1、 IEC 60512-9-4 Edition 1.0 2011-04 INTERNATIONAL STANDARD NORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 9-4: Endurance tests Test 9d: Durability of contact retention system and seals (maintenance, ageing) Connecteurs pour quipements lectroniques Essais et mesur
2、es Partie 9-4: Essais dendurance Essai 9d: Durabilit du systme de rtention des contacts et des joints dtanchit (entretien, vieillissement) IEC 60512-9-4:2011 THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2011 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of th
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17、ORME INTERNATIONALE Connectors for electronic equipment Tests and measurements Part 9-4: Endurance tests Test 9d: Durability of contact retention system and seals (maintenance, ageing) Connecteurs pour quipements lectroniques Essais et mesures Partie 9-4: Essais dendurance Essai 9d: Durabilit du sys
18、tme de rtention des contacts et des joints dtanchit (entretien, vieillissement) INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE F ICS 31.220.01 PRICE CODE CODE PRIX ISBN 978-2-88912-445-9 Registered trademark of the International Electrotechnical Commission Marqu
19、e dpose de la Commission Electrotechnique Internationale 2 60512-9-4 IEC:2011 CONTENTS FOREWORD . 3 1 Scope and object 5 2 Normative references . 5 3 Details of test equipment 5 4 Preparation of the specimen . 5 5 Test method . 6 6 Initial measurements 6 7 Final measurements . 6 8 Details to be spec
20、ified 6 60512-9-4 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 9-4: Endurance tests Test 9d: Durability of contact retention system and seals (maintenance, ageing) FOREWORD 1) The International Electrotechnical Commission (IEC
21、) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
22、 to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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24、nditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC N
25、ational Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the
26、 way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any
27、IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity
28、. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of
29、 its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any
30、other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be
31、the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 60512-9-4 has been prepared by subcommittee 48B: Connectors, of IEC technical committee 48: Electromechanical components and mechanical structures for electronic
32、equipment. This standard cancels and replaces Test 9d of IEC 60512-5, issued in 1992 and constitutes a technical revision. This standard is to be read in conjunction with IEC 60512-1 and IEC 60512-1-100, which explains the structure of the IEC 60512 series. 4 60512-9-4 IEC:2011 The text of this stan
33、dard is based on the following documents: CDV Report on voting 48B/2123/CDV 48B/2215/RVC Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Pa
34、rt 2. A list of all parts in the IEC 60512 series, under the general title Connectors for electronic equipment Tests and measurements, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC
35、web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. 60512-9-4 IEC:2011 5 CONNECTORS FOR ELECTRONIC EQUIPMENT TESTS AND MEASUREMENTS Part 9-4: Endurance tests T
36、est 9d: Durability of contact retention system and seals (maintenance, ageing) 1 Scope and object This part of IEC 60512, when required by the detail specification, is used for testing connectors within the scope of IEC technical committee 48. It may also be used for similar devices when specified i
37、n a detail specification. The object of this standard is to detail a standard test method to assess the ability of a connector to withstand stresses caused by repeated extraction and insertion of contacts during maintenance. 2 Normative references The following referenced documents are indispensable
38、 for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60512-1, Connectors for electronic equipment Tests and measurements Part 1: General IEC 60512-1-1
39、, Connectors for electronic equipment Tests and measurements Part 1-1: General examination Test 1a: Visual examination IEC 60512-1-100, Connectors for electronic equipment Tests and measurements Part 1-100: General Applicable publications IEC 60512-15-1, Connectors for electronic equipment Tests and
40、 measurements Part 15-1: Connector tests (mechanical) Test 15a: Contact retention in insert IEC 60512-15-4, Connectors for electronic equipment Tests and measurements Part 15-4: Connector tests (mechanical) Test 15d: Contact insertion, release and extraction force 3 Details of test equipment The tes
41、t equipment shall consist of insertion and extraction tools as specified in the detail specification. 4 Preparation of the specimen The specimen shall consist of a component with all contacts installed and wired according to the detail specification. Loosen or remove any accessories to permit extrac
42、tion and insertion of contacts. The accessories shall remain loose or be removed during the test. 6 60512-9-4 IEC:2011 5 Test method Unless otherwise specified in the detail specification, for test specimens having fewer than 6 positions, all contacts shall be tested. For test specimens with more th
43、an 6 positions, 20 % of contact positions, but not less than 6 nor more than 10, shall be tested in each test specimen. For test specimens with more than 6 positions, the contacts tested shall be chosen at random but shall include at least one contact near the periphery and at least one near the cen
44、tre of the insert or housing. For components having six or less contacts, all contacts shall be used for the tests. Unless otherwise specified, there shall be ten extraction and insertion cycles for each contact. 6 Initial measurements a) Contact retention in insert (IEC 60512-15-1, Test 15a). b) Co
45、ntact insertion, release and extraction force (IEC 60512-15-4, Test 15d). 7 Final measurements a) Contact retention in insert (IEC 60512-15-1, Test 15a). b) Contact insertion, release and extraction force (IEC 60512-15-4, Test 15d). c) Visual examination for damage to wire, seals, etc. (IEC 60512-1-
46、1, Test 1a). 8 Details to be specified When this test is required by the detail specification, the following details shall be given: a) design or type of insertion and extraction tools; b) cable/wire to be used; c) preparation and mounting of the specimen; d) requirements for initial measurements; e
47、) requirements for final measurements; f) any deviation from the standard test method. _ 8 60512-9-4 CEI:2011 SOMMAIRE AVANT-PROPOS 9 1 Domaine dapplication et objet 11 2 Rfrences normatives . 11 3 Dtails de lappareillage dessai . 11 4 Prparation du spcimen 11 5 Mthode dessai . 12 6 Mesures initiale
48、s 12 7 Mesures finales 12 8 Dtails spcifier . 12 60512-9-4 CEI:2011 9 COMMISSION LECTROTECHNIQUE INTERNATIONALE _ CONNECTEURS POUR QUIPEMENTS LECTRONIQUES ESSAIS ET MESURES Partie 9-4: Essais dendurance Essai 9d: Durabilit du systme de rtention des contacts et des joints dtanchit (entretien, vieilli
49、ssement) AVANT-PROPOS 1) La Commission Electrotechnique Internationale (CEI) est une organisation mondiale de normalisation compose de lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet de favoriser la coopration internationale pour toutes les questions
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