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IEC 61987-10-2009 Industrial-process measurement and control - Data structures and elements in process equipment catalogues - Part 10 Lists of properties (LOPs) for industrial-proc.pdf

1、 IEC 61987-10 Edition 1.0 2009-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Industrial-process measurement and control Data structures and elements in process equipment catalogues Part 10: Lists of Properties (LOPs) for Industrial-Process Measurement and Control for Electronic Data Exchange Fundam

2、entals Mesure et commande des processus industriels Structures de donnes et lments dans les catalogues dquipement de processus Partie 10: Liste de proprits (LOP) pour lchange lectronique de donnes pour la mesure et le contrle de processus industriels Principes essentiels IEC 61987-10:2009 colour ins

3、ide THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permissi

4、on in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for fu

5、rther information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du C

6、omit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue

7、 de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC pub

8、lications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search

9、 by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publicati

10、ons released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the Inte

11、rnational Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919

12、 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des

13、publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches

14、en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fo

15、is par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes qui

16、valents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service

17、clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 61987-10 Edition 1.0 2009-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Industrial-process measurement and control Data structures and elements in process equipment catalogues Part 10: Lists of Properties (L

18、OPs) for Industrial-Process Measurement and Control for Electronic Data Exchange Fundamentals Mesure et commande des processus industriels Structures de donnes et lments dans les catalogues dquipement de processus Partie 10: Liste de proprits (LOP) pour lchange lectronique de donnes pour la mesure e

19、t le contrle de processus industriels Principes essentiels INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE X ICS 25.040.40; 35.100.20 PRICE CODE CODE PRIX ISBN 978-2-88912-273-8 Registered trademark of the International Electrotechnical Commission Marque dpose de

20、 la Commission Electrotechnique Internationale colour inside 2 61987-10 IEC:2009 CONTENTS FORE WORD 4 INTRODUCTION 6 1 Scope 10 2 Normative references 10 3 Terms, definitions and abbreviations. 11 3.1 Terms and definitions . 11 3.2 Abbreviations. 15 4 Structural elements and concepts of lists of pro

21、perties . 16 4.1 General . 16 4.2 Structural elements 16 4.2.1 Properties 16 4.2.2 Blocks of properties . 18 4.2.3 Views . 19 4.3 Structural concepts 19 4.3.1 Cardinality 19 4.3.2 Polymorphism . 20 4.3.3 Composition/Aggregation . 21 5 Types of Lists of Properties . 22 5.1 General . 22 5.2 Administra

22、tive List of Properties (ALOP) . 22 5.3 Operating List of Properties (OLOP) . 23 5.4 Device List of Properties (DLOP) . 23 5.5 Commercial List of Properties (CLOP) 24 5.6 Additional types of Lists of Properties. 24 5.7 LOP types for composite devices . 25 6 Structural and Transaction Data . 25 6.1 C

23、oncept Identifier . 25 6.2 Structural Data 26 6.3 Transaction Data 26 Annex A (normative) Conceptual model of a List of Properties . 30 Annex B (informative) Usage of LOPs 34 Annex C (informative) Use cases for engineering 41 Bibliography . 48 Figure 1 Layers of electronic exchange procedures consid

24、ered in this standard . 7 Figure 2 Support for business-to-business relationships through the use of Lists of Prop erties 8 Figure 3 A property and its attributes . 17 Figure 4 Interpretation of a block of properties 18 Figure 5 Illustration of cardinality . 20 Figure 6 Illustration of polymorphism

25、. 21 Figure 7 Structure of a composite device 22 Figure 8 Relationship between property values in the OLOP and DLOP . 24 Figure A.1 Simplified UML scheme of an LOP . 30 61987-10 IEC:2009 3 Figure A.2 Conceptual UML scheme of the data model 31 Figure C.1 Use of LOP types at individual project stages

26、. 41 Figure C.2 Data exchange in the engineering workflow 42 Figure C.3 Structural and transaction data for inquiry and offer 44 Figure C.4 Data exchange throughout the life-cycle of a device 47 Table 1 Example of concept Identifiers . 26 Table 2 Example of transaction data 27 Table 3 Example of vis

27、ualisation of the transaction data 29 Table B.1 Suggestion for an Administrative List of Properties . 34 Table B.2 Example of Operating List of Properties 37 Table B.3 Example of Device List of Properties . 38 Table C.1 Structural and transaction data for the example described 46 4 61987-10 IEC:2009

28、 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL DATA STRUCTURES AND ELEMENTS IN PROCESS EQUIPMENT CATALOGUES Part 10: Lists of Properties (LOPs) for Industrial-Process Measurement and Control for Electronic Data Exchange Fundamentals FOREWORD 1) The Internatio

29、nal Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic

30、 fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; an

31、y IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standar

32、dization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has repr

33、esentation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IE

34、C cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publi

35、cations. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some area

36、s, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents includi

37、ng individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or relianc

38、e upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elem

39、ents of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61987-10 has been prepared by subcommittee 65E: Devices and integration in enterprise systems, of IEC technical committee 65:

40、Industrial-process measurement, controls and automation. This bilingual version, published in 2010-12, corresponds to the English version. The text of this standard is based on the following documents: FDIS Report on voting 65E/134/FDIS 65E/145/RVD Full information on the voting for the approval of

41、this standard can be found in the report on voting indicated in the above table. 61987-10 IEC:2009 5 The French version of this standard has not been voted upon. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. This part of IEC 61987 has to be read in conjunction

42、with IEC 61987-1. A list of all parts in the IEC 61987 series, under the general title Industrial-process measurement and control Data structures and elements in process equipment catalogues, can be found on the IEC website. The committee has decided that the contents of this publication will remain

43、 unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. The contents of the corrigendum of May 2012 have b

44、een included in this copy. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 61987-10 IEC:2009

45、 INTRODUCTION The exchange of product data between companies, business systems, engineering tools and, in the future, control systems (electrical, measuring and control technology) can run smoothly only when both the information to be exchanged and the use of this information have been clearly defin

46、ed. In the past, requirements on process control devices and systems were specified by customers in various ways when suppliers or manufacturers were asked to quote for suitable equipment. The suppliers in their turn described the devices according to their own documentation schemes, often using dif

47、ferent terms, structures and media (paper, databases, CDs, e-catalogues, etc.). The situation was similar in the planning and development process, with device information frequently being duplicated in a number of different information technology (IT) systems. Any method that is capable of recording

48、 all existing information once only during the planning and ordering process and making it available for further processing gives all parties involved an opportunity to concentrate on the essentials. A precondition for this is the standardization of both the descriptions of the objects and the excha

49、nge of information. IEC 61987-1 makes an important step towards this goal by defining a generic structure in which product features of industrial process measurement and control equipment with analogue or digital output can be arranged. This facilitates the understanding of product descriptions when they are transferred from one party to another. Part 1 of

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