IEC 61000-4-27-2000 Electromagnetic compatibility (EMC) - Part 4-27 Testing and measurement techniques Unbalance immunity test for equipment with input current .pdf

1、NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61000-4-27Premire ditionFirst edition2000-08Compatibilit lectromagntique (CEM) Partie 4-27:Techniques dessai et de mesure Essai dimmunit aux dsquilibresElectromagnetic compatibility (EMC) Part 4-27:Testing and measurement techniques Unbalance, immunity t

2、estNumro de rfrenceReference numberCEI/IEC 61000-4-27:2000PUBLICATION FONDAMENTALE EN CEMBASIC EMC PUBLICATIONCopyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-Numros des publicat

3、ionsDepuis le 1er janvier 1997, les publications de la CEIsont numrotes partir de 60000.Publications consolidesLes versions consolides de certaines publications dela CEI incorporant les amendements sont disponibles.Par exemple, les numros ddition 1.0, 1.1 et 1.2indiquent respectivement la publicatio

4、n de base, lapublication de base incorporant lamendement 1, et lapublication de base incorporant les amendements 1et 2.Validit de la prsente publicationLe contenu technique des publications de la CEI estconstamment revu par la CEI afin quil reflte ltatactuel de la technique.Des renseignements relati

5、fs la date de reconfir-mation de la publication sont disponibles dans leCatalogue de la CEI.Les renseignements relatifs des questions ltude etdes travaux en cours entrepris par le comit techniquequi a tabli cette publication, ainsi que la liste despublications tablies, se trouvent dans les documents

6、 ci-dessous: Site web de la CEI* Catalogue des publications de la CEIPubli annuellement et mis jourrgulirement(Catalogue en ligne)* Bulletin de la CEIDisponible la fois au site web de la CEI*et comme priodique imprimTerminologie, symboles graphiqueset littrauxEn ce qui concerne la terminologie gnral

7、e, le lecteurse reportera la CEI 60050: Vocabulaire Electro-technique International (VEI).Pour les symboles graphiques, les symboles littrauxet les signes dusage gnral approuvs par la CEI, lelecteur consultera la CEI 60027: Symboles littraux utiliser en lectrotechnique, la CEI 60417: Symbolesgraphiq

8、ues utilisables sur le matriel. Index, relev etcompilation des feuilles individuelles, et la CEI 60617:Symboles graphiques pour schmas.* Voir adresse site web sur la page de titre.NumberingAs from 1 January 1997 all IEC publications areissued with a designation in the 60000 series.Consolidated publi

9、cationsConsolidated versions of some IEC publicationsincluding amendments are available. For example,edition numbers 1.0, 1.1 and 1.2 refer, respectively, tothe base publication, the base publication incor-porating amendment 1 and the base publicationincorporating amendments 1 and 2.Validity of this

10、 publicationThe technical content of IEC publications is keptunder constant review by the IEC, thus ensuring thatthe content reflects current technology.Information relating to the date of the reconfirmationof the publication is available in the IEC catalogue.Information on the subjects under consid

11、eration andwork in progress undertaken by the technicalcommittee which has prepared this publication, as wellas the list of publications issued, is to be found at thefollowing IEC sources: IEC web site* Catalogue of IEC publicationsPublished yearly with regular updates(On-line catalogue)* IEC Bullet

12、inAvailable both at the IEC web site* andas a printed periodicalTerminology, graphical and lettersymbolsFor general terminology, readers are referred toIEC 60050: International Electrotechnical Vocabulary(IEV). For graphical symbols, and letter symbols and signsapproved by the IEC for general use, r

13、eaders arereferred to publications IEC 60027: Letter symbols tobe used in electrical technology, IEC 60417: Graphicalsymbols for use on equipment. Index, survey andcompilation of the single sheets and IEC 60617:Graphical symbols for diagrams.* See web site address on title page.Copyright Internation

14、al Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-NORMEINTERNATIONALECEIIECINTERNATIONALSTANDARD61000-4-27Premire ditionFirst edition2000-08Compatibilit lectromagntique (CEM) Partie 4-27:Techniques de

15、ssai et de mesure Essai dimmunit aux dsquilibresElectromagnetic compatibility (EMC) Part 4-27:Testing and measurement techniques Unbalance, immunity testCommission Electrotechnique InternationaleInternational Electrotechnical CommissionPour prix, voir catalogue en vigueurFor price, see current catal

16、ogue IEC 2000 Droits de reproduction rservs Copyright - all rights reservedAucune partie de cette publication ne peut tre reproduite niutilise sous quelque forme que ce soit et par aucun procd,lectronique ou mcanique, y compris la photocopie et lesmicrofilms, sans laccord crit de lditeur.No part of

17、this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without permission inwriting from the publisher.International Electrotechnical Commission 3, rue de Varemb Geneva, SwitzerlandTelefax: +41 22 919 0300 e-mail: inm

18、ailiec.ch IEC web site http:/www.iec.chCODE PRIXPRICE CODESPUBLICATION FONDAMENTALE EN CEMBASIC EMC PUBLICATIONCopyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 2 61000-4-27 CEI:

19、2000SOMMAIREPagesAVANT-PROPOS . 4INTRODUCTION 8Articles1 Domaine dapplication et objet 102 Rfrences normatives. 103 Dfinitions 124 Gnralits 125 Niveaux dessai 146 Matriels dessai 146.1 Gnrateurs dessai 146.2 Vrification des caractristiques des gnrateurs dessai 167 Installation dessai 168 Procdures d

20、essai. 188.1 Conditions de rfrence en laboratoire 188.2 Excution des essais 189 Evaluation des rsultats dessai 2010 Rapport dessai 20Annex A (informative) Sources, effets et mesure du dsquilibre . 28Annex B (informative) Calcul du taux de dsquilibre . 34Annex C (informative) Informations sur les niv

21、eaux dessai 36Annex D (Informative) Classes denvironnement lectromagntique . 38Bibliographie 40Figure 1 Exemple de tension dalimentation triphase dsquilibre (essai 3). 24Figure 2 Succession de trois combinaisons de dsquilibre dans lessai(les tensions Ua, Ub, Ucsont alternes) . 24Figure 3 Schma de li

22、nstrumentation dessai au dsquilibre 26Figure A.1 Vecteurs de tension dsquilibre. 30Figure A.2 Composantes des vecteurs dsquilibrs de la figure A.1 . 30Tableau 1 Niveaux dessai . 14Tableau 2 Caractristiques du gnrateur 16Copyright International Electrotechnical Commission Provided by IHS under licens

23、e with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,-61000-4-27 IEC:2000 3 CONTENTSPageFOREWORD 5INTRODUCTION 9Clause1 Scope and object . 112 Normative references . 113 Definitions 134 General 135 Test levels . 156 Test equipment 156.1 Test generators. 156.2 Ver

24、ification of the characteristics of the test generators . 177 Test set-up. 178 Test procedures . 198.1 Laboratory reference conditions 198.2 Execution of the test . 199 Evaluation of test results 2110 Test report . 21Annex A (informative) Sources, effects and measurement of unbalance . 29Annex B (in

25、formative) Calculation of the degree of unbalance 35Annex C (informative) Information on test levels 37Annex D (informative) Electromagnetic environment classes 39Bibliography . 41Figure 1 Example of unbalanced three-phase supply voltage (Test 3). 25Figure 2 Succession of three unbalance sequences o

26、f the test (the voltages Ua, Ub, Ucrotate) 25Figure 3 Schematic diagram of test instrumentation for unbalance . 27Figure A.1 Unbalanced voltage vectors 31Figure A.2 Components of the unbalanced vectors in figure A.1 . 31Table 1 Test levels 15Table 2 Characteristics of the generator. 17Copyright Inte

27、rnational Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 4 61000-4-27 CEI:2000COMMISSION LECTROTECHNIQUE INTERNATIONALE_COMPATIBILIT LECTROMAGNTIQUE (CEM) Partie 4-27: Techniques dessai et de mesure

28、Essai dimmunit aux dsquilibresAVANT-PROPOS1) La CEI (Commission Electrotechnique Internationale) est une organisation mondiale de normalisation composede lensemble des comits lectrotechniques nationaux (Comits nationaux de la CEI). La CEI a pour objet defavoriser la coopration internationale pour to

29、utes les questions de normalisation dans les domaines dellectricit et de llectronique. A cet effet, la CEI, entre autres activits, publie des Normes internationales.Leur laboration est confie des comits dtudes, aux travaux desquels tout Comit national intress par lesujet trait peut participer. Les o

30、rganisations internationales, gouvernementales et non gouvernementales, enliaison avec la CEI, participent galement aux travaux. La CEI collabore troitement avec lOrganisationInternationale de Normalisation (ISO), selon des conditions fixes par accord entre les deux organisations.2) Les dcisions ou

31、accords officiels de la CEI concernant des questions techniques, reprsentent, dans la mesuredu possible, un accord international sur les sujets tudis, tant donn que les Comits nationaux intressssont reprsents dans chaque comit dtudes.3) Les documents produits se prsentent sous la forme de recommanda

32、tions internationales; ils sont publiscomme normes, spcifications techniques, rapports techniques ou guides et agrs comme tels par les Comitsnationaux.4) Dans le but dencourager lunification internationale, les Comits nationaux de la CEI sengagent appliquer defaon transparente, dans toute la mesure

33、possible, les Normes internationales de la CEI dans leurs normesnationales et rgionales. Toute divergence entre la norme de la CEI et la norme nationale ou rgionalecorrespondante doit tre indique en termes clairs dans cette dernire.5) La CEI na fix aucune procdure concernant le marquage comme indica

34、tion dapprobation et sa responsabilitnest pas engage quand un matriel est dclar conforme lune de ses normes.6) Lattention est attire sur le fait que certains des lments de la prsente Norme internationale peuvent fairelobjet de droits de proprit intellectuelle ou de droits analogues. La CEI ne saurai

35、t tre tenue pourresponsable de ne pas avoir identifi de tels droits de proprit et de ne pas avoir signal leur existence.La Norme internationale CEI 61000-4-27 a t tablie par le sous-comit 77A: Phnomnesbasse frquence, du comit dtudes 77 de la CEI: Compatibilit lectromagntique.Elle constitue la partie

36、 4-27 de la CEI 61000. Elle a le statut de publication fondamentale enCEM conformment au Guide 107 de la CEI.Le texte de la prsente norme est issu des documents suivants:FDIS Rapport de vote77A/308/FDIS 77A/314/RVDLe rapport de vote mentionn dans le tableau ci-dessus donne toute information sur le v

37、oteayant abouti lapprobation de cette norme.Cette publication a t rdige selon les Directives ISO/CEI, Partie 3.Les annexes A, B, C et D sont donnes uniquement titre dinformation.Copyright International Electrotechnical Commission Provided by IHS under license with IECNot for ResaleNo reproduction or

38、 networking permitted without license from IHS-,-61000-4-27 IEC:2000 5 INTERNATIONAL ELECTROTECHNICAL COMMISSION_ELECTROMAGNETIC COMPATIBILITY (EMC) Part 4-27: Testing and measurement techniques Unbalance, immunity testFOREWORD1) The IEC (International Electrotechnical Commission) is a worldwide org

39、anization for standardization comprisingall national electrotechnical committees (IEC National Committees). The object of the IEC is to promoteinternational cooperation on all questions concerning standardisation in the electrical and electronic fields. Tothis end and in addition to other activities

40、 the IEC publishes International Standards. Their preparation isentrusted to technical committees; any IEC National Committee interested in the subject dealt with mayparticipate in this preparatory work. International, governmental and non-governmental organizations liaisingwith the IEC also partic

41、ipate in this preparation. The IEC collaborates closely with the InternationalStandardization Organization (ISO) in accordance with conditions determined by agreement between the twoorganizations.2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an

42、international consensus of opinion on the relevant subjects since each technical committee has representationfrom all interested National Committees.3) The documents produced have the form of recommendations for international use published in the form ofstandards, technical specifications, technical

43、 reports or guides and they are accepted by the NationalCommittees in that sense.4) In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergenc

44、e between the IEC Standard an the corresponding national or regional standard shall be clearlyindicated in the latter.5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.6) Attent

45、ion is drawn to the possibility that some of the elements of this International Standard may be the subjectof patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.International Standard IEC 61000-4-27 has been prepared by subcommittee 77A: Low-frequency

46、phenomena, of IEC technical committee 77: Electromagnetic compatibility.It forms part 4-27 of IEC 61000. It has the status of basic EMC publication in accordance withIEC Guide 107.The text of this standard is based on the following documents:FDIS Report on voting77A/308/FDIS 77A/314/RVDFull informat

47、ion on the voting for the approval of this standard can be found in the report onvoting indicated in the above table.This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.Annexes A, B, C and D are for information only.Copyright International Electrotechnical Commission

48、Provided by IHS under license with IECNot for ResaleNo reproduction or networking permitted without license from IHS-,- 6 61000-4-27 CEI:2000Le comit a dcid que le contenu de cette publication ne sera pas modifi avant 2002. A cettedate, la publication sera reconduite; supprime; remplace par une dition rvise, ou amende.Copyright International Electrote