IEC 62228-2-2016 Integrated circuits - EMC evaluation of transceivers - Part 2 LIN transceivers《集成电路 收发器EMC评估 第2部分 LIN收发器》.pdf

1、 IEC 62228-2 Edition 1.0 2016-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits EMC evaluation of transceivers Part 2: LIN transceivers Circuits intgrs valuation de la CEM des metteurs-rcepteurs Partie 2: metteurs-rcepteurs LIN IEC 62228-2:2016-11(en-fr) colour inside THIS PUBLICATI

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19、te publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62228-2 Edition 1.0 2016-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Integrated circuits EMC evaluation of transceivers Part 2: LIN transceivers Circuits intgrs valuation de la CEM des metteurs-rcepteurs Partie 2: metteur

20、s-rcepteurs LIN INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 31.200 ISBN 978-2-8322-3776-2 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtai

21、ned this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 62228-2:2016 IEC 2016 CONTENTS FOREWORD . 5 1 Scope 7 2 Normative references 7 3 Terms, definitions and abbreviations . 8 3.1 Term

22、s and definitions 8 3.2 Abbreviations 8 4 General . 8 5 Test and operating conditions 9 5.1 Supply and ambient conditions 9 5.2 Test operation modes . 10 5.3 Test configuration . 10 5.3.1 General test configuration for functional test 10 5.3.2 General test configuration for unpowered ESD test 11 5.3

23、.3 Coupling ports and coupling networks for functional tests 11 5.3.4 Coupling ports and coupling networks for unpowered ESD tests 12 5.4 Test signals 13 5.4.1 General . 13 5.4.2 Test signals for normal operation mode . 13 5.4.3 Test signal for wake-up from sleep mode . 14 5.5 Evaluation criteria .

24、14 5.5.1 General . 14 5.5.2 Evaluation criteria in functional operation modes during exposure to disturbances 15 5.5.3 Evaluation criteria in unpowered condition after exposure to disturbances 16 5.5.4 Status classes . 17 6 Test and measurement 17 6.1 Emission of RF disturbances . 17 6.1.1 Test meth

25、od 17 6.1.2 Test setup . 17 6.1.3 Test procedure and parameters . 18 6.2 Immunity to RF disturbances . 19 6.2.1 Test method 19 6.2.2 Test setup . 19 6.2.3 Test procedure and parameters . 20 6.3 Immunity to impulses 22 6.3.1 Test method 22 6.3.2 Test setup . 23 6.3.3 Test procedure and parameters . 2

26、3 6.4 Electrostatic Discharge (ESD) . 26 6.4.1 Test method 26 6.4.2 Test setup . 26 6.4.3 Test procedure and parameters . 28 7 Test report . 28 Annex A (normative) LIN test circuits . 29 A.1 General . 29 IEC 62228-2:2016 IEC 2016 3 A.2 LIN test circuit for standard LIN transceiver ICs for functional

27、 tests . 29 A.3 LIN test circuit for IC with embedded LIN transceiver for functional tests 31 A.4 LIN test circuit for LIN transceiver ICs for unpowered ESD test . 32 Annex B (normative) Test circuit boards. 33 B.1 Test circuit board for functional tests 33 B.2 ESD test . 33 Annex C (informative) Ex

28、amples for test limits for LIN transceiver in automotive application 35 C.1 General . 35 C.2 Emission of RF disturbances . 35 C.3 Immunity to RF disturbances . 36 C.4 Immunity to impulses 37 C.5 Electrostatic Discharge (ESD) . 37 Annex D (informative) Test of indirect ESD discharge 38 D.1 General .

29、38 D.2 Test setup . 38 D.3 Typical current wave form for indirect ESD test . 39 D.4 Test procedure and parameters 39 Figure 1 General test configuration for tests in functional operation modes 10 Figure 2 General test configuration for unpowered ESD test 11 Figure 3 Coupling ports and networks for f

30、unctional tests 11 Figure 4 Coupling ports and networks for unpowered ESD tests 12 Figure 5 Principal drawing of the maximum deviation on an I-V characteristic 16 Figure 6 Test setup for measurement of RF disturbances 18 Figure 7 Test setup for DPI tests 19 Figure 8 Test setup for impulse immunity t

31、ests 23 Figure 9 Test setup for direct ESD tests . 27 Figure A.1 General drawing of the circuit diagram of test network for standard LIN transceiver ICs for functional test 30 Figure A.2 General drawing of the circuit diagram of the test network for ICs with embedded LIN transceiver for functional t

32、est 32 Figure A.3 General drawing of the circuit diagram for direct ESD tests of LIN transceiver ICs in unpowered mode 32 Figure B.1 Example of IC interconnections of LIN signal 33 Figure B.2 Example of ESD test board for LIN transceiver ICs . 34 Figure C.1 Example of limits for RF emission . 36 Fig

33、ure C.2 Example of limits for RF immunity for functional status class A IC. 36 Figure C.3 Example of limits for RF immunity for functional status class C ICor D IC37 Figure D.1 Test setup for indirect ESD tests 38 Figure D.2 Example of ESD current wave form for indirect ESD test at V ESD= -8 kV . 39

34、 Table 1 Overview of required measurements and tests 9 Table 2 Supply and ambient conditions for functional operation . 10 Table 3 Definition of coupling ports and coupling network component values for functional tests . 12 4 IEC 62228-2:2016 IEC 2016 Table 4 Definitions of coupling ports for unpowe

35、red ESD tests . 13 Table 5 Communication test signal TX1 . 13 Table 6 Communication test signal TX2 . 14 Table 7 Wake-up test signal TX3 . 14 Table 8 Evaluation criteria for Standard LIN transceiver IC in functional operation modes . 15 Table 9 Evaluation criteria for ICs with embedded LIN transceiv

36、er in functional operation modes . 16 Table 10 Definition of functional status classes 17 Table 11 Parameters for emission measurements 18 Table 12 Settings of the RF measurement equipment 19 Table 13 Specifications for DPI tests . 20 Table 14 Required DPI tests for functional status class A ICevalu

37、ation of standard LIN transceiver ICs . 21 Table 15 Required DPI tests for functional status class A ICevaluation of ICs with embedded LIN transceiver 22 Table 16 Required DPI tests for functional status class C ICor D ICevaluation of standard LIN transceiver ICs and ICs with embedded LIN transceive

38、r . 22 Table 17 Specifications for impulse immunity tests 24 Table 18 Parameters for impulse immunity test 24 Table 19 Required impulse immunity tests for functional status class A ICevaluation of standard LIN transceiver ICs . 25 Table 20 Required impulse immunity tests for functional status class

39、A ICevaluation of ICs with embedded LIN transceiver . 25 Table 21 Required impulse immunity tests for functional status class C ICor D ICevaluation of standard LIN transceiver ICs and ICs with embedded LIN transceiver 26 Table 22 Recommendations for direct ESD tests 28 Table B.1 Parameter ESD test c

40、ircuit board . 34 Table C.1 Example of limits for impulse immunity for functional status class C ICor D IC37 Table D.1 Specifications for indirect ESD tests 40 IEC 62228-2:2016 IEC 2016 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ INTEGRATED CIRCUITS EMC EVALUATION OF TRANSCEIVERS Part 2: LIN trans

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