IEEE 120-1989 en Master Test Guide for Electrical Measurements in Power Circuits《电源电路电气测量的基本试验导则》.pdf

1、ANSI/IEEE Std 120-1989(Revision of IEEE Std. 120-1955and ASME PTC 19.6-1955)An American National StandardIEEE Master Test Guide for Electrical Measurements in Power CircuitsSponsorPower Systems Instrumentation and Measurements Committeeof theIEEE Power Engineering SocietyApproved May 22, 1989IEEE St

2、andards BoardApproved October 20, 1989American National Standards Institute Copyright 1989 byThe Institute of Electrical and Electronics Engineers, Inc345 East 47th Street, New York NY 10017-2394, USANo part of this publication may be reproduced in any form, in an electronic retrieval system or othe

3、rwise, without theprior written permission of the publisher.iiIEEE Standards documents are developed within the Technical Committees of the IEEE Societies and the StandardsCoordinating Committees of the IEEE Standards Board. Members of the committees serve voluntarily and withoutcompensation. They a

4、re not necessarily members of the Institute. The standards developed within IEEE represent aconsensus of the broad expertise on the subject within the Institute as well as those activities outside of IEEE whichhave expressed an interest in participating in the development of the standard.Use of an I

5、EEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that there are no otherways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEEStandard. Furthermore, the viewpoint expressed at the time a standard is app

6、roved and issued is subject to changebrought about through developments in the state of the art and comments received from users of the standard. EveryIEEE Standard is subjected to review at least once every five years for revision or reaffirmation. When a document ismore than five years old, and ha

7、s not been reaffirmed, it is reasonable to conclude that its contents, although still ofsome value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they havethe latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome

8、from any interested party, regardless of membership affiliationwith IEEE. Suggestions for changes in documents should be in the form of a proposed change of text, together withappropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of stand

9、ards as they relate tospecific applications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiateaction to prepare appropriate responses. Since IEEE Standards represent a consensus of all concerned interests, it isimportant to ensure that any interpretat

10、ion has also received the concurrence of a balance of interests. For this reasonIEEE and the members of its technical committees are not able to provide an instant response to interpretation requestsexcept in those cases where the matter has previously received formal consideration.Comments on stand

11、ards and requests for interpretations should be addressed to:Secretary, IEEE Standards BoardP.O. Box 1331445 Hoes LanePiscataway, NJ 08855-1331USAIEEE Standards documents are adopted by the Institute of Electrical and Electronics Engineers without regard towhether their adoption may involve patents

12、on articles, materials, or processes. Such adoptions does not assumeany liability to any patent owner, nor does it assume any obligation whatever to parties adopting the standardsdocuments.iiiForeword(This Foreword is not a part of IEEE Std 120-1989, IEEE Master Test Guide for Electrical Measurement

13、s in Power Circuits.)This updated version is based on the material submitted for the abandoned 1981 draft plus material submitted duringthe 198587 reinstatement of Working Group 120.The basic approach for the new organization is to provide general guidelines intended to assist nonelectrical engineer

14、sand technicians involved in quality control, acceptance, and prototype testing where electrical instrumentation is themain tool for measuring, observing, or recording physical quantities.The contributors strived to reflect in the new text the many improvements and novel techniques developed in mode

15、rninstrumentation in the last decades.A list of complete definitions characterizing voltage/current waves generated or injected by modern converters isprovided.Digital meters are presented in the context of all the measurements described in this standard when applicable.Since the new instrumentation

16、 based on digital logic is most sensitive to electromagnetic noise, special sections, 1.7and 1.8, were dedicated to grounding and shielding.This updated edition also contains the following new material:Chapter 6, Measurements of Magnetic Quantities in Power CircuitsSection 7.1, TransducersSection 7.

17、2, OscilloscopesSection 7.3, Analog RecordersSection 7.4, Power SuppliesSection 8.1, Computer-Based TechniquesSection 8.2, Optical Fibers in InstrumentationThe membership of the 1985/7 Working Group 120 is as follows:A. E. Emanuel, Chair D. McAuliff (Editorial Coordinator)Chapter CoordinatorsChapter

18、 1: W. J. M. MooreChapter 2: O. PetersonsChapter 3, 6, 8: A. E. EmanuelChapters 4, 5, 7: D. McAuliffivOther Contributors:S. W. CramptonL. T. FitchA. A. GirgisR. HopkinsF. J. LevitskyD. C. McDonaldN. M. OldhamR. W. ShoemakerE. SoR. H. StevensThe following persons were on the balloting committee that

19、approved this document for submission to the IEEEStandards Board:A. AbramowitzS. A. AnnestrandJ. M. BelangerJ. M. CarrG. CarraraS. W. CramptonF. C. CreedA. E. EmanuelR. E. HebnerR. HopkinsP. B. Jacob, Jr.W. E. Keagle, Jr.J. A. KiseS. R. KnudsenF. R. KotterJ. KuffelF. J. LevitskyR. MalewskiD. McAulif

20、fT. R. McCombR. H. McKnightW. J. M. MooreJ. H. MoranD. MukhedkarO. PetersonsR. ReidP. H. ReynoldsW. E. RichR. L. RichardsonH. M. SchneiderE. SoJ. M. VanderleckD. L. WhiteheadWhen the IEEE Standards Board approved this standard on May 22, 1989, it had the following membership:Dennis Bodson, Chair Mar

21、co W. Migliaro, Vice Chair Andrew G. Salem, Secretary Arthur A. BlaisdellFletcher J. BuckleyAllen L. ClappJames M. DalyStephen R. DillonDonald C. FleckensteinEugene P. FogartyJay Forster*Thomas L. HannanKenneth D. HendrixTheodore W. Hissey, Jr.John W. HorchDavid W. HutchinsFrank D. KirschnerFrank C.

22、 KitzantidesJoseph L. Koepfinger*Edward LohseJohn E. May, Jr.Lawrence V. McCallL. Bruce McClungDonald T. Michael*Richard E. MosherStig NilssonL. John RankineGary S. RobinsonDonald W. Zipse*Member EmeritusvCLAUSE PAGE1. Chapter 1General 11.1 Purpose. 11.2 Scope 11.3 Units. 11.4 Definitions 21.5 Wavef

23、orm Parameters (see Table 1-1). 31.6 Operating Principles of Measuring Instrument 71.7 Grounding 111.8 Magnetic and Capacitive Interferences and Their Reduction 131.9 Terms and Definitions for Performance Evaluation of a Measurement Process or Instrument 171.10 Transportation 201.11 Safety . 201.12

24、Bibliography. 202. Chapter 2Voltage and Current Measurements 222.1 Introduction 222.2 Voltage Measurements. 222.3 Current Measurements . 292.4 Instrument Transformers 342.5 Bibliography. 453. Chapter 3Power, Energy, and Power Factor .463.1 Power Measurement. 463.2 Energy Measurements 543.3 Power Fac

25、tor and Phase-Angle Measurement . 583.4 Transducers 593.5 Bibliography. 594. Chapter 4Frequency Measurements604.1 Description. 604.2 Methods of Measuring Frequency . 604.3 Calibration 625. Chapter 5Impedance Measurements .635.1 Description. 635.2 Determination of Impedance 635.3 Effective Resistance

26、. 635.4 Effective Reactance 645.5 Difficulties Encountered in Making Measurements 645.6 Bridge Methods 655.7 Bibliography. 666. Chapter 6Measurements of Magnetic Quantities in Power Circuits.676.1 Description. 676.2 Measurements in Air 676.3 Measurements in Electromagnets 69viCLAUSE PAGE6.4 Measurem

27、ents in Permanent Magnets . 696.5 Measurements of B, , and H in Samples of Magnetic Materials706.6 Measurement of Permeability in Electrical Steels or Magnet Iron 707. Chapter 7Ancillary Instruments and Equipment.717.1 Electrical Transducers 717.2 Oscilloscopes . 747.3 Analog Recording Meters and De

28、vices . 787.4 Power Supplies. 817.5 Bibliography. 868. Chapter 8New Technology .878.1 Computer-based Techniques 878.2 Optical Fibers in Instrumentation 918.3 Bibliography. 92Copyright 1989 IEEE All Rights Reserved 1IEEE Master Test Guide for Electrical Measurements in Power Circuits1. Chapter 1Gener

29、al1.1 PurposeIt is the purpose of this guide to give instructions for those measurements of electrical quantities that are commonlyneeded in determining the performance characteristics of electric machinery and equipment. The choice of themeasurement method and instrument systems to be used depends

30、on the purpose of the measurement, the accuracyrequired, the time and testing equipment available, and the nature of the circuit.1.2 ScopeThe methods given here relate to measurements, as made with either analog or digital indicating or integratinginstruments, of power, energy, voltage, and current,

31、 in dc or ac rotating machines, transformers, induction apparatus,arc and resistance heating equipment, mercury arc, thermionic, or solid-state rectifiers and inverters. Measurementsmade with supplementary instruments and devices are also included. This guide does not deal with measurements ofresist

32、ance or temperature that are often included in determining the performance characteristics of electric machinery.Instruments for these latter measurements will be found in the specific publications dealing with the particularmeasurement, such as IEEE Std 118-1978, IEEE Standard Test Code for Resista

33、nce Measurements 41, and IEEE Std119-1974, IEEE Recommended Practice for General Principles of Temperature Measurement as Applied to ElectricalApparatus 5.1.3 UnitsThe measurement of any electrical quantity is the comparison of that quantity with another quantity of the same kindthat has been chosen

34、 as a unit. The fundamental or basic electrical units are based on the International System of Units(SI), which is a modern version of the MKSA (meter, kilogram, second, ampere) system. For further details see ansi/ieee 268-1982, IEEE Standard for Metric Practice 3. In magnetic measurements it is th

35、e common practice to use thecgs (centimeter-gram-second) system. The instrument readouts are frequently in the cgs units. Hence, in Chapter 6 ofthis guide both units are used and a conversion table is provided.1The numbers in brackets correspond to those of the bibliography at the end of this chapte

36、r.2 Copyright 1989 IEEE All Rights ReservedIEEE Std 120-1989 IEEE MASTER TEST GUIDE FOR1.3.1 International System of UnitsThe units of the electrical quantities are as follows:1.4 Definitions1.4.1 RMS Value: where yrms is the root-mean-square (rms) value of y, y is an instantaneous value of a period

37、 function, a is any instantof time, and T is the period.The rms value of a periodic waveform may also be expressed as the square root of the sum of the squares of the Fouriercomponents of y.where A1, A2, An are the rms values of the fundamental component, second harmonic, and nth harmonic, respectiv

38、ely.1.4.2 Average Absolute Value: where yAAV is the average absolute value (often called simply the average) of y, a is any instant of time, and T is theperiod.1.4.3 Peak Value: The peak value yp is the largest absolute value of y.1.4.4 Form Factor: The form factor (ff) of a periodic function is the

39、 ratio of the rms value to the average absolute valueff = yrms/yAAV1.4.5 Crest Factor: The crest factor (cf) of a periodic function is the ratio of the peak value to the rms valuecf = yp/yrmsQuantity Name of SI Unit SymbolElectric potential, potential difference, tension, electromotive forcevolt VEl

40、ectric current ampere AElectric charge (quantity) coulomb CPower watt WEnergy joule (watt-second) JCapacitance farad FInductance henry HFrequency hertz HzResistance ohm yrms1T- y2dtaaT+12=yrmsA12 A22 An2+12=yAAV1T- y dtaaT+=Copyright 1989 IEEE All Rights Reserved 3ELECTRICAL MEASUREMENTS IN POWER CI

41、RCUITS IEEE Std 120-19891.4.6 Distortion Factor: The distortion factor df is defined aswhere A1 is the rms value of the fundamental component and A2 to An are the rms values of the harmonic components.1.4.7 Deviation Factor: The deviation factor is the ratio of the maximum difference between corresp

42、onding ordinatesof the wave and of the equivalent sine wave to the maximum ordinate of the equivalent sine wave when the waves aresuperposed in such a way as to make this maximum difference as small as possible. The equivalent sine wave isdefined as having the same frequency and the same rms value a

43、s the wave being tested.1.4.8 Apparent (Phasor) Power: S = VIwhere S is the apparent power, V is the rms value of the voltage, and I is the rms value of the current.1.4.9 Average Active Power: where P is the average active power at any time t0, p = vi is the instantaneous power, v and i are the inst

44、antaneousvalues of voltage and current, and T is the period.If both the voltage and current are sinusoidal and of the same period, P is given byP = VI cos where V and I are the rms values of voltage and current respectively and is the phase angle separating V and I.The general expression for polypha

45、se active power in a system with m phases and n harmonics involves a summationover all harmonics in accordance with the above equation and a summation over all phases.1.4.10 Reactive Power: The reactive power Q is defined as the square root of the square of the apparent power S minusthe square of th

46、e active power P.Q = (S2 P2)1/2Reactive power is developed when there are inductive, capacitive, or nonlinear elements in the system. It does notrepresent useful energy that can be extracted from the system but it can cause increased losses and excessive voltagepeaks.1.5 Waveform Parameters (see Tab

47、le 1-1)1.5.1 Sine Wavewhere = 2pidfAk2A12-k 2=n12=P 1T- p dtt0 T 2t0 T 2+=yrms1T- yp tsin()2dt0T12 yp2- 0.7071yp=yAAV1T- yp tsindt0T 2yppi- 0.6366yp=f yp2- 2yppi- pi22- 1.1107=4 Copyright 1989 IEEE All Rights ReservedIEEE Std 120-1989 IEEE MASTER TEST GUIDE FOR1.5.2 Square Waveyrms = yAAV = ypff = c

48、f = 11.5.3 Triangular Wavecfyp yp2- 1.4142=yrmsyp2 4T- t2dt0T 412 yp3- 0.5774yp=yAAVyp 4T- t dt0T 4 0.5yp=f 0.5774yp0.5yp- 1.1548=cfyp0.5774yp- 1.7319=Copyright 1989 IEEE All Rights Reserved 5ELECTRICAL MEASUREMENTS IN POWER CIRCUITS IEEE Std 120-19891.5.4 Sine Wave Distorted with 30% Third Harmonic

49、 Shifted by (This is the waveform influence test specified in the ANSIC39 series 2.)(for = 0, maximum AAV)(for = 180, minimum AAV)where T = 2pi and yp is the peak value of the fundamental component,cf ( = 0) = 1.2460ff ( = 180) = 1.2883cf ( = 180) = 1.7610yrmsyp22-0.3yp2-+120.7382yp=yAAVypT- tsin0.33t +()sin+dt0T=yppi- 20.2cos+=2.2yppi- 0.7003yp=1.8yp