IEC 60512-16-4-2008 Connectors for electronic equipment - Tests and measurements - Part 16-4 Mechanical tests on contacts and terminations - Test 16d Tensile st.pdf

1、 IEC 60512-16-4 Edition 1.0 2008-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 16-4: Mechanical tests on contacts and terminations Test 16d: Tensile strength (crimped connections) Connecteurs pour quipements lectroniques Essais et mesu

2、res Partie 16-4: Essais mcaniques des contacts et des sorties Essai 16d: Rsistance la traction (connexions serties) IEC 60512-16-4:2008 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2008 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be

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15、ermes lectroniques et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_ent

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17、onnectors for electronic equipment Tests and measurements Part 16-4: Mechanical tests on contacts and terminations Test 16d: Tensile strength (crimped connections) Connecteurs pour quipements lectroniques Essais et mesures Partie 16-4: Essais mcaniques des contacts et des sorties Essai 16d: Rsistanc

18、e la traction (connexions serties) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE F ICS 31.220.10 PRICE CODE CODE PRIX ISBN 2-8318-9822-6 2 60512-16-4 IEC:2008 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS

19、 Part 16-4: Mechanical tests on contacts and terminations Test 16d: Tensile strength (crimped connections) FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). Th

20、e object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specif

21、ications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmental organizations

22、 liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters e

23、xpress, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Com

24、mittees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC Nati

25、onal Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC provides no

26、 marking procedure to indicate its approval and cannot be rendered responsible for any equipment declared to be in conformity with an IEC Publication. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, se

27、rvants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publica

28、tion, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibili

29、ty that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-16-4 has been prepared by subcommittee 48B, Connectors, of IEC technical committee 48: Electrome

30、chanical components and mechanical structures for electronic equipment. This standard cancels and replaces test 16d of IEC 60512-8, issued in 1993. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100 which explains the structure of the IEC 60512 series. 60512-16-4 IEC:200

31、8 3 The text of this standard is based on the following documents: FDIS Report on voting 48B/1879/FDIS 48B/1912/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with

32、 the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the maintenan

33、ce result date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed; withdrawn; replaced by a revised edition; or amended. 4 60512-16-4 IEC:2008 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEA

34、SUREMENTS Part 16-4: Mechanical tests on contacts and terminations Test 16d: Tensile strength (crimped connections) 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for

35、 similar devices when specified in a detail specification. The object of this part of IEC 60512 is to detail a standard test method to determine the tensile strength of a crimped connection. 2 Normative references The following referenced documents are indispensable for the application of this docum

36、ent. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1-1, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination 3 P

37、reparations 3.1 Preparation of specimen The specimen shall consist of a contact or terminal crimped to a conductor. This shall be done in accordance with the relevant detail specification and tooling specifications given therein. If the specimen has a cable insulation support or any other clamping d

38、evice not part of the conductor crimp, this shall be rendered inoperative such that it has no influence on the test. Any preconditioning required by the detail specification shall be applied. NOTE It may be convenient to crimp a specimen to each end of a conductor; if this is done such a specimen sh

39、all be considered as one specimen. 3.2 Equipment A tensile testing machine with relevant fixtures able to comply with the test procedure herein detailed shall be required. 3.3 Mounting If mounting of the specimen is appropriate, it shall be as specified in the detail specification. The specimen shal

40、l be fixed in the jaws of a tensile testing machine such that the crimp barrel of the specimen is nor damaged or otherwise affected by the jaws. The fixing of the specimen shall be such that the tensile load is applied axially to the crimped connection under test. 60512-16-4 IEC:2008 5 4 Test method

41、 The testing machine head, travelling at a rate of between 25 and 50 mm/min, shall apply tension to the specimen until the conductor is pulled out of the crimp barrel or the wire or the specimen breaks. 5 Measurements and requirements 5.1 Before testing Visual examination according to IEC 60512-1-1

42、shall be carried out. 5.2 During testing The load to cause breakage shall be recorded. Also, the testing machine head rate of travel in mm/min shall be recorded. NOTE The elongation versus load graph may be of interest to users. However, this information is not a requirement of this part of IEC 6051

43、2. 5.3 After testing Visual examination according to IEC 60512-1-1 shall be carried out. The nature and characterics of the breakage shall be recorded. 6 Details to be specified When this test is required by a detail specification, the following shall be given therein: whether preconditioning is req

44、uired; cable/wire/conductor size(s) to be used; details of assembly and/or crimping tooling; whether a lubricant, including that for assembly and/or crimping tooling, is to be used; whether special mounting of the specimen is required; number of specimens to be tested; minimum ultimate load (if none

45、 is specified the values in IEC 60352-2 shall be referenced); any deviation from the standard test method. 6 60512-16-4 IEC:2008 Bibliography IEC 60352-2, Solderless connections Part 2: Crimped connections General requirements, test methods and practical guidance _ 8 60512-16-4 CEI:2008 COMMISSION L

46、ECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 16-4: Essais mcaniques des contacts et des sorties Essai 16d: Rsistance la traction (connexions serties) AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale

47、 de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les domaines de llectricit et de llectronique. A cet effet, la CEI entre autres act

48、ivits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par

49、le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisation Internationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux o