IEC 60512-23-2-2010 Connectors for electronic equipment - Tests and measurements - Part 23-2 Screening and filtering tests - Test 23b Suppression characteristic.pdf

1、 IEC 60512-23-2Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electronic equipment Tests and measurements Part 23-2: Screening and filtering tests Test 23b: Suppression characteristics of integral filters Connecteurs pour quipements lectroniques Essais et mesures Partie

2、 23-2: Essais dcrantage et de filtrage Essai 23b: Caractristiques de coupure des filtres intgraux IEC60512-23-2:2010 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utili

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16、irez nous donner des commentaires sur cette publication ou si vous avez des questions, visitez le FAQ du Service clients ou contactez-nous: Email: csciec.ch Tl.: +41 22 919 02 11 Fax: +41 22 919 03 00 IEC 60512-23-2Edition 1.0 2010-06INTERNATIONAL STANDARD NORME INTERNATIONALEConnectors for electron

17、ic equipment Tests and measurements Part 23-2: Screening and filtering tests Test 23b: Suppression characteristics of integral filters Connecteurs pour quipements lectroniques Essais et mesures Partie 23-2: Essais dcrantage et de filtrage Essai 23b: Caractristiques de coupure des filtres intgraux IN

18、TERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE EICS 31.220.01 PRICE CODECODE PRIXISBN 978-2-88910-953-1 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale 2 60512-23-2 IEC:2010 INTERN

19、ATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 23-2: Screening and filtering tests Test 23b: Suppression characteristics of integral filters FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standard

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29、wn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not

30、 be held responsible for identifying any or all such patent rights. International Standard IEC 60512-23-2 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic equipment. This standard cancels and repla

31、ces Test 23b of IEC 60512-9, issued in 1992. The structure of the IEC 60512 series is explained in IEC 60512-1-100. The text of this standard is based on the following documents: FDIS Report on voting 48B/2150/FDIS 48B/2185/RVD Full information on the voting for the approval of this standard can be

32、found in the report on voting indicated in the above table. 60512-23-2 IEC:2010 3 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can

33、be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed,

34、withdrawn, replaced by a revised edition, or amended. 4 60512-23-2 IEC:2010 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 23-2: Screening and filtering tests Test 23b: Suppression characteristics of integral filters 1 Scope and object This part of IEC 60512, when required by the de

35、tail specification, is used for testing connectors within the scope of technical committee 48. It may also be used for similar devices when specified in a detail specification. The object of this standard is to detail a standard method to measure suppression characteristics (insertion loss) introduc

36、ed by single and multiple circuit radio-frequency filters which are an integral part of a connector. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the lat

37、est edition of the referenced document (including any amendments) applies. CISPR 17:1981, Methods of measurement of the suppression characteristics of passive interference filters and suppression components 3 Preparation of the specimen The specimen shall be unwired and shall be mounted in a test fi

38、xture as described in the detail specification. 4 Measurement procedure The suppression characteristics shall be measured according to CISPR 17, using the test circuit A1 or A2 as relevant. 5 Requirements The measured suppression characteristics shall not be less than the minimum values specified in

39、 the detail specification. 6 Details to be specified When this test is required by the detail specification, the following details shall be specified: a) preparation of the specimen; b) mounting of the specimen and details of the test fixture; c) test frequency or frequency range; d) load current, w

40、hen required; e) system impedance; 60512-23-2 IEC:2010 5 f) test method; g) minimum values of insertion loss; h) any deviation from the standard test method. _ 6 60512-23-2 CEI:2010 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 23-2: Es

41、sais dcrantage et de filtrage Essai 23b: Caractristiques de coupure des filtres intgraux AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI

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