IEEE 115-2009 en Guide for Test Procedures for Synchronous Machines Part I-Acceptance and Performance Testing Part II-Test Procedures and Parameter Determinatio.pdf

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3、3g36g81g68g79g92g86g76g86g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g69g92g3g87g75g72g40g79g72g70g87g85g76g70g3g48g68g70g75g76g81g72g85g92g3g38g82g80g80g76g87g87g72g72g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g

4、85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g26g3g48g68g92g3g21g19g20g19g20g20g24g55g48IEEE Std 115-2009 (Revision of IEEE Std 115-1995) IEEE Guide for Test Procedures for Synchronous Machines Part IAcceptance and Performance Testing Part IITest Procedures and Parameter Determi

5、nation for Dynamic Analysis Sponsor Electric Machinery Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2010 IEEE. All rights reserved. Intr

6、oduction This introduction is not part of IEEE Std 115-2009, IEEE Guide for Test Procedures for Synchronous Machines: Part IAcceptance and Performance Testing and Part IITest Procedures and Parameter Determination for Dynamic Analysis. IEEE Std 115-2009 incorporates and updates virtually all of the

7、1995 edition (reaffirmed in 2002). The first AIEE “Test Code” for Synchronous Machines (#503) was issued in 1945 and formed the basis for the subsequent IEEE Std 115, which was first published in 1965. The Generator Subcommittees Working Group #7, which produced this guide, was formed in June 2005,

8、and the Project Authorization Request (PAR) was approved by the IEEE-SA Standards Board in March 2005 and again in March 2009. This PAR included a proposal by the working group to revise the procedure of 7.3.6 to correct errors in the previous edition, to add a new subclause about vibration testing

9、procedure, and to update the entire document to reflect state-of-the-art practices and technology. The working group decided to keep the format and titles of the guide the same as the previous edition, i.e., in two parts with the overall title of “Test Procedures for Synchronous Machines” and the fo

10、llowing titles for the parts: Part I, Acceptance and Performance Testing Part II, Test Procedures and Parameter Determination for Dynamic Analysis Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this

11、standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with ap

12、plicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standa

13、rdization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. v Copyright 2010 IEEE. All rights reserved. Updating of IEEE documents

14、Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of

15、the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/iee

16、explore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standar

17、ds can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.

18、html. Patents Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is no

19、t responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or

20、in any licensing agreements are reasonable or non-discriminatory. Users of this guide are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE St

21、andards Association. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this guide was submitted to the IEEE-SA Standards Board for approval, the Generator Subcommittees Working Group #7 had the following membership: Haran C. Karmaker, Chair Innocent Kamwa, Co-chair Ren Wamkeue, S

22、ecretary Michael W. Brimsek Ron Chu Joseph D. Hurley Reinhard Joho Swam S. Kalsi Joseph D. Law Bruce Ledger Timothy MacDonald Arezki Merkhouf Chris Mi Lon Montgomery Nils E. Nilsson Edward L. Owen Pouyan Pourbeik John J. Ready Shep Salon Ahmed El Serafi Manoj Shah Gregory Snitchler Nick Stranges Ste

23、phan Umans John Yagielski The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Michael Adams Ali Al Awazi William Bartley Thomas Bishop William Bloethe Steven Brockschink Andrew Brown G

24、ustavo Brunello Antonio Cardoso Weijen Chen Ian Culbert Roger Daugherty Matthew Davis Gary L. Donner Donald Dunn James Dymond Gary Engmann Rostyslaw Fostiak Randall Groves Gary Heuston Scott Hietpas William B. Hopf David Horvath James Jones Innocent Kamwa Haran C. Karmaker John Kay Tanuj Khandelwal

25、Geoffrey Klempner J. Koepfinger Saumen Kundu Chung-Yiu Lam William Lockley Lawrence Long O. Malik Omar Mazzoni Don McLaren Gary Michel Jerry Murphy Michael S. Newman Howard Penrose Christopher Petrola Alvaro Portillo Iulian Profir Madan Rana Daniel Sauer Bartien Sayogo Douglas Seely Ahmed El Serafi

26、Gil Shultz James E. Smith David Tepen S. Thamilarasan James Timperley John Vergis James Wilson Oren Yuen vii Copyright 2010 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 9 December 2009, it had the following membership: Robert M. Grow, Chair Thomas A. Prevost, Vi

27、ce Chair Steve M. Mills, Past Chair Judith Gorman, Secretary John Barr Karen Bartleson Victor Berman Ted Burse Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman Jim Hughes Richard H. Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Ted Olsen Glenn Parsons Ronald C. Peters

28、en Narayanan Ramachandran Jon Walter Rosdahl Sam Sciacca *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Howard L. Wolfman, TAB Representative Michael Janezic, NIST Representative Satish K. Aggarwal, NRC Representative Lisa Perry IEEE Standards Program Ma

29、nager, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development viii Copyright 2010 IEEE. All rights reserved. Contents Part IAcceptance and Performance Testing 1. Overview 1 1.1 Scope 1 1.2 Organization of the guide . 1 1.3 Miscellaneous notes 2 1.4 Instr

30、umentation. 3 2. Normative references 4 3. Miscellaneous tests. 6 3.1 Insulation resistance 6 3.2 Dielectric and partial discharge tests 6 3.3 Resistance measurements . 8 3.4 Tests for short-circuited field turns. 10 3.5 Polarity test for field poles 12 3.6 Shaft current and bearing insulation . 12

31、3.7 Phase sequence . 14 3.8 Telephone-influence factor (TIF) . 16 3.9 Balanced TIF 17 3.10 Residual-component TIF 18 3.11 Line-to-neutral TIF . 19 3.12 Stator terminal voltagewaveform deviation and distortion factors . 19 3.13 Overspeed tests . 24 3.14 Line-charging capacity . 25 3.15 Acoustic noise

32、 26 3.16 Vibration testing . 26 4. Saturation curves, segregated losses, and efficiency 28 4.1 General 28 4.2 Method 1. Separate drive 31 4.3 Method 2. Electric input . 36 4.4 Method 3. Retardation 42 4.5 Method 4. Heat transfer 50 4.6 Efficiency 51 5. Load excitation . 53 5.1 General 53 5.2 Test m

33、ethods. 53 5.3 Load excitation calculation methods for specified machine terminal conditions . 56 5.4 Excitation calculation methods used in stability computer programs. 62 6. Temperature tests 65 6.1 General 65 6.2 Methods of loading . 65 6.3 Duration of test . 71 6.4 Methods to measure temperature

34、 72 6.5 Preparation for test 73 ix Copyright 2010 IEEE. All rights reserved. 6.6 Determination of coolant temperature 74 6.7 Temperature readings . 76 6.8 Shutdown temperatures. 77 6.9 Temperature rise . 78 7. Torque tests 79 7.1 General 79 7.2 Locked-rotor current and torque . 79 7.3 Speed-torque t

35、ests. 82 7.4 Pull-out torque 87 8. Sudden short-circuit tests 89 8.1 Mechanical integrity of machine 89 8.2 Electrical integrity of machine 89 Part IITest Procedures and Parameter Determination for Dynamic Analysis 9. Applications of machine electrical parameters. 90 9.1 General 90 9.2 P.U. quantiti

36、es. 91 10. Tests for determining parameter values for steady-state conditions. 97 10.1 Purpose . 97 10.2 Instrumentation . 97 10.3 Direct-axis synchronous reactance, Xd98 10.4 Quadrature-axis synchronous reactance, Xq99 10.5 Negative-sequence quantities (steady state) 102 10.6 Zero-sequence quantiti

37、es 108 10.7 Testing procedures and parameter determination for positive-sequence resistance for a synchronous machine. 113 10.8 Additional miscellaneous steady-state tests for synchronous machines . 114 11. Tests for evaluating transient or subtransient characteristic values 117 11.1 General 117 11.

38、2 Reasons for tests with sudden changes to armature or field electrical circuits . 117 11.3 Methodology for conducting short-circuit current tests 117 11.4 Procedural details and instrumentation for short-circuit test data extraction 118 11.5 Precautions required in conducting short-circuit tests 11

39、9 11.6 Theoretical background for determining short-circuit reactance and time constant values 120 11.7 Tests for transient and subtransient direct-axis parameters (reactance values). 121 11.8 Determination of transient and subtransient reactance values based on method 1, method 2, and method 3 in 1

40、1.7 125 11.9 Tests for direct-axis transient and subtransient short-circuit time constants. 129 11.10 Tests for direct-axis transient and subtransient open-circuit time constants. 131 11.11 Determining short-circuit armature time constant, a. 135 11.12 Computerized implementation of the general proc

41、edures noted in 11.7 through 11.11 137 11.13 Stationary or unbalanced tests for determining Xd, X2, or Xq. 143 x Copyright 2010 IEEE. All rights reserved. 12. Standstill frequency response (SSFR) testing. 148 12.1 General considerations and basic theory. 148 12.2 Testing conditions for SSFR procedur

42、es and instrumentation requirements 152 12.3 Test procedures. 157 12.4 Interpretation of test data 165 12.5 Suggested procedure for development of a third-order model 168 Annex A (informative) Bibliography 179 Annex B (normative) Nomenclature . 183 Annex C (informative) Discussion on leakage and Pot

43、ier reactances . 184 Annex D (informative) Example of calculation of p.u. field current (IF) 185 Annex E (informative) Quadrature-axis transient or subtransient tests. 186 Annex F (informative) Generator load rejection tests . 190 Annex G (informative) Magnetic nonlinearity 198 Annex H (informative)

44、 Alternative approach to model development . 201 1 Copyright 2010 IEEE. All rights reserved. IEEE Guide for Test Procedures for Synchronous Machines Part IAcceptance and Performance Testing IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protectio

45、n. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all p

46、ublications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This guide con

47、tains instructions for conducting generally applicable and accepted tests to determine the performance characteristics of synchronous machines. Although the tests described are applicable in general to synchronous generators, synchronous motors (larger than fractional horsepower), synchronous conden

48、sers, and synchronous frequency changers, the descriptions make reference primarily to synchronous generators and synchronous motors. The tests described may be applied to motors and generators, as needed, and no attempt is made to partition this guide into clauses applying to motors and clauses app

49、lying to generators. It is not intended that this guide shall cover all possible tests or tests of a research nature, but only general methods that may be used to obtain performance data. The schedule of factory and field tests, which may be required on new equipment, is normally specified by applicable standards or by contract specifications. This guide should not be interpreted as requiring any specific test in a given transaction or implying any guarantee about specific performance indices or operating conditions. The term specified conditions for te