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IEC 60512-17-2-2011 Connectors for electronic equipment - Tests and measurements - Part 17-2 Cable clamping tests - Test 17b Cable clamp resistance to cable rot.pdf

1、 IEC 60512-17-2 Edition 1.0 2011-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 17-2: Cable clamping tests Test 17b: Cable clamp resistance to cable rotation Connecteurs pour quipements lectroniques Essais et mesures Partie 17-2: Essais

2、 de pincement de cble Essai 17b: Rsistance des pinces de maintien des cbles la rotation des cbles IEC 60512-17-2:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or util

3、ized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining addition

4、al rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soit et par au

5、cun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication, utilisez le

6、s coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office 3, rue de Varemb CH-1211 Geneva 20 Switzerland Email: inmailiec.ch Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that pre

7、pares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have b

8、een published. Catalogue of IEC publications: www.iec.ch/searchpub The IEC on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, withdrawn and replaced publications. IEC Just Published: www.iec.ch/onlin

9、e_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. Electropedia: www.electropedia.org The worlds leading online dictionary of electronic and electrical terms containing more than 20 000

10、terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. Customer Service Centre: www.iec.ch/webstore/custserv If you wish to give us your feedback on this publication or need further assistance, p

11、lease visit the Customer Service Centre FAQ or contact us: Email: csciec.ch Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des normes internationales pour tout ce qui a trai

12、t llectricit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Catalogue des publications de

13、 la CEI: www.iec.ch/searchpub/cur_fut-f.htm Le Catalogue en-ligne de la CEI vous permet deffectuer des recherches en utilisant diffrents critres (numro de rfrence, texte, comit dtudes,). Il donne aussi des informations sur les projets et les publications retires ou remplaces. Just Published CEI: www

14、.iec.ch/online_news/justpub Restez inform sur les nouvelles publications de la CEI. Just Published dtaille deux fois par mois les nouvelles publications parues. Disponible en-ligne et aussi par email. Electropedia: www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques

15、 et lectriques. Il contient plus de 20 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International en ligne. Service Clients: www.iec.ch/webstore/custserv/custserv_entry-f.htm Si vous d

16、sirez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-17-2 Edition 1.0 2011-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for elec

17、tronic equipment Tests and measurements Part 17-2: Cable clamping tests Test 17b: Cable clamp resistance to cable rotation Connecteurs pour quipements lectroniques Essais et mesures Partie 17-2: Essais de pincement de cble Essai 17b: Rsistance des pinces de maintien des cbles la rotation des cbles I

18、NTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE F ICS 31.220.01 PRICE CODE CODE PRIX ISBN 978-2-88912-448-0 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-17-2 IEC:2011 CO

19、NTENTS FOREWORD . 3 Scope and object 5 1Normative references . 5 2Preparation of the specimen . 5 3Test method . 5 4Final measurements . 6 5Requirements . 6 6Details to be specified 6 7Figure 1 Cable test set-up 6 60512-17-2 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECT

20、RONIC EQUIPMENT TESTS AND MEASUREMENTS Part 17-2: Cable clamping tests Test 17b: Cable clamp resistance to cable rotation FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National

21、Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly A

22、vailable Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non- governmenta

23、l organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on tech

24、nical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by I

25、EC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international unifo

26、rmity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5)

27、IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensur

28、e that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of an

29、y nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the refe

30、renced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. Inter

31、national Standard IEC 60512-17-2 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and replaces Test 17b of IEC 60512-9, issued in 1992 and constitutes a technical r

32、evision. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100, which explains the structure of the IEC 60512 series. 4 60512-17-2 IEC:2011 The text of this standard is based on the following documents: CDV Report on voting 48B/2124/CDV 48B/2217/RVC Full information on the

33、voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts in the IEC 60512 series, under the general title Connectors for electronic equipment Te

34、sts and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publica

35、tion will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60512-17-2 IEC:2011 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 17-2: Cable clamping tests Test 17b: Cable clamp resistance to cable rotation Scope and object 1 This part of IEC 60512, when required

36、 by the detail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard method to assess the ability of a cable- clamping device to a

37、llow rotary movement of the cable/wire bundle without damage to the external surface of the cable/wire bundle, the cable-clamping device, the connector or the sub-assembly. Normative references 2 The following referenced documents are indispensable for the application of this document. For dated ref

38、erences, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1, Connectors for electronic equipment Tests and measurements Part 1: General IEC 60512-1-1, Connectors for electronic equipment Tests and meas

39、urements Part 1-1: General examination Test 1a: Visual examination IEC 60512-1-100, Connectors for electronic equipment Tests and measurements Part 1-100: General Applicable publications Preparation of the specimen 3 The specimen shall consist of the specified cable/wire bundle fitted in the normal

40、manner to its associated component or sub-assembly by means of the cable-clamping device. The specimen shall be prepared and mounted in accordance with the detail specification. Test method 4 The free end of the cable/wire bundle shall be deflected at an angle of 45 to 50 to the axis at the point of

41、 entry to the specimen and rotated 360, see Figure 1. The number and the speed of the rotations shall be stated in the detail specification. 6 60512-17-2 IEC:2011 Connector Platen Mass Bushing hole 45-50 IEC 693/11 Figure 1 Cable test set-up During the test, the cable/wire bundle shall be subjected

42、to a torque or a pull not greater than the minimum value necessary to maintain the proper alignment of the cable/wire bundle. NOTE If necessary, suitable devices to measure and control the forces and torques (e.g. a universal materials testing machine and torque tester) should be used. Final measure

43、ments 5 The specimen shall be examined visually in accordance with IEC 60512-1-1, Test 1a at the junction of the cable/wire bundle and the clamping device and at the junction of the clamping device and the component or sub-assembly. Requirements 6 There shall be no damage to the cable/wire bundle ex

44、ternal surface, nor to the specimen. Details to be specified 7 When this test is required by the detail specification, the following details shall be specified: a) preparation of the specimen and type of cable/wire bundle to be used; b) mounting of the specimen; c) number and speed of rotations; d)

45、requirements for final measurements; e) any deviation from the standard test method. _ 8 60512-17-2 CEI:2011 SOMMAIRE AVANT-PROPOS 9 1 Domaine dapplication et objet 11 2 Rfrences normatives . 11 3 Prparation du spcimen 11 4 Mthode dessai . 11 5 Mesures finales 12 6 Exigences 12 7 Dtails spcifier . 1

46、2 Figure 1 Organisation cble dessai . 12 60512-17-2 CEI:2011 9 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 17-2: Essais de pincement de cble Essai 17b: Rsistance des pinces de maintien des cbles la rotation des cbles AVANT-PROPOS 1) L

47、a Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions de normalisation dans les

48、 domaines de llectricit et de llectronique. A cet effet, la CEI entre autres activits publie des Normes internationales, des Spcifications techniques, des Rapports techniques, des Spcifications accessibles au public (PAS) et des Guides (ci-aprs dnomms “Publication(s) de la CEI“). Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par le sujet trait peut participer. Les organisations internationales, gouvernementales et non gouvernementales, en liaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec

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