1、 IEC 61967-8 Edition 1.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions IC stripline method Circuits intgrs Mesure des missions lectromagntiques Partie 8: Mesure des missions rayonnes Mthode d
2、e la ligne TEM plaques (stripline) pour CI IEC 61967-8:2011 colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic
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16、 publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61967-8 Edition 1.0 2011-08 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits Measurement of electromagnetic emissions Part
17、8: Measurement of radiated emissions IC stripline method Circuits intgrs Mesure des missions lectromagntiques Partie 8: Mesure des missions rayonnes Mthode de la ligne TEM plaques (stripline) pour CI INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE Q ICS 31.200 PR
18、ICE CODE CODE PRIX ISBN 978-2-88912-619-4 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale colour inside 2 61967-8 IEC:2011 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 4 Ge
19、neral 6 5 Test conditions . 6 5.1 General . 6 5.2 Supply voltage. 6 5.3 Frequency range . 6 6 Test equipment . 7 6.1 General . 7 6.2 RF measuring instrument 7 6.3 Preamplifier . 7 6.4 IC stripline . 7 6.5 50 termination 7 6.6 System gain 7 7 Test set-up . 8 7.1 General . 8 7.2 Test configuration 8 7
20、.3 EMC test board (PCB) . 8 8 Test procedure . 9 8.1 General . 9 8.2 Ambient conditions 9 8.3 Operational check . 9 8.4 Verification of IC stripline RF characteristic . 9 8.5 Test technique. 9 9 Test report 10 9.1 General . 10 9.2 Measurement conditions 10 10 IC Emissions reference levels. 10 Annex
21、A (normative) IC stripline description. 11 Annex B (informative) Specification of emission levels . 15 Bibliography 17 Figure 1 IC stripline test set-up 8 Figure A.1 Cross section view of an example of an unshielded IC stripline . 11 Figure A.2 Cross section view of an example of an IC stripline wit
22、h housing 12 Figure A.3 Example of IC stripline with housing . 14 Figure B.1 Emission characterization levels . 16 Table A.1 Maximum DUT dimensions for 6,7 mm IC stripline open version 12 Table A.2 Maximum DUT dimensions for 6,7 mm IC stripline closed version 12 61967-8 IEC:2011 3 INTERNATIONAL ELEC
23、TROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS Part 8: Measurement of radiated emissions IC stripline method FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnica
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34、l such patent rights. International Standard IEC 61967-8 has been prepared by subcommittee 47A: Integrated circuits, of IEC technical committee 47: Semiconductor devices. The text of this standard is based on the following documents: FDIS Report on voting 47A/868/FDIS 47A/870/RVD Full information on
35、 the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 61967-8 IEC:2011 This part of IEC 61967 is to be read in conjunction with IEC 61967-1. A list of all
36、 parts of IEC 6xxxx series, under the general title Integrated circuits Measurement of electromagnetic emissions can be found on the IEC website. NOTE Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the t
37、ime of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, with
38、drawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour print
39、er. 61967-8 IEC:2011 5 INTEGRATED CIRCUITS MEASUREMENT OF ELECTROMAGNETIC EMISSIONS Part 8: Measurement of radiated emissions IC stripline method 1 Scope The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circui
40、t (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. 2 Normative references The following referenced documents are indispensable for
41、the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-131: International Electrotechnical Vocabulary (IEV) Part 131: Circuit theory IEC 60050-161: Int
42、ernational Electrotechnical Vocabulary (IEV) Chapter 161: Electro- magnetic compatibility IEC 61967-1: Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 1: General conditions and definitions IEC 61967-2: Integrated circuits Measurement of electromagnetic emissions,
43、150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method IEC 61000-4-20: Electromagnetic compatibility (EMC) Part 4-20: Testing and measurement techniques Emission and immunity testing in transverse electromagnetic (TEM) waveguides 3 Terms and definitions For
44、the purposes of this document, the terms and definitions given in IEC 61967-1, IEC 60050-131 and IEC 60050-161 as well as the following apply. 3.1 transverse electromagnetic (TEM) mode waveguide mode in which the components of the electric and magnetic fields in the propagation direction are much le
45、ss than the primary field components across any transverse cross-section 3.2 TEM waveguide open or closed transmission line system, in which a wave is propagating in the transverse electromagnetic mode to produce a specified field for testing purposes 6 61967-8 IEC:2011 3.3 IC stripline TEM waveguid
46、e, consisting of an active conductor placed on a defined spacing over an enlarged ground plane, connected to a port structure on each end and an optional shielded enclosure NOTE This arrangement guides a wave propagation in the transverse electromagnetic mode to produce a specific field for testing
47、purposes between the active conductor and the enlarged ground plane. As enlarged ground plane the ground plane of the standard EMC test board according to IEC 61967-1 should be used. An optional shielding enclosure may be used for fixing the IC stripline configuration and for shielding purposes. Thi
48、s leads to a closed version of the IC stripline in opposite to the open version without shielding enclosure. For further information see Annex A. 3.4 two-port TEM waveguide TEM waveguide with input/output measurement ports at both ends 3.5 characteristic impedance magnitude of the ratio of the volta
49、ge between the active conductor and the corresponding ground plane to the current on either conductor for any constant phase wave-front NOTE The characteristic impedance is independent of the voltage/current magnitudes and depends only on the cross sectional geometry of the transmission line. TEM waveguides are typically designed to have 50 characteristic imp
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