IEC 62810-2015 Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods《用圆柱形谐振腔法测量低损耗介质棒材的复介电常数》.pdf

1、 IEC 62810 Edition 1.0 2015-02 INTERNATIONAL STANDARD Cylindrical cavity method to measure the complex permittivity of low-loss dielectric rods IEC 62810:2015-02(en) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2015 IEC, Geneva, Switzerland All rights reserved. Unless otherwise sp

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11、INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 33.120.30 ISBN 978-2-8322-2264-5 Registered trademark of the International Electrotechnical Commission Warning! Make sure that you obtained this publication from an authorized distributor. colour inside 2 IEC 62810:2015 IEC 2015 CONTENTS FOREWORD . 3 1 S

12、cope 5 2 Normative references 5 3 Measurement parameters 5 4 Theory and calculation equations 5 5 Measurement system . 12 6 Measurement procedure 14 6.1 Preparation of measurement apparatus. 14 6.2 Measurement of reference level 14 6.3 Measurement of cavity parameters: r14 6.4 Measurement of complex

13、 permittivity of test sample: , tan d 15 Annex A (informative) Example of measurement results and accuracy . 16 A.1 Measurement of and tand values . 16 A.2 Measurement uncertainty of and tand 17 Bibliography 19 Figure 1 Structure of a cylindrical cavity resonator . 6 Figure 2 Correction factor C 1fo

14、r . 7 Figure 3 Correction factor C 2for tand with the different values of d 19 Figure 4 Schematic diagram of measurement systems . 13 Figure 5 Resonance frequency f 0 , insertion attenuation IA 0and half-power band width f BW. 14 Figure 6 Frequency responses of the TM 010mode of cylindrical cavity .

15、 15 Table 1 Numerical values of correction factor C 1. 8 Table 2 Numerical values of correction factor C 2. 10 Table 3 Numerical values of correction factor C 2. 11 Table A.1 The parameters of the cavity and the rod sample . 16 Table A.2 The resonant frequencies and unloaded Q-factors . 16 Table A.3

16、 The approximate values and the relative conductivity value . 16 Table A.4 Correction factors and the measurement results 16 Table A.5 The measurement uncertainty of . 17 Table A.6 The measurement uncertainty of tand 18 IEC 62810:2015 IEC 2015 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CYLINDRICA

17、L CAVITY METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC RODS FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promo

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27、he correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 62810 has been prepa

28、red by subcommittee 46F: R.F. and microwave passive components, of IEC technical committee 46: Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and accessories. The text of this standard is based on the following documents: CDV Report on voting 46F/242/CDV 46F/260/RV

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32、810:2015 IEC 2015 5 CYLINDRICAL CAVITY METHOD TO MEASURE THE COMPLEX PERMITTIVITY OF LOW-LOSS DIELECTRIC RODS 1 Scope This International Standard relates to a measurement method for complex permittivity of a dielectric rod at microwave frequency. This method has been developed to evaluate the dielec

33、tric properties of low-loss materials in coaxial cables and electronic devices used in microwave systems. It uses the TM 010mode in a circular cylindrical cavity and presents accurate measurement results of a dielectric rod sample, where the effect of sample insertion holes is taken into account acc

34、urately on the basis of the rigorous electromagnetic analysis. In comparison with the conventional method described in IEC 60556 2 1 , this method has the following characteristics: the values of the relative permittivity and loss tangent tand of a dielectric rod sample can be measured accurately an

35、d non-destructively; the measurement accuracy is within 1,0 % for and within 20 % for tand; the effect of sample insertion holes is corrected using correction charts presented; this method is applicable for the measurements on the following condition: frequency: 1 GHz f 10 GHz; relative permittivity

36、: 1 100; loss tangent: 10 4tand 10 1 . 2 Normative references Void. 3 Measurement parameters The measurement parameters are defined as follows: r= -j“ (1) tand = “/ (2) where and “ are the real and imaginary parts of the complex relative permittivity r . 4 Theory and calculation equations A resonato

37、r structure used in these measurements is shown in Figure 1. A cavity, made with copper, with diameter D and height H has sample insertion holes with diameter d 2and depth g oriented coaxially. A dielectric rod sample of diameter d 1having and tand is inserted into the holes. 1Figures in square brac

38、kets refer to the Bibliography. 6 IEC 62810:2015 IEC 2015 The TM 010mode, where the electric field component in the cavity is parallel to the sample rod, is used for the measurement. Taking account of the effect of sample insertion holes calculated on the basis of the rigorous electromagnetic field

39、analysis, and tand are determined from the measured values of the resonant frequency f 0and the unloaded Q-factor Q u . To avoid the tedious numerical calculation and make the measurements easy, the following process is taken in this measurement: Figure 1 Structure of a cylindrical cavity resonator

40、The following steps shall be taken: 1) At the first step, obtain approximate values pand tand pfrom the f 0and Q uvalues by using the simple perturbation formulas, where the effect of sample insertion holes is neglected. The subscript p denotes the calculated values using the following perturbation

41、formulas: 1 1 2 1 1 1 0 p + = d D f f f (3) = u0 u1 2 1 p p 1 1 2 1 tan Q Q d D d (4) where 855 , 1 1 2 01 1 = = ) ( x J . ) ( x J nis the Bessel function of order n of first kind and 405 , 2 01 = x is the first root of 0 0 = ) ( x J . f 0and Q u0are the resonant frequency and unloaded Q-factor meas

42、ured for the cavity without a sample, respectively. f 1and Q u1are ones measured for the cavity with a sample. 2) In the second step, obtain accurate values and tand from pand tand pvalues by using the following equations with correction factors calculated based on the rigorous analysis: p 1 C = (5)

43、 p 2 tan tan d d C = (6) IEC Dielectric rod (sample) Sample insertion hole Cylindrical cavity Coaxial cable with small loop d 2d 1D g H g IEC 62810:2015 IEC 2015 7 where correction factors C 1and C 2 , due to the sample insertion holes and errors included in the perturbation formulas, are calculated

44、 numerically by using the Ritz-Galerkin method 35, as shown in Figure 2 and Figure 3, and the corresponding data are listed in detail in Table 1, 2, and 3. The missing data of C 1and C 2can be obtained by interpolation or extrapolation from the tables. The correction factors shown in these figures a

45、re calculated for the cavity with D = 76,5 mm, H = 20,0 mm, d 2= 3,0 mm, and g = 10,0 mm, where the resonant frequency is about 3 GHz. C 1is also used for a cavity having the same aspect ratios as H/D, d 2 /D and g/D. It is found from the analysis for a cavity with insertion holes which constitute a

46、 cut-off TM 01mode cylindrical waveguide that f 0converges to a constant value for g10 mm and d 2= 3 mm. Therefore, the correction factors shown in Figure 2 and Figure 3 are applicable to a dielectric sample rod with d 1 3 mm and below the value calculated by the following equation for the measured

47、value of the resonant frequency: 2 0 2 01 f d c x (7) where c is the velocity of light in a vacuum (c = 2,9 979 108 m/s). Assumptions D 76,5 mm d 2 3,0 mm H 20,0 mm g 10,0 mm Figure 2 Correction factor C 1for IEC 1 2 3 4 5 6 10 2 3 4 5 6 100 p1,0 76,5 0,5 76,5 1,5 76,5 2,0 76,5 2,5 76,5 3,0 76,5 = d

48、 1D 0,6 0,7 0,8 0,9 1,0 1,1 1,2 Factor C 1 8 IEC 62810:2015 IEC 2015 Table 1 Numerical values of correction factor C 1a) Dielectric sample rod with d 1= 2,0 mm 0,5 1,0 1,5 2,0 2,5 3,0 1 1,000 1,000 1,000 1,000 1,000 1,000 1,5 1,023 1,022 1,021 1,019 1,016 1,010 2 1,035 1,034 1,033 1,030 1,024 1,013

49、3 1,047 1,047 1,046 1,041 1,032 1,012 4 1,054 1,055 1,053 1,047 1,035 1,007 5 1,058 1,060 1,059 1,051 1,037 1,001 6 1,061 1,064 1,063 1,054 1,037 0,995 7 1,064 1,068 1,066 1,056 1,037 0,988 8 1,066 1,071 1,069 1,058 1,036 0,981 9 1,068 1,073 1,071 1,059 1,035 0,975 10 1,070 1,076 1,073 1,060 1,033 0,