IEC 62391-1-2015 Fixed electric double-layer capacitors for use in electric and electronic equipment - Part 1 Generic specification《电气和电子设备用双层固定电容器.第1部分 通用规范》.pdf

1、 IEC 62391-1 Edition 2.0 2015-10 REDLINE VERSION Fixed electric double-layer capacitors for use in electric and electronic equipment Part 1: Generic specification IEC 62391-1:2015-10 RLV(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights rese

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11、nic equipment Part 1: Generic specification INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.060.10 ISBN 978-2-8322-2986-6 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 6

12、2391-1:2015 RLV IEC 2015 CONTENTS FOREWORD . 7 1 General . 1 Scope 9 2 Normative references 9 3 Terms and definitions 11 4 Technical Data General items 15 4.1 Unit and symbols 15 4.2 Preferred values and class . 15 4.2.1 General . 15 4.2.2 Preferred values of nominal capacitance . 15 4.2.3 Class . 1

13、5 4.3 Marking . 15 4.3.1 General . 15 4.3.2 Coding . 16 4.4 Quality assessment procedures 16 5 Tests and measurement procedures 16 5.1 General . 16 5.2 Standard atmospheric conditions Test and measurement requirements 16 5.2.1 Standard atmospheric conditions for testing Test conditions 16 5.2.2 Meas

14、urement conditions 17 5.2.3 Voltage treatment 18 5.2.4 Thermal treatment . 18 5.3 Drying . 18 5.4 Visual examination and check of dimensions 18 5.4.1 Visual examination 18 5.4.2 Dimensions (gauging) 18 5.4.3 Dimensions (detail) 18 5.5 Measurement method 1 for capacitance and internal resistance (con

15、stant current discharge) . 20 5.5.1 Basic circuit for measuring 20 5.5.2 Measuring equipment 21 5.5.3 Measuring procedure . 22 5.5.4 Calculation methods for capacitance . 24 5.5.5 Calculation methods for internal resistance 25 5.5.6 Conditions to be prescribed in the detail specification 26 5.6 Meas

16、urement method 2 for capacitance and internal resistance 26 5.6.1 Constant resistance charging method for capacitance measurement . 26 5.6.2 AC internal resistance measuring method 27 5.7 Leakage current 29 5.7.1 Measuring method . 29 5.7.2 Items to be specified in the detail specification 29 5.8 Se

17、lf-dicharge Maintain voltage 30 5.8.1 Measuring method . 30 5.8.2 Calculation of voltage maintenance rate 30 5.8.3 Conditions to be prescribed in the detail specification 31 5.9 Robustness of terminations . 31 IEC 62391-1:2015 RLV IEC 2015 3 5.9.1 Test Ua1 Tensile 31 5.9.2 Test Ub Bending (half of t

18、he sample) 31 5.9.3 Test Uc Torsion (remaining sample) . 32 5.9.4 Test Ud Torque (for terminations with threaded studs or screws and for integral mounting devices) . 32 5.9.5 Visual examination 32 5.10 Resistance to soldering heat . 32 5.10.1 Preconditioning and initial measurement 32 5.10.2 Test 32

19、 5.10.3 Recovery . 33 5.10.4 Final inspection, measurements and requirements. 33 5.11 Solderability 33 5.11.1 General . 33 5.11.2 Preconditioning 33 5.11.3 Capacitors with leads 33 5.11.4 Surface mount capacitors 34 5.12 Rapid change of temperature 35 5.12.1 Initial measurement . 35 5.12.2 Test . 35

20、 5.12.3 Final inspection, measurements and requirements. 35 5.13 Vibration . 35 5.13.1 Initial measurement . 35 5.13.2 Test . 35 5.13.3 Final measurement and requirements 35 5.14 Damp heat, steady state . 35 5.14.1 Initial measurement . 35 5.14.2 Test 35 5.14.3 Final measurement 35 5.15 Endurance 36

21、 5.15.1 Initial measurements . 36 5.15.2 Test 36 5.15.3 Final measurement, inspection and requirements 37 5.16 Storage . 37 5.16.1 Storage at high temperature 37 5.16.2 Storage at low temperature 37 5.17 Characteristics at high and low temperature 37 5.17.1 General . 37 5.17.2 Test procedure 38 5.17

22、3 Dry heat 38 5.17.4 Cold. 38 5.17.5 Final measurement and requirements 38 5.18 Component solvent resistance . 38 5.18.1 Initial measurements . 38 5.18.2 Test . 38 5.18.3 Requirements 39 5.19 Solvent resistance of marking 39 5.19.1 Test . 39 5.19.2 Requirements 39 5.20 Passive flammability . 39 4 I

23、EC 62391-1:2015 RLV IEC 2015 5.20.1 Test procedure 39 5.20.2 Requirements 39 5.21 Pressure relief (if applicable) 40 5.21.1 d.c.Test . 40 5.21.2 Requirements 40 Annex A (normative) Classification according to capacitance and internal resistance 41 A.1 General . 41 A.2 Classification by capacitance a

24、nd internal resistance 41 Annex B (informative) Measuring method of capacitance and low resistance by low frequency a.c. method (reference) . 44 B.0 Introduction . B.1 General . 44 B.2 Measuring system . 44 B.3 Calculation of capacitance 44 B.4 Measuring conditions 45 Annex C (informative) Thermal e

25、quilibrium time of capacitors 46 C.1 General . 46 C.2 Thermal equilibrium time of capacitors 46 Annex D (informative) Charging/discharging efficiency and measurement current 48 D.1 General . 48 D.2 Charging efficiency, discharging efficiency, and current 48 Annex E (informative) Procedures for setti

26、ng the measurement current of capacitor with uncertain nominal internal resistance . 50 E.1 General . 50 E.2 Current setting procedures for measurement of capacitor . 50 E.3 Example of setting current for determining capacitor characteristics . 50 Annex F (informative) Policy on uncertainty of measu

27、rement and inset limits . 51 F.1 Objective 51 F.2 Terms and definitions 51 F.3 Calculation of measurement uncertainty 51 F.4 Policy 52 F.5 Calculation of inset and outset limits . 52 F.6 Examples 52 F.6.1 General . 52 F.6.2 Example 1: Resistor measurement 52 F.6.3 Example 2: Resistor measurement 53

28、F.6.4 Example 3: Transistor measurement (gain) 53 F.6.5 Example 4: Comparison between initial and final measurement results 53 Annex G (informative) Reference to IEC 62391-1:2006 54 Annex Q (normative) Quality assessment procedures 55 Q.1 General . 55 Q.1.1 Overview . 55 Q.1.2 Applicability of quali

29、fication approval . 55 Q.1.3 Applicability of capability approval . 55 Q.1.4 Applicability of technology approval . 56 Q.2 Primary stage of manufacture . 56 Q.3 Subcontracting 56 Q.4 Structurally similar components 56 IEC 62391-1:2015 RLV IEC 2015 5 Q.5 Qualification approval procedures . 56 Q.5.1 E

30、ligibility for qualification approval . 56 Q.5.2 Application for qualification approval . 57 Q.5.3 Test procedure for qualification approval . 57 Q.5.4 Granting of qualification approval 57 Q.5.5 Maintenance of qualification approval 57 Q.5.6 Quality conformance inspection . 57 Q.6 Capability approv

31、al procedures . 57 Q.6.1 General . 57 Q.6.2 Eligibility for capability approval . 58 Q.6.3 Application for capability approval . 58 Q.6.4 Description of capability . 58 Q.6.5 Demonstration and verification of capability . 59 Q.6.6 Programme for capability approval . 59 Q.6.7 Capability approval test

32、 report . 60 Q.6.8 Abstract of description of capability . 60 Q.6.9 Modifications likely to affect the capability approval . 60 Q.6.10 Initial capability approval . 60 Q.6.11 Granting of capability approval 61 Q.6.12 Maintenance of capability approval 61 Q.6.13 Extension of capability approval 62 Q.

33、6.14 Quality conformance inspection . 62 Q.7 Rework and repair. 62 Q.7.1 Rework 62 Q.7.2 Repair . 63 Q.8 Release for delivery 63 Q.8.1 General . 63 Q.8.2 Release for delivery under qualification approval before the completion of Group B tests 63 Q.9 Certified test records of released lots 63 Q.10 De

34、layed delivery . 63 Q.11 Alternative test methods . 63 Q.12 Manufacture outside the geographical limits of IECQ CBs . 63 Q.13 Unchecked parameters . 63 Q.14 Technology approval procedures 64 Q.14.1 General . 64 Q.14.2 Eligibility for technology approval 64 Q.14.3 Application of technology approval 6

35、4 Q.14.4 Description of technology 64 Q.14.5 Demonstration and verification of the technology . 64 Q.14.6 Granting of technology approval 64 Q.14.7 Maintenance of technology approval 64 Q.14.8 Quality conformance inspection . 64 Q.14.9 Failure rate level determination 65 Q.14.10 Outgoing quality lev

36、el 65 Bibliography 66 6 IEC 62391-1:2015 RLV IEC 2015 Figure 1 Circuit for constant current discharge method Figure 1 Basic circuit for measuring . 21 Figure 2 Voltage characteristic between capacitor terminals Figure 2 Voltagetime characteristics between capacitor terminals in capacitance and inter

37、nal resistance measurement 22 Figure 3 Circuit for constant resistance charging method . 26 Figure 4 Circuit for a.c. resistance method . 27 Figure 5 Voltage characteristic between capacitor terminals Figure 6 5 Self-discharge Maintain voltage test diagram 30 Figure A.1 Conceptual rendering orientat

38、ed by characteristics in each classification 42 Figure B.1 Capacitance measuring system by the low frequency a.c. method 44 Figure C.1 Thermal equilibrium times of capacitors (from 85 C to 25 C) 46 Figure C.2 Thermal equilibrium times of capacitors (from 40 C to 25 C) 47 Figure C.3 Capacitor core te

39、mperature change with respect to time . 47 Figure Q.1 General scheme for capability approval 58 Table 1 Reference test: standard atmospheric conditions Table 1 Measuring conditions for measuring method 1A 23 Table 2 Discharge conditions . Table 2 Measuring conditions for measuring method 1B 24 Table

40、 3 Discharge current Table 3 Tensile force . 31 Table 4 Torque 32 Table 5 Severities and requirements 40 Table A.1 Measurement items for electric performance Electrical performance and measuring method by class . 43 Table E.1 Example of setting current for measurement of capacitor . 50 IEC 62391-1:2

41、015 RLV IEC 2015 7 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ FIXED ELECTRIC DOUBLE-LAYER CAPACITORS FOR USE IN ELECTRIC AND ELECTRONIC EQUIPMENT Part 1: Generic specification FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

42、all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards,

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