IEC 60115-2-2-1992 Fixed resistors for use in electronic equipment part 2 blank detail specification fixed low-power non-wirewound resistors assessment level F《电子设备用固定电阻器 第2-2部分 空白详细规范 低功率非线绕固定电阻器.pdf

1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 1 1512-2 QC 400102 Premire dition First edition 1992-04 Rsistances fixes utilises dans les quipements lectroniques Partie 2: S pcif icat ion particu I i re-cadre: Rsistances fixes non bobines, faible dissipation Niveau dassurance F Fixed resistors

2、for use in electronic equipment Part 2: Blank detail specification: Fixed low-power non-wirewound resistors Assessment level F Numro de rfrence Reference number CEMEC 11 5-2-2: 1992 Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproductio

3、n or networking permitted without license from IHS-,-,-Numros des publications Depuis le ler janvier 1997, les publications de la CE1 sont numrotes partir de 60000. Publications consolides Les versions consolides de certaines publications de la CE1 incorporant les amendements sont disponibles. Par e

4、xemple, les numros ddition 1.0, 1.1 et 1.2 indiquent respectivement la publication de base, la publication de base incorporant lamendement 1, et la publication de base incorporant les amendements 1 et 2. Validit de la prsente publication Le contenu technique des publications de la CE1 est constammen

5、t revu par la CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfirmation de la publication sont disponibles dans le Catalogue de la CEI. Les renseignements relatifs des questions ltude et des travaux en cours entrepris par le comit technique qui a tabli c

6、ette publication, ainsi que la liste des publications tablies, se trouvent dans les documents ci- dessous: Site web de la CEI* Catalogue des publications de la CE1 Publi annuellement et mis jour rgulirement (Catalogue en ligne)* Disponible la fois au 4te web, de la CEI et comme priodique imprim Bull

7、etin de la CE1 Terminologie, symboles graphiques et littraux En ce qui concerne la terminologie gnrale, le lecteur se reportera la CE1 60050: Vocabulaire Electro- technique International (VE I). Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le le

8、cteur consultera la CE1 60027: Symboles littraux i utiliser en lectrotechnique, la CE1 6041 7: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles, et la CE1 60617: Symboles graphiques pour schmas. * Voir adresse Limiting element voltage (V d.c. or

9、a.c. r.m.s.) TABLE I Isolat ion voltage (V d.c. or a.c. peak) Maximum dimensions L D All dimensions are in millimetres or inches and millimetres. Resistance range* Tolerance on rated resistance Climatic category Low air pressure Stability class Limits for change of resistance: - for long-term tests

10、- for short-term tests dnom : Tol. : . to . Q f . % -/-/- 8,s kPa (85 mbar) . % I( . %R + . Q) I( . %R + . Q) Variation of resistance with (Comme pour Sous- groupe C2) Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networkin

11、g permitted without license from IHS-,-,-115-2-2 O LEC -23- Sub-clause number and Test (see Note 1) Sub-group D4 4.25 Endurance at other tempe- ratures (if appl icable ) :onditions of test :see Note 1) les ist ance Cnsulation resistance Insulated resistors nW) luration: 1 O00 h Examination at 48 h,

12、500 h and 1 O00 h: irisual examinat ion Res ist ance Examination at 1 O00 h: Insulation resistance (Insulated resistors only) (This sub-group is only applicable if a derating curve other than those shown in the sectional specification, IEC Publication 115-2, Sub-clause 2.2.3, is claimed in the detai

13、l specification) Duration: 1 O00 h Examination at 48 h, 500 h and 1 O00 h: Visual examinat ion Resistance iample size : criterion If accepta- Iiity (see lote P 36 36 C 1 1 e rf ormance .e qu i rement s see Note 1) ,R 1. I( . %R + . Q) L 100 MR - LS specified in lable I of this ;pecif ication lo visi

14、ble damage LR 1. f( . %R -+ . Q: tll GQ To visible damage IR 5 f( . %R + . Q: (As for Sub-group C2: Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- 24 - 115-2-2 O CE1 Numro d

15、e paragraphe I et essai (voir note 1) Sous-groupe D5 4.8 Variation de rsistance en fonction de la temprature Sous-groupe D6 4.7 Tension de tenue (rsis- tances isoles seulement) Conditions dessai (voir note i) Examen 2 1 O00 h: Rsistance disolement (rsistances isoles Seulement) Temprature minimale de

16、 catgorie/20 C 20 “C/temprature maximale de catgorie Mthode: . Effectif de Lchantillon zt critre i acceptat ion (voi P - 36 36 no n - !O !O e 3) C - 1 1 Ex i g e nc e s (voir note 1) RL 1 GR LE f . % R- ou a: . x o-/oc f . % R- ou a: . x o-/oc Pas de claquage, ni de contournement Copyright Internati

17、onal Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-115-2-2 O IEC Sub-clause number and Test (see Note 1) Sub-group D5 4.8 Variation of resistance with temp er a- ture Sub-group D6 4.7 Voltage proof

18、 (Insulated resistors only) - 25 - :onditions of test (see Note 1) Examination at 1 O00 h: Insulation resistance (Insulated resistors only 1 Lower category tempera- ture/20 “C 20 Wupper category temperature Method: . ;ample size ic criterion )f accepta- )iiity (see Tote P - 36 - 36 Performance requi

19、rements (see Note 1) RL1 GR !E f . % R- or a: . x o-/oc &E f . % R- or a: . x o-/oc No breakdown or f 1 ashove r Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright Inte

20、rnational Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ICs 31.040.10 Typeset and printed by the IEC Central Office GENEVA, SWITZERLAND Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-