IEC 61280-4-2-2014 Fibre-optic communication subsystem test procedures - Part 4-2 Installed cable plant - Single-mode attenuation and optical return loss measur.pdf

1、 IEC 61280-4-2 Edition 2.0 2014-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre-optic communication subsystem test procedures Part 4-2: Installed cable plant Single-mode attenuation and optical return loss measurement Procdures dessai des sous-systmes de tlcommunication fibres optiques Partie 4

2、-2: Installations cbles Mesure de laffaiblissement de rflexion optique et de laffaiblissement des fibres unimodales IEC 61280-4-2:2014-06(en-fr) colour inside THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2014 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of t

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20、on 2.0 2014-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Fibre-optic communication subsystem test procedures Part 4-2: Installed cable plant Single-mode attenuation and optical return loss measurement Procdures dessai des sous-systmes de tlcommunication fibres optiques Partie 4-2: Installations cb

21、les Mesure de laffaiblissement de rflexion optique et de laffaiblissement des fibres unimodales INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XC ICS 33.180.01 PRICE CODE CODE PRIX ISBN 978-2-8322-1665-1 Registered trademark of the International Electrotechnical

22、 Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. colour inside 2 IEC 61280-4-2:2014 IEC 2014

23、 CONTENTS FOREWORD . 7 INTRODUCTION . 9 1 Scope 10 2 Normative references 10 3 Terms, definitions, graphical symbols and abbreviations 11 3.1 Terms and definitions 11 3.2 Graphical symbols 13 3.3 Abbreviations 14 4 Measurement methods 15 4.1 General . 15 4.2 Cabling configurations and applicable tes

24、t methods 16 Cabling configurations and applicable test methods for attenuation 4.2.1 measurements . 16 Cabling configurations and applicable test methods for optical return 4.2.2 loss measurements 18 4.3 Overview of uncertainties 18 General . 18 4.3.1Test cords . 18 4.3.2Reflections from other inte

25、rfaces . 18 4.3.3Optical source . 18 4.3.4Output power reference . 19 4.3.5Received power reference . 19 4.3.6Mode field diameter variation . 19 4.3.7Bi-directional measurements 19 4.3.8 5 Apparatus 19 5.1 General . 19 5.2 Light source 19 Stability . 19 5.2.1Spectral characteristics . 20 5.2.2Launch

26、 cord . 20 5.2.3 5.3 Receive or tail cord . 20 5.4 Substitution cord . 21 5.5 Power meter LSPM methods only. 21 5.6 OTDR apparatus . 21 5.7 Return loss test set . 22 5.8 Connector end-face cleaning and inspection equipment 22 5.9 Adapters . 22 6 Procedures 22 6.1 General . 22 6.2 Common procedures .

27、 23 Care of the test cords 23 6.2.1Make reference measurements (LSPM and OCWR methods only) . 23 6.2.2Inspect and clean the ends of the fibres in the cabling . 23 6.2.3Make the measurements 23 6.2.4Make the calculations 23 6.2.5 6.3 Calibration 23 IEC 61280-4-2:2014 IEC 2014 3 6.4 Safety . 24 7 Calc

28、ulations . 24 8 Documentation 24 8.1 Information for each test . 24 8.2 Information to be made available 24 Annex A (normative) One-cord reference method . 25 A.1 Applicability of test method . 25 A.2 Apparatus . 25 A.3 Procedure . 25 A.4 Calculation 26 A.5 Components of reported attenuation . 26 An

29、nex B (normative) Three-cord reference method 27 B.1 Applicability of test method . 27 B.2 Apparatus . 27 B.3 Procedure . 27 B.4 Calculations 28 B.5 Components of reported attenuation . 28 Annex C (normative) Two-cord reference method 29 C.1 Applicability of test method . 29 C.2 Apparatus . 29 C.3 P

30、rocedure . 29 C.4 Calculations 31 C.5 Components of reported attenuation . 31 Annex D (normative) Optical time domain reflectometer . 32 D.1 Applicability of test method . 32 D.2 Apparatus . 32 D.2.1 General . 32 D.2.2 OTDR 32 D.2.3 Test cords . 32 D.3 Procedure (test method) . 33 D.4 Calculation of

31、 attenuation . 34 D.4.1 General . 34 D.4.2 Connection location . 34 D.4.3 Definition of the power levels F 1and F 235 D.4.4 Alternative calculation 36 D.5 Calculation of optical return loss . 37 D.6 Calculation of reflectance for discrete components . 39 D.7 OTDR uncertainties 40 Annex E (normative)

32、 Continuous wave optical return loss measurement Method A . 41 E.1 Applicability of test method . 41 E.2 Apparatus . 41 E.2.1 General . 41 E.2.2 Light source . 41 E.2.3 Branching device or coupler 41 E.2.4 Power meters 42 E.2.5 Connector interface . 42 E.2.6 Low reflection termination 42 E.3 Procedu

33、re . 42 4 IEC 61280-4-2:2014 IEC 2014 E.3.1 Test set characterization 42 E.3.2 Measurement procedure 44 E.3.3 Calculations . 44 E.3.4 Measurement uncertainty. 45 Annex F (normative) Continuous wave optical return loss measurement Method B 46 F.1 Applicability of test method . 46 F.2 Apparatus . 46 F

34、.2.1 General requirements 46 F.2.2 Known reflectance termination . 46 F.3 Procedure . 46 F.3.1 Set-up characterization 46 F.3.2 Measurement procedure 47 F.3.3 Calculation 48 F.3.4 Measurement uncertainty. 48 Annex G (informative) Measurement uncertainty examples 49 G.1 Reduction of uncertainty by us

35、ing reference grade terminations and related issues . 49 G.1.1 Motivations for using reference grade terminations on test cords . 49 G.1.2 Adjusting acceptance limits to allow for different expected losses when using reference grade and standard grade connectors . 49 G.2 Estimation of the measuremen

36、t uncertainties 51 G.2.1 Measurement uncertainty. 51 G.2.2 Uncertainty due to the instrument 51 G.2.3 Uncertainty due to the source 51 G.2.4 Uncertainty due to the device under test 52 G.2.5 Example of uncertainty accumulation using a single power meter 53 G.2.6 Example of uncertainty accumulation u

37、sing two power meters . 54 Annex H (informative) OTDR configuration information 55 H.1 Introductory remarks . 55 H.2 Fundamental parameters that define the operational capability of an OTDR 56 H.2.1 Dynamic range 56 H.2.2 Pulse width 56 H.2.3 Averaging time 56 H.2.4 Dead zone . 56 H.3 Other paramete

38、rs 56 H.3.1 Index of refraction 56 H.3.2 Measurement range . 57 H.3.3 Distance sampling . 57 H.4 Other measurement configurations . 57 H.4.1 General . 57 H.4.2 Macro bend attenuation measurement . 57 H.4.3 Splice attenuation measurement 58 H.4.4 Measurement with high reflection connectors or short l

39、ength cabling . 58 H.4.5 Ghost 60 H.5 More on the measurement method 61 H.6 Bidirectional measurement 62 H.7 OTDR bi-directional trace analysis 63 H.8 Non recommended practices . 64 H.8.1 Measurement without tail cord . 64 IEC 61280-4-2:2014 IEC 2014 5 H.8.2 Cursor measurement . 64 Annex I (informat

40、ive) Test cord attenuation verification 65 I.1 Introductory remarks . 65 I.2 Apparatus . 65 I.3 Procedure . 65 I.3.1 General . 65 I.3.2 Test cord verification for the one-cord and two-cord reference test methods when using non-pinned/unpinned and non-plug/socket style connectors . 66 I.3.3 Test cord

41、 verification for the one-cord and two-cord reference test methods using pinned/unpinned or plug/socket style connectors . 67 I.3.4 Test cord verification for the three-cord reference test method using non-pinned/unpinned and non-plug/socket style connectors. 68 I.3.5 Test cord verification for the

42、three-cord reference test method using pinned/unpinned or plug/socket style connectors . 70 Annex J (informative) Spectral attenuation measurement . 72 J.1 Applicability of test method . 72 J.2 Apparatus . 72 J.2.1 Broadband light source 72 J.2.2 Optical spectrum analyser . 72 J.3 Procedure . 72 J.3

43、.1 Reference scan . 72 J.3.2 Measurement scan 73 J.4 Calculations 73 Bibliography 74 Figure 1 Connector symbols 13 Figure 2 Symbol for cabling under test . 14 Figure 3 Configuration A Start and end of measured losses in reference test method . 16 Figure 4 Configuration B Start and end of measured lo

44、sses in reference test method . 17 Figure 5 Configuration C Start and end of measured losses in reference test method . 17 Figure 6 Typical OTDR schematic 21 Figure 7 Return loss test set illustration . 22 Figure A.1 One-cord reference measurement . 26 Figure A.2 One-cord test measurement . 26 Figur

45、e B.1 Three-cord reference measurement 27 Figure B.2 Three-cord test measurement . 28 Figure C.1 Two-cord reference measurement. 30 Figure C.2 Two-cord test measurement 30 Figure C.3 Two-cord test measurement for plug-socket style connectors . 30 Figure D.1 Test measurement for method D . 34 Figure

46、D.2 Location of the cabling under test ports 35 Figure D.3 Graphic construction of F 1and F 236 Figure D.4 Graphic construction of F 1 , F 11 , F 21and F 237 6 IEC 61280-4-2:2014 IEC 2014 Figure D.5 Graphic representation of OTDR ORL measurement . 38 Figure D.6 Graphic representation of reflectance

47、measurement . 39 Figure E.1 Return loss test set illustration 41 Figure E.2 Measurement of the system internal attenuation P ref243 Figure E.3 Measurement of the system internal attenuation P ref143 Figure E.4 Measurement of the system reflected power P rs. 43 Figure E.5 Measurement of the input pow

48、er P in. 44 Figure E.6 Measurement of the reflected power . 44 Figure F.1 Return loss test set illustration 46 Figure F.2 Measurement of P rs with reflections suppressed . 47 Figure F.3 Measurement of P refwith reference reflector 47 Figure F.4 Measurement of the system reflected power P rs. 47 Figu

49、re F.5 Measurement of the reflected power . 48 Figure H.1 Splice and macro bend attenuation measurement . 58 Figure H.2 Attenuation measurement with high reflection connectors . 59 Figure H.3 Attenuation measurement of a short length cabling . 60 Figure H.4 OTDR trace with ghost 61 Figure H.5 Cursor positioning. 62 Figure H.6 Bidirectional OTDR trace d