1、 IEC 62562 Edition 1.0 2010-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Cavity resonator method to measure the complex permittivity of low-loss dielectric plates Mthode de la cavit rsonante pour mesurer la permittivit complexe des plaques dilectriques faibles pertes IEC 62562:2010 colour inside T
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16、ts ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 62562 Edition 1.0 2010-02 INTERNATIONAL STANDARD NORME INTERNATIONALE Cavity resonator method to measure the complex permittivity of low-loss dielectric plates Mthode de la cavit rsonante pour mesurer la permittiv
17、it complexe des plaques dilectriques faibles pertes INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE R ICS 17.220 PRICE CODE CODE PRIX ISBN 978-2-88910-931-9 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electr
18、otechnique Internationale colour inside 2 62562 IEC:2010 CONTENTS FOREWORD.3 1 Scope.5 2 Measurement parameters.5 3 Theory and calculation equations .6 3.1 Relative permittivity and loss tangent 6 3.2 Temperature dependence of and tan .9 3.3 Cavity parameters .9 4 Measurement equipment and apparatus
19、 .10 4.1 Measurement equipment .10 4.2 Measurement apparatus for complex permittivity.11 5 Measurement procedure.12 5.1 Preparation of measurement apparatus.12 5.2 Measurement of reference level 12 5.3 Measurement of cavity parameters: D , H , r , c , TC .12 5.4 Measurement of complex permittivity o
20、f test specimen: , tan .14 5.5 Temperature dependence of and tan .14 Annex A (informative) Example of measured result and accuracy 15 Bibliography18 Figure 1 Resonator structures of two types 6 Figure 2 Correction term / a 8 Figure 3 Correction terms A/A and B/B .8 Figure 4 Schematic diagram of meas
21、urement equipments10 Figure 5 Cavity resonator used for measurement .11 Figure 6 Photograph of cavity resonator for measurement around 10 GHz.11 Figure 7 Mode chart of cavity resonator .12 Figure 8 Resonance peaks of cavity resonator.13 Figure 9 Resonance frequency f 0 , insertion attenuation IA 0an
22、d half-power band width f BW 13 Figure 10 Resonance frequency f 0of TE 011mode of cavity resonator with dielectric plate (D = 35 mm, H = 25 mm) 14 Figure A.1 Measured temperature dependence of f 1and Q uc .16 Figure A.2 Resonance peaks of cavity resonator clamping sapphire plate16 Figure A.3 Measure
23、d results of temperature dependence of f 0 , Q u , and tan for sapphire plate.17 Table A.1 Measured results of cavity parameters.15 Table A.2 Measured results of of and tan for sapphire plate .17 62562 IEC:2010 3 INTERNATIONAL ELECTROTECHNICAL COMMISION _ CAVITY RESONATOR METHOD TO MEASURE THE COMPL
24、EX PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on a
25、ll questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publ
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34、lication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62562 has been prepared by subcommittee 46F: R.F. and
35、microwave passive components, of IEC technical committee 46: Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-02, corresponds to the English
36、version. The text of this standard is based on the following documents: CDV Report on voting 46F/118/CDV 46F/143/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. The French version of this standard has not been vo
37、ted upon. 4 62562 IEC:2010 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data relat
38、ed to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct underst
39、anding of its contents. Users should therefore print this document using a colour printer. 62562 IEC:2010 5 CAVITY RESONATOR METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC PLATES 1 Scope The object of this International Standard is to describe a measurement method of dielectric pr
40、operties in the planar direction of dielectric plate at microwave frequency. This method is called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properti
41、es is more and more important. This method has the following characteristics: the relative permittivity and loss tangent tan values of a dielectric plate sample can be measured accurately and non-destructively; temperature dependence of complex permittivity can be measured; the measurement accuracy
42、is within 0,3 % for and within 510 6for tan ; fringing effect is corrected using correction charts calculated on the basis of rigorous analysis. This method is applicable for the measurements on the following condition: frequency : 2 GHz f 40 GHz; relative permittivity: 2 100; loss tangent : 10 6 ta
43、n 10 2 . 2 Measurement parameters The measurement parameters are defined as follows: ) /( “ 0 r E D j = = (1) / “ tan = (2) - = 6 ref ref ref 10 1 T T TC T (110 6 /K) (3) where D is the electric flux density; E is the electric field strength; 0 is the permittivity in a vacuum; and are the real and i
44、maginary components of the complex relative permittivity r ; TC is the temperature coefficient of relative permittivity; T and ref are the real parts of the complex relative permittivity at temperature T and reference temperature ref T (= 20 C to 25 C), respectively. 6 62562 IEC:2010 3 Theory and ca
45、lculation equations 3.1 Relative permittivity and loss tangent A resonator structure used in the nondestructive measurement of the complex permittivity is shown in Figure 1a. A cavity having diameter D and length M H 2 = is cut into two halves in the middle of its length. A dielectric plate sample h
46、aving , tan and thickness t is placed between these two halves. The TE 011mode, having only the electric field component tangential to the plane of the sample, is used for the measurement, since air gaps at the plate-cavity interfaces do not affect the electromagnetic field. Taking account of the fr
47、inging field in the plate region outside diameter of the cavity on the basis of the rigorous mode matching analysis, we determine and tan from the measured values of the resonant frequency 0 f and the unloaded Q-factor u Q . This numerical calculation, however, is rather tedious. Therefore, a) appro
48、ximated values a and a tan from the 0 f and u Q values by using simple formula for a resonator structure shown in Figure 1b, where a fringing effect for Figure 1a is neglected, will be determined; b) then, accurate values and tan from a and a tan using charts calculated from the rigorous analysis will be obtained. Figure 1a Resonator used in measurement Figure 1b Resonator to calculate aand tan aFigure 1 Resonator structures of two types The value of a is given by 1 2 2 2 2 2 0 a +
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