IEC 62788-1-2-2016 Measurement procedures for materials used in photovoltaic modules - Part 1-2 Encapsulants - Measurement of volume resistivity of photovoltaic.pdf

1、 IEC 62788-1-2 Edition 1.0 2016-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement procedures for materials used in photovoltaic modules Part 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materials Procdures de mesure des matriaux utilis

2、s dans les modules photovoltaques Partie 1-2: Encapsulants Mesurage de la rsistivit transversale des encapsulants photovoltaques et autres matriaux polymres IEC 62788-1-2:2016-05(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2016 IEC, Geneva, Switzerland All rights reserved. Unless otherw

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20、16-05 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement procedures for materials used in photovoltaic modules Part 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materials Procdures de mesure des matriaux utiliss dans les modules photovolta

21、ques Partie 1-2: Encapsulants Mesurage de la rsistivit transversale des encapsulants photovoltaques et autres matriaux polymres INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE ICS 27.160 ISBN 978-2-8322-3349-8 Registered trademark of the International Electrotech

22、nical Commission Marque dpose de la Commission Electrotechnique Internationale Warning! Make sure that you obtained this publication from an authorized distributor. Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agr. 2 IEC 62788-1-2:2016 IEC 2016 CONTENTS

23、 FOREWORD . 3 1 Scope 5 2 Normative references. 6 3 Sampling . 6 4 Apparatus 6 5 Procedure . 7 5.1 Preconditioning . 7 5.2 Test conditions 8 5.2.1 Room temperature . 8 5.2.2 Elevated temperatures . 8 5.3 Measurement voltage 8 5.3.1 Method A voltage . 8 5.3.2 Method B voltage . 9 5.4 Measurement cycl

24、e . 9 5.4.1 Method A cycle 9 5.4.2 Method B cycle 9 5.5 Results . 9 6 Test report. 10 Annex A (informative) Historical studies of the volume resistivity of encapsulation materials 12 Annex B (informative) Example data . 13 Bibliography . 14 Figure 1 Schematic of electrode apparatus for resistivity m

25、easurements . 7 Figure B.1 Example data showing current and voltage as a function of time for Method A measurement 13 Table B.1 End of cycle current measurements and values used for calculation of volume resistivity according to Method A . 13 IEC 62788-1-2:2016 IEC 2016 3 INTERNATIONAL ELECTROTECHNI

26、CAL COMMISSION _ MEASUREMENT PROCEDURES FOR MATERIALS USED IN PHOTOVOLTAIC MODULES Part 1-2: Encapsulants Measurement of volume resistivity of photovoltaic encapsulants and other polymeric materials FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for stand

27、ardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes Int

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33、ational or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any servic

34、es carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC Natio

35、nal Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is

36、 drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall

37、 not be held responsible for identifying any or all such patent rights. International Standard IEC 62788-1-2 has been prepared by IEC technical committee 82: Solar photovoltaic energy systems. The text of this standard is based on the following documents: FDIS Report on voting 82/1085/FDIS 82/1105/R

38、VD Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. 4 IEC 62788-1-2:2016 IEC 2016 A list of all parts in the IEC 62788 series, publi

39、shed under the general title Measurement procedures for materials used in photovoltaic modules, can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC website under “http:/webstore.iec.ch“ i

40、n the data related to the specific publication. At this date, the publication will be reconfirmed, withdrawn, replaced by a revised edition, or amended. IEC 62788-1-2:2016 IEC 2016 5 MEASUREMENT PROCEDURES FOR MATERIALS USED IN PHOTOVOLTAIC MODULES Part 1-2: Encapsulants Measurement of volume resist

41、ivity of photovoltaic encapsulants and other polymeric materials 1 Scope This part of IEC 62788 provides a method and guidelines for measuring the volume resistivity of materials used as encapsulation, edge seals, front-sheets, backsheets, or any other insulating material in a photovoltaic (PV) modu

42、le. The test is performed on dry, humid or wet preconditioned samples. In the case of frontsheets and backsheets comprised of multiple layers, the measured resistivity is an effective value. This test is designed for room temperature measurement, but can also be utilized at higher temperatures. Degr

43、adation of PV modules is known to occur in part by electrochemical corrosion, and other potential induced degradation processes. These processes may be dependent upon the resistivity of a polymeric component. Therefore, the DC resistivity of polymeric components is relevant to module design and dura

44、bility in the field. The resistivity may depend on cure state, temperature, water content, and voltage history. A number of options are included to allow the measurement to be performed in a manner consistent with representative fielded module conditions. Most resistivity measurement methods and equ

45、ipment typically become inaccurate and variable for materials with volume resistivity above 10 16cm 5 1 .Therefore, this standard is used for measurements less than 110 17cm. Both monolithic and multilayer materials (e.g. frontsheets and backsheets) are suitable for measurement. Methods are describe

46、d for room temperature measurement, with guidelines included for testing at elevated temperatures. Results will vary with moisture content, therefore materials should be tested in a manner anticipatory of usage. Preconditioning procedures for dry, humid and wet environments are included. Depending o

47、n the material, voltage history will affect the measured result. The rate of change of current, and time to equilibrium varies with material often taking hours or days to come to a static level. For this reason, long and short duration methods are included (Methods A and B). The specified short-dura

48、tion alternating polarity Method B is intended for qualitative comparison. Method A, long-duration on/off polarity, is recommended for characterization with regard to PID resistance. Measurements obtained using either method may be used by material manufacturers for the purpose of quality control of

49、 their electrical insulating material as well as for reporting in product datasheets. PV module manufacturers may use these methods for the purpose of material acceptance, material selection, process development, design analysis, or failure analysis. _ 1Numbers in square brackets refer to the Bibliography. 6 IEC 62788-1-2:2016 IEC 2016 This measurement method can also be utilized to monit