IEC 61747-20-3-2016 Liquid crystal display devices - Part 20-3 Visual inspection - Active matrix colour liquid crystal display modules《液晶显示装置 第20-3部分 视觉检验 有源矩阵彩色液晶显示模块》.pdf

1、 IEC 61747-20-3 Edition 1.0 2016-02 INTERNATIONAL STANDARD Liquid crystal display devices Part 20-3: Visual inspection Active matrix colour liquid crystal display modules IEC 61747-20-3:2016-02(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All righ

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10、Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. IEC 61747-20-3 Edition 1.0 2016-02 INTERNATIONAL STANDARD Liquid crystal display devices Part 20-3: Visual inspection Active matrix

11、 colour liquid crystal display modules INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.120 ISBN 978-2-8322-3210-1 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 61747-20-

12、3:2016 IEC 2016 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope 6 2 Normative references. 6 3 Terms, definitions and abbreviations 6 3.1 General . 6 3.3 Abbreviations 11 4 Visual inspection method and criteria . 11 4.1 Standard inspection conditions 11 4.1.1 Ambient conditions . 11 4.1.2 Visual inspe

13、ction conditions . 12 4.1.3 Electrical driving conditions 12 4.2 Standard inspection method 12 4.2.1 Setup of inspection equipment and liquid crystal display modules . 12 4.2.2 Inspector and limit sample for visual inspection 12 4.2.3 Inspection and record of result . 12 4.3 Criteria . 12 4.3.1 Brig

14、ht subpixel defects . 12 4.3.2 Dark subpixel defects . 12 4.3.3 Intermediate subpixel defects . 13 4.3.4 Cluster subpixel defects . 13 4.3.5 Bright line defects 13 4.3.6 Dark line defects 13 4.3.7 Scratch and dent defects 13 4.3.8 Foreign material and bubble defects . 13 4.3.9 Light leakage defects

15、. 14 Bibliography . 15 Figure 1 Classification of defects by visual inspection . 7 Figure 2 Examples of bright subpixel and adjacent subpixel defects in case of an RGB primary colour display . 8 Figure 3 Examples of dark subpixel and adjacent subpixel defects in case of RGB primary colour display .

16、9 Figure 4 Examples of minimum distance between subpixel defects . 10 Figure 5 Example of light leakage between the top case and outer black matrix 11 Figure 6 Shape of scratch and dent defects 13 Figure 7 Shape of foreign material and bubble defects 14 Table 1 Criteria for scratch and dent defects

17、. 13 Table 2 Criteria for foreign material and bubble defects 14 IEC 61747-20-3:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ LIQUID CRYSTAL DISPLAY DEVICES Part 20-3: Visual inspection Active matrix colour liquid crystal display modules FOREWORD 1) The International Electrotechnical C

18、ommission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end a

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27、cation or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publi

28、cation may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-20-3 has been prepared by IEC technical committee 110: Electronic display devices. This first edition cancels and replaces the first edition o

29、f IEC 61747-5-2 published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) document numbering was changed to align with the new numbering of IEC 61747. 4 IEC 61747-20-3:2016 IEC 2016 The

30、 text of this standard is based on the following documents: FDIS Report on voting 110/725/FDIS 110/740/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/

31、IEC Directives, Part 2. A list of all parts of the IEC 61747 series, under the general title Liquid crystal display devices, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website un

32、der “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. A bilingual version of this publication may be issued at a later date. IMPORTANT The colour inside logo on the cover p

33、age of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. IEC 61747-20-3:2016 IEC 2016 5 INTRODUCTION This part of IEC 61747 facilitates the visual ins

34、pection of the image defect of LCD modules by human eyes subjectively. Visual inspection is performed at specified conditions and criteria. The objective measurement method of visual image defects with an instrument will be studied and standardized. 6 IEC 61747-20-3:2016 IEC 2016 LIQUID CRYSTAL DISP

35、LAY DEVICES Part 20-3: Visual inspection Active matrix colour liquid crystal display modules 1 Scope This part of IEC 61747 gives the details of the quality assessment procedures and provides general rules for visual inspection of the active area of transmissive type active matrix colour liquid crys

36、tal display modules by the human eye. Furthermore, this standard includes defect definitions and the method for visual defect inspection. NOTE 1 Mura is excluded from this standard because it was not clearly specified at the time this standard was developed. NOTE 2 Restrictions on defect types, numb

37、er, and sizes are specified in the quality contract (customer acceptance specification and incoming inspection specification). 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated referen

38、ces, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61747-10-2:2014, Liquid crystal display devices Part 10-2: Environmental, endurance and mechanical test methods Environmental and endurance 3 Terms, defi

39、nitions and abbreviations For the purposes of this document, the following terms, definitions and abbreviations apply. 3.1 General 3.1.1 visual inspection method of checking display defects with the human eye Note 1 to entry: The limitation on display defects depends on supplier and customer. Theref

40、ore a limit sample, with well-defined observation and operational conditions, can be used as a reference for the defect level. 3.2 defect any observable abnormal phenomenon appearing in the active display area EXAMPLE Figure 1 shows a classification of defects into two categories. The first category

41、 is classified as defects with a clear boundary, and the second category is classified as defects with an unclear boundary. The latter category is not yet well defined, and hence difficult to evaluate. For this reason, defects in the second category are excluded from this standard. IEC 61747-20-3:20

42、16 IEC 2016 7 Figure 1 Classification of defects by visual inspection 3.2.1 subpixel defect defect in the smallest pixel element when it appears in a state different from the intended one EXAMPLE Bright subpixels appear on a dark pattern, and dark subpixels appear on a bright pattern. 3.2.2 bright s

43、ubpixel defect defect which appears bright on the screen when a dark pattern is displayed EXAMPLE Figure 2 a) shows a single subpixel bright defect of red, green, and blue respectively. Figure 2 b) shows two adjacent bright subpixel defects connected or disconnected in a horizontal and/or vertical o

44、ne-pixel area. Figure 2 c) shows three adjacent bright subpixel defects connected in three horizontal and/or vertical subpixel areas. Defect Clear boundary Unclear boundary Foreign material Bubble Mura Single Plural Dark Adjacent bright Adjacent dark small large Subpixel defect Scratch & dent defect

45、 Line defect Bright Intermediate IEC Point defect 8 IEC 61747-20-3:2016 IEC 2016 Figure 2 a) Examples of one bright subpixel defect Figure 2 b) Examples of two adjacent bright subpixel defects Figure 2 c) Examples of three adjacent bright subpixel defects Figure 2 Examples of bright subpixel and adj

46、acent subpixel defects in case of an RGB primary colour display 3.2.3 dark subpixel defect defect which appears dark on the screen when a bright pattern is displayed EXAMPLE Figure 3 a) shows a single subpixel defect of the dark-type of red, green, blue, respectively. Figure 3 b) shows two adjacent

47、dark subpixel defects connected or disconnected in a horizontal and/or vertical one-pixel area. Figure 3 c) shows three adjacent dark subpixel defects connected in three horizontal and/or vertical subpixel areas. IEC G R B B G G R G B G B B B B R G R B B G G R G B G B B B B R IEC R B G G G G B B B R

48、 R B R B G G G G B B B R R B IEC R B G R B GIEC 61747-20-3:2016 IEC 2016 9 Figure 3 a) One dark subpixel defect Figure 3 b) Two adjacent dark subpixel defects Figure 3 c) Three adjacent dark subpixel defects Figure 3 Examples of dark subpixel and adjacent subpixel defects in case of RGB primary colo

49、ur display 3.2.4 intermediate subpixel defect defect which appears with an intermediate luminance level on the screen when a bright or dark pattern is displayed 3.2.5 cluster subpixel defect at least two subpixel defects in a specified area or within a specified distance with many subpixel defects EXAMPLE Figure 4 a) and Figure 4 b) show an example of bright and dark cluster subpixel defects in which the minimum distance between the defects is specified.