IEC 60512-15-4-2008 Connectors for electronic equipment - Tests and measurements - Part 15-4 Connector tests (mechanical) - Test 15d Contact insertion release a.pdf

1、 IEC 60512-15-4Edition 1.0 2008-05INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 15-4: Connector tests (mechanical) Test 15d: Contact insertion, release and extraction force Connecteurs pour quipements lectroniques Essais et mesures Partie

2、15-4: Essais (mcaniques) des connecteurs Essai 15d: Force dinsertion, de dverrouillage et dextraction des contacts IEC60512-15-4:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be re

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17、tors for electronic equipment Tests and measurements Part 15-4: Connector tests (mechanical) Test 15d: Contact insertion, release and extraction force Connecteurs pour quipements lectroniques Essais et mesures Partie 15-4: Essais (mcaniques) des connecteurs Essai 15d: Force dinsertion, de dverrouill

18、age et dextraction des contacts INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE FICS 31.220.10 PRICE CODECODE PRIXISBN 2-8318-9770-X 2 60512-15-4 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part

19、15-4: Connector tests (mechanical) Test 15d: Contact insertion, release and extraction force FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IE

20、C is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)

21、 and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with

22、the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as near

23、ly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that

24、 sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees

25、 undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no marking proced

26、ure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agent

27、s including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, o

28、r reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of

29、 the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-15-4 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical compon

30、ents and mechanical structures for electronic equipment. This standard cancels and replaces test 15d of IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. 60512-15-4 IEC:2008 3 The text of

31、 this standard is based on the following documents: FDIS Report on voting 48B/1846/FDIS 48B/1898/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Di

32、rectives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenance result date

33、indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-15-4 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part

34、15-4: Connector tests (mechanical) Test 15d: Contact insertion, release and extraction force 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when s

35、pecified in a detail specification. The object of this document is to detail a standard test method to determine the forces required to insert contact into, and extract them from, their normal position in the intended connector. 2 Normative references The following referenced documents are indispens

36、able for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General exami

37、nation Test 1a: Visual examination 3 Preparations 3.1 Preparation of specimen The specimen shall consist of a connector with its terminations, wired as specified in the detail specification. Any accessories, which do not form part of the contact system, may be removed. Any preconditioning given in t

38、he detail specification shall be applied. Any contact retention device shall be placed in such a position as not to influence the test, except where the use of such devices is part of the normal insertion and extraction process. All contacts shall be installed except for those to be used for the tes

39、t. 3.2 Lubricant or sealing substance For the application and measurement of the forces a suitable device able to provide the controls on the loads shall be required (e.g.: a universal materials testing machine). NOTE If the detail specification requires special preconditioning of the specimen, all

40、the necessary equipment detailed in the relevant documents describing such conditioning would also be required. 3.3 Equipment Insertion and extraction tools, when specified by the detail specification, shall be provided. 3.4 Mounting If mounting of the specimen is appropriate, it shall be as specifi

41、ed in the detail specification. 60512-15-4 IEC:2008 5 4 Test method 4.1 Procedure Unless otherwise stated in the detail specification, 3 connectors shall be tested. 4.1.1 Selection of contact for test 20 % of the contacts, but not less than 6, shall be selected at random provided that at least one c

42、ontact is near the periphery, and one near the centre of the connector. For connectors having six or less contacts, all contacts shall be used. 4.1.2 Insertion A contact shall be inserted into its cavity using the insertion tool, lubricant and any other aid specified in the detail specification. Ins

43、tructions for this procedure given, or referred to, in the detail specification, shall be followed. It shall be ascertained that the contacts are in the intended position and are latched or locked into place. The foregoing procedure shall be applied to the selected contacts in turn. 4.1.3 Extraction

44、 In a similar manner to the insertion, the selected contacts shall be removed. In the case of non-removable contacts, this part of the test shall not apply. 4.1.4 Repeated insertion and extraction The foregoing constitutes one insertion and extraction cycle. If specified in the detail specification,

45、 it shall be repeated a specified number of times. 4.2 Measurements 4.2.1 Before testing Visual examination according to IEC 60512-1-1 shall be done. 4.2.2 During testing The forces required to achieve insertion and extraction (release) of the contact shall be measured and recorded. The insertion an

46、d extraction forces shall not exceed those given in the detail specification. 4.2.3 After testing Visual examination according to IEC 60512-1-1 shall be done. 5 Details to be specified When this test is required by a detail specification, the following shall be given therein: a) the number of connec

47、tors to test if other than 3; b) preconditioning required; c) wiring of the specimen; d) mounting of the specimen, if required; e) specification and application method of any lubricant or sealant to be used; 6 60512-15-4 IEC:2008 f) maximum insertion and extraction forces; g) number of insertion and

48、 extraction, if other than one; h) if the contact is non-removable; i) any deviation from the standard test method. _ 8 60512-15-4 CEI:2008 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 15-4: Essais (mcaniques) des connecteurs Essai 15d

49、 Force dinsertion, de dverrouillage et dextraction des contacts AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions d