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本文(IEC 61300-2-7-2013 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-7 Tests - Bending moment《纤维光学互连设备和无源元件.基本试验和测量规程.第2-7部分 试验.弯曲力矩》.pdf)为本站会员(李朗)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 61300-2-7-2013 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-7 Tests - Bending moment《纤维光学互连设备和无源元件.基本试验和测量规程.第2-7部分 试验.弯曲力矩》.pdf

1、 IEC 61300-2-7 Edition 2.0 2013-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-7: Tests Bending moment Dispositifs dinterconnexion et composants passifs fibres optiques Procdures fondamentales des

2、sais et de mesures Partie 2-7: Essais Moment de flexion IEC61300-2-7:2013 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic

3、 or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contac

4、t the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compri

5、s la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit n

6、ational de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and pub

7、lishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published

8、 Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.i

9、ec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30

10、 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistanc

11、e, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A pr

12、opos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous

13、permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications

14、de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglai

15、s et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez

16、nous: csciec.ch. IEC 61300-2-7 Edition 2.0 2013-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 2-7: Tests Bending moment Dispositifs dinterconnexion et composants passifs fibres optiques Procdures

17、fondamentales dessais et de mesures Partie 2-7: Essais Moment de flexion INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE K ICS 33.180.20 PRICE CODE CODE PRIX ISBN 978-2-83220-790-1 Registered trademark of the International Electrotechnical Commission Marque dpose

18、 de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 61300-2-7 IEC:2013 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative

19、references . 5 3 General description 5 4 Apparatus . 5 4.1 Design for a 1 piece or 3 piece DUT . 5 4.2 Design for a 2 piece DUT 6 4.3 Optical measurements . 7 5 Procedure. 7 5.1 Preconditioning . 7 5.2 Initial examinations and measurements . 7 5.3 Conditioning for a 1 piece or 3 piece DUT . 7 5.4 Co

20、nditioning for a 2 piece DUT 7 5.5 Recovery . 8 5.6 Final examinations and measurements 8 6 Severity 8 7 Details to be specified 9 Annex A (informative) Example for a bending moment test method for splices . 10 Figure 1 Test apparatus to apply a bending moment to a 1 piece or 3 piece DUT. 6 Figure 2

21、 Test apparatus to apply a bending moment to a 2 piece DUT . 7 Figure A.1 Example for a bending moment test set-up for splices 10 Table 1 Relationship between severities, performance categories and DUT . 8 Table 2 Severities for an 1 piece or 3 piece DUT . 9 Table 3 Severities for an 2 piece DUT 9 6

22、1300-2-7 IEC:2013 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 2-7: Tests Bending moment FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardizat

23、ion comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes Internatio

24、nal Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in t

25、his preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the tw

26、o organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have th

27、e form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinter

28、pretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national

29、or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carri

30、ed out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Comm

31、ittees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn t

32、o the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be

33、held responsible for identifying any or all such patent rights. International Standard IEC 61300-2-7 has been prepared by subcommittee 86B: Fibre optic interconnecting devices and passive components, of IEC technical committee 86: Fibre optics. This second edition cancels and replaces the first edit

34、ion published in 1995. It constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) a complete reconsideration of the entire document, including additional normative references; b) clarification of the device under te

35、st (DUT); c) clarification of the relationship between severities, performance categories and the DUT. 4 61300-2-7 IEC:2013 The text of this standard is based on the following documents: FDIS Report on voting 86B/3579A/FDIS 86B/3621/RVD Full information on the voting for the approval of this standar

36、d can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in IEC 61300 series, published under the general title Fibre optic interconnecting and passive components Basic test and measu

37、rement procedures, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publicatio

38、n will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61300-2-7 IEC:2013 5 FIBRE OPTIC INTERCONNECTING DEVICES AND PASSIVE COMPONENTS BASIC TEST AND MEASUREMENT PROCEDURES Part 2-7: Tests Bending moment 1 Scope This part of IEC 61300 details a procedure for determining the sui

39、tability of a fibre optic device to withstand the environmental condition of a bending moment which may occur in actual use, storage and/or transport. The test is primarily intended to permit the observation of effects of a bending moment. The bending moment may result in effects that would destroy

40、functional utility, cause loss of physical strength, and cause changes in other important mechanical properties. Degradation of optical properties may also occur. The specimen may be a component, a connector set, a splice or other device combination intended for fibre optic usage. 2 Normative refere

41、nces The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IE

42、C 61300-3-1, Fibre optic interconnecting devices and passive components Basic test and measurement procedures Part 3-1: Examinations and measurements Visual examination IEC 61300-3-3, Fibre optic interconnecting devices and passive components Basic tests and measurement procedures Part 3-3: Examinat

43、ions and measurements Active monitoring of changes in attenuation and return loss IEC 61300-3-4, Fibre optic interconnecting devices and passive components Basic tests and measurement procedures Part 3-4: Examinations and measurements Attenuation 3 General description The specimen is placed in an ap

44、paratus and subjected to a bending moment which is maintained at a given temperature for a specified duration, as specified in the relevant specification. The bending moment is smoothly applied to the specimen so as to bend its longitudinal axis. 4 Apparatus 4.1 Design for a 1 piece or 3 piece DUT T

45、his design is suitable for specimens which consist of one part, like splices. The apparatus consists of the following elements: a) two steel rods placed at an appropriate distance in from the extreme ends of the DUT; 6 61300-2-7 IEC:2013 b) a steel finger with a defined endface radius which is place

46、d in the middle of the supported DUT; c) a force generator capable of smoothly applying the specified force at the specified rate to the steel finger; d) an optional clamping device to fix the DUT; e) additional measuring equipment. If the specimen has to operate during the test, then additional equ

47、ipment and operating conditions shall be specified in the relevant specification. An example of an apparatus is shown in Figure 1. Rigid plateCBAForce FDDUTFigure 1 Test apparatus to apply a bending moment to a 1 piece or 3 piece DUT 4.2 Design for a 2 piece DUT This design is suitable for specimens

48、 which consist of two parts, like connector sets. The two parts are joined together. The apparatus consists of the following elements: a) a clamping device on which the DUT, Part 1 is placed; b) a steel finger with a defined endface radius which is placed at the end of the DUT, Part 2; c) a force ge

49、nerator capable of smoothly applying the specified force at the specified rate to the steel finger; d) additional measuring equipment. If the specimen has to operate during the test, then additional equipment and operating conditions shall be specified in the relevant specification. An example of an apparatus is shown in Figure 2. IEC 956/13 61300-2-7 IEC:2013 7 BAForce FDUT Part 2DUT

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