1、IEEE Std C62.41.1-2002IEEE StandardsC62.41.1TMIEEE Guide on the SurgeEnvironment inLow-Voltage (1000 V and Less)AC Power CircuitsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USA11 April 2003IEEE Power Engineering SocietySponsored by
2、theSurge Protective Devices CommitteeIEEE StandardsPrint: SH95030PDF: SS95030Recognized as anAmerican National Standard (ANSI)IEEE Std C62.41.1-2002(R2008)IEEE Guide on the Surge Environment inLow-Voltage (1000 V and Less)AC Power CircuitsSponsorSurge Protective Devices Committeeof theIEEE Power Eng
3、ineering SocietyReaffirmed 10 December 2008Approved 11 November 2002IEEE-SA Standards BoardReaffirmed 30 April 2009Approved 4 April 2003American National Standards InstituteThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2003 by the Ins
4、titute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 11 April 2003. Printed in the United States of America.National Electrical Codeand NECare both registered trademarks owned by the National Fire Protection Association, Inc. National Electrical Safety Codeand NESCare b
5、oth registered trademarks and service marks owned by the Institute of Electrical and Electronics Engineers, Inc.Print: ISBN 0-7381-3391-4 SH95030PDF: ISBN 0-7381-3392-5 SS95030No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior
6、 written permission of the publisher.IEEE thanks the International Electrotechnical Commission (IEC) for permission to reproduceinformation from its International Standards, Technical Reports and Technical Specifications: IEC62066:2002Figure 15, Figure 16, Figure A.13, Figure A.14, Figure A.23, Tabl
7、e A.4, Figure A.24,Figure A.25, TableA.5, and Figure A.31; IEC 61000-4-4:1995Figure B.7 and Figure B.8. All suchextracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC isavailable from www.iec.ch. IEC has no responsibility for the placement and context
8、 in which the extractsand contents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracytherein.IEEE also thanks the following organizations or individuals for permission to reproduce figures from theirpublications, appearing respectively as Figure 3 (Global Atm
9、ospherics, Inc.); Figure 17 (K.Berger); FigureA.15, Figure A.21, Figure A.22, and Figure A.30 (F. D. Martzloff); Figure A.16 (T. Shaunessy); FigureA.17and Figure A.20 (A. McEachern); Figure A.18 (H. Rauworth); FigureA.19 (J. G. Dalton); Table A.6 (D. S.Dorr); Figure A.26 (M. B. Hughes); Figure A.27
10、(V. A. Rakov); Figure A.28 (K. L. Cummins); Figure A.34and Figure A.34 (J. Weisinger); Figure B.1 (J. J. Goedbloed).Abstract: This is a guide describing the surge voltage, surge current, and temporary overvoltages(TOV) environment in low-voltage up to 1000 V root mean square (rms) ac power circuits.
11、 Thisscope does not include other power disturbances, such as notches, sags, and noise.Keywords: lightning surges, low-voltage ac power circuit, surge environment, surge testing, surgewithstand level, switching surgesIEEE Standards documents are developed within the IEEE Societies and the Standards
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28、right 2003 IEEE. All rights reserved.IntroductionThis introduction is not part of IEEE Std C62.41.1-2002, IEEE Guide on the Surge Environment in Low-Voltage(1000 V and Less) AC Power Circuits.This guide is the result of 20 years of evolution from the initial 1980 document, IEEE Std 587, IEEE Guidefo
29、r Surge Voltages in Low-Voltage AC Power Circuits, which promptly became IEEE Std C62.41with thesame title. The guide was updated in 1991 as IEEE Std C62.41-1991, IEEE Recommended Practice onSurge Voltages in Low-Voltage AC Power Circuits, reflecting new data on the surge environment andexperience i
30、n the use (and misuse) of the original guide. The purpose of the document was and still is toprovide information on the surge environment and offer recommendations to interested parties involved indeveloping application standards related to surge protective devices (SPDs) as well as recommendations
31、toproduct designers and users.The 1980 version, based on data available up to 1979, proposed two novel concepts: 1) The reduction of a complex database to two representative surges: a new “Ring Wave”featuring a decaying 100 kHz oscillation, and the combination of the classical, well-accepted1.2/50s
32、voltage waveform and 8/20 s current waveform into a “Combination Wave” to bedelivered by a surge generator having well-defined open-circuit voltage and short-circuitcurrent.2) The concept that location categories could be defined within an installation where surgevoltages impinging upon the service
33、entrance of an installation or generated within aninstallation would propagate, unabated, in the branch circuits, while the associated currents,impeded by (mostly) the inductance of the conductors, would be reduced from the valuesobserved in circuits located close to the service entrance to lower va
34、lues observed in circuitslocated at the end of long branch circuits.The 1991 version, based on additional data as well as experience in the use of the 1980 guide, maintained theconcepts of the location categories and the recommendation of representative surge waveforms.The two seminal surges, Ring W
35、ave and Combination Wave, were designated as “standard surge-testingwaveforms,” and three new “additional surge-testing waveforms” were added to the “menu.” Meanwhile, acompanion document, IEEE Std C62.45-1992, IEEE Guide on Surge Testing for Equipment Connected toLow-Voltage AC Power Circuits, was
36、developed, outlining procedures for error-free application of the wave-forms defined by IEEE Std C62.41-1991 while enhancing operator safety.The perceived need to justify the expansion of the two-only waveforms to a menu of five led to the growth inthe document volume, from the 25-page IEEE Std 587-
37、1980 to the 111-page IEEE Std C62.41-1991.Additional data collected toward an update of the 1991 version (which was reaffirmed in 1996) would haveincreased further the volume of the document. Instead, a new approach was selected: to create a “Trilogy”by separating the information into three distinct
38、 documents, making their use more reader-friendly whilemaintaining the credibility of the recommendations:A guide on the surge environment in low-voltage ac power circuits (the present document)A recommended practice on characterization of surges in low-voltage ac power circuits (IEEE StdC62.41.2-20
39、02)A recommended practice on surge testing for equipment connected to low-voltage ac power circuits(IEEE Std C62.45-2002)In this manner, interested parties will have a faster, simpler access to the recommendations for selectingrepresentative surges relevant to their needs. A comprehensive database w
40、ill be available for parties desiringto gain a deeper understanding of the surge environment and an up-to-date set of recommendations on surgetesting procedures.Copyright 2003 IEEE. All rights reserved vParticipantsAt the time this recommended practice was completed, the Working Group on Surge Chara
41、cterization onLow-Voltage Circuits had the following membership:Hans Steinhoff, ChairJames Funke, Co-ChairRaymond Hill, SecretaryFranois D. Martzloff, Technical EditorOther individuals who contributed review and comments in developing this recommended practice areThe following members of the balloti
42、ng committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. Richard BentingerWilliam Bush Ernie Gallo Andrea Turner Haa Jim Harrison Michael Hopkins Deborah Jennings-ConnerPhilip J. JonesWilhem H. Kapp Joesph L. Koepfinger Richard OdenbergAlan W. RebeckMich
43、ael StringfellowS. Frank Waterer Don WordenP. P. BarkerJ. BirklB. ConnatserT. R. ConradC. DhoogeD. Dorr H. E. FoelkerG. L. GoeddeW. GoldbachP. Hasse T. S. KeyG. KohnD. LaceyJ. Levine W. A. MaguireA. Mansoor D. MessinaR. W. NorthropK. O. PhippsJ. B. PoseyV. A. Rakov A. RousseauS. G. Whisenant W. J. Z
44、ischankRichard BentingerJames CaseChrys ChrysanthouBryan R. ColeBill CurryDouglas C. DawsonE. P. DickClifford C. ErvenErnie GalloGary GoeddeJim HarrisonSteven P. HensleyAndrew Robert HilemanDavid W. JacksonPhilip J. JonesWilhelm H. KappJoseph L. KoepfingerBenny H. LeeCarl E. LindquistWilliam A. Magu
45、ireFranois D. MartzloffNigel P. McQuinGary L. MichelRichard OdenbergJoseph C. OsterhoutMichael ParentePercy E. PoolR. V. RebbapragadaAlan W. RebeckTim E. RoysterMark S. SimonHans SteinhoffAntony J. SurteesDonald B. TurnerS. Frank WatererJames W. WilsonJonathan J. WoodworthDonald M. Wordenvi Copyrigh
46、t 2003 IEEE. All rights reserved.At the time this document was sent to ballot, the Accredited Standards Committee on Surge Arresters, C62,had the following members:Joseph L. Keepfinger, ChairS. Choinski, SecretaryVacant, NEMA Co-SecretaryNaeem Ahmad, IEEE Co-SecretaryOrganization Represented Name of
47、 RepresentativeElectric Light however, for the convenience of the reader, importantdefinitions already in existence are cited in the glossary (Informative Annex C). Clause 4 provides a tutorialdescription of the origins of surge voltages and surge currents. Clause 5 provides information on thepropag
48、ation of surges. Clause 6 provides a summary of the database, drawn from the comprehensive datalisted in Informative Annex A. Clause 7 provides basic information on the occurrence of temporaryovervoltages (TOVs). Clause 8 suggests how this complex database can be simplified toward selecting a fewrep
49、resentative surge waveforms that will be more specifically defined in the recommended practice IEEEStd C62.41.2-2002,1which is a companion to this guide within the Trilogy.This guide also contains four informative annexes. Informative Annex A describes the results of surgemeasurements performed in the field, as well as the results of numerical simulations performed tosupplement the recording of surge events. Useful inferences on the surge environment that can be drawnfrom equipment field success and failures are also discussed in this annex. Informative Annex
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