1、 S+ IEC 61000-4-15 Edition 2.0 2010-08IEC STANDARDS+Electromagnetic compatibility (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications Compatibilit lectromagntique (CEM) Partie 4-15: Techniques dessai et de mesure Flickermtre Spcifications fonctionnel
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16、s commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 S+ IEC 61000-4-15 Edition 2.0 2010-08 IEC STANDARDS+ Electromagnetic compatibility (EMC) Part 4-15: Testing and measur
17、ement techniques Flickermeter Functional and design specifications Compatibilit lectromagntique (CEM) Partie 4-15: Techniques dessai et de mesure Flickermtre Spcifications fonctionnelles et de conception INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE RD ICS 33.1
18、00.20 PRICE CODE CODE PRIX ISBN 978-2-88912-076-5 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale IEC 61000-4-15 Edition 2.0 2010-08 INTERNATIONAL STANDARD NORME
19、INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications Compatibilit lectromagntique (CEM) Partie 4-15: Techniques dessai et de mesure Flickermtre Spcifications fonctionnelles et de conception IEC 61000-4-15:2
20、010 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM 2 61000-4-15 IEC:2010 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope and object7 2 Normative references7 3 Parameters and symbols.8 3.1 Directly measured parameters and characteristics .8 3.1.1 General .8 3.1.2 Half period rms value of the voltag
21、e .8 3.1.3 Half period rms value characteristics8 3.1.4 Relative half period rms value characteristics.8 3.1.5 Steady state voltage and voltage change characteristics 8 3.1.6 Steady state voltage change 9 3.1.7 Maximum voltage change during a voltage change characteristic .9 3.1.8 Maximum steady sta
22、te voltage change during an observation period 9 3.1.9 Maximum absolute voltage change during an observation period 10 3.1.10 Voltage deviation .10 3.1.11 Centre voltage .10 3.2 Symbols 10 4 Description of the instrument 11 4.1 General .11 4.2 Block 1 Input voltage adaptor11 4.3 Block 2 Squaring mul
23、tiplier11 4.4 Block 3 Weighting filters .12 4.5 Block 4 Squaring and smoothing.12 4.6 Block 5 On-line statistical analysis 12 4.7 Outputs .13 4.7.1 General .13 4.7.2 P linoutput13 4.7.3 P instoutput 13 4.7.4 P stoutput 13 4.7.5 P ltoutput .13 4.7.6 d-meter outputs .13 5 Specification.13 5.1 Response
24、 and accuracy.13 5.2 Input voltage ranges 18 5.3 Voltage adaptor .18 5.4 Weighting filters.18 5.5 Weighting filter response in block 318 5.6 Squaring multiplier and sliding mean filter 19 5.7 General statistical analysis procedure19 5.7.1 General .19 5.7.2 Short-term flicker evaluation 19 5.7.3 Long
25、-term flicker evaluation.20 6 Flickermeter tests .20 6.1 General .20 6.2 Sinusoidal/rectangular voltage changes .21 61000-4-15 IEC:2010 3 6.3 Rectangular voltage changes and performance testing.21 6.4 Combined frequency and voltage changes Class F1 flickermeters .22 6.5 Distorted voltage with multip
26、le zero crossings Class F1 flickermeters 23 6.6 Bandwidth test using harmonic and inter-harmonic side band modulation .23 6.7 Phase jumps Class F1 flickermeters .24 6.8 Rectangular voltage changes with 20 % duty cycle.24 6.9 d parameter test, d c , d max , and d(t) 3,3% .25 7 Environmental and other
27、 requirements27 7.1 General .27 7.2 Insulation, climatic, electromagnetic compatibility, and other tests27 Annex A (normative) Techniques to improve accuracy of flicker evaluation .30 Annex B (informative) Meaning of U/U and number of voltage changes, d c , d(t), d maxexamples 32 Annex C (informativ
28、e) Sample protocols for type testing .36 Bibliography40 Figure 1 Illustration of 28 Hz modulated test voltage with 20 % duty cycle .25 Figure 2 Functional diagram of IEC flickermeter .28 Figure 3 Basic illustration of the time-at-level method for P st= 2,000 29 Figure B.1 Rectangular voltage change
29、U/U = 40 %, 8,8 Hz, 17,6 changes/second33 Figure B.2 Illustration of “d” parameter definitions.35 Table 1a Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for sinusoidal voltage fluctuations.14 Table 1b Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for sinusoidal
30、voltage fluctuations.15 Table 2a Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for rectangular voltage fluctuations.16 Table 2b Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for rectangular voltage fluctuations.17 Table 3 Indicative values for the parameters of
31、lamps.19 Table 4 Test specifications for flickermeter.21 Table 5 Test specification for flickermeter classifier22 Table 6 Test specification for combined frequency and voltage changes Class F1 flickermeters .23 Table 7 Test specification for distorted voltage with multiple zero crossings Class F1 fl
32、ickermeters .23 Table 8 8,8 Hz modulation depth for distorted voltage test Class F 1 flickermeters .23 Table 9 Test specification for Harmonics with side band Class F1 flickermeters .24 Table 10 Test specification for phase jumps Class F1 flickermeters.24 Table 11 Test specification for rectangular
33、voltage changes with duty ratio .24 Table 12 Test specification for d c , d max , t (d(t) 3,3 % 25 Table 13 Test specification for d c , d max , t (d(t) 3,3 % 26 Table B.1 Correction factor for other voltage/frequency combinations .33 4 61000-4-15 IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION _
34、 ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-15: Testing and measurement techniques Flickermeter Functional and design specifications FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IE
35、C National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
36、 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-
37、governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of
38、IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are ac
39、cepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote internat
40、ional uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the
41、latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users s
42、hould ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other d
43、amage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the normative references cited in this publication. Use
44、of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent ri
45、ghts. International Standard IEC 61000-4-15 has been prepared by subcommittee 77A: Low frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. IEC 61000-4-15 is based on work by the “Disturbances” Working Group of the International Union for Electroheat (UIE), on work of t
46、he IEEE, and on work within IEC itself. It forms part 4-15 of the IEC 61000 series. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 1997 and its Amendment 1 (2003) and constitutes a technical revis
47、ion. This new edition, in particular, adds or clarifies the definition of several directly measured parameters, so that diverging interpretations are avoided. 61000-4-15 IEC:2010 5 The text of this standard is based on the following documents: FDIS Report on voting 77A/722/FDIS 77A/730/RVD Full info
48、rmation on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series, under the general title Electromagnetic compati
49、bility (EMC) can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn,
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