SANS 61000-4-17-2009 Electromagnetic compatibility (EMC) Part 4-17 Testing and measurement techniques - Ripple on d c input power port immunity test《电磁兼容性(EMC) 第4-17部分 试验及测量技术 直流输入.pdf

1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-22351-9 SANS 61000-4-17:2009Edition 1.2IEC 61000-4-17:2009Edition 1.2SOUTH AFRICAN NATIONAL STANDARD Electromagnetic compatibility (EMC) P

4、art 4-17: Testing and measurement techniques Ripple on d.c. input power port immunity test This national standard is the identical implementation of IEC 61000-4-17:2009 and is adopted with the permission of the International Electrotechnical Commission. Published by SABS Standards Division 1 Dr Late

5、gan Road Groenkloof Private Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 61000-4-17:2009 Edition 1.2 IEC 61000-4-17:2009 Edition 1.2 Table of changes Change No. Date Scope Amdt 1 2001 Amendment to change the requirements for climatic conditions and the eva

6、luation of test results, and to add a test report. Amdt 2 2009 Amendment on Normative reference to delete the dates to the referenced international standards, IEC 60050(161) and IEC 60068-1, and delete the third reference IEC 61000-4-11. Amendment to subclause 6.2 Verification of the characteristics

7、 of the generator to delete, at the end of the first paragraph in the fourth dashed item, the brackets and the text: (as in IEC 61000-4-11). National foreword This South African standard was approved by National Committee SABS TC 73, Electromagnetic compatibility, in accordance with procedures of th

8、e SABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SANS document was published in March 2009. This SANS document supersedes SANS 61000-4-17:2003 (edition 1.1). IEC 61000-4-17Edition 1.2 2009-01INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility

9、(EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input power port immunity test Compatibilit lectromagntique (CEM) Partie 4-17: Techniques dessai et de mesure Essai dimmunit londulation rsiduelle sur entre de puissance courant continu INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMI

10、SSION ELECTROTECHNIQUE INTERNATIONALE CCICS 33.100.20 PRICE CODECODE PRIXISBN 2-8318-1024-6BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale SANS 61000-4-17:2009Thi

11、s s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 2 61000-4-17 IEC:1999+A1:2001 +A2:2008 CONTENTS FOREWORD.3 INTRODUCTION.5 1 Scope.6 2 Normative references7 3 General 7 4 Definitions 7 5 Test levels and waveform .8 6 Test generator 9 6.1 Charact

12、eristics and performance of the generator 9 6.2 Verification of the characteristics of the generator9 7 Test set-up .10 8 Test procedure .10 8.1 Laboratory reference conditions.10 8.1.1 Climatic conditions.10 8.1.2 Electromagnetic conditions 10 8.2 Execution of the test 10 9 Evaluation of test resul

13、ts.11 10 Test report12 Annex A (informative) Information on the phenomenon .14 Figure 1 Examples of ripple voltage waveforms 13 Figure A.1 Example of generator based on a rectifier system 15 Figure A.2 Example of generator based on programmable instrumentation .15 Table 1 Test levels.8 SANS 61000-4-

14、17:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS .61000-4-17 IEC:1999+A1:2001 3 +A2:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input p

15、ower port immunity test FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concernin

16、g standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their pr

17、eparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closel

18、y with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant

19、 subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the tech

20、nical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum ext

21、ent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for a

22、ny equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committee

23、s and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

24、8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent ri

25、ghts. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-17 has been prepared by subcommittee 77A: Low-frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. It forms part 4-17 of IEC 61000. It has the statu

26、s of a basic EMC publication in accordance with IEC Guide 107. This consolidated version of IEC 61000-4-17 consists of the first edition (1999) documents 77A/271/FDIS and 77A/280/RVD, its amendment 1 (2001) documents 77B/291+293/FDIS and 77B/298+300/RVD and its amendment 2 (2008) documents 77A/632/C

27、DV and 77A/652/RVC. The technical content is therefore identical to the base edition and its amendments and has been prepared for user convenience. It bears the edition number 1.2. SANS 61000-4-17:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the

28、 SABS . 4 61000-4-17 IEC:1999+A1:2001 +A2:2008 A vertical line in the margin shows where the base publication has been modified by amendments 1 and 2. Annex A is for information only. The committee has decided that the contents of the base publication and its amendments will remain unchanged until t

29、he maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. SANS 61000-4-17:2009This s tandard may only be used and pri

30、nted by approved subscription and freemailing clients of the SABS .61000-4-17 IEC:1999+A1:2001 5 +A2:2008 INTRODUCTION This standard is part of the IEC 61000 series, according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, termi

31、nology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques Measurement te

32、chniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as International Standards or technical reports, some

33、 of which have already been published as sections. Others will be published with the part number followed by a dash and a second number identifying the subdivision. This part is an International Standard which gives test procedures related to ripple on d.c. input power port. SANS 61000-4-17:2009This

34、 s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 6 61000-4-17 IEC:1999+A1:2001 +A2:2008 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-17: Testing and measurement techniques Ripple on d.c. input power port immunity test 1 Scope This part of IEC 61000

35、 defines test methods for immunity to ripple at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low-voltage d.c. power ports of equipment supplied by external rectifier systems, or batteries which are being charged. The object of this standard is to es

36、tablish a common and reproducible basis for testing, in a laboratory, electrical and electronic equipment when subjected to ripple voltages such as those generated by rectifier systems and/or auxiliary service battery chargers overlaying on d.c. power supply sources. This standard defines test volta

37、ge waveform; range of test levels; test generator; test set-up; test procedure. The test described hereafter applies to electrical or electronic equipment and systems. It also applies to modules or subsystems whenever the equipment under test (EUT) rated power is greater than the test generator capa

38、city specified in clause 6. This test does not apply to equipment connected to battery charger systems incorporating switch mode converters. This standard does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product com

39、mittees. These product committees (or users or manufacturers of equipment) remain responsible for the appropriate choice of the test and the severity level to be applied to their equipment. Dedicated test procedures are in use for testing specific categories of electrical or electronic equipment, e.

40、g. equipment connected to d.c. supply network of telephone switching centres; the related product committees should evaluate the relevance and applicability of the test procedure specified in this basic standard. SANS 61000-4-17:2009This s tandard may only be used and printed by approved subscriptio

41、n and freemailing clients of the SABS .61000-4-17 IEC:1999+A1:2001 7 +A2:2008 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the refe

42、renced document (including any amendments) applies. IEC 60050(161), International Electrotechnical Vocabulary (IEV) Chapter 161: Electromagnetic compatibility IEC 60068-1, Environmental testing Part 1: General and guidance 3 General Ripple may influence the reliable operation of equipment and system

43、s, powered by d.c. supplies, installed in industrial plants as well in residential and commercial installations. The ripple disturbance is represented by the voltage derived from a pulsating quantity from which the direct component has been removed. The main sources of ripple disturbance are rectifi

44、er systems used in the external d.c. power networks and battery chargers. Ripple is therefore a phenomenon continuously present in this type of d.c. power source, and may be accentuated when the battery is recharging after a recovery of the a.c. power line service. Ripple components may also be prod

45、uced by equipment absorbing a pulsating current; this is not covered in this standard. 4 Definitions For the purpose of this part of IEC 61000 the following definitions apply, together with the definitions of IEC 60050(161) IEV. 4.1 ripple content, alternating component quantity derived by removing

46、the direct component from a pulsating quantity (see figure 1), IEV 161-02-25 4.2 EUT equipment under test SANS 61000-4-17:2009This s tandard may only be used and printed by approved subscription and freemailing clients of the SABS . 8 61000-4-17 IEC:1999+A1:2001 +A2:2008 5 Test levels and waveform T

47、he preferred range of test levels, applicable to the d.c. power supply port of the equipment, are given in table 1. Table 1 Test levels Level Percentage of the nominal d.c. voltage 1 2 3 4 x 2 5 10 15 x NOTE “x“ is an open level. This level can be given in the product specification. For the duration

48、 of the test, see 8.2. The test levels are a peak-to-peak voltage expressed as a percentage of the nominal d.c. voltage Ud.c. The amplitude of the ripple voltage is represented in figure 1 by the difference Umax Umin. The frequency of the ripple is the power frequency or its multiple 2, 3 or 6, as s

49、pecified by a product committee or according to the EUT manufacturers specifications or according to the characteristics of the rectifier system (see also clause A.2). The waveform of the ripple voltage, at the output of the test generator, has a sinusoid-linear character. A sinusoidal-linear characteristic can be described as a part of a sine wave and a line, tangent to the decreasing side of the rectified wave, that intersects the rising edge of the followin