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本文(IEC 60862-2-2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2 Guide for the use《声表面波(SAW)滤波器质量评定.第2部分 使用指南》.pdf)为本站会员(brainfellow396)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 60862-2-2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2 Guide for the use《声表面波(SAW)滤波器质量评定.第2部分 使用指南》.pdf

1、 IEC 60862-2 Edition 3.0 2012-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Surface acoustic wave (SAW) filters of assessed quality Part 2: Guidelines for the use Filtres ondes acoustiques de surface (OAS) sous assurance de la qualit Partie 2: Lignes directrices dutilisation IEC 60862-2:2012 colour

2、 inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without perm

3、ission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee fo

4、r further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou

5、du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Te

6、l.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and

7、related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The

8、 advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. J

9、ust Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent

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11、 de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de

12、 la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents crit

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15、additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 60862-2 Edition 3.0 2012-05 INTERNATIONAL ST

16、ANDARD NORME INTERNATIONALE Surface acoustic wave (SAW) filters of assessed quality Part 2: Guidelines for the use Filtres ondes acoustiques de surface (OAS) sous assurance de la qualit Partie 2: Lignes directrices dutilisation INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE IN

17、TERNATIONALE XB ICS 31.140 PRICE CODE CODE PRIX ISBN 978-2-88912-074-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention!

18、Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 60862-2 IEC:2012 CONTENTS FOREWORD . 5 INTRODUCTION . 7 1 Scope . 8 2 Normative references . 8 3 Technical considerations 8 4 Fundamentals of SAW transversal filters 9 4.1 Frequency response charact

19、eristics 9 4.2 Weighting methods 10 4.3 Filter configurations and their general characteristics 13 4.3.1 General . 13 4.3.2 Bidirectional IDT filters 14 4.3.3 Unidirectional IDT (UDT) filters 15 4.3.4 Tapered IDT filters . 22 4.3.5 Reflector filters 23 4.3.6 RSPUDT filters 27 5 Fundamentals of SAW r

20、esonator filters . 30 5.1 Classification of SAW resonator filters . 30 5.2 Ladder and lattice filters 30 5.2.1 Basic structure 30 5.2.2 Principle of operation . 31 5.2.3 Characteristics of ladder and lattice filters . 32 5.3 Coupled resonator filters . 35 5.3.1 General . 35 5.3.2 Transversely couple

21、d type . 36 5.3.3 Longitudinally coupled type . 36 5.3.4 Other characteristics of coupled resonator filters . 36 5.3.5 Balanced connection . 41 5.4 Interdigitated interdigital transducer (lIDT) resonator filters . 45 5.4.1 Configuration . 45 5.4.2 Principle 45 5.4.3 Characteristics 45 6 Application

22、guidelines . 46 6.1 Substrate materials and their characteristics . 46 6.2 Application to electronics circuits. 50 6.3 Availability and limitations . 52 6.4 Input levels 53 6.5 Packaging of SAW filters . 54 7 Practical remarks 56 7.1 General . 56 7.2 Feed-through signals . 56 7.3 Impedance matching

23、condition 57 7.4 Miscellaneous . 57 7.4.1 Soldering conditions 57 7.4.2 Static electricity . 57 8 Ordering procedure 58 60862-2 IEC:2012 3 Bibliography 61 Figure 1 Frequency response of a SAW filter . 10 Figure 2 Applicable range of frequency and relative bandwidth of the SAW filter and the other fi

24、lters . 11 Figure 3 Schematic diagram showing signal flow through a transversal filter 11 Figure 4 Basic configuration of a SAW transversal filter . 12 Figure 5 Frequency response of the SAW transversal filter shown in Figure 4, where f 0is the centre frequency and N is the number of finger pairs of

25、 the IDT . 12 Figure 6 Apodization weighting obtained by apodizing fingers 13 Figure 7 Withdrawal weighting obtained by selective withdrawal of the fingers . 13 Figure 8 Series weighting obtained by the dog-leg structure 13 Figure 9 Split-finger configuration 14 Figure 10 Typical characteristics of

26、a SAW IF filter for radio transmission equipment (nominal frequency of 70,0 MHz) 17 Figure 11 Typical characteristics of a frequency asymmetrical SAW filter (nominal frequency of 58,75 MHz for TV-IF use) . 17 Figure 12 SAW three-IDT filter . 18 Figure 13 Typical frequency response of a 900 MHz range

27、 SAW filter for communication (mobile telephone use) . 18 Figure 14 Schematic of the IIDT (multi-IDT) filter 19 Figure 15 Multi-phase unidirectional transducer . 19 Figure 16 Single-phase unidirectional transducers . 20 Figure 17 Frequency characteristics of a filter using multi-phase unidirectional

28、 transducers . 21 Figure 18 Frequency characteristics of a filter using single-phase unidirectional transducers . 21 Figure 19 Tapered IDT filter . 22 Figure 20 Frequency response of a 140 MHz tapered IDT filter 22 Figure 21 Various reflector filter configurations 24 Figure 22 Z-path filter configur

29、ation . 25 Figure 23 Dual-track reflector filter configuration 25 Figure 24 SPUDT-based dual-track filter 26 Figure 25 Frequency characteristics of Z-path filter 26 Figure 26 Frequency characteristics of dual-track reflector filter. 27 Figure 27 Frequency characteristics of SPUDT-based reflector fil

30、ter 27 Figure 28 A part of DART electrode in RSPUDT filter . 28 Figure 29 Distribution of internal reflection and detection inside RSPUDT filter 28 Figure 30 Frequency and time responses of a 456 MHz RSPUDT filter 29 Figure 31 Structure of ladder and lattice filters . 32 Figure 32 Equivalent circuit

31、 of basic section of ladder and lattice filter . 33 Figure 33 Pattern layout of ladder filter 33 Figure 34 Basic concept of ladder and lattice filter . 34 Figure 35 Typical characteristics of a 1,5 GHz range ladder filter . 35 4 60862-2 IEC:2012 Figure 36 SAW energy distribution and equivalent circu

32、it of transversely coupled resonator filter 37 Figure 37 Typical characteristics of a transversely coupled resonator filter 38 Figure 38 Basic configuration and SAW energy distribution of longitudinally coupled resonator filter 39 Figure 39 Typical characteristics of a longitudinally coupled resonat

33、or filter . 40 Figure 40 Configuration of balanced type transversely coupled resonator filter 41 Figure 41 Frequency characteristics of balanced type transversely coupled resonator filter 42 Figure 42 Configuration of balanced type longitudinally coupled resonator filter . 43 Figure 43 Typical chara

34、cteristics of a balanced type longitudinally coupled resonator filter 45 Figure 44 Schematic of IIDT resonator filter . 46 Figure 45 Frequency characteristics of a 820 MHz range IIDT resonator filter 46 Figure 46 Minimum theoretical conversion losses for various substrates 48 Figure 47 Relationship

35、between relative bandwidth and insertion attenuation for various SAW filters, with the practical SAW filters bandwidth for their typical applications 52 Figure 48 Ripples in the characteristics of a SAW filter caused by TTE or feed- through signal: f = 1/(2t) for the TTE, and f = 1/t for the feed-th

36、rough, where t is the delay of the SAW main signal . 53 Figure 49 Example of SAW metal package . 54 Figure 50 Example of SAW ceramic package . 55 Figure 51 Example of SAW resin package . 55 Figure 52 Example of SAW CSP 56 Table 1 Properties of typical single-crystal substrate materials 50 Table 2 Pr

37、operties of typical thin-film substrate materials 50 Table 3 Properties of typical ceramic substrate materials . 50 60862-2 IEC:2012 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY Part 2: Guidelines for the use FOREWORD 1) The International Elec

38、trotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields.

39、 To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC Na

40、tional Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization

41、 (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representati

42、on from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot

43、 be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications.

44、 Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, acces

45、s to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including indiv

46、idual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon,

47、this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of

48、this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60862-2 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials

49、for frequency control, selection and detection. This third edition cancels and replaces the second edition published in 2002 and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: Clause 3-“Terms and definitions“ has been deleted to be included in the next edition of

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