IEC 60384-1-2016 Fixed capacitors for use in electronic equipment - Part 1 Generic specification《电子设备用固定电容器.第1部分 总规范》.pdf

1、 IEC 60384-1 Edition 5.0 2016-02 REDLINE VERSION Fixed capacitors for use in electronic equipment Part 1: Generic specification IEC 60384-1:2016-02 RLV(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, n

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10、o give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 60384-1 Edition 5.0 2016-02 REDLINE VERSION Fixed capacitors for use in electronic equipment Part 1: Generic specification INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS

11、31.060 ISBN 978-2-8322-3167-8 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 60384-1:2016 RLV IEC 2016 CONTENTS FOREWORD . 9 INTRODUCTION . 11 1 General . 13 1.1 Scope . 1

12、3 1.2 Normative references 13 2 Technical data . 15 2.1 Symbols, units and abbreviated terms . 15 2.1.1 General . 15 2.1.2 Letter symbols . 15 2.1.3 Abbreviations . 16 2.2 Terms and definitions 16 2.3 Preferred values and additional technical requirements 21 2.3.1 General . 21 2.3.2 Preferred values

13、 of nominal capacitance 22 2.3.3 Preferred values of rated voltage 22 2.3.4 Rated a.c. load 22 2.3.5 Rated pulse load 22 2.3.6 Temperature derated voltage 23 2.4 Marking . 23 2.4.1 General . 23 2.4.2 Coding . 23 3 Quality assessment procedures . 24 4 Tests and measurement procedures . 24 4.1 General

14、 . 25 4.2 Standard atmospheric conditions . 25 4.2.1 Standard atmospheric conditions for testing 25 4.2.2 Recovery conditions . 25 4.2.3 Referee conditions . 26 4.2.4 Reference conditions . 26 4.3 Drying . 26 4.4 Visual examination and check of dimensions . 26 4.4.1 Visual examination . 26 4.4.2 Dim

15、ensions (gauging) 27 4.4.3 Dimensions (detail) 27 4.5 Insulation resistance . 27 4.5.1 Preconditioning 27 4.5.2 Measuring conditions . 27 4.5.3 Test points . 27 4.5.4 Test methods . 28 4.5.5 Temperature compensation 28 4.5.6 Conditions to be prescribed in the relevant specification . 28 4.6 Voltage

16、proof 30 4.6.1 General . 30 4.6.2 Test circuit (for the test between terminations) 30 4.6.3 Test . 31 4.6.4 Requirements 32 IEC 60384-1:2016 RLV IEC 2016 3 4.6.5 Conditions to be prescribed in the relevant specification . 32 4.7 Capacitance 33 4.7.1 Measuring frequency and measuring voltage 33 4.7.2

17、 Measuring equipment . 33 4.7.3 Conditions to be prescribed in the relevant specification . 33 4.8 Tangent of loss angle and equivalent series resistance (ESR) 33 4.8.1 Tangent of loss angle . 33 4.8.2 Equivalent series resistance (ESR) . 34 4.9 Leakage current 34 4.9.1 Preconditioning 34 4.9.2 Test

18、 method . 34 4.9.3 Power source . 34 4.9.4 Measuring accuracy . 34 4.9.5 Test circuit . 34 4.9.6 Conditions to be prescribed in the relevant specification . 34 4.10 Impedance 35 4.11 Self-resonant frequency and inductance 36 4.11.1 Self-resonant frequency (f r ) 36 4.11.2 Inductance . 39 4.11.3 Cond

19、itions to be prescribed in the relevant specification . 39 4.12 Outer foil termination . 39 4.13 Robustness of terminations . 40 4.13.1 General . 40 4.13.2 Test Ua 1 Tensile . 40 4.13.3 Test Ub Bending (half of the sample) . 41 4.13.4 Test Uc Torsion (remaining sample) 41 4.13.5 Test Ud Torque . 41

20、4.13.6 Visual examination . 41 4.14 Resistance to soldering heat . 41 4.14.1 Preconditioning and initial measurement . 41 4.14.2 Test procedure . 41 4.14.3 Recovery . 42 4.15 Solderability 42 4.15.1 General . 42 4.15.2 Preconditioning 42 4.15.3 Test procedure . 42 4.15.4 Final inspection, measuremen

21、ts and requirements 43 4.16 Rapid change of temperature 43 4.16.1 Initial measurement 43 4.16.2 Test procedure . 43 4.16.3 Final inspection, measurements and requirements 43 4.17 Vibration . 43 4.17.1 Initial measurement 43 4.17.2 Test procedure . 43 4.17.3 Electrical test (intermediate measurement)

22、 . 43 4.17.4 Final inspection, measurements and requirements 43 4.18 Bump (repetitive shock) . 44 4.18.1 Initial measurement 44 4.18.2 Test procedure . 44 4 IEC 60384-1:2016 RLV IEC 2016 4.18.3 Final inspection, measurements and requirements 44 4.14.4 Final inspection, measurement and requirements 4

23、2 4.19 Shock . 44 4.19.1 Initial measurement 44 4.19.2 Test procedure . 44 4.19.3 Final inspection, measurements and requirements 44 4.20 Container sealing 44 4.21 Climatic sequence . 44 4.21.1 General . 44 4.21.2 Initial measurements 44 4.21.3 Dry heat . 45 4.21.4 Damp heat, cyclic, Test Db, first

24、cycle 45 4.21.5 Cold . 45 4.21.6 Low air pressure 45 4.21.7 Damp heat, cyclic, Test Db, remaining cycles . 46 4.21.8 Final measurements . 46 4.22 Damp heat, steady state 46 4.22.1 Initial measurement 46 4.22.2 Test procedure . 46 4.22.3 Final inspection, measurements and requirements 46 4.23 Enduran

25、ce 46 4.23.1 Initial measurements 46 4.23.2 Test procedure . 46 4.23.3 Conditions to be prescribed in the relevant specification . 47 4.23.4 Test voltage . 47 4.23.5 Placement in the test chamber . 48 4.23.6 Recovery . 48 4.23.7 Final inspection, measurements and requirements 48 4.24 Variation of ca

26、pacitance with temperature 48 4.24.1 Static method . 48 4.24.2 Dynamic method 49 4.24.3 Methods of calculation . 49 4.25 Storage . 51 4.25.1 Storage at high temperature . 51 4.25.2 Storage at low temperature 51 4.26 Surge 51 4.26.1 Initial measurement 51 4.26.2 Test procedure . 51 4.26.3 Final inspe

27、ction, measurements and requirements 53 4.26.4 Information to be given in the relevant detail specification . 53 4.27 Charge and discharge tests and inrush current test 53 4.27.1 Initial measurement 53 4.27.2 Test procedure . 53 4.27.3 Charge and discharge 54 4.27.4 Inrush current 55 4.27.5 Final in

28、spection, measurements and requirements 55 4.28 Pressure relief (for aluminium electrolytic capacitors) . 55 4.28.1 General . 55 4.28.2 AC test 55 IEC 60384-1:2016 RLV IEC 2016 5 4.28.3 DC test 55 4.28.4 Pneumatic test . 55 4.28.5 Final inspection, measurements and requirements 55 4.29 Characteristi

29、cs at high and low temperature . 55 4.29.1 Test procedure . 55 4.29.2 Requirements 56 4.30 Thermal stability test . 56 4.31 Component solvent resistance . 56 4.31.1 Initial measurements 56 4.31.2 Test procedure . 56 4.31.3 Final inspection, measurements and requirements 56 4.32 Solvent resistance of

30、 marking 56 4.32.1 Test procedure . 56 4.32.2 Final inspection, measurements and requirements 57 4.33 Mounting (for surface mount capacitors only) . 57 4.33.1 Substrate . 57 4.33.2 Wave soldering 57 4.33.3 Reflow soldering 57 4.34 Shear test . 60 4.34.1 Test procedure . 60 4.34.2 Final inspection, m

31、easurements and requirements 60 4.35 Substrate bending test 60 4.35.1 Test procedure . 60 4.35.2 Recovery . 61 4.35.3 Final inspection and requirements 61 4.36 Dielectric absorption . 61 4.36.1 Test procedure . 61 4.36.2 Requirement 62 4.37 Damp heat, steady state (for multilayer ceramic capacitors

32、only), accelerated . 62 4.37.1 Mounting of capacitors 4.37.1 Initial measurements . 62 4.37.2 Test methods . 62 4.37.3 Test procedures . 62 4.37.4 Recovery 4.37.4 Final inspection, measurements and requirements 63 4.38 Passive flammability 63 4.38.1 Test procedure . 63 4.38.2 Final inspection, measu

33、rements and requirements 63 4.39 High surge current test 64 4.39.1 Initial measurements 64 4.39.2 Test procedure . 64 4.39.3 Requirements for the charging circuit . 64 4.39.4 Nonconforming items . 65 4.40 Voltage transient overload (for aluminium electrolytic capacitors with non- solid electrolyte)

34、65 4.40.1 Initial measurement 65 4.40.2 Test procedure . 65 4.40.3 Final inspection, measurements and requirements 66 6 IEC 60384-1:2016 RLV IEC 2016 4.40.4 Conditions to be prescribed in the relevant specification . 66 4.41 Whisker growth test . 67 4.41.1 General . 67 4.41.2 Preparation of specimen

35、. 67 4.41.3 Initial measurement 67 4.41.4 Test procedures . 67 4.41.5 Test severities . 67 4.41.6 Final inspection, measurements and requirements 67 Annex A (informative) Interpretation of sampling plans and procedures as described in IEC 60410 for use within the IECQ system quality assessment syste

36、ms . 68 Annex B (normative informative) Rules for the preparation of detail specifications for capacitors and resistors for electronic equipment for use within the IECQ system quality assessment systems 69 B.1 Drafting . 69 B.2 Reference standard . 69 B.3 Circulation 69 Annex C (normative informativ

37、e) Layout of the first page of a PCP/CQC specification . 70 Annex D (normative informative) Requirements for capability approval test report . 71 D.1 Introduction General 71 D.2 General Requirements 71 D.3 Summary of test information (for each CQC) 71 D.4 Measurement record . 71 Annex E (informative

38、) Guide for pulse testing of capacitors . 72 E.1 Introduction Overview 72 E.2 Typical capacitor pulse conditions . 72 E.3 Effect of inductance on pulse testing . 73 Annex F (informative) Guidance for the extension of endurance tests on fixed capacitors . 75 F.1 Introduction Overview 75 F.2 Guideline

39、s. 75 Annex G (normative) Damp heat, steady state with voltage applied, for metallized film capacitors only . 76 G.1 Introduction Overview 76 G.2 Test procedure 76 Annex H (normative) Accelerated damp heat, steady state, for multilayer ceramic capacitors only . 77 H.1 Mounting of capacitors 77 H.2 I

40、nitial measurement . 77 H.3 Test procedure 77 H.4 Recovery 77 H.5 Final inspection, measurements and requirements . 77 Annex Q (normative informative) Quality assessment procedures . 78 Q.1 General . 88 Q.1.1 Scope of this annex . 88 Q.1.2 Quality assessment definitions . 89 Q.1.3 Rework 89 Q.1.4 Al

41、ternative test methods . 90 Q.1.5 Certified test records of released lots . 90 Q.1.6 Unchecked parameters 90 IEC 60384-1:2016 RLV IEC 2016 7 Q.1.7 Delayed delivery 90 Q.1.8 Repair . 90 Q.1.9 Registration of approvals 91 Q.1.10 Manufacture outside the geographical limits . 91 Q.2 Qualification approv

42、al (QA) procedures . 91 Q.2.1 Eligibility for qualification approval 91 Q.2.2 Application for qualification approval 91 Q.2.3 Subcontracting . 91 Q.2.4 Test procedure for the initial product qualification approval . 91 Q.2.5 Granting of qualification approval . 91 Q.2.6 Maintenance of qualification

43、approval . 92 Q.2.7 Quality conformance inspection 92 Q.3 Capability approval (CA) procedures 92 Q.3.1 General . 92 Q.3.2 Eligibility for capability approval . 92 Q.3.3 Application for capability approval 93 Q.3.4 Subcontracting . 93 Q.3.5 Description of the capability . 93 Q.3.6 Demonstration and v

44、erification of capability 93 Q.3.7 Granting of capability approval . 93 Q.3.8 Maintenance of capability approval . 93 Q.3.9 Quality conformance inspection 93 Q.4 Technology approval (TA) procedure . 94 Q.4.1 General . 94 Q.4.2 Eligibility for technology approval . 94 Q.4.3 Application of technology

45、approval . 94 Q.4.4 Subcontracting . 94 Q.4.5 Description of technology . 94 Q.4.6 Demonstration and verification of the technology 94 Q.4.7 Granting of technology approval . 95 Q.4.8 Maintenance of technology approval . 95 Q.4.9 Quality conformance inspection 95 Bibliography . 96 Figure 1 Reactive

46、power against frequency 22 Figure 2 Relation between category temperature range and applied voltage 23 Figure 3 Voltage-proof test circuit . 30 Figure 4 Schematic diagram of the impedance measuring circuit . 35 Figure 5 Capacitor mounting arrangement 36 Figure 6 Capacitor mounting arrangement 37 Fig

47、ure 7 Typical diagram of an absorption oscillator-wavemeter 38 Figure 8 Schematic diagram of the measuring circuit 38 Figure 9 Test circuit . 40 Figure 10 Test circuit for electrolytic capacitors 48 Figure 11 Relay circuit . 52 Figure 12 Thyristor circuit 52 Figure 13 Voltage waveform across capacit

48、or . 53 8 IEC 60384-1:2016 RLV IEC 2016 Figure 14 Voltage and current waveform 54 Figure 15 Suitable substrate for mechanical tests (may not be suitable for impedance measurements) . 59 Figure 16 Suitable substrate for electrical tests 60 Figure 17 High surge current test . 64 Figure 18 Voltage tran

49、sient overload test circuit . 65 Figure 19 Voltage waveform 66 Figure Q.1 General scheme for capability approval Table 1 Referee conditions 26 Table 2 Measurement of insulation resistance 27 Table 3 Measuring points . 29 Table 4 Tensile force . 40 Table 5 Torque 41 Table 6 Number of cycles 46 Table 7 Severities and requirements 63 IEC 60384-1:2016 RLV IEC 2016 9 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT Pa