IEC 60748-21-1997 Semiconductor devices - Integrated circuits - Part 21 Sectional specification for film integrated circuits and hybrid film integrated circuits.pdf

1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 6074821 QC760100 Deuximedition Secondedition 199704 Numroderfrence Referencenumber CEI/IEC6074821:1997 Dispositifssemiconducteurs Circuitsintgrs Partie21: Spcificationintermdiairepourlescircuitsintgrs couchesetlescircuitsintgrshybridescouches surla

2、basedesprocduresdhomologation Semiconductordevices Integratedcircuits Part21: Sectionalspecificationforfilmintegratedcircuits andhybridfilmintegratedcircuitsonthebasis ofthequalificationapprovalproceduresValiditdelaprsentepublication LecontenutechniquedespublicationsdelaCEIestcons tammentrevuparlaCE

3、Iafinquilreflteltatactuelde latechnique. Desrenseignementsrelatifsladatedereconfirmationde lapublicationsontdisponiblesauprsduBureauCentralde laCEI. Lesrenseignementsrelatifscesrvisions,ltablis sementdesditionsrvisesetauxamendementspeuvent treobtenusauprsdesComitsnationauxdelaCEIet danslesdocumentsc

4、idessous: BulletindelaCEI AnnuairedelaCEI Publiannuellement CataloguedespublicationsdelaCEI Publiannuellementetmisjourrgulirement Terminologie Encequiconcernelaterminologiegnrale,lelecteurse reporteralaCEI50:VocabulaireElectrotechniqueInter national(VEI),quiseprsentesousformedechapitres sparstraitan

5、tchacundunsujetdfini.Desdtails completssurleVEIpeuventtreobtenussurdemande. VoirgalementledictionnairemultilinguedelaCEI. Lestermesetdfinitionsfigurantdanslaprsentepubli cationonttsoittirsduVEI,soitspcifiquement approuvsauxfinsdecettepublication. Symbolesgraphiquesetlittraux Pourlessymbolesgraphique

6、s,lessymboleslittrauxetles signesdusagegnralapprouvsparlaCEI,lelecteur consultera: laCEI27: Symboleslittrauxutiliseren lectrotechnique; laCEI417: Symbolesgraphiquesutilisables surlematriel.Index,relevetcompilationdes feuillesindividuelles; laCEI617: Symbolesgraphiquespourschmas; etpourlesappareilsle

7、ctromdicaux, laCEI878: Symbolesgraphiquespour quipementslectriquesenpratiquemdicale. Lessymbolesetsignescontenusdanslaprsentepubli cationonttsoittirsdelaCEI27,delaCEI417,dela CEI617et/oudelaCEI878,soitspcifiquementapprouvs auxfinsdecettepublication. PublicationsdelaCEItabliesparle mmecomitdtudes Lat

8、tentiondulecteurestattiresurleslistesfigurantlafin decettepublication,quinumrentlespublicationsdela CEIprparesparlecomitdtudesquiatablila prsentepublication. Validityofthispublication ThetechnicalcontentofIECpublicationsiskeptunder constantreviewbytheIEC,thusensuringthatthecontent reflectscurrenttec

9、hnology. Informationrelatingtothedateofthereconfirmationofthe publicationisavailablefromtheIECCentralOffice. Informationontherevisionwork,theissueofrevised editionsandamendmentsmaybeobtainedfromIEC NationalCommitteesandfromthefollowingIEC sources: IECBulletin IECYearbook Publishedyearly CatalogueofI

10、ECpublications Publishedyearlywithregularupdates Terminology Forgeneralterminology,readersarereferredtoIEC50: InternationalElectrotechnicalVocabulary (IEV),whichis issuedintheformofseparatechapterseachdealing withaspecificfield.FulldetailsoftheIEVwillbe suppliedonrequest.SeealsotheIECMultilingual Di

11、ctionary. Thetermsanddefinitionscontainedinthepresentpubli cationhaveeitherbeentakenfromtheIEVorhavebeen specificallyapprovedforthepurposeofthispublication. Graphicalandlettersymbols Forgraphicalsymbols,andlettersymbolsandsigns approvedbytheIECforgeneraluse,readersarereferredto publications: IEC27:

12、Lettersymbolstobeusedinelectrical technology; IEC417: Graphicalsymbolsforuseon equipment.Index,surveyandcompilationofthe singlesheets; IEC617: Graphicalsymbolsfordiagrams; andformedicalelectricalequipment, IEC878:Graphicalsymbolsforelectromedical equipmentinmedicalpractice. Thesymbolsandsignscontain

13、edinthepresentpublication haveeitherbeentakenfromIEC27,IEC417,IEC617 and/orIEC878,orhavebeenspecificallyapprovedforthe purposeofthispublication. IECpublicationspreparedbythesame technicalcommittee Theattentionofreadersisdrawntotheendpagesofthis publicationwhichlisttheIECpublicationsissuedbythe techn

14、icalcommitteewhichhaspreparedthepresent publication.NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 6074821 QC760100 Deuximedition Secondedition 199704 Dispositifssemiconducteurs Circuitsintgrs Partie21: Spcificationintermdiairepourlescircuitsintgrs couchesetlescircuitsintgrshybridescouches surl

15、abasedesprocduresdhomologation Semiconductordevices Integratedcircuits Part21: Sectionalspecificationforfilmintegratedcircuits andhybridfilmintegratedcircuitsonthebasis ofthequalificationapprovalprocedures S Pourprix,voircatalogueenvigueur Forprice,seecurrentcatalogue CODEPRIX PRICECODE IEC1997Droit

16、sdereproductionrservs Copyrightallrightsreserved Aucunepartiedecettepublicationnepeuttrereproduiteniut ilise sousquelqueformequecesoitetparaucunprocd,lectronique oumcanique,ycomprislaphotocopieetlesmicrofilms,sans laccordcritdelditeur. Nopartofthispublicationmaybereproducedorut ilizedin anyformorbya

17、nymeans,electronicormechanical,including photocopyingandmicrofilm,withoutpermissioninwritingfrom thepublisher. InternationalElectrotechnicalCommission 3,ruedeVarembGeneva,Switzerland Telefax:+41229190300 email:inmailiec.ch IECwebsitehttp:/www.iec.ch CommissionElectrotechniqueInternationale Internati

18、onalElectrotechnicalCommission2 6074821CEI:1997 SOMMAIRE Pages AVANTPROPOS 4 Articles 1 Domainedapplicationetobjet 6 2 Gnralits,caractristiquesprfrentielles,valeurslimitesetsvrits pourlesessaisdenvironnement. 6 2.1Rfrences normatives 6 2.2 Valeurslimitesetcaractristiquesprfrentielles . 8 2.3 Informa

19、tionsdonnerdanslaspcificationparticulire 8 3Procdures dhomologation. 10 3.1Modles associs 10 3.2Homologation 10 3.3Niveaux dassurance 18 3.4 Nouvelleprsentationdeslotsrefuss(contrlelotparlot) 26 3.5 Etapesdefabricationdansuneusinedunfabricantagrsitue dansunpaysquinestpasmembredelaCEI 28 4 Procduresd

20、essaisetdemesures. 28 5 TableauxpourlamthodeB . 30 Tableaux 1 ProgrammedessaipourprocduredhomologationpourlamthodeA . 14 2 NiveauxdassuranceetcritresdacceptationpourlhomologationpourlamthodeA 20 3 Niveauxdassuranceetcritresdacceptationpourlecontrledeconformit delaqualitpourlamthodeA. 22 4 Slection 2

21、6 5 ProgrammedessaipourlaprocduredhomologationpourlamthodeB 30 6 Niveauxdassuranceetcritresdacceptationpourprocduredhomologation pourlamthodeB 34 7 Niveauxdassuranceetcritresdacceptationpourlecontrledeconformit delaqualitpourlamthodeB. 366074821IEC:1997 3 CONTENTS Page FOREWORD 5 Clause 1 Scopeandob

22、ject 7 2 General,preferredcharacteristics,ratingsandseveritiesforenvironmentaltests 7 2.1 Normativereferences 7 2.2 Preferredratingsandcharacteristics. 9 2.3 Informationtobegiveninadetailspecification 9 3 Qualificationapprovalprocedures 11 3.1 Structuralsimilarity . 11 3.2 Qualificationapproval . 11

23、 3.3 Assessmentlevels 19 3.4 Resubmissionofrejectedlots(forlotbylotinspection) 27 3.5 Manufacturingstagesinafactoryofanapprovedmanufacturer inanonIECmembercountry. 29 4 Testandmeasurementprocedures 29 5 TablesofmethodB . 31 Tables 1 TestscheduleforqualificationapprovalformethodA 15 2 Assessmentlevel

24、sandacceptancecriteriaforqualificationapprovalformethodA 21 3 Assessmentlevelsandacceptancecriteriaforqualityconformanceinspection formethodA. 23 4 Screening. 27 5 TestscheduleforqualificationapprovalformethodB 31 6 AssessmentlevelsandacceptancecriteriaforqualificationapprovalformethodB 35 7 Assessm

25、entlevelsandacceptancecriteriaforqualifyconformanceinspection formethodB. 374 6074821CEI:1997 COMMISSIONLECTROTECHNIQUEINTERNATIONALE _ DISPOSITIFSSEMICONDUCTEURS CIRCUITSINTGRS Partie21:Spcificationintermdiairepourlescircuitsintgrs couchesetlescircuitsintgrshybridescouches surlabasedesprocduresdhom

26、ologation AVANTPROPOS 1) LaCEI(CommissionElectrotechniqueInternationale)estuneorganisationmondialedenormalisation composedelensembledescomitslectrotechniquesnationaux(ComitsnationauxdelaCEI).LaCEIa pourobjetdefavoriserlacooprationinternationalepourtouteslesquestionsdenormalisationdansles domainesdel

27、lectricitetdellectronique.Aceteffet,laCEI,entreautresactivits,publiedesNormes Internationales.Leurlaborationestconfiedescomitsdtudes,auxtravauxdesquelstoutComit nationalintressparlesujettraitpeutparticiper.Lesorganisationsinternationales,gouvernementaleset nongouvernementales,enliaisonaveclaCEI,part

28、icipentgalementauxtravaux.LaCEIcollabore troitementaveclOrganisationInternationaledeNormalisation(ISO),selondesconditionsfixesparaccord entrelesdeuxorganisations. 2) LesdcisionsouaccordsofficielsdelaCEIconcernantlesquestionstechniques,reprsentent,dansla mesuredupossibleunaccordinternationalsurlessuj

29、etstudis,tantdonnquelesComitsnationaux intressssontreprsentsdanschaquecomitdtudes. 3) Lesdocumentsproduitsseprsententsouslaformederecommandationsinternationales.Ilssontpublis commenormes,rapportstechniquesouguidesetagrscommetelsparlesComitsnationaux. 4) Danslebutdencouragerlunificationinternationale

30、,lesComitsnationauxdelaCEIsengagentappliquer defaontransparente,danstoutelamesurepossible,lesNormesinternationalesdelaCEIdansleursnormes nationalesetrgionales.ToutedivergenceentrelanormedelaCEIetlanormenationaleourgionale correspondantedoittreindiqueentermesclairsdanscettedernire. 5) LaCEInafixaucun

31、eprocdureconcernantlemarquagecommeindicationdapprobationetsa responsabilitnestpasengagequandunmatrielestdclarconformelunedesesnormes. 6) LattentionestattiresurlefaitquecertainsdeslmentsdelaprsenteNormeinternationalepeuventfaire lobjetdedroitsdepropritintellectuelleoudedroitsanalogues.LaCEInesauraitt

32、retenuepour responsabledenepasavoiridentifidetelsdroitsdepropritetdenepasavoirsignalleurexistence. LaNormeInternationaleCEI6074821attablieparlesouscomit47A:Circuitsintgrs, ducomitdtudes47delaCEI:Dispositifssemiconducteurs. Cettedeuximeditionannuleetremplacelapremireditionparueen1991etconstitueune rv

33、isiontechnique. Cettenormeestunespcificationintermdiairepourlescircuitsintgrscouchesetles circuitsintgrshybridescouchessurlabasedesprocduresdhomologation. Letextedecettenormeestissudesdocumentssuivants: FDIS Rapportdevote 47A/444/FDIS 47A/476/RVD Lerapportdevoteindiqudansletableaucidessusdonnetoutei

34、nformationsurlevoteayant aboutilapprobationdecettenorme. LenumroQCquifiguresurlapagedecouverturedelaprsentepublicationestlenumrode spcificationdanslesystmeCEIdassurancedelaqualitdescomposantslectroniques (IECQ).6074821IEC:1997 5 INTERNATIONALELECTROTECHNICALCOMMISSION _ SEMICONDUCTORDEVICES INTEGRAT

35、EDCIRCUITS Part21:Sectionalspecificationforfilmintegratedcircuits andhybridfilmintegratedcircuitsonthebasisof thequalificationapprovalprocedures FOREWORD 1) TheIEC(InternationalElectrotechnicalCommission)isaworldwideorganizationforstandardization comprisingallnationalelectrotechnicalcommittees(IECNa

36、tionalCommittees).TheobjectoftheIECisto promoteinternationalcooperationonallquestionsconcerningstandardizationintheelectricalandelectronic fields.Tothisendandinadditiontootheractivities,theIECpublishesInternationalStandards.Their preparationisentrustedtotechnicalcommittees;anyIECNationalCommitteeint

37、erestedinthesubjectdealt withmayparticipateinthispreparatorywork.International,governmentalandnongovernmentalorganizations liaisingwiththeIECalsoparticipateinthispreparation.TheIECcollaboratescloselywiththeInternational OrganizationforStandardization(ISO)inaccordancewithconditionsdeterminedbyagreeme

38、ntbetweenthe twoorganizations. 2) TheformaldecisionsoragreementsoftheIEContechnicalmattersexpress,asnearlyaspossible,an internationalconsensusofopinionontherelevantsubjectssinceeachtechnicalcommitteehasrepresentation fromallinterestedNationalCommittees. 3) Thedocumentsproducedhavetheformofrecommenda

39、tionsforinternationaluseandarepublishedinthe formofstandards,technicalreportsorguidesandtheyareacceptedbytheNationalCommitteesinthat sense. 4) Inordertopromoteinternationalunification,IECNationalCommitteesundertaketoapplyIECInternational Standardstransparentlytothemaximumextentpossibleintheirnationa

40、landregionalstandards.Any divergencebetweentheIECStandardandthecorrespondingnationalorregionalstandardshallbeclearly indicatedinthelatter. 5) TheIECprovidesnomarkingproceduretoindicateitsapprovalandcannotberenderedresponsibleforany equipmentdeclaredtobeinconformitywithoneofitsstandards. 6) Attention

41、isdrawntothepossibilitythatsomeoftheelementsofthisInternationalStandardmaybethe subjectofpatentrights.TheIECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights. InternationalStandardIEC6074821hasbeenpreparedbysubcommittee47A:Integrated circuits,ofIECtechnicalcommittee47:Semiconductordevi

42、ces. Thissecondeditioncancelsandreplacesthefirsteditionpublishedin1991andconstitutesa technicalrevision. Thisstandardisasectionalspecificationforfilmintegratedcircuitsandhybridfilmintegrated circuitsandhybridfilmintegratedcircuitsonthebasisofthequalificationapprovalprocedures. Thetextofthisstandardisbasedonthefollowingdocuments: FDIS Reportonvoting 47A/444/FDIS 47A/476/RVD Fullinformationonthevotingfortheapprovalofthisstanda