SANS 984-2009 IEEE guide for performing arc-flash hazard calculations《弧闪光危害计算的IEEE标准实施导则》.pdf

1、 Collection of SANS standards in electronic format (PDF) 1. Copyright This standard is available to staff members of companies that have subscribed to the complete collection of SANS standards in accordance with a formal copyright agreement. This document may reside on a CENTRAL FILE SERVER or INTRA

2、NET SYSTEM only. Unless specific permission has been granted, this document MAY NOT be sent or given to staff members from other companies or organizations. Doing so would constitute a VIOLATION of SABS copyright rules. 2. Indemnity The South African Bureau of Standards accepts no liability for any

3、damage whatsoever than may result from the use of this material or the information contain therein, irrespective of the cause and quantum thereof. ISBN 978-0-626-23224-5 SANS 984:2009Edition 1 and IEEE amdt 1IEEE Std 1584:2002Edition 1 and amdt 1SOUTH AFRICAN NATIONAL STANDARD IEEE Guide for Perform

4、ing Arc-Flash Hazard Calculations This national standard is the identical implementation of IEEE Std 1584:2002 and IEEE amendment 1, and is adopted with the permission of the Institute of Electrical and Electronics Engineers. Published by SABS Standards Division 1 Dr Lategan Road Groenkloof Private

5、Bag X191 Pretoria 0001Tel: +27 12 428 7911 Fax: +27 12 344 1568 www.sabs.co.za SABS SANS 984:2009 Edition 1 and IEEE amdt 1 IEEE Std 1584:2002 Edition 1 and amdt 1 Table of changes Change No. Date Scope IEEE amdt 1 2004 Amended to introduce a second calculation for arc current for applications with

6、a system voltage under 1 000 V, to indicate specific formulae to be used when calculating arc-flash energies for current-limiting fuses, to specify equations to be used where time-current curves are available for systems using low-voltage circuit breakers, and to change a formula in the arc-flash ca

7、lculator. National foreword This South African standard was approved by National Committee SABS SC 67E, Electricity distribution systems and components Electricity distribution, in accordance with procedures of the SABS Standards Division, in compliance with annex 3 of the WTO/TBT agreement. This SA

8、NS document was published in December 2009. The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2002 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 23 September 2002. Printed in the United State

9、s of America.Print:ISBN 0-7381-3351-5 SH95023PDF:ISBN 0-7381-3352-3 SS95023National Electrical Code and NEC are both registered trademarks of the National Fire Protection Association, Inc.IEEE Buff Book, IEEE Green Book, and IEEE Red Book are registered trademarks of the Institute of Electrical and

10、ElectronicEngineers, Inc.No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1584-2002IEEE Guide for Performing Arc-Flash Hazard CalculationsSponsorPetroleum and Chemical Industry Co

11、mmitteeof theIndustry Applications SocietyAbstract: This guide provides techniques for designers and facility operators to apply indetermining the arc-flash hazard distance and the incident energy to which employees could beexposed during their work on or near electrical equipment.Keywords: arc faul

12、t currents, arc-flash hazard, arc-flash hazard analysis, arc-flash hazardmarking, arc in enclosures, arc in open air, bolted fault currents,electrical hazard, flash protectionboundary, incident energy, personal protective equipment, protective device coordination study,short-circuit study, working d

13、istancesAuthorized licensed use limited to: South African Bureau of Standard (SABS). Downloaded on August 11, 2009 at 04:41 from IEEE Xplore. Restrictions apply. SANS 984:2009This standard may only be used and printed by approved subscription and freemailing clients of the SABS .IEEE Standardsdocume

14、nts are developed within the IEEE Societies and the Standards Coordinating Commit-tees of the IEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through aconsensus development process, approved by the American National Standards Institute, which brings togethervolu

15、nteers representing varied viewpoints and interests to achieve the nal product. Volunteers are not necessarilymembers of the Institute and serve without compensation. While the IEEE administers the process and establishesrules to promote fairness in the consensus development process, the IEEE does n

16、ot independently evaluate, test,or verify the accuracy of any of the information contained in its standards.Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property orother damage, of any nature whatsoever, whether special, indirect, consequential,

17、or compensatory, directly orindirectly resulting from the publication, use of, or reliance upon this, or any other IEEE Standard document.The IEEE does not warrant or represent the accuracy or content of the material contained herein, and expresslydisclaims any express or implied warranty, including

18、 any implied warranty of merchantability or tness for a spe-cic purpose, or that the use of the material contained herein is free from patent infringement. IEEE Standardsdocuments are supplied “AS IS.”The existence of an IEEE Standard does not imply that there are no other ways to produce, test, mea

19、sure, pur-chase, market, or provide other goods and services related to the scope of the IEEE Standard. Furthermore, theviewpoint expressed at the time a standard is approved and issued is subject to change brought about throughdevelopments in the state of the art and comments received from users of

20、 the standard. Every IEEE Standard issubjected to review at least every ve years for revision or reafrmation. When a document is more than ve yearsold and has not been reafrmed, it is reasonable to conclude that its contents, although still of some value, do notwholly reect the present state of the

21、art. Users are cautioned to check to determine that they have the latest edi-tion of any IEEE Standard.In publishing and making this document available, the IEEE is not suggesting or rendering professional or otherservices for, or on behalf of, any person or entity. Nor is the IEEE undertaking to pe

22、rform any duty owed by anyother person or entity to another. Any person utilizing this, and any other IEEE Standards document, should relyupon the advice of a competent professional in determining the exercise of reasonable care in any given circum-stances.Interpretations: Occasionally questions may

23、 arise regarding the meaning of portions of standards as they relate tospecic applications. When the need for interpretations is brought to the attention of IEEE, the Institute will ini-tiate action to prepare appropriate responses. Since IEEE Standards represent a consensus of concerned interests,i

24、t is important to ensure that any interpretation has also received the concurrence of a balance of interests. For thisreason, IEEE and the members of its societies and Standards Coordinating Committees are not able to provide aninstant response to interpretation requests except in those cases where

25、the matter has previously received formalconsideration. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership afl-iation with IEEE. Suggestions for changes in documents should be in the form of a proposed change of text,together with appropriate supp

26、orting comments. Comments on standards and requests for interpretations shouldbe addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by the Insti-tu

27、te of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright ClearanceCenter. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service,222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to pho

28、tocopy portions of any indi-vidual standard for educational classroom use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may require use of subject mat-ter covered by patent rights. By publication of this

29、standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsfor which a license may be required by an IEEE standard or for conducting inquiries into the legal validity orscope of those

30、patents that are brought to its attention.Authorized licensed use limited to: South African Bureau of Standard (SABS). Downloaded on August 11, 2009 at 04:41 from IEEE Xplore. Restrictions apply. SANS 984:2009This standard may only be used and printed by approved subscription and freemailing clients

31、 of the SABS .Copyright 2002 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std 1584-2002, IEEE Guide for Performing Arc-Flash Hazard Calculations.)A technical paper by Lee, “The other electrical hazard: electric arc blast burns” B19 provided insight thatelectrical a

32、rc burns make up a substantial portion of the injuries from electrical malfunctions.aHe identiedthat electrical arcing is the term applied to current passing through vapor of the arc terminal conductivemetal or carbon material. The extremely high temperatures of these arcs can cause fatal burns at u

33、p to about5 ft and major burns at up to about 10 ft distance from the arc. Additionally, electrical arcs expel droplets ofmolten terminal material that shower the immediate vicinity, similar to, but more extensive than that fromelectrical arc welding. These ndings started to ll a void created by ear

34、ly works that identied electricalshock as the major electrical hazard. Mr. Lees work also helped establish a relationship between time tohuman tissue cell death and temperature, as well as a curable skin burn time-temperature relationship.Once forensic analysis of electrical incidents focused on the

35、 arc-ash hazard, experience over a period oftime indicated that Ralph Lees formulas for calculating the distance-energy relationship from source of arcdid not serve to reconcile the greater thermal effect on persons positioned in front of opened doors orremoved covers, from arcs inside electrical eq

36、uipment enclosures. A technical paper by Doughty, Neal, and Floyd, “Predicting incident energy to better manage the electric archazard on 600 v power distribution systems” B4 presented the ndings from many structured tests usingboth “arcs in open air” and “arcs in a cubic box.” These three phase tes

37、ts were performed at the 600 V ratingand are applicable for the range of 16 000 to 50 000 A short-circuit fault current. It was established that thecontribution of heat reected from surfaces near the arc intensies the heat directed toward the opening ofthe enclosure.The focus of industry on electric

38、al safety and recognition of arc-ash burns as having great signicancehighlighted the need for protecting employees from all arc-ash hazards. The limitations on applying theknown “best available” formulas for calculating the “curable” and “incurable” burn injuries have beenovercome. This guide does t

39、hat with new, empirically derived models based on statistical analysis and curvetting of the overall test data available.Conducting an arc-ash hazard analysis has been difcult. Not enough arc-ash incident energy testing hadbeen done from which to develop models that accurately represent all the real

40、 applications. The availablealgorithms are difcult for engineers in ofces to solve and near impossible for people in the eld to apply.This working group has overseen a signicant amount of testing and has developed new models of incidentenergy. The arc-ash hazard calculations included in this guide w

41、ill enable quick and comprehensivesolutions for arcs in single- or three- phase electrical systems either of which may be in open air or in a box,regardless of the low or medium voltage available.WarrantyTHE IEEE DOES NOT WARRANT OR REPRESENT THE ACCURACY OR CONTENT OF THE WORKAND EXPRESSLY DISCLAIM

42、S ANY EXPRESS OR IMPLIED WARRANTY, INCLUDING ANYIMPLIED WARRANTY OF MERCHANTABILITY OR FITNESS FOR A SPECIFIC PURPOSE ORTHAT THE USE OF THE WORK IS FREE FROM PATENT INFRINGEMENT. THE WORK ISSUPPLIED ONLY “AS IS.”USE AT YOUR OWN RISK.aThe numbers in brackets correspond to those of the bibliography in

43、 Annex F.Authorized licensed use limited to: South African Bureau of Standard (SABS). Downloaded on August 11, 2009 at 04:41 from IEEE Xplore. Restrictions apply. SANS 984:2009This standard may only be used and printed by approved subscription and freemailing clients of the SABS .ivCopyright 2002 IE

44、EE. All rights reserved.AcknowledgmentsMany organizations and individuals made cash or in-kind contributions that enabled the test program onwhich this guide is based. The IEEE Std 1584-2002 working group and IEEE gratefully acknowledge thesecontributions.SponsorsCooper BussmannCooper Crouse-HindsDu

45、Pont NomexKinectrics Inc.U. S. Navy NAVSEA CommandSquare D CompanySupportersAgrium Inc.The Dow Chemical Company Eastman KodakL Bruce McClungContributorsDuke EnergyEastman ChemicalSKM SystemsSophisticated statistical analysis was required to develop the empirically derived model which is presentedin

46、this guide. The IEEE Std 1584-2002 working group recognizes and thanks Dr. David Berengut for hiswork on this analysis.The “Bolted Fault Calculator” worksheet in the “IEEE_1584_Bolted_Fault_Cal.xls” was contributed byPaul and Dick Porcaro. The IEEE Std 1584-2002 working group recognizes and thanks t

47、hem for thiscontribution.The calculators can be accessed via the auxiliary les, “IEEE_1584_Bolted_Fault_Cal.xls” and“IEEE_1584_Arc_Flash_Hazard.xls”, and test data can be accessed via the auxiliary les, “Data_set.xls”,“Test_results_database.xls”, and “CL_Fuse_test_data.xls” provided with this standa

48、rd (CD ROM for printversions and spreadsheet les for the PDF version).Authorized licensed use limited to: South African Bureau of Standard (SABS). Downloaded on August 11, 2009 at 04:41 from IEEE Xplore. Restrictions apply. SANS 984:2009This standard may only be used and printed by approved subscrip

49、tion and freemailing clients of the SABS .Copyright 2002 IEEE. All rights reserved.vParticipantsAt the time this standard was completed, the working group had the following membership:Craig M. Wellman,ChairL. Bruce McClung, Vice ChairThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. Allen H. BinghamJames E. BowenE. William BussJohn CadickMicheal I. CallananDonald M. ColaberardinoAnthony CortezGreg CrawfordStephen CressD. Ray CrowDaniel DoanPaul Dobrowsk