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IEC 62496-2-4-2013 Optical circuit boards - Basic test and measurement procedures - Part 2-4 Optical transmission test for optical circuit boards without input .pdf

1、 IEC 62496-2-4 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical circuit boards Basic test and measurement procedures Part 2-4: Optical transmission test for optical circuit boards without input/output fibres Cartes circuits optiques Procdures fondamentales dessais et de mesure

2、s Partie 2-4: Essai de transmission optique des cartes circuits optiques sans fibres dentre/sortie IEC62496-2-4:2013 colourinsideTHIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2013 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reprodu

3、ced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECs member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaini

4、ng additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction rservs. Sauf indication contraire, aucune partie de cette publication ne peut tre reproduite ni utilise sous quelque forme que ce soi

5、t et par aucun procd, lectronique ou mcanique, y compris la photocopie et les microfilms, sans laccord crit de la CEI ou du Comit national de la CEI du pays du demandeur. Si vous avez des questions sur le copyright de la CEI ou si vous dsirez obtenir des droits supplmentaires sur cette publication,

6、utilisez les coordonnes ci-aprs ou contactez le Comit national de la CEI de votre pays de rsidence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varemb Fax: +41 22 919 03 00 CH-1211 Geneva 20 infoiec.ch Switzerland www.iec.ch About the IEC The International Electrotechnical Commission (IEC) i

7、s the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition,

8、 a corrigenda or an amendment might have been published. Useful links: IEC publications search - www.iec.ch/searchpub The advanced search enables you to find IEC publications by a variety of criteria (reference number, text, technical committee,). It also gives information on projects, replaced and

9、withdrawn publications. IEC Just Published - webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published details all new publications released. Available on-line and also once a month by email. Electropedia - www.electropedia.org The worlds leading online dictionary of

10、electronic and electrical terms containing more than 30 000 terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary (IEV) on-line. Customer Service Centre - webstore.iec.ch/csc If you wish to give us your

11、 feedback on this publication or need further assistance, please contact the Customer Service Centre: csciec.ch. A propos de la CEI La Commission Electrotechnique Internationale (CEI) est la premire organisation mondiale qui labore et publie des Normes internationales pour tout ce qui a trait llectr

12、icit, llectronique et aux technologies apparentes. A propos des publications CEI Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possdez ldition la plus rcente, un corrigendum ou amendement peut avoir t publi. Liens utiles: Recherche de publicatio

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14、published Restez inform sur les nouvelles publications de la CEI. Just Published dtaille les nouvelles publications parues. Disponible en ligne et aussi une fois par mois par email. Electropedia - www.electropedia.org Le premier dictionnaire en ligne au monde de termes lectroniques et lectriques. Il

15、 contient plus de 30 000 termes et dfinitions en anglais et en franais, ainsi que les termes quivalents dans les langues additionnelles. Egalement appel Vocabulaire Electrotechnique International (VEI) en ligne. Service Clients - webstore.iec.ch/csc Si vous dsirez nous donner des commentaires sur ce

16、tte publication ou si vous avez des questions contactez-nous: csciec.ch. IEC 62496-2-4 Edition 1.0 2013-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Optical circuit boards Basic test and measurement procedures Part 2-4: Optical transmission test for optical circuit boards without input/output fibr

17、es Cartes circuits optiques Procdures fondamentales dessais et de mesures Partie 2-4: Essai de transmission optique des cartes circuits optiques sans fibres dentre/sortie INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE S ICS 33.180.01 PRICE CODE CODE PRIX ISBN 97

18、8-2-83220-868-7 Registered trademark of the International Electrotechnical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette public

19、ation via un distributeur agr. colourinside 2 62496-2-4 IEC:2013 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms, definitions and abbreviations 6 3.1 Terms and definitions 6 3.2 Abbreviations 7 4 Measurement conditions . 7 5 Inspection methods 8 5.1 Equipment . 8 5.1.1 Light sou

20、rce system . 9 5.1.2 Observation system . 10 5.1.3 Data processing unit 11 5.1.4 Unit for holding the sample 12 5.2 Measurement procedures of relative optical loss . 12 5.2.1 Preparation of light source . 12 5.2.2 Preparation of the optical observation system measuring equipment . 13 5.2.3 Measuring

21、 coordinates of I/O ports 13 5.2.4 Capturing of optical images for control sample and samples to be measured 13 5.2.5 Image data processing (detection of I/O port range) 14 5.2.6 Calculation of relative loss . 14 5.3 Evaluation of pass or fail . 15 Annex A (informative) Example of an optical transmi

22、ssion test for an OCB without I/O fibres 16 Annex B (informative) Measurement of input and output ports in offset positions 19 Bibliography 21 Figure 1 Optical transmission test system without I/O fibres for surface I/O type OCB . 8 Figure 2 Optical transmission test system without I/O fibres for en

23、d-face I/O type OCB . 9 Figure 3 Schematic diagram of measurement of uniformity of illumination area 10 Figure 4 Example of obtained uniformity of illumination area 10 Figure 5 Example of obtained sensitivity of an image sensor (input uniformity within 1 %) 11 Figure 6 Position alignment of light so

24、urce . 13 Figure 7 Example of captured image and extracted I/O port range by image binarization . 14 Figure 8 Calculation of the total detected intensity of extracted I/O port range from detected intensity for each pixel 15 Figure A.1 Example of relative optical loss measurement . 17 Figure A.2 Exam

25、ple of reproducibility of relative optical loss measurement 18 Figure B.1 Ray traces for OCBs with mirror having designated mirror angle (left) and not designated one (right) . 19 Figure B.2 Difference of focus positions between without offset and with offset . 20 Figure B.3 Optical images at surfac

26、e of OCB plane (without offset) and offset position (with offset) 20 62496-2-4 IEC:2013 3 Table A.1 Observation system . 16 Table A.2 Light source . 16 Table A.3 Samples to be measured 16 4 62496-2-4 IEC:2013 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ OPTICAL CIRCUIT BOARDS BASIC TEST AND MEASUREME

27、NT PROCEDURES Part 2-4: Optical transmission test for optical circuit boards without input/output fibres FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The

28、object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specific

29、ations (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations li

30、aising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters expr

31、ess, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Commit

32、tees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC Nationa

33、l Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does no

34、t provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have t

35、he latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoeve

36、r, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publication

37、s is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard

38、IEC 62496-2-4 has been prepared by IEC technical committee 86: Fibre optics. The text of this standard is based on the following documents: FDIS Report on voting 86/449/FDIS 86/456/RVD Full information on the voting for the approval of this standard can be found in the report on voting indicated in

39、the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 62496-2-4 IEC:2013 5 A list of all parts of the IEC 62496 series, published under the general title Optical circuit boards Basic test and measurement procedures, can be found on the IEC website. Fut

40、ure standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the I

41、EC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IMPORTANT The colour inside logo on the cover page of this publication indicates that it contains colour

42、s which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer. 6 62496-2-4 IEC:2013 OPTICAL CIRCUIT BOARDS BASIC TEST AND MEASUREMENT PROCEDURES Part 2-4: Optical transmission test for optical circuit boards witho

43、ut input/output fibres 1 Scope This part of IEC 62496 specifies the test method to decide whether to pass or fail an optical circuit board using direct illumination by a light. The input ports are directly illuminated and the optical intensity from the output ports of the optical circuit board is mo

44、nitored using an area image sensor. Excess optical losses are the calculated from total detected intensities of light from a sample to be measured and from a control sample. This method is used to illuminate uniformly the input port of the optical circuit board (OCB) with a larger area than the core

45、 area, obtain the radiance of an area image from the corresponding output port of the OCB using an area image sensor, and evaluate whether to pass or fail using the radiance obtained compared to that of a control sample. The advantage of this test method is that the alignment procedure between a lau

46、nch fibre and the OCB is not necessary. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the

47、referenced document (including any amendments) applies. IEC 60068-1, Environmental testing Part 1: General and guidance 3 Terms, definitions and abbreviations 3.1 Terms and definitions For the purposes of this document, the following terms, definitions and abbreviations apply. 3.1.1 shading non-unif

48、ormity of detected intensity of an image caused by non-uniformity of the sensitivity of elements of an area image sensor and vignetting depending on the optical system Note 1 to entry: Correction of the non-uniformity of the detection sensitivity of elements of a uniform one is called “shading corre

49、ction“. 3.1.2 gamma value factor “” for a camera expressed by the following equation: (input optical intensity signal) = A (output image signal) where A is a proportionality constant Note 1 to entry: The input optical intensity is linearly proportional to the output image signal when = 1. 62496-2-4 IEC:2013 7 3.1.3 telecentric optical system optical system where the optical input

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