1、 Electromagnetic compatibility (EMC) Part 3-3: Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current 16 A per phase and not subject to conditional connection INTERNATIONAL STANDARD IEC61000-3-3Edition 1.22005-10R
2、eference number IEC 61000-3-3:1994+A1:2001+A2:2005(E) Edition 1:1994 consolidated with amendments 1:2001 and 2:2005 This English-language version is derived from the original bilingual publication by leaving out all French-language pages. Missing page numbers correspond to the French-language pages.
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9、c.ch Tel: +41 22 919 02 11 Fax: +41 22 919 03 00 Electromagnetic compatibility (EMC) Part 3-3: Limits Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current 16 A per phase and not subject to conditional connection For pr
10、ice, see current catalogue IEC 2005 Copyright - all rights reserved No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from the publisher. International Electrotechnical
11、Commission, 3, rue de Varemb, PO Box 131, CH-1211 Geneva 20, SwitzerlandTelephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmailiec.ch Web: www.iec.ch INTERNATIONAL STANDARD IEC61000-3-3Edition 1.22005-10U Commission Electrotechnique InternationaleInternational Electrotechnical Commissio
12、n PRICE CODE Edition 1:1994 consolidated with amendments 1:2001 and 2:2005 61000-3-3 IEC:1994+A1:2001+A2:2005 3 CONTENTS FOREWORD.5 INTRODUCTION.9 1 Scope.11 2 Normative references .11 3 Definitions .13 4 Assessment of voltage changes, voltage fluctuations and flicker .17 4.1 Assessment of a relativ
13、e voltage change, d .17 4.2 Assessment of the short-term flicker value, Pst.17 4.2.1 Flickermeter .19 4.2.2 Simulation method.19 4.2.3 Analytical method .19 4.2.4 Use of Pst = 1 curve.21 4.3 Assessment of long-term flicker value, Plt.21 5 Limits .21 6 Test conditions .23 6.1 General .23 6.2 Measurem
14、ent accuracy .25 6.3 Test supply voltage .25 6.4 Reference impedance.25 6.5 Observation period .27 6.6 General test conditions.27 Annex A (normative) Application of limits and type test conditions for specific equipment.37 Annex B (normative) Test conditions and procedures for measuring dmax voltage
15、 changes caused by manual switching .53 Figure 1 Reference network for single-phase and three-phase supplies derived from a three-phase, four-wire supply.29 Figure 2 Histogram evaluation of U(t).31 Figure 3 Relative voltage change characteristic .31 Figure 4 Curve for Pst=1 for rectangular equidista
16、nt voltage changes .33 Figure 5 Shape factors F for double-step and ramp-voltage characteristics.33 Figure 6 Shape factors F for rectangular and triangular voltage characteristics.35 Figure 7 Shape factor F for motor-start voltage characteristics having various front times .35 Table 1 Assessment met
17、hod .17 Table A.1 Electrode parameters.47 Table A.2 Frequency factor R related to repetition rate r .51 61000-3-3 IEC:1994+A1:2001+A2:2005 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY (EMC) Part 3-3: Limits Limitation of voltage changes, voltage fluctuations and flicke
18、r in public low-voltage supply systems, for equipment with rated current 16 A per phase and not subject to conditional connection FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC N
19、ational Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Pu
20、blicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-gove
21、rnmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC
22、on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accept
23、ed by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote internationa
24、l uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latt
25、er. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its di
26、rectors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses aris
27、ing out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is
28、drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-3-3 has been prepared by subcommittee 77A: Low-frequency phenomena, of IEC
29、 technical committee 77: Electromagnetic compatibility. This consolidated version of IEC 61000-3-3 is based on the first edition (1994) documents 77A(BC)38 and 77A(BC)40, its amendment 1 (2001) documents 77A/326/FDIS and 77A/328/RVD and its amendment 2 (2005) documents 77A/493/FDIS and 77A/502/RVD.
30、It bears the edition number 1.2. A vertical line in the margin shows where the base publication has been modified by amendments 1 et 2. 61000-3-3 IEC:1994+A1:2001+A2:2005 7 Annexes A and B form an integral part of this standard. The committee has decided that the contents of the base publication and
31、 its amendments will remain unchanged until the maintenance result date indicated on the IEC web site under http:/webstore.iec.ch in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61000-3-3 IEC:19
32、94+A1:2001+A2:2005 9 INTRODUCTION IEC 61000 is published in separate parts according to the following structure: Part 1: General General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment
33、 Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility of product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guideli
34、nes Mitigation methods and devices Part 9: Miscellaneous Each part is further subdivided into sections which are to be published either as International Standards or as Technical Reports. These standards and reports will be published in chronological order and numbered accordingly. This part is a Pr
35、oduct Family Standard. The limits in this standard relate to the voltage changes experienced by consumers connected at the interface between the public supply low-voltage network and the equipment users installation. Consequently, if the actual impedance of the supply at the supply terminals of equi
36、pment connected within the equipment users installation exceeds the test impedance, it is possible that supply disturbance exceeding the limits may occur. 61000-3-3 IEC:1994+A1:2001+A2:2005 11 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 3-3: Limits Limitation of voltage changes, voltage fluctuations an
37、d flicker in public low-voltage supply systems, for equipment with rated current 16 A per phase and not subject to conditional connection 1 Scope This part of IEC 61000 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limit
38、s of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This part of IEC 61000 is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected
39、 to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. Equipment which does not comply with the limits of this part of IEC 61000 when tested with the reference impedance Zref of 6.4, and which therefore cannot be de
40、clared compliant with this part, may be retested or evaluated to show conformity with IEC 61000-3-11. Part 3-11 is applicable to equipment with rated input current 75 A per phase and subject to conditional connection. The tests according to this part are type tests. Particular test conditions are given in annex A and the test circuit is shown in f
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