TIA-455-191-B-2003 FOTP- 191 IEC-60793-1-45 Optical Fibres- Part 1-45 Measurement Methods and Test Procedures- Mode Field Diameter《FOTP-191 光纤 第1-45部分 单模式光纤的野外直径模式测量》.pdf

1、 TIA-455-191-B-2003 APPROVED: NOVEMBER 26, 2003 REAFFIRMED: FEBRUARY 6, 2013 TIA-455-191-B (Revision of TIA-455-191-A) November 2003FOTP- 191 IEC-60793-1-45 Optical Fibres- Part 1-45: Measurement Methods and Test Procedures- Mode Field Diameter NOTICE TIA Engineering Standards and Publications are d

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19、 OF DAMAGES IS A FUNDAMENTAL ELEMENT OF THE USE OF THE CONTENTS HEREOF, AND THESE CONTENTS WOULD NOT BE PUBLISHED BY TIA WITHOUT SUCH LIMITATIONS. FOREWARD With the adoption of international standard IEC 60793-1-45 (Optical Fibres Part 1-45: Measurement Methods and Test Procedures Mode Field Diamete

20、r) TIA-455-191-B supercedes the current TIA/EIA-455-191-A (FOTP-191 Measurement of Mode Field Diameter of Single-Mode Optical Fiber). This action was taken under the cognizance of the TIA-FO-4.6 Subcommittee on Optical Fibers. IEC 60793-1-45 adopted as TIA-455-191-B iCONTENTS 1 Scope1 2 Normative re

21、ferences.2 3 Reference test method.2 4 Apparatus 2 4.1 Light source 2 4.2 Input optics .3 4.3 Input positioner .3 4.4 Cladding mode stripper3 4.5 High-order mode filter3 4.6 Output positioner.3 4.7 Output optics.3 4.8 Detector 3 4.9 Computer 4 5 Sampling and specimens .4 5.1 Specimen length4 5.2 Spe

22、cimen end face4 6 Procedure4 7 Calculations.4 7.1 Method A Direct far-field scan.4 7.2 Method B Variable aperture in the far field 5 7.3 Method C Near-field scan .6 8 Results 7 8.1 Information to be provided with each measurement7 8.2 Information available upon request 7 9 Specification information7

23、 Annex A (normative) Requirements specific to method A Mode field diameter by direct far-field scan.8 A.1 Apparatus .8 A.1.1 Scanning detector assembly Signal detection electronics 8 A.2 Procedure .9 A.3 Calculations 9 A.4 Sample data10 Annex B (normative) Requirements specific to method B Mode fiel

24、d diameter by variable aperture in the far field 11 B.1 Apparatus .11 B.1.1 Output variable aperture assembly.11 B.1.2 Output optics system .12 B.1.3 Detector assembly and signal detection electronics12 B.2 Procedure .12 B.3 Calculations 13 B.4 Sample data set 13 IEC 60793-1-45 adopted as TIA-455-19

25、1-B iiAnnex C (normative) Requirements specific to method C Mode field diameter by near-field scan14 C.1 Apparatus .14 C.1.1 Magnifying output optics 14 C.1.2 Scanning detector14 C.1.3 Detection electronics .14 C.2 Procedure .15 C.3 Calculations 16 C.3.1 Calculate the centroid 16 C.3.2 Fold the inte

26、nsity profile.16 C.3.3 Compute the integrals16 C.3.4 Complete the calculation17 Annex D (normative) Requirements specific to method D Mode field diameter by optical time domain reflectometer (OTDR).18 D.1 Apparatus .18 D.1.1 OTDR 18 D.1.2 Optional auxiliary switches.18 D.1.3 Optional computer .19 D.

27、1.4 Test sample.19 D.1.5 Reference sample19 D.2 Procedure .19 D.3 Calculations 20 D.3.1 Reference fibre MFD20 Annex E (informative) Sample data sets and calculated values.23 E.1 Method A MFD by direct far-field scan 23 E.2 Method B MFD by variable aperture in the far field24 E.3 Method C MFD by near

28、-field scan .24 Figure 1 Transform relationships between measurement results.1 Figure A.1 Far-field measurement set 8 Figure B.1 Variable aperture by far-field measurement set .11 Figure C.1 Near-field measurement set-ups .15 Figure D.1 Optical switch arrangement.19 Figure D.2 View from reference fi

29、bre A.20 Figure D.3 View from reference fibre B.20 Figure D.4 Validation example Comparison of methods .21 Table E.1 Sample data, method A MFD by direct far-field scan23 Table E.2 Sample data set, method B MFD by variable aperture in the far field24 Table E.3 Sample data set, method C MFD by near-fi

30、eld scan.24 IEC 60793-1-45 adopted as TIA-455-191-B iiiINTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL FIBRES Part 1-45: Measurement methods and test procedures Mode field diameter FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization com

31、prising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes Internati

32、onal Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation.

33、 The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international cons

34、ensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for international use and are published in the form of standards, technical specifications, technical report

35、s or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maximum extent possible in their national and regional standards. Any divergence b

36、etween the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with one of its standards. 6) Atte

37、ntion is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60793-1-45 has been prepared by subcommittee 86A: Fibres and

38、 cables, of IEC technical committee 86: Fibre optics. This standard, together with the other standards in the IEC 60793-1-4X series, replaces the second edition of IEC 60793-1-4, of which it constitutes a technical revision. The text of this standard is based on the following documents: FDIS Report

39、on voting 86A/674/FDIS 86A/698/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 3. Annexes A, B, C and D form an integral part of t

40、his standard. IEC 60793-1-45 adopted as TIA-455-191-B ivAnnex E is for information only. IEC 60793-1-1 and IEC 60793-1-2 cover generic specifications. IEC 60793-1-4X consists of the following parts, under the general title: Optical fibres: Part 1-40: Measurement methods and test procedures Attenuati

41、on Part 1-41: Measurement methods and test procedures Bandwidth Part 1-42: Measurement methods and test procedures Chromatic dispersion Part 1-43: Measurement methods and test procedures Numerical aperture Part 1-44: Measurement methods and test procedures Cut-off wavelength Part 1-45: Measurement m

42、ethods and test procedures Mode field diameter Part 1-46: Measurement methods and test procedures Monitoring of changes in optical transmittance Part 1-47: Measurement methods and test procedures Macrobending loss Part 1-48: Measurement methods and test procedures Under consideration Part 1-49: Meas

43、urement methods and test procedures Under consideration The committee has decided that the contents of this publication will remain unchanged until 2003. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition, or amended. The contents of the corrigendum of July 2

44、002 have been included in this copy. IEC 60793-1-45 adopted as TIA-455-191-B vINTRODUCTION Publications in the IEC 60793-1 series concern measurement methods and test procedures as they apply to optical fibres. Within the same series several different areas are grouped, as follows: parts 1-10 to 1-1

45、9: General parts 1-20 to 1-29: Measurement methods and test procedures for dimensions parts 1-30 to 1-39: Measurement methods and test procedures for mechanical characteristics parts 1-40 to 1-49: Measurement methods and test procedures for transmission and optical characteristics parts 1-50 to 1-59

46、: Measurement methods and test procedures for environmental characteristics IEC 60793-1-45 adopted as TIA-455-191-B vi.IEC 60793-1-45 adopted as TIA-455-191-B 1OPTICAL FIBRES Part 1-45: Measurement methods and test procedures Mode field diameter 1 Scope This part of IEC 60793 establishes uniform req

47、uirements for measuring the mode field diameter (MFD) of optical fibre, thereby assisting in the inspection of fibres and cables for commercial purposes. The MFD represents a measure of the transverse extent of the electromagnetic field intensity of the mode in a fibre cross section, and it is defin

48、ed from the far-field intensity distribution as a ratio of integrals known as the Petermann II definition. See equation (1). The definitions of MFD are strictly related to the measurement configurations. The mathematical equivalence of these definitions results from transform relationships between m

49、easurement results obtained by different implementations summarized in figure 1 as follows: Far-fieldscanVariableaperturetechniqueHankeltransformIntegrationNear fieldscanFigure 1 Transform relationships between measurement results Four methods are described for measuring MFD: method A: direct far-field scan; method B: variable aperture in the far field; method C: near-field scan; method D: bi-directional backscatter using an optical time domain ref