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本文(IEC 61000-4-4-2012 Electromagnetic compatibility (EMC) - Part 4-4 Testing and measurement techniques - Electrical fast transient burst immunity test《电磁兼容性(EMC).第4-4部分 试验和测量技术.快速瞬变脉冲 脉冲串抗扰性试验》.pdf)为本站会员(appealoxygen216)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 61000-4-4-2012 Electromagnetic compatibility (EMC) - Part 4-4 Testing and measurement techniques - Electrical fast transient burst immunity test《电磁兼容性(EMC).第4-4部分 试验和测量技术.快速瞬变脉冲 脉冲串抗扰性试验》.pdf

1、 IEC 61000-4-4 Edition 3.0 2012-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test Compatibilit lectromagntique (CEM) Partie 4-4: Techniques dessai et de mesure Essai dimmunit a

2、ux transitoires lectriques rapides en salves IEC 61000-4-4:2012 BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be repr

3、oduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obta

4、ining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce

5、soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publicatio

6、n, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC

7、) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest editi

8、on, a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced a

9、nd withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary

10、of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us y

11、our feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait lle

12、ctricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publica

13、tions CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/j

14、ustpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques.

15、 Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur

16、 cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61000-4-4 Edition 3.0 2012-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Electromagnetic compatibility (EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test Compatibilit lectro

17、magntique (CEM) Partie 4-4: Techniques dessai et de mesure Essai dimmunit aux transitoires lectriques rapides en salves INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 33.100.20 PRICE CODE CODE PRIX ISBN 978-2-83220-016-2 BASIC EMC PUBLICATION PUBLICATION F

18、ONDAMENTALE EN CEM Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette pub

19、lication via un distributeur agr. colour inside 2 61000-4-4 IEC:2012 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope . 7 2 Normative references . 7 3 Terms, definitions and abbreviations 7 3.1 Terms and definitions 7 3.2 Abbreviations 10 4 General 10 5 Test levels 10 6 Test equipment . 11 6.1 Overvie

20、w . 11 6.2 Burst generator . 11 6.2.1 General . 11 6.2.2 Characteristics of the fast transient/burst generator . 12 6.2.3 Calibration of the characteristics of the fast transient/burst generator 14 6.3 Coupling/decoupling network for a.c./d.c. power port . 15 6.3.1 Characteristics of the coupling/de

21、coupling network 15 6.3.2 Calibration of the coupling/decoupling network 16 6.4 Capacitive coupling clamp . 17 6.4.1 General . 17 6.4.2 Calibration of the capacitive coupling clamp 18 7 Test setup 20 7.1 General . 20 7.2 Test equipment . 20 7.2.1 General . 20 7.2.2 Verification of the test instrumen

22、tation . 20 7.3 Test setup for type tests performed in laboratories 21 7.3.1 Test conditions 21 7.3.2 Methods of coupling the test voltage to the EUT 24 7.4 Test setup for in situ tests . 26 7.4.1 Overview . 26 7.4.2 Test on power ports and earth ports 26 7.4.3 Test on signal and control ports . 27

23、8 Test procedure . 28 8.1 General . 28 8.2 Laboratory reference conditions 28 8.2.1 Climatic conditions 28 8.2.2 Electromagnetic conditions 28 8.3 Execution of the test 28 9 Evaluation of test results 29 10 Test report 29 Annex A (informative) Information on the electrical fast transients . 30 Annex

24、 B (informative) Selection of the test levels 32 Annex C (informative) Measurement uncertainty (MU) considerations . 34 Bibliography 43 61000-4-4 IEC:2012 3 Figure 1 Simplified circuit diagram showing major elements of a fast transient/burst generator 12 Figure 2 Representation of an electrical fast

25、 transient/burst . 13 Figure 3 Ideal waveform of a single pulse into a 50 load with nominal parameters t r= 5 ns and t w = 50 ns 13 Figure 4 Coupling/decoupling network for a.c./d.c. power mains supply ports/terminals 16 Figure 5 Calibration of the waveform at the output of the coupling/decoupling n

26、etwork 17 Figure 6 Example of a capacitive coupling clamp . 18 Figure 7 Transducer plate for coupling clamp calibration 19 Figure 8 Calibration of a capacitive coupling clamp using the transducer plate 19 Figure 9 Block diagram for electrical fast transient/burst immunity test . 20 Figure 10 Example

27、 of a verification setup of the capacitive coupling clamp 21 Figure 11 Example of a test setup for laboratory type tests 22 Figure 12 Example of test setup using a floor standing system of two EUTs. 23 Figure 13 Example of a test setup for equipment with elevated cable entries . 24 Figure 14 Example

28、 of a test setup for direct coupling of the test voltage to a.c./d.c. power ports for laboratory type tests . 25 Figure 15 Example for in situ test on a.c./d.c. power ports and protective earth terminals for stationary, floor standing EUT 26 Figure 16 Example of in situ test on signal and control po

29、rts without the capacitive coupling clamp 27 Table 1 Test levels. 11 Table 2 Output voltage peak values and repetition frequencies 15 Table C.1 Example of uncertainty budget for voltage rise time (t r ) . 36 Table C.2 Example of uncertainty budget for EFT/B peak voltage value (V P ) . 37 Table C.3 E

30、xample of uncertainty budget for EFT/B voltage pulse width (t w ) . 38 Table C.4 factor (Equation (C.4) of different unidirectional impulse responses corresponding to the same bandwidth of the system B 40 4 61000-4-4 IEC:2012 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ ELECTROMAGNETIC COMPATIBILITY

31、EMC) Part 4-4: Testing and measurement techniques Electrical fast transient/burst immunity test FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object o

32、f IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (

33、PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising

34、with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as

35、 nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in

36、 that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Commi

37、ttees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provi

38、de any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the late

39、st edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whet

40、her direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is in

41、dispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 610

42、00-4-4 has been prepared by subcommittee 77B: High frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. It forms Part 4-4 of IEC 61000. It has the status of a basic EMC publication in accordance with IEC Guide 107, Electromagnetic compatibility Guide to the drafting of

43、electromagnetic compatibility publications. This third edition cancels and replaces the second edition published in 2004 and its amendment 1 (2010) and constitutes a technical revision. This third edition improves and clarifies simulator specifications, test criteria and test setups. 61000-4-4 IEC:2

44、012 5 The text of this standard is based on the following documents: FDIS Report on voting 77B/670/FDIS 77B/673/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with

45、 the ISO/IEC Directives, Part 2. The list of all currently available parts of the IEC 61000 series, under the general title Electromagnetic compatibility (EMC), can be found on the IEC web site. The committee has decided that the contents of this publication will remain unchanged until the stability

46、 date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates

47、 that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 61000-4-4 IEC:2012 INTRODUCTION IEC 61000 is published in separate parts, according to the following structure: Part 1: Gene

48、ral General considerations (introduction, fundamental principles) Definitions, terminology Part 2: Environment Description of the environment Classification of the environment Compatibility levels Part 3: Limits Emission limits Immunity limits (in so far as they do not fall under the responsibility

49、of the product committees) Part 4: Testing and measurement techniques Measurement techniques Testing techniques Part 5: Installation and mitigation guidelines Installation guidelines Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards or as technical specificatio

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