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本文(IEC 62047-15-2015 Semiconductor devices - Micro-electromechanical devices - Part 15 Test method of bonding strength between PDMS and glass《半导体器件 微型机电装置 第15部分 PDMS和玻璃之间粘结强度的试验方法》.pdf)为本站会员(孙刚)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEC 62047-15-2015 Semiconductor devices - Micro-electromechanical devices - Part 15 Test method of bonding strength between PDMS and glass《半导体器件 微型机电装置 第15部分 PDMS和玻璃之间粘结强度的试验方法》.pdf

1、 IEC 62047-15 Edition 1.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices Micro-electromechanical devices Part 15: Test method of bonding strength between PDMS and glass Dispositifs semiconducteurs Dispositifs microlectromcaniques Partie 15: Mthode dessai de la rsistance de

2、 collage entre PDMS et verre IEC 62047-15:2015-03(en-fr) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or

3、 mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact t

4、he address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par aucun procd, lectronique ou mcanique, y compris l

5、a photocopie et les microfilms, sans laccord crit de lIEC ou du Comit national de lIEC du pays du demandeur. Si vous avez des questions sur le copyright de lIEC ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez les coordonnes ci-aprs ou contactez le Comit national d

6、e lIEC de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes Inte

7、rnational Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. IEC Catal

8、ogue - webstore.iec.ch/catalogue The stand-alone application for consulting the entire bibliographical information on IEC International Standards, Technical Specifications, Technical Reports and other documents. Available for PC, Mac OS, Android Tablets and iPad. IEC publications search - www.iec.ch

9、/searchpub The advanced search enables to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publi

10、cations. Just Published details all new publications released. Available online and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with eq

11、uivalent terms in 15 additional languages. Also known as the International Electrotechnical Vocabulary (IEV) online. IEC Glossary - std.iec.ch/glossary More than 60 000 electrotechnical terminology entries in English and French extracted from the Terms and Definitions clause of IEC publications issu

12、ed since 2002. Some entries have been collected from earlier publications of IEC TC 37, 77, 86 and CISPR. IEC Customer Service Centre - webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A pr

13、opos de lIEC La Commission Electrotechnique Internationale (IEC) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectricit, llectronique et aux technologies apparentes. A propos des publications IEC Le contenu technique des publications

14、IEC est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue IEC - webstore.iec.ch/catalogue Application autonome pour consulter tous les renseignements bibliographiques sur les Normes internationales, Spcificatio

15、ns techniques, Rapports techniques et autres documents de lIEC. Disponible pour PC, Mac OS, tablettes Android et iPad. Recherche de publications IEC - www.iec.ch/searchpub La recherche avance permet de trouver des publications IEC en utilisant diffrents critres (numro de rfrence, texte, comit dtudes

16、). Elle donne aussi des informations sur les projets et les publications remplaces ou retires. IEC Just Published - webstore.iec.ch/justpublished Restez inform sur les nouvelles publications IEC. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par moi

17、s par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne de termes lectroniques et lectriques. Il contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans 15 langues additionnelles. Egalement appel Vocabulaire Electrotechniq

18、ue International (IEV) en ligne. Glossaire IEC - std.iec.ch/glossary Plus de 60 000 entres terminologiques lectrotechniques, en anglais et en franais, extraites des articles Termes et Dfinitions des publications IEC parues depuis 2002. Plus certaines entres antrieures extraites des publications des

19、CE 37, 77, 86 et CISPR de lIEC. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur cette publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62047-15 Edition 1.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices Micro-el

20、ectromechanical devices Part 15: Test method of bonding strength between PDMS and glass Dispositifs semiconducteurs Dispositifs microlectromcaniques Partie 15: Mthode dessai de la rsistance de collage entre PDMS et verre INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATI

21、ONALE ICS 31.080.99 ISBN 978-2-8322-2291-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vo

22、us avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 62047-15:2015 IEC 2015 CONTENTS FOREWORD . 3 1 Scope 5 2 Normative references 5 3 Terms and definitions 5 4 Testing method 6 4.1 Visual test . 6 4.1.1 General . 6 4.1.2 Equipment . 6 4.1.3 Procedure 6 4.1.4 Visual test res

23、ults 6 4.2 Bonding strength test 6 4.2.1 General . 6 4.2.2 Sample preparation . 7 4.2.3 Procedure 7 4.2.4 Result of blister test . 8 4.3 Contact angle measurement . 8 4.3.1 General . 8 4.3.2 Equipment . 8 4.3.3 Procedure 8 4.3.4 Result of test . 9 4.4 Hermeticity test . 9 4.4.1 General . 9 4.4.2 Equ

24、ipment . 9 4.4.3 Procedure 10 4.4.4 Result of test . 10 Bibliography 11 Figure 1 Blister mask . 7 Figure 2 PDMS blister 8 Figure 3 Contact angle measurement of water drop on PDMS 9 Figure 4 Test set-up for hermeticity 10 Table 1 Result of visual test . 6 IEC 62047-15:2015 IEC 2015 3 INTERNATIONAL EL

25、ECTROTECHNICAL COMMISSION _ SEMICONDUCTOR DEVICES MICRO-ELECTROMECHANICAL DEVICES Part 15: Test method of bonding strength between PDMS and glass FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical c

26、ommittees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Techn

27、ical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmen

28、tal and non- governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or a

29、greements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international u

30、se and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to pro

31、mote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indi

32、cated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6

33、) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property dama

34、ge or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publ

35、ication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all s

36、uch patent rights. International Standard IEC 62047-15 has been prepared by subcommittee 47F: Micro- electromechanical systems, of IEC technical committee 47: Semiconductor devices. The text of this standard is based on the following documents: FDIS Report on voting 47F/208/FDIS 47F/213/RVD Full inf

37、ormation on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 IEC 62047-15:2015 IEC 2015 A list of all parts in the IEC 62047 series, published under t

38、he general title Semiconductor devices Micro-electromechanical devices, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to t

39、he specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding

40、of its contents. Users should therefore print this document using a colour printer. IEC 62047-15:2015 IEC 2015 5 SEMICONDUCTOR DEVICES MICRO-ELECTROMECHANICAL DEVICES Part 15: Test method of bonding strength between PDMS and glass 1 Scope This part of IEC 62047 describes test method for bonding stre

41、ngth between poly dimethyl siloxane (PDMS) and glass. Silicone-based rubber, PDMS, is used for building of chip-based microfluidic devices fabricated using lithography and replica moulding processes. The problem of bonding strength is mainly for high pressure applications as in the case of certain p

42、eristaltic pump designs where an off chip compressed air supply is used to drive the fluids in micro channels created by a twin layer, one formed by bondage between glass with replica moulded PDMS and another between PDMS and PDMS. Also, in case of systems having pneumatic microvalves, a relatively

43、high level of bonding particularly between two replica moulded layers of PDMS becomes quite necessary. Usually there is a leakage and debonding phenomena between interface of bonded areas, which causes unstability and shortage of lifetime for MEMS devices. This standard specifies general procedures

44、on bonding test of PDMS and glass chip. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the

45、referenced document (including any amendments) applies. IEC 62047-9, Semiconductor devices Micro-electromechanical devices Part 9: Wafer to wafer bonding strength measurement for MEMS 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 complete b

46、onded area bonded wafer without void areas 3.2 hydrophilic physical property of a molecule that can bond with water (H 2 O) through hydrogen bonding Note 1 to entry: A definition of the term “molecule“ can be found on this page: http:/en.wikipedia.org/wiki/Molecule. Note 2 to entry: A definition of

47、hydrogen bond“ can be found on this page: http:/en.wikipedia.org/wiki/Hydrogen_bonding. 3.3 hydrophobic property that tend to be non-polar molecules which form aggregates of like molecules in water and analogous intramolecular interactions 6 IEC 62047-15:2015 IEC 2015 3.4 PDMS silicone-based rubber

48、 poly dimethyl siloxane having a chemical formula of (H 3 C) 3 SiOSi(CH 3 ) 2 O n Si(CH 3 ) 34 Testing method 4.1 Visual test 4.1.1 General The visual test should be performed to confirm whether substantial other bonding tests are required. Visual test is a simple qualitative test method. Optical eq

49、uipment shall be used to evaluate the bonding interface of glass to PDMS and PDMS to PDMS. 4.1.2 Equipment One or a few equipments of optical microscope, scanning acoustic microscope, scanning electron microscope (SEM), transmittion electron microscope (TEM) and infra-red (IR) or optical camera can be used. 4.1.3 Procedure The procedure is as follows: a) to observe bonding conditions using the o

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