1、 IEC 62271-101 Edition 2.0 2012-10 INTERNATIONAL STANDARD NORME INTERNATIONALE High-voltage switchgear and controlgear Part 101: Synthetic testing Appareillage haute tension Partie 101: Essais synthtiques IEC62271-101:2012 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2012 IEC, Genev
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16、t 101: Synthetic testing Appareillage haute tension Partie 101: Essais synthtiques INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XH ICS 29.130.10 PRICE CODE CODE PRIX ISBN 978-2-83220-421-4 Registered trademark of the International Electrotechnical Commission M
17、arque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colourinside 2 62271-101 IEC:2012 CONTENTS FOREWORD . 7
18、1 Scope . 9 2 Normative references . 9 3 Terms and definitions . 9 4 Synthetic testing techniques and methods for short-circuit breaking tests . 11 Basic principles and general requirements for synthetic breaking test 4.1methods 11 General . 11 4.1.1High-current interval 12 4.1.2Interaction interval
19、 . 12 4.1.3High-voltage interval 13 4.1.4Synthetic test circuits and related specific requirements for breaking tests 14 4.2Current injection methods 14 4.2.1Voltage injection method . 15 4.2.2Duplicate circuit method (transformer or Skeats circuit) . 15 4.2.3Other synthetic test methods . 16 4.2.4T
20、hree-phase synthetic test methods 16 4.35 Synthetic testing techniques and methods for short-circuit making tests . 19 Basic principles and general requirements for synthetic making test methods . 19 5.1General . 19 5.1.1High-voltage interval 19 5.1.2Pre-arcing interval . 19 5.1.3Latching interval a
21、nd fully closed position 20 5.1.4Synthetic test circuit and related specific requirements for making tests 20 5.2General . 20 5.2.1Test circuit 20 5.2.2Specific requirements 20 5.2.36 Specific requirements for synthetic tests for making and breaking performance related to the requirements of 6.102 t
22、hrough 6.111 of IEC 62271-100:2008 . 21 Annex A (informative) Current distortion 42 Annex B (informative) Current injection methods 58 Annex C (informative) Voltage injection methods . 62 Annex D (informative) Skeats or duplicate transformer circuit 65 Annex E (normative) Information to be given and
23、 results to be recorded for synthetic tests . 68 Annex F (normative) Synthetic test methods for circuit-breakers with opening resistors . 69 Annex G (informative) Synthetic methods for capacitive-current switching . 76 Annex H (informative) Re-ignition methods to prolong arcing 88 Annex I (normative
24、) Reduction in di/dt and TRV for test duty T100a 91 Annex J (informative) Three-phase synthetic test circuits . 100 Annex K (normative) Test procedure using a three-phase current circuit and one voltage circuit . 107 Annex L (normative) Splitting of test duties in test series taking into account the
25、 associated TRV for each pole-to-clear 127 Annex M (normative) Tolerances on test quantities for type tests . 147 62271-101 IEC:2012 3 Annex N (informative) Typical test circuits for metal-enclosed and dead tank circuit-breakers . 150 Annex O (informative) Combination of current injection and voltag
26、e injection methods . 160 Bibliography 163 Figure 1 Interrupting process Basic time intervals . 33 Figure 2 Examples of evaluation of recovery voltage 34 Figure 3 Equivalent surge impedance of the voltage circuit for the current injection method . 35 Figure 4 Making process Basic time intervals 36 F
27、igure 5 Typical synthetic making circuit for single-phase tests 37 Figure 6 Typical synthetic making circuit for out-of-phase 38 Figure 7 Typical synthetic make circuit for three-phase tests (kpp= 1,5) 39 Figure 8 Comparison of arcing time settings during three-phase direct tests (left) and three-ph
28、ase synthetic (right) for T100s with kpp= 1,5 40 Figure 9 Comparison of arcing time settings during three-phase direct tests (left) and three-phase synthetic (right) for T100a with kpp= 1,5 41 Figure A.1 Direct circuit, simplified diagram . 49 Figure A.2 Prospective short-circuit current . 49 Figure
29、 A.3 Distortion current 49 Figure A.4 Distortion current 50 Figure A.5 Simplified circuit diagram 51 Figure A.6 Current and arc voltage characteristics for symmetrical current 52 Figure A.7 Current and arc voltage characteristics for asymmetrical current 53 Figure A.8 Reduction of amplitude and dura
30、tion of final current loop of arcing . 54 Figure A.9 Reduction of amplitude and duration of final current loop of arcing . 55 Figure A.10 Reduction of amplitude and duration of final current loop of arcing . 56 Figure A.11 Reduction of amplitude and duration of final current loop of arcing . 57 Figu
31、re B.1 Typical current injection circuit with voltage circuit in parallel with the test circuit-breaker . 59 Figure B.2 Injection timing for current injection scheme with circuit B.1 60 Figure B.3 Examples of the determination of the interval of significant change of arc voltage from the oscillogram
32、s . 61 Figure C.1 Typical voltage injection circuit diagram with voltage circuit in parallel with the auxiliary circuit-breaker (simplified diagram) 63 Figure C.2 TRV waveshapes in a voltage injection circuit with the voltage circuit in parallel with the auxiliary circuit-breaker . 64 Figure D.1 Tra
33、nsformer or Skeats circuit 66 Figure D.2 Triggered transformer or Skeats circuit . 67 Figure F.1 Test circuit to verify thermal re-ignition behaviour of the main interrupter 73 Figure F.2 Test circuit to verify dielectric re-ignition behaviour of the main interrupter . 73 Figure F.3 Test circuit on
34、the resistor interrupter 74 Figure F.4 Example of test circuit for capacitive current switching tests on the main interrupter . 75 4 62271-101 IEC:2012 Figure F.5 Example of test circuit for capacitive current switching tests on the resistor interrupter 75 Figure G.1 Capacitive current circuits (par
35、allel mode) 79 Figure G.2 Current injection circuit . 80 Figure G.3 LC oscillating circuit . 81 Figure G.4 Inductive current circuit in parallel with LC oscillating circuit . 82 Figure G.5 Current injection circuit, normal recovery voltage applied to both terminals of the circuit-breaker 83 Figure G
36、6 Synthetic test circuit (series circuit), normal recovery voltage applied to both sides of the test circuit breaker . 84 Figure G.7 Current injection circuit, recovery voltage applied to both sides of the circuit-breaker . 85 Figure G.8 Making test circuit 86 Figure G.9 Inrush making current test
37、circuit 87 Figure H.1 Typical re-ignition circuit diagram for prolonging arc-duration . 89 Figure H.2 Combined Skeats and current injection circuits . 89 Figure H.3 Typical waveforms obtained during an asymmetrical test using the circuit in Figure H.2 . 90 Figure J.1 Three-phase synthetic combined c
38、ircuit . 102 Figure J.2 Waveshapes of currents, phase-to-ground and phase-to phase voltages during a three-phase synthetic test (T100s; kpp = 1,5 ) performed according to the three-phase synthetic combined circuit . 103 Figure J.3 Three-phase synthetic circuit with injection in all phases for kpp= 1
39、5. 104 Figure J.4 Waveshapes of currents and phase-to-ground voltages during a three-phase synthetic test (T100s; kpp=1,5) performed according to the three-phase synthetic circuit with injection in all phases . 104 Figure J.5 Three-phase synthetic circuit for terminal fault tests with kpp= 1,3 (cur
40、rent injection method) . 105 Figure J.6 Waveshapes of currents, phase-to-ground and phase-to-phase voltages during a three-phase synthetic test (T100s; kpp=1,3 ) performed according to the three-phase synthetic circuit shown in Figure J.5 105 Figure J.7 TRV voltages waveshapes of the test circuit de
41、scribed in Figure J.5 . 106 Figure K.1 Example of a three-phase current circuit with single-phase synthetic injection 118 Figure K.2 Representation of the testing conditions of Table K.1 . 119 Figure K.3 Representation of the testing conditions of Table K.2 . 120 Figure K.4 Representation of the tes
42、ting conditions of Table K.3 . 121 Figure K.5 Representation of the testing conditions of Table K.4 . 122 Figure K.6 Representation of the testing conditions of Table K.5 . 123 Figure K.7 Representation of the testing conditions of Table K.6 . 124 Figure K.8 Representation of the testing conditions
43、of Table K.7 . 125 Figure K.9 Representation of the testing conditions of Table K.8 . 126 Figure L.1 Graphical representation of the test shown in Table L.6 137 Figure L.2 Graphical representation of the test shown in Table L.7 138 Figure N.1 Test circuit for unit testing (circuit-breaker with inter
44、action due to gas circulation) 151 62271-101 IEC:2012 5 Figure N.2 Half-pole testing of a circuit-breaker in test circuit given by Figure N.1 Example of the required TRVs to be applied between the terminals of the unit(s) under test and between the live parts and the insulated enclosure 152 Figure N
45、3 Synthetic test circuit for unit testing (if unit testing is allowed as per 6.102.4.2 of IEC 62271-100:2008) 153 Figure N.4 Half-pole testing of a circuit-breaker in the test circuit of Figure N.3 Example of the required TRVs to be applied between the terminals of the unit(s) under test and betwee
46、n the live parts and the insulated enclosure 154 Figure N.5 Capacitive current injection circuit with enclosure of the circuit-breaker energized 155 Figure N.6 Capacitive synthetic circuit using two power-frequency sources and with the enclosure of the circuit-breaker energized . 156 Figure N.7 Capa
47、citive synthetic current injection circuit Example of unit testing on half a pole of a circuit-breaker with two units per pole Enclosure energized with d.c. voltage source 157 Figure N.8 Symmetrical synthetic test circuit for out-of-phase switching tests on a complete pole of a circuit-breaker . 158
48、 Figure N.9 Full pole test with voltage applied to both terminals and the metal enclosure 159 Figure O.1 Example of combined current and voltage injection circuit with application of full test voltage to earth 161 Figure O.2 Example of combined current and voltage injection circuit with separated ap
49、plication of test voltage . 162 Table 1 Test circuits for test duties T100s and T100a 17 Table 2 Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp= 1,5 . 17 Table 3 Test parameters during three-phase interruption for test-duties T10, T30, T60 and T100s, kpp= 1,3 . 18 Table 4 Tes
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