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本文(IEC 61788-13-2012 Superconductivty - Part 13 AC loss measurements - Magnetometer methods for hysteresis loss in superconducting multifilamentary composites《超导性.第13部分 交流电损耗测量.多芯复合超导体磁滞损耗的磁强计法》.pdf)为本站会员(appealoxygen216)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 61788-13-2012 Superconductivty - Part 13 AC loss measurements - Magnetometer methods for hysteresis loss in superconducting multifilamentary composites《超导性.第13部分 交流电损耗测量.多芯复合超导体磁滞损耗的磁强计法》.pdf

1、 IEC 61788-13 Edition 2.0 2012-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 13: AC loss measurements Magnetometer methods for hysteresis loss in superconducting multifilamentary composites Supraconductivit Partie 13: Mesure des pertes en courant alternatif Mthodes de mesure

2、par magntomtre des pertes par hystrsis dans les composites multifilamentaires supraconducteurs IEC61788-13:2012 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized i

3、n any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rig

4、hts to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun pr

5、ocd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coor

6、donnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading glo

7、bal organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or

8、an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publica

9、tions. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and el

10、ectrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this

11、 publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectroniqu

12、e et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publications CEI - www.iec.

13、ch/searchpub La recherche avance vous permet de trouver des publications CEI en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. Just Published CEI - webstore.iec.ch/justpublished Restez

14、inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de

15、 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication o

16、u si vous avez des questions contactez-nous: csciec.ch. IEC 61788-13 Edition 2.0 2012-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Superconductivity Part 13: AC loss measurements Magnetometer methods for hysteresis loss in superconducting multifilamentary composites Supraconductivit Partie 13: Mes

17、ure des pertes en courant alternatif Mthodes de mesure par magntomtre des pertes par hystrsis dans les composites multifilamentaires supraconducteurs INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE T ICS 17.220, 29.050 PRICE CODE CODE PRIX ISBN 978-2-83220-292-0

18、Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un dis

19、tributeur agr. 2 61788-13 IEC:2012 CONTENTS FOREWORD . 3 INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 General specifications 8 4.1 Target uncertainty . 8 4.2 Uncertainty and uniformity of the applied field . 8 4.3 VSM calibration . 8 4.4 Temperature 9 4.5 Spe

20、cimen length 9 4.6 Specimen orientation and demagnetization effects 9 4.7 Normalization volume 9 4.8 Mode of field cycling or sweeping 9 5 The VSM method of measurement 10 5.1 General . 10 5.2 VSM measurement principle 10 5.3 VSM specimen preparation 10 5.4 VSM measurement conditions and calibration

21、 . 12 5.4.1 Field amplitude 12 5.4.2 Direction of applied field 12 5.4.3 Rate of change of the applied field (sweep rate) 12 5.4.4 Waveform of the field change 12 5.4.5 Specimen size and shape correction 12 5.4.6 Allowance for addendum (background subtraction) 13 5.4.7 Data point density 13 6 Test r

22、eport 13 6.1 General . 13 6.2 Initiation of the test 13 6.3 Technical details . 13 Annex A (informative) The SQUID method of measurement . 15 Annex B (normative) Extension of the standard to the measurement of superconductors in general . 16 Annex C (informative) Uncertainty considerations 18 Biblio

23、graphy 23 Figure 1 A typical experimental setup of VSM measurement 11 Figure 2 Three alternative specimen configurations for the VSM measurement 11 Table C.1 Output signals from two nominally identical extensometers 19 Table C.2 Mean values of two output signals . 19 Table C.3 Experimental standard

24、deviations of two output signals . 19 Table C.4 Standard uncertainties of two output signals 20 Table C.5 Coefficient of variations of two output signals 20 61788-13 IEC:2012 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SUPERCONDUCTIVITY Part 13: AC loss measurements Magnetometer methods for hyster

25、esis loss in superconducting multifilamentary composites FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-ope

26、ration on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to a

27、s “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this pre

28、paration. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international con

29、sensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts

30、 are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

31、 transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Indepen

32、dent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No lia

33、bility shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (inc

34、luding legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application o

35、f this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61788-13 has been prepared by IEC technical

36、committee 90: Superconductivity. This second edition cancels and replaces the first edition published in 2003. It constitutes a technical revision. Modifications made to the second edition are to extend to the measurement of superconductors in general, in various sample sizes and shapes, and at temp

37、eratures other than 4,2 K, to use the word “uncertainty” for all quantitative (associated with a number) statistical expressions and eliminate the quantitative use of “precision” and “accuracy” in accordance with the decision at the June 2006 IEC/TC90 meeting in Kyoto. 4 61788-13 IEC:2012 The text o

38、f this standard is based on the following documents: FDIS Report on voting 90/302/FDIS 90/306/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Direc

39、tives, Part 2. A list of all parts of the IEC 61788 series, under the general title: Superconductivity, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.

40、iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 61788-13 IEC:2012 5 INTRODUCTION IEC Technical Committee 90 proposes magnetometer and pickup coil methods for measuring the AC losses of C

41、u/Nb-Ti composite superconducting wires in transverse time-varying magnetic fields. These represent initial steps in standardization of methods for measuring the various contributions to AC loss in transverse fields, the most frequently encountered configuration. It was decided to split the initial

42、proposal mentioned above into two documents covering two standard methods. One of them describes the magnetometer method for hysteresis loss and low frequency (or sweep rate) total AC loss measurement in a slowly varying magnetic field, and the other describes the pickup coil method for total AC los

43、s measurement in higher frequency (or sweep rate) magnetic fields. The frequency range is 0 Hz 0,06 Hz for the magnetometer method and 0,005 Hz 60 Hz for the pickup-coil method. The overlap between 0,005 Hz and 0,06 Hz is a complementary frequency range for the two methods. This standard deals with

44、the magnetometer method. 6 61788-13 IEC:2012 SUPERCONDUCTIVITY Part 13: AC loss measurements Magnetometer methods for hysteresis loss in superconducting multifilamentary composites 1 Scope This part of IEC 61788 describes considerations for the measurement of hysteretic loss in Cu/Nb-Ti multifilamen

45、tary composites using DC- or low-ramp-rate magnetometry. This international standard specifies a method of the measurement of hysteretic loss in multifilamentary Cu/Nb-Ti composite conductors. Measurements are assumed to be on round wires with temperatures at or near 4,2 K. DC or low-ramp-rate magne

46、tometry will be performed using either a superconducting quantum interference device (SQUID magnetometer, See Annex A.) or a vibrating-sample magnetometer (VSM). In case differences between the calibrated magnetometer results are noted, the VSM results, extrapolated to zero ramp rate, will be taken

47、as definitive. Extension to the measurement of superconductors in general is given in Annex B. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited appl

48、ies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050 (all parts), International Electrotechnical Vocabulary (available at 5 Lp. 4.6 Specimen orientation and demagnetization effects Loss measurements shall be made on strand specimens

49、 in a transverse magnetic field. For the fully penetrated fine filaments of a multifilamentary Cu/Nb-Ti strand, demagnetization is negligible. By the same token, it is negligible for round-, flat-, or square-cross-sectioned bundles of such strands. However, for the sake of completeness in reporting the results, the specimen configuration shall be reported. 4.7 Normalization volume It may be desirable to report h

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