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本文(IEC 62007-2-2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 Measuring methods《光纤系统用半导体光电器件.第2部分 测量方法》.pdf)为本站会员(visitstep340)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 62007-2-2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2 Measuring methods《光纤系统用半导体光电器件.第2部分 测量方法》.pdf

1、 IEC 62007-2 Edition 2.0 2009-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor optoelectronic devices for fibre optic system applications Part 2: Measuring methods Dispositifs optolectroniques semiconducteurs pour application dans les systmes fibres optiques Partie 2: Mthodes de mesure I

2、EC 62007-2:2009 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2009 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, with

3、out permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Comm

4、ittee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la

5、 CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central O

6、ffice 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: 0Hinmailiec.ch Web: 1Hwww.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologie

7、s. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: 2Hwww.iec.ch/searchpub The IEC on-line Catalogue ena

8、bles you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: 3Hwww.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a mon

9、th all new publications released. Available on-line and also by email. Electropedia: 4Hwww.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000 terms and definitions in English and French, with equivalent terms in additional languages.

10、Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: 5Hwww.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, please visit the Customer Service Centre FAQ or contact us: Email: 6Hcsciec.ch Tel.: +41 22

11、 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications CEI

12、 Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de la CEI: 7Hwww.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous perme

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14、Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: 9Hwww.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en f

15、ranais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: 10Hwww.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des qu

16、estions, visitez le FAQ du Service clients ou contactez-nous: Email: 11Hcsciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62007-2 Edition 2.0 2009-01 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor optoelectronic devices for fibre optic system applications Part 2: Measuring methods

17、 Dispositifs optolectroniques semiconducteurs pour application dans les systmes fibres optiques Partie 2: Mthodes de mesure INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE W ICS 31.080.01; 31.260; 33.180.01 PRICE CODE CODE PRIX ISBN 2-8318-1023-6 Registered trade

18、mark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 62007-2 IEC:2009 CONTENTS FOREWORD. 0H4 INTRODUCTION. 1H6 1 Scope. 2H7 2 Normative references . 3H7 3 Terms, definitions and abbreviations 4H7 3.1 Terms and definitions 5H7 3.2 Abbre

19、viations 6H8 4 Measuring methods for photoemitters. 7H8 4.1 Outline of the measuring methods . 8H8 4.2 Radiant power or forward current of LEDs and LDs with or without optical fibre pigtails 9H8 4.3 Small signal cut-off frequency (f c ) of LEDs and LDs with or without optical fibre pigtails 10H9 4.4

20、 Threshold current of LDs with or without optical fibre pigtails 11H10 4.5 Relative intensity noise of LEDs and LDs with or without optical fibre pigtails 12H12 4.6 S 11parameter of LEDs, LDs and LD modules with or without optical fibre pigtails 13H13 4.7 Tracking error for LD modules with optical f

21、ibre pigtails, with or without cooler 14H15 4.8 Spectral linewidth of LDs with or without optical fibre pigtails 15H17 4.9 Modulation current at 1 dB efficacy compression (I F (1 dB) ) of LEDs 16H18 4.10 Differential efficiency ( d ) of a LD with or without pigtail and an LD module 17H20 4.11 Differ

22、ential (forward) resistance r dof an LD with or without pigtail 18H22 5 Measuring methods for receivers 19H23 5.1 Outline of the measuring methods . 20H23 5.2 Noise of a PIN photodiode. 21H23 5.3 Excess noise factor of an APD with or without optical fibre pigtails 22H25 5.4 Small-signal cut-off freq

23、uency of a photodiode with or without optical fibre pigtails 23H27 5.5 Multiplication factor of an APD with or without optical fibre pigtails 24H28 5.6 Responsivity of a PIN-TIA module . 25H30 5.7 Frequency response flatness (S/S) of a PIN-TIA module 26H32 5.8 Output noise power (spectral) density P

24、 no, of a PIN-TIA module 27H33 5.9 Low frequency output noise power (spectral) density (P no , LF ) and corner frequency (f cor ) of a PIN-TIA module 28H35 5.10 Minimum detectable power of PIN-TIA module 29H36 Bibliography 30H38 Figure 1 Equipment setup for measuring radiant power and forward curren

25、t of LEDs and LDs 31H8 Figure 2 Circuit diagram for measuring small-signal cut-off frequency LEDs and LDs 32H10 Figure 3 Circuit diagram for measuring threshold current of a LD. 33H11 Figure 4 Graph to determine threshold current of lasers. 34H11 Figure 5 Circuit diagram for measuring RIN of LEDs an

26、d LDs 35H12 Figure 6 Circuit diagram for measuring the S 11parameter LEDs, LDs and LD modules 36H14 62007-2 IEC:2009 3 Figure 7 Cathode and anode connected to the package of a LD 37H15 Figure 8 Output radiant power versus time. 38H16 Figure 9 Output radiant power versus case temperature 39H16 Figure

27、 10 Circuit diagram for measuring linewidth of LDs. 40H17 Figure 11 Circuit diagram for measuring 1 dB efficacy compression of LDs 41H19 Figure 12 Plot of log V 2versus log I 1 . 42H20 Figure 13 Circuit diagram for measuring differential efficiency of a LD . 43H21 Figure 14 Current waveform for diff

28、erential efficiency measurement 44H21 Figure 15 Circuit diagram for measuring differential resistance 45H22 Figure 16 Current waveform for differential resistance . 46H23 Figure 17 Circuit diagram for measuring noise of a PIN photoreceiver . 47H24 Figure 18 Circuit diagram for measuring noise with s

29、ynchronous detection 48H25 Figure 19 Circuit diagram for measuring excess noise of an APD. 49H26 Figure 20 Circuit diagram for measuring small-signal cut-off wavelength of a photodiode 50H28 Figure 21 Circuit diagram for measuring multiplication factor of an APD 51H29 Figure 22 Graph showing measure

30、ment of I R1and I R2 . 52H30 Figure 23 Circuit diagram for measuring responsivity of a PIN-TIA module 53H31 Figure 24 Circuit diagram for measuring frequency response flatness of a PIN-TIA module 54H32 Figure 25 Circuit diagram for measuring output noise power (spectral) density of a PIN-TIA module

31、under matched output conditions. 55H34 Figure 26 Circuit diagram for measuring output noise power (spectral) density of a non-irradiated PIN-TIA module in the low frequency region. 56H35 Figure 27 Graph of V mversus frequency 57H36 Figure 28 Circuit diagram for measuring minimum detectable power of

32、a PIN-TIA module at a specified bit-error rate (BER) or carrier-to-noise ratio (C/N) 58H37 4 62007-2 IEC:2009 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ SEMICONDUCTOR OPTOELECTRONIC DEVICES FOR FIBRE OPTIC SYSTEM APPLICATIONS Part 2: Measuring methods FOREWORD 1) The International Electrotechnical

33、Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end

34、and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Commit

35、tee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in acc

36、ordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all i

37、nterested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held resp

38、onsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergen

39、ce between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6)

40、All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage

41、 or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this public

42、ation. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all suc

43、h patent rights. International Standard IEC 62007-2 has been prepared by subcommittee 86C: Fibre optic systems and active devices, of IEC technical committee 86: Fibre optics. This second edition cancels and replaces the first edition published in 1997, and its amendment 1(1998). It is a technical r

44、evision. This edition includes the following significant technical changes with respect to the previous edition: a) descriptions related to analogue characteristics have been removed; b) some definitions and terms have been revised for harmonisation with other standards originating from SC 86C. 6200

45、7-2 IEC:2009 5 The text of this standard is based on the following documents: FDIS Report on voting 86C/868/FDIS 86C/870/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accord

46、ance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 62007 series can be found, under the general title Semiconductor optoelectronic devices for fibre optic system applications, on the IEC website. The committee has decided that the contents of this publication will remain unchan

47、ged until the maintenance result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 6 62007-2 IEC:2009 INTRODUCTION Semiconductor op

48、tical signal transmitters and receivers play important roles in optical information networks. This standard covers the measurement procedures for their optical and electrical properties that are intended for digital communication systems. These properties are essential to specify their performance.

49、62007-2 IEC:2009 7 SEMICONDUCTOR OPTOELECTRONIC DEVICES FOR FIBRE OPTIC SYSTEM APPLICATIONS Part 2: Measuring methods 1 Scope This part of IEC 62007 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. All optical fibres and cables that are defi

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