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IEEE 1205-2014 en Guide for Assessing Monitoring and Mitigating Aging Effects on Electrical Equipment Used in Nuclear Power Generating Stations and Other Nuclea.pdf

1、 IEEE Std 1205-2014 (Revision of IEEE Std 1205-2000) IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Electrical Equipment Used in Nuclear Power Generating Stations and Other Nuclear Facilities Sponsor Nuclear Power Engineering Committee of the IEEE Power and Energy Society Appr

2、oved 27 March 2014 IEEE-SA Standards Board Abstract: Guidelines for assessing, monitoring, and mitigating aging degradation effects on electrical equipment used in nuclear power generating stations and other nuclear facilities are provided. This guide also includes informative annexes on aging mecha

3、nisms, environmental monitoring, condition monitoring, aging program essential attributes, and examples demonstrating the application of the basic principles described in this guideline. Keywords: activation energy, aging, aging assessment, aging effects, aging management, Arrhenius, condition monit

4、oring, degradation, environmental monitoring, IEEE 1205, license renewal, radiation aging model, residual life, stressor, thermal aging modelThe Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Institute of Electrical and Elect

5、ronics Engineers, Inc. All rights reserved. Published 16 May 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition,

6、IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measur

7、e, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about through developments in the state of the art and comments received from users of t

8、he standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standa

9、rds document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIREC

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11、NCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of docu

12、ments in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manua

13、l shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied on as, a formal position of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall m

14、ake it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. Howeve

15、r, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests,

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17、s where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the foll

18、owing address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicabl

19、e regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be const

20、rued as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and u

21、se in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of th

22、e appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer

23、Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be

24、 aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any am

25、endments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflec

26、t the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the

27、 IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be

28、 accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by

29、 patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement

30、is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that

31、 are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for co

32、nducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are exp

33、ressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2014 IEEE. All rights reserved. vi Participants At the time th

34、is guide was submitted to the IEEE-SA Standards Board for approval, the Aging Assessment Working Group had the following membership: Rebecca L. Steinman, Chair Suresh Channarasappa, Vice Chair George Kyle, Secretary George A. Ballassi Ramesh Boddula Nissen M. Burstein Howard Butler Hamidreza Heidari

35、safa Charles Hills David A. Horvath Steven Hutchins Robert Konnik James K. Liming Kirklyn Melson Sheila Ray John A. Stevens Leina Tocchetto At the time this guide was balloted, Subcommittee 3 on Operations, Maintenance, Aging, Testing and Reliability had the following membership: James K. Liming, Ch

36、air Yvonne Williams, Vice Chair Tom Crawford, Secretary Gopal Aravapalli George A. Ballassi John Beatty Thomas Carrier Suresh Channarasappa Marie Cuvelier John Erinc Edward Eustace Hamidreza Heidarisafa* Sharon Honecker Steven Hutchins Peter J. Kang Jacob Kulangara Kirklyn Melson Edward R. Mohtashem

37、i Joseph Napper James Parello Vish Patel Sheila Ray Ted Riccio Glen E. Schinzel Rebecca L. Steinman John A. Stevens John Taylor* * Nonvoting members At the time this guide was balloted, the Nuclear Power Engineering Committee had the following membership: George A. Ballassi, Chair James Parello, Vic

38、e Chair Stephen A. Fleger, Secretary Thomas Koshy, Secretary Elect Satish Aggarwal Ijaz Ahmad Dheya Al-Othmany George Attarian Farouk D. Baxter * Royce Beacom Mark D. Bowman Daniel F. Brosnan* Nissen M. Burstein Keith Bush Robert C. Carruth John P. Carter Suresh Channarasappa Dennis Dellinger David

39、R. Desaulniers John Disosway Walter F. Emerson Kenneth Fleischer Robert J. Fletcher Robert Francis Robert B. Fuld David Gladey James F. Gleason Dale T. Goodney Brit Grim* Robert Hall Kuljit Hara Daryl Harmon David Herrell Dirk C. Hopp Christopher Kerr Bok-Ryul Kim James K. Liming Bruce Lord John D.

40、MacDonald J. Scott Malcolm Alexander Marion* Kenneth Miller Michael H. Miller Edward R. Mohtashemi Yasushi Nakagawa Warren Odess-Gillett Ted Riccio Glen E. Schinzel Rebecca L. Steinman vii Copyright 2014 IEEE. All rights reserved. James E. Stoner * Marek Tengler James E. Thomas Masafumi Utsumi Micha

41、el Waterman Edward Wenzinger John White Yvonne Williams Paul L. Yanosy Won Young Yun Oon-Pyo Zhu* Nonvoting members The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Satish Aggarwal Geo

42、rge A. Ballassi Farouk D. Baxter Robert Beavers William Bloethe Thomas Brewington Daniel F. Brosnan Nissen M. Burstein Suresh Channarasappa Weijen Chen Tom Crawford Marie Cuvelier Edward Eustace Wells Fargo Stephen A. Fleger Rabiz Foda Doaa Galal Frank Gerleve Randall Groves Daryl Harmon Hamidreza H

43、eidarisafa Charles Hills Werner Hoelzl David A. Horvath Greg Hostetter Steven Hutchins Yuri Khersonsky Chad Kiger J. Koepfinger Robert Konnik George Kyle Greg Luri John D. MacDonald John McAlhaney Kirklyn Melson John Merando Michael Newman Mirko Palazzo Jan Pirrong Robert Queenan Ted Riccio Fredrick

44、 Roy Bartien Sayogo Glen E. Schinzel James Smith Rebecca L. Steinman John A. Stevens Gary Stoedter Michael Swearingen John Vergis John Webb Yvonne Williams James Wilson When the IEEE-SA Standards Board approved this guide on 27 March 2014, it had the following membership: John Kulick, Chair Jon Walt

45、er Rosdahl, Vice-chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Phillippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David Law Hung Ling Oleg Logvinov Ted Olsen Glenn Parsons Ron P

46、eterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Do

47、cument Development Malia Zaman IEEE Standards Program Manager, Technical Program Development viii Copyright 2014 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1205-2014, IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Electrical Equipment Use

48、d in Nuclear Power Generating Stations and Other Nuclear Facilities. In 1988, the Nuclear Power Engineering Committee (NPEC) of IEEE recognized a need for, and directed Working Group 3.4 to prepare a guide for, providing guidance and promoting uniformity in the evaluation methods used in aging asses

49、sment, monitoring, and mitigation. The working groups effort culminated in 1993 with the original issue of IEEE Std 1205, which reflected the industry focus on identifying and addressing aging mechanisms. The guide was revised in 2000 to incorporate industry feedback and bring the approaches discussed in the guide into closer conformance with the industry philosophy at that time and then was reaffirmed in 2007. IEEE Std 1205-2014 is the result of a thorough review of IEEE Std 1205-2000 and of present practices in aging management of electrical equipment. This revision incorpor

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