IEC 61000-4-29-2000 Electromagnetic compatibility (EMC) - Part 4-29 Testing and measurement techniques Voltage dips short interruptions and voltage variations o.pdf

1、NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61000429 Premiredition Firstedition 200008 Compatibilitlectromagntique(CEM) Partie429: Techniquesdessaietdemesure Essaisdimmunitauxcreuxdetension, coupuresbrvesetvariationsdetension surlesaccsdalimentationencourantcontinu Electromagneticcompatibili

2、ty(EMC) Part429: Testingandmeasurementtechniques Voltagedips,shortinterruptionsandvoltage variationsond.c.inputpowerportimmunitytests Numroderfrence Referencenumber CEI/IEC61000429:2000 PUBLICATIONFONDAMENTALEENCEM BASICEMCPUBLICATIONNumrosdespublications Depuisle1erjanvier1997,lespublicationsdelaCE

3、I sontnumrotespartirde60000. Publicationsconsolides Lesversionsconsolidesdecertainespublicationsde laCEIincorporantlesamendementssontdisponibles. Parexemple,lesnumrosddition1.0,1.1et1.2 indiquentrespectivementlapublicationdebase,la publicationdebaseincorporantlamendement1,etla publicationdebaseincor

4、porantlesamendements1 et2. Validitdelaprsentepublication LecontenutechniquedespublicationsdelaCEIest constammentrevuparlaCEIafinquilreflteltat actueldelatechnique. Desrenseignementsrelatifsladatedereconfir mationdelapublicationsontdisponiblesdansle CataloguedelaCEI. Lesrenseignementsrelatifsdesquest

5、ionsltudeet destravauxencoursentreprisparlecomittechnique quiatablicettepublication,ainsiquelalistedes publicationstablies,setrouventdanslesdocumentsci dessous: SitewebdelaCEI* CataloguedespublicationsdelaCEI Publiannuellementetmisjour rgulirement (Catalogueenligne)* BulletindelaCEI Disponiblelafois

6、ausitewebdelaCEI* etcommepriodiqueimprim Terminologie,symbolesgraphiques etlittraux Encequiconcernelaterminologiegnrale,lelecteur sereporteralaCEI60050: VocabulaireElectro techniqueInternational (VEI). Pourlessymbolesgraphiques,lessymboleslittraux etlessignesdusagegnralapprouvsparlaCEI,le lecteurcon

7、sulteralaCEI60027: Symboleslittraux utiliserenlectrotechnique,laCEI60417:Symboles graphiquesutilisablessurlematriel.Index,relevet compilationdesfeuillesindividuelles, etlaCEI60617: Symbolesgraphiquespourschmas. * Voiradressesitewebsurlapagedetitre. Numbering Asfrom1January1997allIECpublicationsare i

8、ssuedwithadesignationinthe60000series. Consolidatedpublications ConsolidatedversionsofsomeIECpublications includingamendmentsareavailable.Forexample, editionnumbers1.0,1.1and1.2refer,respectively,to thebasepublication,thebasepublicationincor poratingamendment1andthebasepublication incorporatingamend

9、ments1and2. Validityofthispublication ThetechnicalcontentofIECpublicationsiskept underconstantreviewbytheIEC,thusensuringthat thecontentreflectscurrenttechnology. Informationrelatingtothedateofthereconfirmation ofthepublicationisavailableintheIECcatalogue. Informationonthesubjectsunderconsiderationa

10、nd workinprogressundertakenbythetechnical committeewhichhaspreparedthispublication,aswell asthelistofpublicationsissued,istobefoundatthe followingIECsources: IECwebsite* CatalogueofIECpublications Publishedyearlywithregularupdates (Onlinecatalogue)* IECBulletin AvailablebothattheIECwebsite*and asapr

11、intedperiodical Terminology,graphicalandletter symbols Forgeneralterminology,readersarereferredto IEC60050:InternationalElectrotechnicalVocabulary (IEV). Forgraphicalsymbols,andlettersymbolsandsigns approvedbytheIECforgeneraluse,readersare referredtopublicationsIEC60027: Lettersymbolsto beusedinelec

12、tricaltechnology ,IEC60417: Graphical symbolsforuseonequipment.Index,surveyand compilationofthesinglesheets andIEC60617: Graphicalsymbolsfordiagrams. * Seewebsiteaddressontitlepage.NORME INTERNATIONALE CEI IEC INTERNATIONAL STANDARD 61000429 Premiredition Firstedition 200008 Compatibilitlectromagnti

13、que(CEM) Partie429: Techniquesdessaietdemesure Essaisdimmunitauxcreuxdetension, coupuresbrvesetvariationsdetension surlesaccsdalimentationencourantcontinu Electromagneticcompatibility(EMC) Part429: Testingandmeasurementtechniques Voltagedips,shortinterruptionsandvoltage variationsond.c.inputpowerpor

14、timmunitytests Commission Electrotechnique Internationale InternationalElectrotechnicalCommission Pourprix,voircatalogueenvigueur Forprice,seecurrentcatalogue IEC2000Droitsdereproductionrservs Copyrightallrightsreserved Aucunepartiedecettepublicationnepeuttrereproduiteni utilisesousquelqueformequece

15、soitetparaucunprocd, lectroniqueoumcanique,ycomprislaphotocopieetles microfilms,sanslaccordcritdelditeur. Nopartofthispublicationmaybereproducedorutilizedin anyformorbyanymeans,electronicormechanical, includingphotocopyingandmicrofilm,withoutpermissionin writingfromthepublisher. InternationalElectro

16、technicalCommission 3,ruedeVarembGeneva,Switzerland Telefax:+41229190300 email:inmailiec.ch IECwebsitehttp:/www.iec.ch CODEPRIX PRICECODE R PUBLICATIONFONDAMENTALEENCEM BASICEMCPUBLICATION2 61000429 CEI:2000 SOMMAIRE Pages AVANTPROPOS .4 INTRODUCTION 8 Articles 1 Domainedapplicationetobjet 10 2 Rfre

17、ncesnormatives. 12 3 Dfinitions 12 4 Gnralits 14 5 Niveauxdessai 1 4 6 Gnrateurdessai. 18 6.1 Caractristiquesetperformancesdugnrateur 18 6.2 Vrificationdescaractristiquesdugnrateur 20 7 Matrielsdessai 2 2 8 Procduredessai 22 8.1 Conditionsderfrenceenlaboratoire 24 8.2 Excutiondesessais 24 9 Evaluati

18、ondesrsultatsdessai 26 10 Rapportdessai 26 AnnexeA(informative)Exempledegnrateursdessaietdematrielsdessai. 30 AnnexeB(normative)Mesuredelappeldecourant. 34 FigureA.1Exempledegnrateurdessaibassurdeuxsourcesdalimentationavec commutationinterne .32 FigureA.2Exempledegnrateurdessaibassurunesourcedalimen

19、tation programmable . . 32 FigureB.1Circuitpermettantdemesurerlespossibilitsdattaquedelappelde courantdecrtedugnrateurdessai . 36 FigureB.2CircuitpermettantdemesurerlappeldecourantdecrtedunEST 36 Tableau1aNiveauxetduresdessairecommandspourlescreuxdetension 16 Tableau1bNiveauxetduresdessairecommandsp

20、ourlescoupuresbrves 16 Tableau1cNiveauxetduresdessairecommandspourlesvariationsdetension 1661000429 IEC:2000 3 CONTENTS Page FOREWORD 5 INTRODUCTION 9 Clause 1 Scopeandobject . 11 2 Normativereferences. 13 3 Definitions 13 4 General 15 5 Testlevels . 15 6 Testgenerator . 1 9 6.1 Characteristicsandpe

21、rformancesofthegenerator 19 6.2 Verificationofthecharacteristicsofthegenerator . 21 7 Testsetup. 23 8 Testprocedure. 2 3 8.1 Laboratoryreferenceconditions 25 8.2 Executionofthetest . 25 9 Evaluationoftestresults 27 10 Testreport . 27 AnnexA(informative)Exampleoftestgeneratorsandtestsetup 31 AnnexB(n

22、ormative)Inrushcurrentmeasurement 35 FigureA.1Exampleoftestgeneratorbasedontwopowersourceswithinternalswitching 33 FigureA.2Exampleoftestgeneratorbasedonaprogrammablepowersupply. 33 FigureB.1Circuitformeasuringthepeakinrushcurrentdrivecapabilityofatest generator 37 FigureB.2Circuitformeasuringthepea

23、kinrushcurrentofanEUT 37 Table1aPreferredtestlevelsanddurationsforvoltagedips 17 Table1bPreferredtestlevelsanddurationsforshortinterruptions. 17 Table1cPreferredtestlevelsanddurationsforvoltagevariations 174 61000429 CEI:2000 COMMISSIONLECTROTECHNIQUEINTERNATIONALE _ COMPATIBILITLECTROMAGNTIQUE(CEM)

24、 Partie429:Techniquesdessaietdemesure Essaisdimmunitauxcreuxdetension,coupuresbrveset variationsdetensionsurlesaccsdalimentationencourantcontinu AVANTPROPOS 1) LaCEI(CommissionElectrotechniqueInternationale)estuneorganisationmondialedenormalisationcompose delensembledescomitslectrotechniquesnationau

25、x(ComitsnationauxdelaCEI).LaCEIapourobjetde favoriserlacooprationinternationalepourtouteslesquestionsdenormalisationdanslesdomainesde llectricitetdellectronique.Aceteffet,laCEI,entreautresactivits,publiedesNormesinternationales. Leurlaborationestconfiedescomitsdtudes,auxtravauxdesquelstoutComitnatio

26、nalintressparle sujettraitpeutparticiper.Lesorganisationsinternationales,gouvernementalesetnongouvernementales,en liaisonaveclaCEI,participentgalementauxtravaux.LaCEIcollaboretroitementaveclOrganisation InternationaledeNormalisation(ISO),selondesconditionsfixesparaccordentrelesdeuxorganisations. 2)

27、LesdcisionsouaccordsofficielsdelaCEIconcernantdesquestionstechniques,reprsentent,danslamesure dupossible,unaccordinternationalsurlessujetstudis,tantdonnquelesComitsnationauxintresss sontreprsentsdanschaquecomitdtudes. 3)Lesdocumentsproduitsseprsententsouslaformederecommandationsinternationales.Ilsso

28、ntpublis commenormes,spcificationstechniques,rapportstechniquesouguidesetagrscommetelsparlesComits nationaux. 4) Danslebutdencouragerlunificationinternationale,lesComitsnationauxdelaCEIsengagentappliquerde faontransparente,danstoutelamesurepossible,lesNormesinternationalesdelaCEIdansleursnormes nati

29、onalesetrgionales.ToutedivergenceentrelanormedelaCEIetlanormenationaleourgionale correspondantedoittreindiqueentermesclairsdanscettedernire. 5) LaCEInafixaucuneprocdureconcernantlemarquagecommeindicationdapprobationetsaresponsabilit nestpasengagequandunmatrielestdclarconformelunedesesnormes. 6) Latt

30、entionestattiresurlefaitquecertainsdeslmentsdelaprsenteNormeinternationalepeuventfaire lobjetdedroitsdepropritintellectuelleoudedroitsanalogues.LaCEInesauraittretenuepour responsabledenepasavoiridentifidetelsdroitsdepropritetdenepasavoirsignalleurexistence. LaNormeinternationaleCEI61000429attabliepa

31、rlesouscomit77A:Phnomnes bassefrquence,ducomitdtudes77delaCEI:Compatibilitlectromagntique. Elleconstituelapartie429delaCEI61000.Ellealestatutdepublicationfondamentaleen CEMconformmentauGuide107delaCEI. Letextedelaprsentenormeestissudesdocumentssuivants: FDIS Rapportdevote 77A/307/FDIS 77A/313/RVD Le

32、rapportdevoteindiqudansletableaucidessusdonnetouteinformationsurlevoteayant aboutilapprobationdecettenorme. CettepublicationatrdigeselonlesDirectivesISO/CEI,Partie3. LannexeAestdonneuniquementtitredinformation. LannexeBfaitpartieintgrantedecettenorme.61000429 IEC:2000 5 INTERNATIONALELECTROTECHNICAL

33、COMMISSION _ ELECTROMAGNETICCOMPATIBILITY(EMC) Part429:Testingandmeasurementtechniques Voltagedips,shortinterruptions andvoltagevariationsond.c.inputpowerportimmunitytests FOREWORD 1) TheIEC(InternationalElectrotechnicalCommission)isaworldwideorganizationforstandardizationcomprising allnationalelect

34、rotechnicalcommittees(IECNationalCommittees).TheobjectoftheIECistopromote internationalcooperationonallquestionsconcerningstandardisationintheelectricalandelectronicfields.To thisendandinadditiontootheractivities,theIECpublishesInternationalStandards.Theirpreparationis entrustedtotechnicalcommittees

35、;anyIECNationalCommitteeinterestedinthesubjectdealtwithmay participateinthispreparatorywork.International,governmentalandnongovernmentalorganizationsliaising withtheIECalsoparticipateinthispreparation.TheIECcollaboratescloselywiththeInternational StandardizationOrganization(ISO)inaccordancewithcondi

36、tionsdeterminedbyagreementbetweenthetwo organizations. 2) TheformaldecisionsoragreementsoftheIEContechnicalmattersexpress,asnearlyaspossible,an internationalconsensusofopinionontherelevantsubjectssinceeachtechnicalcommitteehasrepresentation fromallinterestedNationalCommittees. 3) Thedocumentsproduce

37、dhavetheformofrecommendationsforinternationalusepublishedintheformof standards,technicalspecifications,technicalreportsorguidesandtheyareacceptedbytheNational Committeesinthatsense. 4)Inordertopromoteinternationalunification,IECNationalCommitteesundertaketoapplyIECInternational Standardstransparentl

38、ytothemaximumextentpossibleintheirnationalandregionalstandards.Any divergencebetweentheIECStandardanthecorrespondingnationalorregionalstandardshallbeclearly indicatedinthelatter. 5)TheIECprovidesnomarkingproceduretoindicateitsapprovalandcannotberenderedresponsibleforany equipmentdeclaredtobeinconfor

39、mitywithoneofitsstandards. 6)AttentionisdrawntothepossibilitythatsomeoftheelementsofthisInternationalStandardmaybethesubject ofpatentrights.TheIECshallnotbeheldresponsibleforidentifyinganyorallsuchpatentrights. InternationalStandardIEC61000429hasbeenpreparedbysubcommittee77A:Low frequencyphenomena,o

40、fIECtechnicalcommittee77:Electromagneticcompatibility. Thisstandardformspart429ofIEC61000.IthasthestatusofabasicEMCpublicationin accordancewithIECGuide107. Thetextofthisstandardisbasedonthefollowingdocuments: FDIS Reportonvoting 77A/307/FDIS 77A/313/RVD Fullinformationonthevotingfortheapprovalofthis

41、standardcanbefoundinthereporton votingindicatedintheabovetable. ThispublicationhasbeendraftedinaccordancewiththeISO/IECDirectives,Part3. AnnexAisforinformationonly. AnnexBformsanintegralpartofthisstandard.6 61000429 CEI:2000 Lecomitadcidquelecontenudecettepublicationneserapasmodifiavant2002.Acette d

42、ate,lapublicationsera reconduite; supprime; remplaceparuneditionrvise,ou amende.61000429 IEC:2000 7 Thecommitteehasdecidedthatthecontentsofthispublicationwillremainunchangeduntil 2002.Atthisdate,thepublicationwillbe reconfirmed; withdrawn; replacedbyarevisededition,or amended.8 61000429 CEI:2000 INTRODUCTION LaCEI61000estpubliesousformedeplusieurspartiesspares,conformmentla structuresuivante: Pa