IEC 60512-11-8-1995 Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11 Climatic tests - Section 8 .pdf

1、NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 51 2-1 118 Premire dition First edition 1995-1 1 Composants lectromcaniques pour quipements lectroniques - Procdures dessai de base et mthodes de mesure - Partie 11 : Essais climatiques - Section 8: Essai 1 1 h - Sable et poussire Electro mec h an

2、cal compo ne nts for electronic equipment - Basic testing procedures and measuring methods - Part 11 : Climatic tests - Section 8: Test 11 h - Sand and dust Numro de rfrence Reference number CEVIEC 51 2-1 1-8: 1995 Validit de la prsente publication Le contenu technique des publications de la CE1 est

3、 cons- tamment revu par la CE1 afin quil reflte ltat actuel de la technique. Des renseignements relatifs la date de reconfirmation de la publication sont disponibles auprs du Bureau Central de la CEI. Les renseignements relatifs ces rvisions, ltablis- sement des ditions rvises et aux amendements peu

4、vent tre obtenus auprs des Comits nationaux de la CE1 et dans les documents ci-dessous: Bulletin de la CE1 Annuaire de la CE1 Publi annuellement Catalogue des publications de la CE1 Publi annuellement et mis jour rgulirement Terminologie En ce qui concerne la terminologie gnrale, le lecteur se repor

5、tera la CE1 50: Vocabulaire Electrotechnique lnter- national (VEI), qui se prsente sous forme de chapitres spars traitant chacun dun sujet dfini. Des dtails complets sur le VE1 peuvent tre obtenus sur demande. Voir galement le dictionnaire multilingue de la GEI. Les termes et dfinitions figurant dan

6、s la prsente publi- cation ont t soit tirs du VEI, soit spcifiquement approuvs aux fins de cette publication. Symboles graphiques et littraux Pour les symboles graphiques, les symboles littraux et les signes dusage gnral approuvs par la CEI, le lecteur consultera: - la CE1 27: Symboles littraux a ut

7、iliser en lectro-technique; - la CE1 417: Symboles graphiques utilisables sur le matriel. Index, relev et compilation des feuilles individuelles; - la CE1 61 7: Symboles graphiques pour schmas; et pour les appareils lectromdicaux, - la CE1 878: Symboles graphiques pour quipements lectriques en prati

8、que mdicale. Les symboles et signes contenus dans la prsente publi- cation ont t soit tirs de la CE1 27, de la CE1 417, de la CE1 617 etlou de la CE1 878, soit spcifiquement approuvs aux fins de cette publication. Publications de la CEI tablies par le mme comit dtudes Lattention du lecteur est attir

9、e sur les listes figurant la fin de cette publication, qui numrent les publications de la CE1 prpares par le comit dtudes qui a tabli la prsente publication. Validity of this publication The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the conten

10、t reflects current technology. Information relating to the date of the reconfirmation of the publication is available from the IEC Central Office. Information on the revision work, the issue of revised editions and amendments may be obtained from IEC National Committees and from the following IEC so

11、urces: IEC Bulletin 0 IEC Yearbook Catalogue of IEC publications Published yearly Published yearly with regular updates Terminology For general terminology, readers are referred to IEC 50: International Electrotechnical Vocabulary (IEV), which is issued in the form of separate chapters each dealing

12、with a specific field. Full details of the IEV will be supplied on request. See also the IEC Multilingual Dictionary. The terms and definitions contained in the present publi- cation have either been taken from the IEV or have been specifically approved for the purpose of this publication. Graphical

13、 and letter symbols For graphical symbols, and letter symbols and signs approved by the IEC for general use, readers are referred to publications: - IEC 27: Letter symbols to be used in electrical technology; - IEC 417: Graphical symbols for use on equipment. Index, survey and compilation of the sin

14、gle sheets; - IEC 617: Graphical symbols for diagrams; and for medical electrical equipment, - IEC 878: Graphical symbols for electromedical equipment in medical practice. The symbols and signs contained in the present publication have either been taken from IEC 27, IEC 417, IEC 617 and/or IEC 878,

15、or have been specifically approved for the purpose of this publication. IEC publications prepared by the same technical committee The attention of readers is drawn to the end pages of this publication which list the IEC publications issued by the technical committee which has prepared the present pu

16、blication. NORME INTERNATIONALE INTERNATIONAL STANDARD CE1 IEC 51 2-1 1-8 Premiere dition First edition 1995-1 1 Composants lectromcaniques pour quipements lectroniques - Procdures dessai de base et mthodes de mesure - Partie 11: Essais climatiques - Section 8: Essai 11 h - Sable et poussire Electro

17、mechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 11 : Climatic tests - Section 8: Test I1 h - Sand and dust 0 CE1 1995 Droits de reproduction rservs - Copyright - all rights reserved Aucune partie de cette publication ne peut ils sont publis comm

18、e normes, rapports techniques ou guides et agrs comme tels par les Comits nationaux. 4) Dans le but dencourager lunification internationale, les Comits nationaux de la CE1 sengagent appliquer de faon transparente, dans toute la mesure possible, les Normes internationales de la CE1 dans leurs normes

19、nationales et rgionales. Toute divergence entre la norme de la CE1 et la norme nationale ou rgionale correspondante doit tre indique en termes clairs dans cette dernire. 5) La CE1 na fix aucune procdure concernant le marquage comme indication dapprobation et sa responsabilit nest pas engage quand un

20、 matriel est dclar conforme lune de ses normes. 6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent faire lobjet de droits de proprit intellectuelle ou de droits analogues. La CE1 ne saurait tre tenue pour responsable de ne pas avoir identifi de te

21、ls droits de proprit et de ne pas avoir signal leur existence. La Norme internationale CE1 512-1 1-8 a t tablie par le sous-comit 488: Connecteurs, du comit dtudes 48 de la CEI: Composants lectromcaniques et structures mcaniques pour quipements lectroniques. La prsente norme annule et remplace larti

22、cle 8 de la CE1 512-6. Elle doit tre utilise conjointement avec la CE1 51 2-1 : Gnralits. La publication complte comprendra dautres essais qui paratront au fur et mesure de leur mise au point. Le rapport de vote indiqu dans le tableau ci-dessus donne toute information sur le vote ayant abouti lappro

23、bation de cette norme. 512-11-80 IEC:1995 -3- DIS I NTE R NATIONAL E LECTROTEC H N I CAL COM M I SS I ON Report on voting ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT - BASIC TESTING PROCEDURES AND MEASURING METHODS - Part 11: Climatic tests - Section 8: Test 11 h - Sand and dust FOREWORD 1

24、) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international cooperation on all questions concerning standardization in the electr

25、ical and electronic fields. To this end and in addition to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, gov

26、ernmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decis

27、ions or agreements of the IEC on technical matters, express as nearly as possible an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested National Committees. 3) The documents produced have the form of recommendations for i

28、nternational use and are published in the form of standards, technical reports or guides and they are accepted by the National Committees in that sense. 4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards transparently to the maxim

29、um extent possible in their national and regional standards. Any divergence between the IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter. 5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for

30、any equipment declared to be in conformity with one of its standards. 6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International

31、Standard IEC 51 2-1 1-8 has been prepared by sub-committee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces clause 8 of IEC 512-6. It should be used in conjunction with IEC 512-1 : Gene

32、ral. The complete publication will include other tests which will be issued as they become available. TDIS I 48Bl446RVD I Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. -4- 512-11-8OCEI:1995 COMPOSANTS LECTROMCANIQU

33、ES POUR QUIPEMENTS LECTRONIQUES - PROCDURES DESSAI DE BASE ET MTHODES DE MESURE - Partie 11 : Essais climatiques - Section 8: Essai 11 h - Sable et poussire 1 Gnralits 1.1 Domaine dapplication et objet La prsente section de la CE1 512-1 1 dfinit une mthode dessai normalise pour valuer laptitude de c

34、onnecteurs supporter une projection de sable fin et de poussire. 1.2 Rfrence normative Le document normatif suivant contient des dispositions qui, par suite de la rfrence qui y est faite, constituent des dispositions valables pour la prsente section de la CE1 512-1 1. Au moment de la publication, ld

35、ition indique tait en vigueur. Tout document normatif est sujet rvision et les parties prenantes aux accords fonds sur la prsente section de la CE1 51 2-1 1 sont invites a rechercher la possibilit dappliquer les ditions les plus rcentes du document normatif indiqu ci-aprs. Les membres de la CE1 et d

36、e IISO possdent le registre des Normes internationales en vigueur. CE1 51 2-7: 1993, Composants leciromcaniques pour quipements lectroniques: Procdures dessai de base et mthodes de mesure - Partie 7: Essais de fonctionnement mcanique et essai dtanchit 2 Prparation des spcimens Les spcimens doivent t

37、re munis de leurs accessoires normaux monts et cbls selon la spcification particulire. Si requis par la spcification particulire, avant lessai, les spcimens doivent tre accoupls et dsaccoupls autant de fois que prcis. Lessai doit tre effectu sur les connecteurs accoupls ou sur les connecteurs dsacco

38、upls avec des capuchons protect eu rs . 3 Mthode dessai 3.1 Mesures initiales Les mesures initiales doivent tre effectues comme prescrit par la spcification particulire. Le spcimen doit tre soumis a lessai 13a: Forces daccouplement et de dsaccouplement, de la CE1 512-7. (Voir galement la CE1 68-2-68

39、: Essai L: Poussire et sable .) 512-1 1-8 O IEC:1995 -5- ELECTROMECHANICAL COMPONENTS FOR ELECTRONIC EQUIPMENT - BASIC TESTING PROCEDURES AND MEASURING METHODS - Part 11: Climatic tests - Section 8: Test 11 h - Sand and dust 1 General 1.1 Scope and object This section of IEC 512-11 defines a standar

40、d test method to assess the ability of a connector to withstand driving fine sand and dust. 1.2 Normative reference The following normative document contains provisions which, through reference in this text, constitute provisions of this section of IEC 512-11. At the time of publication, the edition

41、 indicated was valid. All normative documents are subject to revision, and parties to agreements based on this section of IEC 512-11 are encouraged to investigate the possibility of applying the most recent edition of the normative document indicated below. Members of IEC and IS0 maintain registers

42、of currently valid International Standards. I EC 51 2-7: 1993, Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests 2 Preparation of specimens The specimens shall be equipped with their normal acc

43、essories mounted and wired according to the detail specification. When the detail specification requires it, the specimens shall be mated and unmated as many times as specified, prior to the test. The test shall be performed on mated connectors or on unmated connectors with protective covers. 3 Test method 3.1 Initial measurements Initial measurements shall be made as specified by the detail specification. The specimen shall be subjected to test 13a: Engaging and separating forces, of IEC 512-7. (See also IEC 68-2-68: Test L: Dust and sand.)