 4.6.4 Reporting of the expanded uncertainty 36 4.7 Application of uncertainties in the compliance criterion37 4.7.1 Introductory remarks37 4.7.2 Manufacturers compliance criterion for compliance measurements .41 4.7.3 Compliance criteria for mass-produced products (80 %/80 % rule) 41 4.7.4 Compli

16、ance criteria for quality assurance tests using a reference EUT42 4.7.5 Application of uncertainties in re-testing 42 SANS 216-4-1:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .TR CISPR 16-4-1 IEC:2009(E) 3 5 Basic considerations on unc

17、ertainties in immunity testing.44 6 Voltage measurements.44 6.1 Introductory remarks .44 6.2 Voltage measurements (general).44 6.2.1 Introductory remarks44 6.2.2 Voltage measurements basics .44 6.2.3 The disturbance source and types of voltage .46 6.3 Voltage measurements using a voltage probe .48 6

18、.4 Voltage measurement using a V-terminal artificial mains network48 6.4.1 Introductory remarks48 6.4.2 Basic circuit diagram of the voltage measurement .49 6.4.3 Voltage measurement and standards compliance uncertainty 50 6.4.4 Combined uncertainty51 6.4.5 The compliance criterion52 6.4.6 Influence

19、 quantities .52 7 Absorbing clamp measurements.56 7.1 General .56 7.1.1 Objective .56 7.1.2 Introductory remarks57 7.2 Uncertainties related to the calibration of the absorbing clamp 57 7.2.1 General .57 7.2.2 The measurand .58 7.2.3 Uncertainty sources.58 7.2.4 Influence quantities .59 7.2.5 Applic

20、ation of the uncertainty budget .63 7.2.6 Typical examples of an uncertainty budget 63 7.2.7 Verification of the uncertainty budget.64 7.3 Uncertainties related to the absorbing clamp measurement method 64 7.3.1 General .64 7.3.2 The measurand .64 7.3.3 Uncertainty sources.65 7.3.4 Influence quantit

21、ies .66 7.3.5 Application of the uncertainty budget .68 7.3.6 Typical examples of the uncertainty budget .68 7.3.7 Verification of the uncertainty budget.69 8 Radiated emission measurements using a SAC or an OATS in the frequency range of 30 MHz to 1 000 MHz .71 8.1 General .71 8.1.1 Objective .71 8

22、.1.2 Introductory remarks71 8.2 Uncertainties related to the SAC/OATS radiated emission measurement method72 8.2.1 General .72 8.2.2 The measurand .73 8.2.3 Uncertainty sources.74 8.2.4 Influence quantities .75 8.2.5 Application of the uncertainty estimate 86 8.2.6 Typical examples of the uncertaint

23、y estimate.86 SANS 216-4-1:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 4 TR CISPR 16-4-1 IEC:2009(E) 8.2.7 Verification of the uncertainty estimate 87 9 Conducted immunity measurements .88 10 Radiated immunity measurements 88 Annex A

24、 (informative) Compliance uncertainty and interference probability89 Annex B (informative) Numerical example of the consequences of Faradays law 91 Annex C (informative) Possible amendments to CISPR publications with regards to voltage measurements .93 Annex D (informative) Analysis method of result

25、s of an interlaboratory test .96 Annex E (informative) Uncertainty budgets for the clamp calibration methods97 Annex F (informative) Uncertainty budget for the clamp measurement method 99 Annex G (informative) Uncertainty estimates for the radiated emission measurement methods .101 Annex H (informat

26、ive) Results of various round robin tests for SAC/OATS-based radiated emission measurements .106 Annex I (informative) Additional information about distinctions between the terms measurement uncertainty and standards compliance uncertainty112 Bibliography114 Figure 1 Illustration of the relation bet

27、ween the overall uncertainty of a measurand due to contributions from the measurement instrumentation uncertainty and the intrinsic uncertainty of the measurand.17 Figure 2 The process of emission compliance measurements and the associated (categories of) uncertainty sources (see also Table 2) 20 Fi

28、gure 3 Relationship between uncertainty sources, influence quantities and uncertainty categories.25 Figure 4 Involvement of the subcommittees CISPR/H and CISPR/A in the determination of the measurands and application of uncertainties.26 Figure 5 The uncertainty estimation process 27 Figure 6 Example

29、 of a fishbone diagram indicating the various uncertainty sources for an absorbing clamp compliance measurement in accordance with CISPR 16-2-2 29 Figure 7 Illustration of the minimum requirement (interval compatibility requirement) for the standards compliance uncertainty33 Figure 8 Graphical repre

30、sentation of four cases in the compliance determination process without consideration of measurement uncertainty during limits setting38 Figure 9 Graphical representation of four cases in the compliance determination process with consideration of measurement uncertainty during limits setting. .39 Fi

31、gure 10 Generic relation between overall uncertainty of measurand and some major categories of uncertainties 39 Figure 11 Graphical representation MIU compliance criterion for compliance measurements, per CISPR 16-4-2 41 Figure 12 Basic circuit of a voltage measurement 45 Figure 13 Basic circuit of

32、a loaded disturbance source (N = 2) .46 Figure 14 Relation between the voltages .47 Figure 15 Basic circuit of the V-AMN voltage measurement (N = 2)49 Figure 16 Basic circuit of the V-AN measurement during the reading of the received voltage Um(the numbers refer to Figure 15)50 SANS 216-4-1:2009This

33、 s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .TR CISPR 16-4-1 IEC:2009(E) 5 Figure 17 The absolute value of the sensitivity coefficient c2as a function of the phase angle difference of the impedances Z13and Zd0for several values of the ratio |Z

34、13/Zd0| 51 Figure 18 Variation of the parasitic capacitance, and hence of the CM-impedance, by changing the position of the reference plane (non-conducting EUT housing) 53 Figure 19 Influence quantities in between the EUT (disturbance source) and the V-AMN .55 Figure 20 Schematic overview of the ori

35、ginal clamp calibration method .58 Figure 21 Diagram that illustrates the uncertainty sources associated with the original clamp calibration method59 Figure 22 Schematic overview of the clamp measurement method.64 Figure 23 Diagram that illustrates the uncertainty sources associated with the clamp m

36、easurement method .65 Figure 24 Measurement results of an absorbing clamp RRT performed by six test laboratories in the Netherlands using a drill as EUT70 Figure 25 Schematic of a radiated emission measurement set-up in a SAC .72 Figure 26 Uncertainty sources associated with the SAC/OATS radiated em

37、ission measurement method .74 Figure A.1 Measured field strength distributions X1 and Y1, emission limit and level to be protected of relevance in the determination of the corresponding interference probability determined by distributions X2 and Y2.90 Figure B.1 Voltage and current limits as given i

38、n CISPR 15:2005, Tables 2b and 3, and the ratio UL/IL92 Figure B.2 Factor Ksderived from the data in Figure B.1 and Equation (B.4) 92 Figure C.1 Schematic diagram of a V-AMN yielding an improved figure-of-merit about the actual compliance probability via two current probes.95 Figure H.1 Expanded unc

39、ertainties of emission measurement results for five different emulated EUTs each with five different cable termination conditions 24108 Figure H.2 Interlaboratory comparison measurement results of twelve 10 m SACs see “HP (2000)” in Table H.1 108 Figure H.3 ILC measurement results radiated emission

40、SAC/OATS 3 m (11 sites) 32 109 Figure H.4 ILC measurement results radiated emission SAC/OATS 3 m (14 sites) 13, 25.110 Figure H.5 Measured correlation curve of 3 m and 10 m SAC/OATS-emission measurement of a battery-fed table-top type of EUT, compared with the free-space rule-of-thumb ratio 13, 25 .

41、111 Table 1 Structure of clauses related to the subject of standards compliance uncertainty9 Table 2 Categories of uncertainty sources in standardised emission measurements 20 Table 3 Example of detailed standard induced uncertainty sources for a radiated emission measurement .21 Table 4 Different t

42、ypes of uncertainties used within CISPR at present .22 Table 5 Examples (not exhaustive) of the translation of uncertainty sources into influence quantities for an emission measurement on an OATS per CISPR 22 23 Table 6 Influence quantities associated with the uncertainty sources given in Figure 21

43、for the original clamp calibration method .60 Table 7 Influence quantities associated with the uncertainty sources given in Figure 23 for the clamp measurement method 66 SANS 216-4-1:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 6 TR C

44、ISPR 16-4-1 IEC:2009(E) Table 8 Measurement results of an absorbing clamp RRT performed by six test laboratories in Germany using a vacuum cleaner motor as EUT70 Table 9 Summary of various MIU and SCU values (expanded uncertainties) for the clamp measurement method derived from different sources of

45、information71 Table 10 Influence quantities for the SAC/OATS radiated emission measurement method associated with the uncertainty sources of Figure 2676 Table 11 Relation between/and type of EUT and set-up-related uncertainties 77 Table 12 Example of uncertainty estimate associated with the NSA meas

46、urement method, 30 MHz to 1 000 MHz82 Table 13 Relationship between intrinsic and apparent NSA83 Table E.1 Uncertainty budget for the original absorbing clamp calibration method in the frequency range 30 MHz to 300 MHz 97 Table E.2 Uncertainty budget for the original absorbing clamp calibration meth

47、od in the frequency range 300 MHz to 1 000 MHz .98 Table F.1 Uncertainty budget for the absorbing clamp measurement method in the frequency range 30 MHz to 300 MHz 99 Table F.2 Uncertainty budget for the absorbing clamp measurement method in the frequency range 300 MHz to 1 000 MHz .100 Table G.1 Un

48、certainty estimate for the radiated emission measurement method in the frequency range 30 MHz to 200 MHz at a measurement distance of 3 m.102 Table G.2 Uncertainty estimate for the radiated emission measurement method in the frequency range 200 MHz to 1 000 MHz at a measurement distance of 3 m103 Ta

49、ble G.3 Uncertainty data of some influence quantities for the radiated emission measurement method in the frequency range 30 MHz to 200 MHz at measurement distances of 3 m, 10 m, or 30 m 104 Table G.4 Uncertainty data of some influence quantities for the radiated emission measurement method in the frequency range 200 MHz to 1 000 MHz at measurement distances of 3 m, 10 m, or 30 m 105 Table H.1 Summary of various MIU an