IEC 61773-1996 Overhead lines - Testing of foundations for structures《架空线路 结构功能试验》.pdf

1、Publication 1773 de la CE1 (Premiere edition - 1996) IEC Publication 1773 (First edition - 1996) Lignes ariennes - Essais de fondations des supports Overhead lines - Testing of foundations for structure CORRIGENDUM Page 32 Figure 5 Remplacer le schma existant par le nouveau schma suivant: I I A S Fo

2、ndation essay6e Page 33 Figure 5 Replace the existing diagram by the following new diagram: I iobile h I IEC 25-7 I -Tesi foundation I IEC 25 - la CE1 417: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles; - la CE1 617: Symboles graphiques pour s

3、chmas; Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology. Infomation relating to the date of the reconfirmation of the publication is available from the IEC Central office. Infor

4、mation on the revision work, the issue of revised editions and amendments may be obtained from IEC National Committees and from the following IEC sources: IEC Bulletin IEC Yearbook Catalogue of IEC publications Published yearly Published yearly with regular updates Terminology For general terminolog

5、y, readers are referred to IEC 50: International Electrotechnical Vocabulary (I EV), which is issued in the form of separate chapters each dealing with a specific field. Full details of the IEV will be supplied on request. See also the IEC Multilingual Dictionary. The terms and definitions contained

6、 in the present publi- cation have either been taken from the IEV or have been specifically approved for the purpose of this publication. Graphical and letter symbols For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications: - IEC

7、27: Letter symbols to be used in electrical technology; - iEC 417: Graphical symbols for use on equipment. Index, survey and compilation of the single sheets; - IEC 617: Graphical symbols for diagrams; et pour les appareils lectromdicaux, and for medical electrical equipment, - la CE1 878: Symboles

8、graphiques pour quipements lectriques en pratique mdicale. Les symboles et signes contenus dans la prsente publi- cation ont t soit tirs de la CE1 27, de la CE1 417, de la CE1 617 eou de la CE1 878, soit spcifiquement approuvs aux fins de cette publication. Publications de la CE1 tablies par le mme

9、comit dtudes Lattention du lecteur est attire sur les listes figurant la fin de cette publication, qui numrent les publications de la CE1 prpares par le comit dtudes qui a tabli la prsente publication. - IEC 878: Graphical symbols for electromedical equipment in medical practice. The symbols and sig

10、ns contained in the present publication have either been taken from IEC 27, IEC 417, IEC 617 and/or IEC 878, or have been specifically approved for the purpose of this publication. IEC publications prepared by the same technical committee The attention of readers is drawn to the end pages of this pu

11、blication which list the IEC publications issued by the technical committee which has prepared the present publication. ! NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 1773 Premire dition First edition 1996-1 1 Lignes ariennes - Essais de fondations des supports Overhead lines - Testing of fou

12、ndations for structures O CE1 1996 Droits de reproduction rservs - Copyright - all rights reserved Aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y cumpris la photocopie et les microfilms, sans raccord

13、crii de IYdleur. No pari of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, *out permission in writing from the publisher Bureau centrai de la Commission Electrotechnique Internationale 3, rue de Varernb Genv

14、e, Suisse X Commission Electrotechnique Internationale CODE PRIX International Electrotechnical Commission PRICE CODE MemmvHaponHan 3netmPoTexHuqect(an HOMUCCHFI Pour prix, voir catalogue en vigueur For price, see current catalogue IEC 1773 96 4844891 Ob34721 5bT -2- SOMMAIRE 1773 O CEI: 1996 Pages

15、AVANT-PROPOS 6 Arti c I es Domaine dapplication et objet Rfrences normatives . Dfinitions Categories dessais 4.1 Essais de conception . 4.2 Essais de routine . Donnes gotechniques . 5.1 Gnralits . 5.2 Rsultats des sondages de sol 5.3 Paramtres dtudes gotechniques 5.4 Mise en oeuvre des fondations .

16、6.1 Gnralits 6.2 Modifications des fondations pour les essais de conception 6.3 Techniques de mise en oeuvre des fondations soumises aux essais de conception 6.4 Fiches de mise en place 6.5 Equipements ncessaires aux essais . 7.1 Application des charges . 7.2 Dispositif de chargement pour les essais

17、 . 7.3 Poutre de rfrence - Essais de conception . 7.4 7.5 Moyens de mesure des dplacements - Essais de routine . 7.6 Etalonnage des instruments de mesure Procdure dessai . 8.1 Nombre dessais . 8.2 Essais de groupes de pieux . 8.3 Procdure de chargement 8.4 Enregistrement des essais . Evaluation de l

18、essai . 9.1 Gnralits . 9.2 Essais de conception 9.3 Essais de routine . Conditions de sol pendant la mise en oeuvre de ia fondation Dlai requis entre la mise en oeuvre de la fondation et lessai . Moyens de mesure des dplacements - Essais de conception . 8 8 10 10 10 . 12 14 14 14 14 14 16 16 16 16 1

19、8 18 20 20 22 24 24 26 26 40 40 40 42 44 46 46 46 48 1773 O IEC:1996 -3- CONTENTS FOREWORD . Clause Scope and object Normative references . Definitions Categories of tests . 4.1 Design tests 4.2 Proof tests . Geotechnical data . 5.1 General . 5.2 Soil investigation results 5.3 Geotechnical design pa

20、rameters 5.4 Soil conditions during foundation installation Foundation installation 6.1 General . 6.2 Variations on foundations for design tests 6.3 Installation techniques for foundations subject to design testing 6.4 Installation records 6.5 Minimum period of time required between installation and

21、 testing . Test equip ment . 7.1 Load application 7.2 Test loading arrangements . 7.3 Reference beam - Design tests . 7.4 Displacement measurement devices - Design tests 7.5 Displacement measurement devices - Proof tests 7.6 Calibration of measuring instruments . Test procedure . 8.1 Number of tests

22、 . 8.2 Testing of pile groups 8.3 Loading procedure i 8.4 Test recording . Test evaluation . 9.1 General . 9.2 Design tests 9.3 Proof tests . Page 7 9 9 11 11 11 13 15 15 15 15 15 17 17 17 17 19 19 21 21 23 25 25 27 27 41 41 41 43 45 47 47 47 49 IEC I1773 96 4844891 0634723 332 W -4- Articles 1773 O

23、 CEI:1996 Pages 1 O Critres dacceptation . 10.1 Gnralits . 10.2 Essais de conception . 10.3 Essais de routine . 11 Rapport dessais . Annexes Bibliographie Essais de sol Commentaires sur la distance libre entre appuis et fondation dessai . Formulaires denregistrement pour la mise en oeuvre et lessai

24、de la fondation Guide pour la dtermination graphique de la rsistance de la fondation Glossaire et explications . larrachement et la compression 48 48 48 50 50 52 54 60 66 76 86 1773 O IEC:1996 Clause IEC 1773 96 H 4844893 Ob34724 279 = -5- Page 1 O Acceptance criteria . 49 10.1 General . 49 10.2 Des

25、ign tests 49 10.3 Proof tests . 51 11 Test report . 51 Annexes A Bibliography . 53 B Soil investigations . 55 C Comments on clear horizontal distance between reaction supports and test foundation . 61 D Formats for records of installation and testing . 67 E Guidance notes for graphical determination

26、 of foundation uplift or compression capacity . 77 F Glossary of terms and explanations 87 IEC 1773 96 W 4844891 Ob34725 205 W -6- 1773 O CEI:1996 COMMISSION LECTROTECHNIQUE INTERNATIONALE LIGNES ARIENNES - ESSAIS DE FONDATIONS DES SUPPORTS AVANT-PROPOS La CE1 (Commission Electrotechnique Internatio

27、nale) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CE1 a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A

28、 cet effet, la CEI, entre autres activits, publie des Normes Internationales. Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison ave

29、c la CEI, participent galement aux travaux. La CE1 collabore troitement avec lorganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations. Les dcisions ou accords officiels de la CE1 concernant les questions techniques, reprsentent, dans la

30、mesure du possible un accord international sur les sujets tudis, tant donn que les Comits nationaux intresss sont reprsents dans chaque comit dtudes. Les documents produits se prsentent sous la forme de recommandations internationales. Ils sont publis comme normes, rapports techniques ou guides et a

31、grs comme tels par les Comits nationaux. Dans le but dencourager lunification internationale, les Comits nationaux de la CE1 sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CE1 dans leurs normes nationales et rgionales. Toute divergence entre

32、 la norme de la CE1 et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. La CE1 na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un matriel est dclar conforme lune de ses normes. La

33、ttention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CE1 ne saurait tre tenue pour responsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur e

34、xistence. La Norme internationale CE1 1773 a t tablie par le comit dtudes 11 de la CEI: Lignes ariennes. Le texte de cette norme est issu des documents suivants: I FDIC I Rapport devote 1 I 11/11 l/FDIS I 1 1 /117/RVD l Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur

35、le vote ayant abouti lapprobation de cette norme. Les annexes A, 6, C, D, E et F sont donnes uniquement a titre dinformation. IEC 1773 96 4844893 Ob34726 041 1111 1 l/FDIS 1773 O IEC:1996 1 1 I1 17lRUD I -7- INTERNATIONAL ELECTROTECHNICAL COMMISSION OVERHEAD LINES - TESTING OF FOUNDATIONS FOR STRUCT

36、URES FOREWORD 1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-operation on all questions concerning standardizati

37、on in the electrical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. In

38、ternational, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. The

39、 formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. The documents produced have the form of recommenda

40、tions for international use and are published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to t

41、he maximum extent possible in their national and regional standards. Any divergence between the I EC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 2) 3) 4) 5) The IEC provides no marking procedure to indicate its approval and cannot be rendere

42、d responsible for any equipment declared to be in conformity with one of its standards. Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. The IEC shall not be held responsible for identifying any or all such patent rig

43、hts. 6) Internatibnal Standard IEC 1773 has been prepared by IEC technical committee 11: Overhead lines. The text of this standard is based on the following documents: I FDIS I Report on voting I Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. Annexes A, B, C, D, E and F are for information only.