IEC 60512-9-2-2011 Connectors for electronic equipment - Tests and measurements - Part 9-2 Endurance tests - Test 9b Electrical load and temperature《电子设备连接器检测和测量.第9-2部分 耐久性试验.9b试验 电力负载和温度》.pdf

1、 IEC 60512-9-2 Edition 1.0 2011-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 9-2: Endurance tests Test 9b: Electrical load and temperature Connecteurs pour quipements lectroniques Essais et mesures Partie 9-2: Essais dendurance Essai

2、9b: Charge lectrique et temprature IEC60512-9-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, inclu

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16、us avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-9-2 Edition 1.0 2011-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 9-2: Endurance tests

17、Test 9b: Electrical load and temperature Connecteurs pour quipements lectroniques Essais et mesures Partie 9-2: Essais dendurance Essai 9b: Charge lectrique et temprature INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE G ICS 31.220.01 PRICE CODE CODE PRIX ISBN 97

18、8-2-88912-809-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-9-2 IEC:2011 CONTENTS FOREWORD . 3 1 Scope and object 5 2 Normative references . 5 3 Preparation 5 Preparation of the specimen 5 3.1Equipment .

19、6 3.24 Test method . 6 5 Final measurements . 6 6 Details to be specified 7 60512-9-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 9-2: Endurance tests Test 9b: Electrical load and temperature FOREWORD 1) The International Ele

20、ctrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields

21、. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC N

22、ational Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization

23、 (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representati

24、on from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot

25、 be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications.

26、 Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, acces

27、s to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including indiv

28、idual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon,

29、this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of

30、this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-9-2 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanica

31、l structures for electronic equipment. This standard cancels and replaces Test 9b of IEC 60512-5, issued in 1992. The structure of the test documents in the IEC 60512 series is explained in IEC 60512-1-100. 4 60512-9-2 IEC:2011 The text of this standard is based on the following documents: FDIS Repo

32、rt on voting 48B/2243/FDIS 48B/2255/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of IEC 60512 series, un

33、der the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data re

34、lated to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60512-9-2 IEC:2011 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 9-2: Endurance tests Test 9b: Electrical load and temperature 1 Scope and o

35、bject This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard test method to ass

36、ess the ability of a connector to withstand elevated temperatures with electrical loading. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies.

37、 For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-1-100, Connectors for electronic equipment Tests an

38、d measurements Part 1-100: General Applicable publications IEC 60512-2-1, Connectors for electronic equipment Tests and measurements Part 2-1: Electrical continuity and contact resistance tests Test 2a: Contact resistance Millivolt level method IEC 60512-2-6, Connectors for electronic equipment Test

39、s and measurements Part 2-6: Electrical continuity and contact resistance tests Test 2f: Housing (shell) electrical continuity IEC 60512-3-1, Connectors for electronic equipment Tests and measurements Part 3-1: Insulation tests Test 3a: Insulation resistance IEC 60512-4-1, Connectors for electronic

40、equipment Tests and measurements Part 4-1: Voltage stress tests Test 4a: Voltage proof 3 Preparation Preparation of the specimen 3.1The specimen shall be suitably fitted with temperature-sensing device(s) with dimensions as laid down in the detail specification, and be wired and mounted according to

41、 the detail specification. NOTE 1 Heat transfer by a measuring probe will influence the measurement. Care should be taken to limit this influence, e.g. by using a non-intrusive measuring method. 6 60512-9-2 IEC:2011 NOTE 2 Attention is drawn to the fact that reproducibility is frequently improved by

42、 arranging the wiring horizontally. Equipment 3.2A suitable climatic chamber. Influence of the air circulation to the specimen shall be avoided. 4 Test method The specimen shall be subjected to a temperature endurance test with electrical load in accordance with the requirements of the detail specif

43、ication. Initially (see note) and again at the end of the test, the insulation resistance at high temperature shall be measured according to IEC 60512-3-1, test 3a and shall be not less than the value specified by the detail specification. NOTE Due to the fact that specimen may be wired in series, a

44、n insulation resistance measurement after e.g. 10 h of exposure can be unpractical. In cases where such a measurement is possible, early failures will be detected, so that time-consuming testing can be avoided. The prepared specimen shall be placed in a chamber, the temperature of which shall be mai

45、ntained at 70 % 5 % of the specified maximum operating temperature of the specimen under test. Current shall be applied to the specimen and slowly increased until the specified maximum operating temperature (= ambient + temperature-rise due to current) is approached. There shall be no further increa

46、se of current before thermal stability is attained. In no case during the adjustment shall the specified maximum operating temperature or the specified current of the specimen be exceeded. When the maximum operating temperature is reached, the current required to achieve this shall be maintained thr

47、oughout the test. If the temperature rise due to the specified maximum current through the specimen does not cause it to reach its specified maximum operating temperature, the chamber temperature shall be increased until the specified maximum operating temperature of the specimen is reached. The tes

48、t shall be carried out at the specified maximum operating temperature and the duration of the test shall be as specified in the detail specification. Preferred durations are 250 h, 500 h, 1 000 h and 2 000 h. At the end of the exposure period, the specimen shall be allowed to cool under standard atm

49、ospheric conditions for a time as stated in the detail specification. If the maximum operating temperature of the specimen is exceeded by 5 % under normal test conditions, the test shall be abandoned and the test shall be regarded as “failed“. 5 Final measurements a) Contact resistance (IEC 60512-2-1, test 2a, or IEC 60512-2-2, test 2b). b) Housing (shell)