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本文(IEC 61300-2-17-2010 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-17 Tests - Cold《光纤互连装置和无源部件.基本试验和测量规程.第2-17部分 冷式法》.pdf)为本站会员(sumcourage256)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 61300-2-17-2010 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-17 Tests - Cold《光纤互连装置和无源部件.基本试验和测量规程.第2-17部分 冷式法》.pdf

1、 IEC 61300-2-17 Edition 3.0 2010-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-17: Tests Cold Dispositifs dinterconnexion et composants passifs fibres optiques Mthodes fondamentales dessais et de

2、 mesures Partie 2-17: Essais Froid IEC 61300-2-17:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, inc

3、luding photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below

4、 or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et

5、les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI d

6、e votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical,

7、 electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/search

8、pub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Jus

9、t Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent te

10、rms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Emai

11、l: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A pr

12、opos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-lig

13、ne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles pub

14、lications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions

15、 en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si

16、vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61300-2-17 Edition 3.0 2010-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic interconnecting devices and passive components Basic test and measurem

17、ent procedures Part 2-17: Tests Cold Dispositifs dinterconnexion et composants passifs fibres optiques Mthodes fondamentales dessais et de mesures Partie 2-17: Essais Froid INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE H ICS 33.180.10 PRICE CODE CODE PRIX ISBN

18、978-2-88912-269-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 61300-2-17 IEC:2010 CONTENTS FORE WORD 3 1 Scop e 5 2 Normative references 5 3 General description. 5 4 Apparatus 5 4.1 Chamber . 5 4.2 Other appara

19、tus . 5 4.3 Support for mounting the DUT . 6 5 Procedure 6 5.1 Gene ra l . 6 5.2 Precondition ing 6 5.3 Initial measurements 6 5.4 Testing 6 5.5 Reco ver y . 6 5.6 Final measurements . 6 6 Severity . 6 7 Details to be specified . 7 Bibliog raph y . 8 61300-2-17 IEC:2010 3 INTERNATIONAL ELECTROTECHNI

20、CAL COMMISSION _ FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 2-17: Tests Cold FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees

21、(IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Repor

22、ts, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and no

23、n- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements

24、of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are

25、 accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote inter

26、national uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in t

27、he latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All user

28、s should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or othe

29、r damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. U

30、se of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent

31、 rights. International Standard IEC 61300-2-17 has been prepared by subcommittee 86B: Fibre optic interconnecting devices and passive components, of IEC technical committee 86: Fibre optics. This third edition cancels and replaces the second edition published in 2003. This edition constitutes a tech

32、nical revision. The main changes with respect to the previous edition are listed below: a) Procedure and details to be specified were reconsidered. b) The deviation of the temperature in severity was changed 3 C to 2 C. 4 61300-2-17 IEC:2010 The text of this standard is based on the following docume

33、nts: CDV Report on voting 86B/2984/CDV 86B/3089/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The list of all parts in the IE

34、C 61300 series, published under the general title, Fibre optic interconnecting and passive components Basic test and measurement procedures, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on th

35、e IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61300-2-17 IEC:2010 5 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASU

36、REMENT PROCEDURES Part 2-17: Tests Cold 1 Scope This part of IEC 61300 details a procedure for determining the suitability of a fibre optic device to withstand environmental conditions of extended low temperature (cold), which may occur in use, storage and/or transport. This procedure does not asses

37、s the ability of a device to operate during temperature variations; in this case, IEC 61300-2-22 would be used. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated referenc

38、es, the latest edition of the referenced document (including any amendments) applies. IEC 60068-2-1, Environmental testing Part 2-1: Tests Test A: Cold IEC 61300-1, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 1: General and guidance IEC 61300

39、-3-1, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-1: Examinations and measurements Visual examination 3 General description This procedure is conducted in accordance with IEC 60068-2-1, test Ab. The Device Under Test (DUT) is placed in a ch

40、amber at ambient temperature. The temperature is then lowered to test temperature at a rate not exceeding 1 C/min averaged over a maximum period of 5 min, and maintained at that temperature for the specified duration. The chamber temperature is then raised to ambient and the DUT is allowed to attain

41、 ambient temperature before final measurements are made. 4 Apparatus 4.1 Chamber The apparatus is an environmental chamber in accordance with IEC 60068-2-1, test Ab. The chamber shall be capable of housing the DUT and of allowing access for measurement during conditioning, if required. It shall also

42、 be capable of maintaining the specified temperature and tolerance. Forced air circulation may be used to maintain homogeneous conditions. Care shall be taken to ensure that the DUT is not directly exposed to the heating or cooling elements. 4.2 Other apparatus Additional apparatus may be necessary

43、to perform the measurements specified by the relevant specification. 6 61300-2-17 IEC:2010 4.3 Support for mounting the DUT Unless otherwise specified in the relevant specifications, the thermal conductivity of the supports for mounting the DUT shall be low, such that for practical purposes the DUT

44、is thermally isolated. 5 Procedure 5.1 General Conduct the test according to the following procedure. Unless otherwise specified in the relevant specification, the following applies: if the component construction includes optical leads, include 1,5 m of cable in the environmental chamber for each po

45、rt monitored during the test; if optical measurements are requested during the test by the relevant specification, these measurements shall be performed at a maximum interval of 1 h. 5.2 Preconditioning Unless otherwise stated in the relevant specification, maintain the DUT under standard atmospheri

46、c conditions specified in IEC 61300-1 for a minimum of 2 h. Clean the mechanical and optical alignment parts of the DUT according to the manufacturers instructions. 5.3 Initial measurements Complete initial examinations and measurements as required by the relevant specification. 5.4 Testing a) Place

47、 the DUT in the chamber in its normal operating position and make connections to the monitoring equipment. b) Adjust the chamber temperature to the specified severity. The rate of change of temperature shall not exceed 1 C/min, averaged over a maximum period of 5 min. Allow the DUT to reach temperat

48、ure stability. The relevant specification may call for measurements to be made during the test and will give details of how this should be done. c) On completion of the test, allow the DUT to remain in the chamber while the temperature is gradually raised to standard atmospheric conditions. The rate

49、 of change of temperature shall not exceed 1 C/min, averaged over a maximum period of 5 min. 5.5 Recovery Dry the DUT if necessary and allow it to remain under standard atmospheric conditions for a period of 2 h. 5.6 Final measurements On completion of the test, remove all fixtures. Clean the mechanical and optical alignment parts of the DUT according to the manufacturers instruc

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