IEC 60747-5-6-2016 Semiconductor devices - Part 5-6 Optoelectronic devices - Light emitting diodes《半导体设备 第5-6部分 光电设备 发光二极管》.pdf

1、 IEC 60747-5-6 Edition 1.0 2016-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices Part 5-6: Optoelectronic devices Light emitting diodes Dispositifs semiconducteurs Partie 5-6: Dispositifs optolectroniques Diodes lectroluminescentes IEC 60747-5-6:2016-02(en-fr) THIS PUBLICATION IS

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19、blication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60747-5-6 Edition 1.0 2016-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices Part 5-6: Optoelectronic devices Light emitting diodes Dispositifs semiconducteurs Partie 5-6: Dispositifs optolectroniques Diodes le

20、ctroluminescentes INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 31.080.99 ISBN 978-2-8322-3209-5 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you

21、obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 60747-5-6:2016 IEC 2016 CONTENTS FOREWORD . 7 1 Scope 9 2 Normative references. 9 3 Terms and definitions 10 3.1 General terms and definiti

22、ons 10 3.2 Terms and definitions relating to the measurement of the quantity of radiation . 12 3.3 Terms and definitions relating to the measurement of the photometric quantity . 14 4 Absolute maximum ratings . 17 5 Electrical and optical characteristics . 18 6 Measuring method . 19 6.1 Basic requir

23、ements . 19 6.1.1 Measuring conditions . 19 6.1.2 Measuring instruments and equipment 20 6.1.3 Essential requirements . 21 6.1.4 General precautions . 21 6.2 Forward voltage (V F ) measurement . 22 6.2.1 Purpose . 22 6.2.2 Circuit diagram 22 6.2.3 Requirements 22 6.2.4 Measurement procedure . 23 6.2

24、5 Precautions to be observed 24 6.2.6 Specified conditions . 24 6.3 Reverse voltage (V R ) measurement . 24 6.3.1 Purpose . 24 6.3.2 Circuit diagram 24 6.3.3 Measurement procedure . 24 6.3.4 Precautions to be observed 24 6.3.5 Specified conditions . 25 6.4 Differential resistance (r f ) measurement

25、 25 6.4.1 Purpose . 25 6.4.2 Circuit diagram 25 6.4.3 Requirements 25 6.4.4 Measurement procedure . 25 6.4.5 Precautions to be observed 26 6.4.6 Specified conditions . 26 6.5 Reverse current (I R ) measurement 26 6.5.1 Purpose . 26 6.5.2 Circuit diagram 26 6.5.3 Provisions 27 6.5.4 Measurement proce

26、dure . 27 6.5.5 Precautions to be observed 27 6.5.6 Specified conditions . 27 6.6 Measurement of capacitance between terminals (C t ) 27 6.6.1 General . 27 IEC 60747-5-6:2016 IEC 2016 3 6.6.2 Measurement using LCR meter 27 6.6.3 Measurement using AC bridge 28 6.7 Measurement of junction temperature

27、and thermal resistance (R th(j-X) ) 29 6.7.1 Purpose . 29 6.7.2 Measurement principle . 29 6.7.3 Measurement procedure . 30 6.7.4 Precautions to be observed 33 6.8 Response time measurement 34 6.8.1 Purpose . 34 6.8.2 Circuit diagram 34 6.8.3 Provisions 34 6.8.4 Measurement procedure . 34 6.8.5 Prec

28、autions to be observed 35 6.8.6 Specified conditions . 35 6.9 Frequency response and cut-off frequency (f c ) measurement . 36 6.9.1 Purpose . 36 6.9.2 Circuit diagram 36 6.9.3 Provisions 37 6.9.4 Measurement procedure . 37 6.9.5 Precautions to be observed 38 6.9.6 Specified conditions . 38 6.10 Lum

29、inous flux ( V ) measurement 38 6.10.1 Purpose . 38 6.10.2 Measurement principle . 38 6.10.3 Measuring circuit 38 6.10.4 Measurement procedure . 39 6.10.5 Precautions to be observed 39 6.10.6 Measurement conditions to be defined 40 6.11 Radiant power ( e ) measurement . 40 6.11.1 Purpose . 40 6.11.2

30、 Measurement principle . 40 6.11.3 Measuring circuit 40 6.11.4 Measurement procedure . 41 6.11.5 Precautions to be observed 41 6.11.6 Measurement conditions to be defined 42 6.12 Luminous intensity (I V ) measurement 42 6.12.1 Purpose . 42 6.12.2 Measurement principle . 42 6.12.3 Measuring circuit 4

31、3 6.12.4 Measurement procedure . 44 6.12.5 Precautions to be observed 44 6.12.6 Measurement conditions to be defined 44 6.13 Radiant intensity (I e ) measurement . 44 6.13.1 Purpose . 44 6.13.2 Measurement principle . 44 6.13.3 Measuring circuit 45 6.13.4 Measurement procedure . 45 6.13.5 Measuremen

32、t conditions to be defined 45 6.14 Luminance (L v ) measurement 45 4 IEC 60747-5-6:2016 IEC 2016 6.14.1 Purpose . 45 6.14.2 Measuring circuit 46 6.14.3 Measurement procedure . 46 6.14.4 Measurement conditions to be defined 46 6.15 Emission spectrum distribution, peak emission wavelength ( p ), and s

33、pectral half bandwidth () measurement 47 6.15.1 Purpose . 47 6.15.2 Measuring circuit 47 6.15.3 Measurement procedure . 48 6.15.4 Measurement conditions to be defined 48 6.16 Chromaticity measurement 49 6.16.1 Purpose . 49 6.16.2 Measurement principle . 49 6.16.3 Measuring circuit 51 6.16.4 Measurem

34、ent procedure . 51 6.16.5 Measuring conditions to be defined 51 6.17 Directional characteristics measurement 51 6.17.1 Purpose . 51 6.17.2 Measuring circuit 51 6.17.3 Measurement procedure . 52 6.17.4 Measuring conditions to be defined 53 6.18 Illuminance (E V ) measurement 54 6.18.1 Purpose . 54 6.

35、18.2 Measuring circuit 54 6.18.3 Measurement procedure . 54 6.18.4 Measuring conditions to be defined 54 7 Items to be indicated on the package . 54 8 Quality evaluation 55 8.1 Classification of quality evaluations . 55 8.1.1 General . 55 8.1.2 Classification I . 55 8.1.3 Classification II 55 8.1.4

36、Classification III . 55 8.1.5 Precautions to be observed 55 8.2 Quality evaluation test . 60 8.2.1 General . 60 8.2.2 Specimens . 60 8.3 Lot quality inspection 60 8.3.1 General . 60 8.3.2 Specimens . 60 8.4 Periodical quality inspection 60 8.4.1 General . 60 8.4.2 Specimens . 60 8.4.3 Inspection per

37、iod . 60 8.5 Easing of the lot quality inspection standards . 61 8.6 Periodical evaluation maintenance tests 61 8.6.1 Test items and specimens 61 8.6.2 Test period 61 8.7 Long-term storage products . 61 IEC 60747-5-6:2016 IEC 2016 5 8.8 Continuous current test . 61 8.8.1 General . 61 8.8.2 Initial m

38、easurement 61 8.8.3 Test circuits . 61 8.8.4 Test conditions 62 8.8.5 Post-treatment . 62 8.8.6 Final measurement 62 Annex A (normative) Standard luminous efficiency . 63 Annex B (normative) How to obtain the self-absorption correction factor . 66 B.1 Purpose 66 B.2 LED light sources for self-absorp

39、tion measurement 66 B.3 Method . 66 Annex C (normative) How to obtain the colour correction factor 68 C.1 Purpose 68 C.2 Method . 68 C.2.1 Luminous flux and luminous intensity measurement 68 C.2.2 Radiant power and radiant intensity measurement 69 Annex D (normative) Calibration of the luminance met

40、er . 70 D.1 Purpose 70 D.2 How to perform the calibration . 70 Annex E (normative) Colour-matching function of the XYZ colour system 72 Annex F (normative) Spectral chromaticity coordinates . 77 Annex G (normative) Illuminometer calibration 82 G.1 Purpose 82 G.2 How to perform the calibration . 82 B

41、ibliography . 83 Figure 1 Radiant intensity 12 Figure 2 Radiance 13 Figure 3 Radiant exitance 14 Figure 4 Irradiance . 14 Figure 5 Spectral luminous efficiency . 15 Figure 6 Circuit diagram for V Fmeasurement . 22 Figure 7 Circuit diagram for V Fmeasurement with a constant voltage source and a curre

42、nt-limiting resistor . 23 Figure 8 Circuit diagram for V Fmeasurement using an SMU . 23 Figure 9 Circuit diagram for V Rmeasurement . 24 Figure 10 circuit diagram for r fmesurement . 25 Figure 11 Circuit diagram for I Rmeasurement 26 Figure 12 Circuit diagram for C tmeasurement 27 Figure 13 Circuit

43、diagram for C tmeasurement 28 Figure 14 Circuit diagram for measurement of change in V F30 Figure 15 Waveform of change in V F32 Figure 16 Transient change in thermal resistance (double-logarithmic plots) . 33 Figure 17 Circuit diagram for response time measurement 34 Figure 18 Waveform of response

44、time measurement . 36 6 IEC 60747-5-6:2016 IEC 2016 Figure 19 Circuit diagram for f cmeasurement . 37 Figure 20 Circuit diagram for Vmeasurement. 39 Figure 21 circuit diagram for emeasurement 41 Figure 22 Schematic diagram for I Vmeasurement 43 Figure 23 Circuit diagram for I Vmeasurement 43 Figure

45、24 circuit diagram for I emeasurement . 45 Figure 25 Circuit diagram for L vmeasurement 46 Figure 26 Circuit diagram for pmeasurement 47 Figure 27 Circuit diagram for pmeasurement 48 Figure 28 Schematic diagram of measurement . 48 Figure 29 Chromaticity . 50 Figure 30 Circuit diagram for chromaticit

46、y measurement . 52 Figure 31 Directional characteristics (example 1) 53 Figure 32 Directional characteristics (example 2) 53 Figure 33 Circuit diagram for E vmeasurement 54 Figure 34 Circuit diagram for continuous current test 62 Figure B.1 Schematic diagram for self-absorption measurement . 66 Figu

47、re D.1 Schematic diagrams for calibration 71 Figure G.1 Schematic diagram for calibration . 82 Table 1 Absolute maximum ratings . 18 Table 2 Electrical and optical characteristics 19 Table 3 CIE averaged LED intensity measurements 43 Table 4 Items for the screening test and their conditions(referenc

48、e) 55 Table 5 Quality evaluation tests (1 of 2) . 56 Table 6 Lot quality inspection . 58 Table 7 Periodical quality inspection . 59 Table A.1 Definitive values of the spectral luminous efficiency function for photopic vision V() (1 of 3) . 63 Table E.1 Colour-matching function of the XYZ colour syst

49、em (1 of 5) . 72 Table F.1 Spectral chromaticity coordinates (1 of 5) 77 IEC 60747-5-6:2016 IEC 2016 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SEMICONDUCTOR DEVICES Part 5-6: Optoelectronic devices Light emitting diodes FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for stan