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本文(IEC 61747-10-1-2013 Liquid crystal display devices - Part 10-1 Mechanical test methods《液晶显示设备.第10-1部分 机械试验方法》.pdf)为本站会员(wealthynice100)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 61747-10-1-2013 Liquid crystal display devices - Part 10-1 Mechanical test methods《液晶显示设备.第10-1部分 机械试验方法》.pdf

1、 IEC 61747-10-1 Edition 1.0 2013-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices Part 10-1: Environmental, endurance and mechanical test methods Mechanical Dispositifs daffichage cristaux liquides Partie 10-1: Mthodes dessais denvironnement, dendurance et mcaniques Essa

2、is mcaniques IEC61747-10-1:2013 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and

3、 microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC memb

4、er National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans la

5、ccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidenc

6、e. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all ele

7、ctrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Useful links: IEC publications search -

8、www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all

9、 new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and

10、French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Cen

11、tre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu techn

12、ique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.ch/searchpub La recherche avance vous permet de trouver des publications CEI en

13、utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouv

14、elles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quiv

15、alents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 61747-10-1 Edition 1

16、.0 2013-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices Part 10-1: Environmental, endurance and mechanical test methods Mechanical Dispositifs daffichage cristaux liquides Partie 10-1: Mthodes dessais denvironnement, dendurance et mcaniques Essais mcaniques INTERNATIONA

17、L ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE M ICS 31.120 PRICE CODE CODE PRIX ISBN 978-2-8322-0893-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained t

18、his publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 61747-10-1 IEC:2013 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references 5 3 Terms, definitions and letter symbols 6 4 Standard atmospheric condition

19、s for measurements and tests: 6 5 Test methods 6 5.1 General . 6 5.2 Robustness of terminations 6 5.2.1 Wire terminations, pins or connectors with pins 6 5.2.2 Flexible terminations 7 5.3 Soldering . 7 5.4 Vibration (sinusoidal) . 7 5.4.1 Test Fc 7 5.4.2 Transverse motion . 7 5.4.3 Distortion . 7 5.

20、4.4 Vibration amplitude tolerance . 7 5.4.5 Severities 7 5.4.6 Vibration amplitude 8 5.4.7 Duration of endurance 8 5.5 Shock 9 5.6 Acceleration, steady state 9 5.7 Bond strength test . 10 5.7.1 General . 10 5.7.2 General description of the test . 10 5.7.3 Preconditioning 10 5.7.4 Initial measurement

21、s 10 5.7.5 Test method (see Figure 1) 10 5.7.6 Information required in the relevant specification 11 Bibliography 12 Figure 1 Example of bond strength . 11 Table 1 Frequency range Lower end 7 Table 2 Frequency range Upper end 7 Table 3 Recommended frequency ranges . 8 Table 4 Recommended vibration a

22、mplitudes . 8 Table 5 Conditions for shock test 9 Table 6 Acceleration conditions 10 61747-10-1 IEC:2013 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 10-1: Environmental, endurance and mechanical test methods Mechanical FOREWORD 1) The International Electrotechni

23、cal Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this

24、end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Co

25、mmittee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in

26、accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from al

27、l interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held r

28、esponsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any diver

29、gence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC m

30、arks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual expe

31、rts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC P

32、ublication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC P

33、ublication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-10-1 has been prepared by IEC technical committee 110: Electronic display devices. This first edition of IEC 61747-10-1 cancels and replac

34、es Clauses 1 and 2 of the first edition of IEC 61747-5 published in 1998. This edition constitutes a technical revision. NOTE It is intended that the other clauses of IEC 61747-5:1998 will be replaced by new parts in the IEC 61747 series. The details of the intended changes are given in Annex D of I

35、EC 61747-30-1:2012. 4 61747-10-1 IEC:2013 The text of this standard is based on the following documents: CDV Report on voting 110/395/CDV 110/454/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication h

36、as been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 61747 series, published under the general title Liquid crystal display devices can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of

37、 existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publicati

38、on. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61747-10-1 IEC:2013 5 LIQUID CRYSTAL DISPLAY DEVICES Part 10-1: Environmental, endurance and mechanical test methods Mechanical 1 Scope This part of IEC 61747 lists test methods applicable to

39、 liquid crystal display devices. It takes into account, wherever possible, the mechanical robustness test methods as outlined in IEC 60068. NOTE Devices include cells and modules. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for j

40、udging the mechanical properties of liquid crystal display devices. In case of contradiction between this standard and a relevant specification, it is the latter that should govern. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and a

41、re indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068 (all parts), Environmental testing IEC 60068-2-6, Environmental testing Part 2-6: Tests Test

42、 Fc: Vibration (sinusoidal) IEC 60068-2-7, Basic environmental testing procedures Part 2-7: Tests Test Ga and guidance: Acceleration, steady state IEC 60068-2-20, Environmental testing Part 2-20: Tests Test T: Test methods for solderability and resistance to soldering heat of devices with leads IEC

43、60068-2-21, Environmental testing Part 2-21: Tests Test U: Robustness of terminations and integral mounting devices IEC 60068-2-27, Environmental testing Part 2-27: Tests Test Ea and guidance: Shock IEC 60747 (all parts), Semiconductor devices IEC 60748 (all parts), Semiconductor devices Integrated

44、circuits IEC 60749-14, Semiconductor devices Mechanical and climatic test methods Part 14: Robustness of terminations (lead integrity) IEC 61747-1, Liquid crystal and solid-state display devices Part 1: Generic specification 6 61747-10-1 IEC:2013 3 Terms, definitions and letter symbols For the purpo

45、ses of this document, the terms, definitions and letter symbols given in IEC 60068, IEC 60747, IEC 60748 and IEC 61747-1 apply. 4 Standard atmospheric conditions for measurements and tests: Unless otherwise specified, all tests and measurements shall be carried out under standard atmospheric conditi

46、ons for testing: Temperature: 15 C to 35 C Relative humidity: 25 % to 85 % RH, where appropriate Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar) The absolute humidity of the atmosphere shall not exceed 22 g/m3. 5 Test methods 5.1 General Choice of the appropriate tests depends on the type o

47、f devices. The relevant specification shall state which tests are applicable. 5.2 Robustness of terminations 5.2.1 Wire terminations, pins or connectors with pins 5.2.1.1 Test U Test U, specified in IEC 60068-2-21, is applicable. 5.2.1.2 Tensile This test shall be in accordance with test Ua1 of IEC

48、60068-2-21, with the following specific requirements. After the test, examine under 3 to 10 magnification. The device shall be rejected if there is breakage, loosening or relative motion between the lead or termination and the device body. 5.2.1.3 Bending This test shall be in accordance with test U

49、b of IEC 60068-2-21. 5.2.1.4 Torsion See IEC 60749-14. Applied only for cells with pin. 5.2.1.5 Torque See IEC 60749-14. Applied only for cells with pin. 61747-10-1 IEC:2013 7 5.2.2 Flexible terminations Under consideration. 5.3 Soldering Test T, specified in IEC 60068-2-20, is applicable. This test shall be in accordance with test Ta (methods 1, 2) (only methods 1 and 2 are

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