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本文(IEC 60534-9-2007 Industrial-process control valves - Part 9 Test procedure for response measurements from step inputs《工业过程控制阀.第9部分 步进输入反应测量的试验程序》.pdf)为本站会员(周芸)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 60534-9-2007 Industrial-process control valves - Part 9 Test procedure for response measurements from step inputs《工业过程控制阀.第9部分 步进输入反应测量的试验程序》.pdf

1、 IEC 60534-9Edition 1.0 2007-09INTERNATIONAL STANDARD NORME INTERNATIONALEIndustrial-process control valves Part 9: Test procedure for response measurements from step inputs Vannes de rgulation des processus industriels Partie 9: Procdure dessai pour la mesure de la rponse des vannes de rgulation de

2、s signaux dentre chelonns IEC60534-9:2007 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photoc

3、opying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your loca

4、l IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilm

5、s, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays

6、de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic a

7、nd related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC o

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9、etails twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additi

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12、ications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI

13、vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de

14、la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais e

15、t en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des

16、 questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60534-9Edition 1.0 2007-09INTERNATIONAL STANDARD NORME INTERNATIONALEIndustrial-process control valves Part 9: Test procedure for response measurements from step inputs V

17、annes de rgulation des processus industriels Partie 9: Procdure dessai pour la mesure de la rponse des vannes de rgulation des signaux dentre chelonns INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE UICS 23.060; 25.040.40 PRICE CODECODE PRIXISBN 2-8318-9280-5 2 6

18、0534-9 IEC:2007 CONTENTS FOREWORD.3 1 Scope and object5 2 Normative references .5 3 Terms and definitions.5 4 Symbols .10 5 General test procedures .11 5.1 Test valve conditions.11 5.2 Test system.11 5.3 Measuring instruments 11 5.4 Process variable12 5.5 Nominal test position.13 6 Examples of step

19、response.13 7 Tests specified for each of three test environments 15 7.1 Bench tests .15 7.2 Laboratory tests 16 7.3 In-process tests.16 8 Detailed test procedures.17 8.1 Baseline test .17 8.2 Small-step test 18 8.3 Response-time tests19 9 Presentation of test results.21 9.1 General information.21 9

20、.2 Test results .22 9.2.1 Baseline test22 9.2.2 Small-step test 22 9.2.3 Response-time tests22 Annex A (informative) Sliding friction measurement .24 Bibliography26 Figure 1 Dead band and resolution 6 Figure 2 Typical step change and response without overshoot.14 Figure 3 Step response with some ove

21、rshoot.15 Figure 4 Example step and response during baseline test18 Figure 5 Signal sequence for small-step test19 Figure 6 Sample signal step sequence for response time tests 20 Figure 7 Sample data from small-step test (s = 0,13 %) performed in a process loop .23 Figure 8 Sample plot showing step

22、response, t86, versus step size for four different valves .23 60534-9 IEC:2007 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL-PROCESS CONTROL VALVES Part 9: Test procedure for response measurements from step inputs FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldw

23、ide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other act

24、ivities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subjec

25、t dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions deter

26、mined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Commit

27、tees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which

28、they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publicatio

29、n and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that

30、they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any natur

31、e whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced

32、publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Internationa

33、l Standard IEC 60534-9 has been prepared by subcommittee 65B: Devices, of IEC technical committee 65: Industrial-process measurement and control. The text of this standard is based on the following documents: FDIS Report on voting 65B/632/FDIS 65B/639/RVDFull information on the voting for the approv

34、al of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 60534-9 IEC:2007 The list of all the parts of the IEC 60634 series, under the general title Industrial-process control valves,

35、 can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be

36、 reconfirmed, withdrawn, replaced by a revised edition, or amended. 60534-9 IEC:2007 5 INDUSTRIAL-PROCESS CONTROL VALVES Part 9: Test procedure for response measurements from step inputs 1 Scope and object This part of IEC 60534 defines the testing and reporting of the step response of control valve

37、s that are used in throttling closed-loop control applications. A control valve consists of the complete, ready-to-use assembly of the control valve body, the actuator, and any required accessories. The most probable accessory is a valve positioner. NOTE For background, refer to technical report ANS

38、I/ISA-TR75.25.02 61. The object of this standard is to define how to test, measure, and report control valve response characteristics in an open-loop environment. This information can be used for process control applications to determine how well and how fast the control valve responds to the contro

39、l valve input signal. This standard does not define the acceptable control valve performance for process control nor does it restrict the selection of control valves for any application. If this standard is used for evaluation or acceptance testing, the parties may agree to documented variations fro

40、m these requirements. The information using the defined test methods is specifically applicable to closed-loop feedback control but may have some application to open-loop control applications. It does not address valves used in on-off control service. Tests specified in this standard may not be suff

41、icient to measure the performance required for all applications. Not all control valve applications will require this testing. 2 Normative references The following documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated refe

42、rences, the latest edition of the referenced document (including any amendments) applies. IEC 60534-1, Industrial-process control valves Part 1: Control valve terminology and general consideration IEC 60534-4, Industrial-process control valves Part 4: Inspection and routine testing 3 Terms and defin

43、itions For the purposes of this document, the following terms and definitions, as well as those given in IEC 60534-1 and other parts of IEC 60534, apply. NOTE 1 In the specific area of non-linear dynamics, it was determined that some terms defined in IEC 60050-351 or in 5 lacked the precision desire

44、d for these documents. Others were inconsistent with the terminology used in the non-linear control literature. 1Figures in square brackets refer to the Bibliography. 6 60534-9 IEC:2007 NOTE 2 Reference 6 explains applicable terms and explores control valve static and dynamic response characteristic

45、s important for process control. That information will aid correct interpretation and application of the test results obtained from the tests defined in this standard. Dynamics are not shown b Time Amplitude Output a resolution b a c d Input c dead band d IEC 1630/07 Figure 1 Dead band and resolutio

46、n 3.1 closed-loop time constant time constant of the closed-loop response of a control loop, used in tuning methods such as Internal Model Control (IMC) and Lambda Tuning and is a measure of the performance of a control loop 3.2 dead band finite range of values within reversal of the input variable

47、does not produce any noticeable change in the output variable IEC 60534-4, 3.2 3.3 dead time time interval between the instant when a variation of an input variable is produced and the instant when the consequent variation of the output variable starts 3.4 dynamic response time-dependent output sign

48、al change resulting from a defined time-dependent input signal change NOTE Commonly used input signal changes include impulse, pulse, step, ramp, and sinusoid 4. Dynamic means that the control valve is moving. Dynamic response can be measured without process loading in bench-top tests, with simulate

49、d or active loading in a flow laboratory or under normal process operating conditions. 60534-9 IEC:2007 7 3.5 gain ratio GRresponse gain GZdivided by the response gain GZ02determined from the multi-step test performed with a step size of 2 %. The ideal gain ratio equals 1,0 for tests about any nominal position GR= GZ/GZ02NOTE Measuring the gain ratio may not be possibl

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