IEEE 1434-2014 en Guide for the Measurement of Partial Discharges in AC Electric Machinery《交流电机中局部放电测量的试用指南》.pdf

1、 IEEE Guide for the Measurement of Partial Discharges in AC Electric Machinery IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society Sponsored by the Electric Machinery Committee and the IEEE Dielectrics and Electrical Insulation Society Sponsored by the Standards Committee IE

2、EE Std 1434-2014 (Revision of IEEE Std 1434-2000) IEEE Std 1434-2014 (Revision of IEEE Std 1434-2000) IEEE Guide for the Measurement of Partial Discharges in AC Electric Machinery Sponsor Electric Machinery Committee of the IEEE Power and Energy Society and the Standards Committee of the IEEE Dielec

3、trics and Electrical Insulation Society Approved 03 November 2014 IEEE-SA Standards Board Abstract: A review of the nature of partial discharge in machine windings, how it can be measured under both off-line and on-line conditions, how it can be measured for individual form wound coils or bars, and

4、the significance and limitations of the measured values are covered in this standard. Keywords: ac electric machine windings, electrical insulation, form-wound bars, form-wound coils, IEEE 1434, partial discharge The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY

5、 10016-5997, USA Copyright 2014 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 4 December 2014. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness for a particular purpose; non-infringement; and quality, a

6、ccuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE standard is wholly voluntary. The existence of an IEEE s

7、tandard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is approved and issued is subject to change brought about throug

8、h developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or entity nor is IEEE undertaking to perform any duty owed by

9、 any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of a competent professional in determining the appropriaten

10、ess of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND O

11、N ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AND REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Tra

12、nslations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Official statements A statement, written or oral, that is n

13、ot processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal position of IEEE. At lectures, symposia, seminars, or educa

14、tional courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments for revision of IEEE Standards documents are welcome fro

15、m any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a proposed change of text, together with appropriate supportin

16、g comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its societies and Standards Coordinating Committees are not abl

17、e to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in revisions to an IEEE standard is welcome to join the rele

18、vant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provis

19、ions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that i

20、s not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE and are adopted for a wide variety of both public and priv

21、ate uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by public authorities and private users, IEEE does not waive

22、any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use or individual, non-commercial use only. To arrange for p

23、ayment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Up

24、dating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any poin

25、t in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and has not undergone a revision process, it is reasonable to

26、conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a given document is the current edition and whether it has bee

27、n amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs standards development process, visit the IEEE-SA Website at

28、http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility tha

29、t implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a s

30、tatement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without com

31、pensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for i

32、dentifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing a

33、greements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Associa

34、tion. Participants At the time this IEEE guide was completed, the IEEE P1434 Working Group had the following membership: William McDermid, Chair David Agnew Kevin Alewine Kevin Becker Stefano Bomben Andrew Brown Donald Campbell William Chen Douglas Conley Ian Culbert Shawn Filliben Nancy Frost Paul

35、Gaberson Michel Gagn Bal Gupta Richard Gupton Richard Huber Claude Hudon Aleksandr Khazanov Amir Khosravi Thomas Klamt Laurent Lamarre Jim Lau Gerhard Lemesch David McKinnon Charles Millet Beant Nindra Sophie Nol Ramtin Omranipour Hlne Provencher Jeffrey Sheaffer Reza Soltani Greg Stone Remi Trembla

36、y Chuck Wilson Hugh Zhu The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Martin Baur Thomas Bishop William Bloethe Andrew Brown Gustavo Brunello Donald Campbell Matthew Campbell Weijen Chen Jerry Corkr

37、an Ian Culbert Jorge Fernandez Daher Matthew Davis Gary Donner James Dymond Sudath Fernando Paul Forquer Rostyslaw Fostiak Nancy Frost Paul Gaberson Doaa Galal Alexander Glaninger-Katschnig Glenn Griffin J. Travis Griffith Randall Groves Bal Gupta Ajit Gwal Paul Hamer Gary Heuston Werner Hoelzl Davi

38、d Horvath John Kay Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam James Lau Michael Lauxman Daniel Levin William Lockley William McCown William McDermid David McKinnon Don McLaren James Michalec T. David Mills Sujeet Mishra Arthur Neubauer Michael Newman Lorraine Padden Alvaro Portillo Iulian Prof

39、ir Johannes Rickmann Bartien Sayogo Veselin Skendzic Reza Soltani Greg Stone Michael Swearingen Remi Tremblay John Vergis Donald Voltz Yingli Wen Kenneth White Roger Wicks James Wilson Dean Yager Hugh Zhu Copyright 2014 IEEE. All rights reserved. viWhen the IEEE-SA Standards Board approved this guid

40、e on 03 November 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplin Stephen Dukes Jean-Philippe Faure Gary Hoffman Michael Janezic Jeffrey Katz Jose

41、ph L. Koepfinger* David J. Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Petersen Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representati

42、ve Michael Janezic, NIST Representative Catherine Berger IEEE-SA Content Publishing Malia Zaman IEEE-SA Technical Community Program Copyright 2014 IEEE. All rights reserved. viiIntroduction This introduction is not part of IEEE Std 1434-2014, IEEE Guide for the Measurement of Partial Discharges in A

43、C Electric Machinery. Partial discharge (PD) measurements have been made on the windings of ac electric machinery for over 40 years. The electrical insulation of these windings may be prone to PD activity as a result of internal delaminations and of surface or slot discharge. These kinds of PD activ

44、ity, when the machine is in normal operation, can result in significant deterioration over a period of time. Experience has indicated that PD measurements can be useful for assessing the condition of complete windings as well as of individual formwound coils and bars. This guide provides a review of

45、 the nature of PD in machine windings, how it can be measured under both off-line and on-line conditions, how it can be measured for individual form-wound coils or bars, and the significance and limitations of the measured values. IEC 60505 (2004-10)adefines the various factors that influence the pe

46、rformance of electrical insulation systems. These are the thermal, electrical, environmental, and mechanical stress factors. Stator winding insulation systems of ac electric machinery experience thermal, electrical, mechanical, and environmental stresses during operation. These stresses, individuall

47、y or in combination, will age the insulation system and may lead to delamination of the groundwall insulation, abrasion of the outer semiconducting (Faraday) shield, loosening of the wedging system, and other potential deterioration mechanisms. Sometimes, as a result of the initial manufacturing pro

48、cess, or because of the subsequent aging, PDs may occur adjacent to the high voltage conductor, in the internal voids of the groundwall, on the outer surface of the coil/bar in the slot, or in the endwinding region. These various PD sites have the potential to cause deterioration to a greater or les

49、ser extent and, in some cases, may ultimately result in an in-service failure. The number, magnitude, and polarity of these PDs can be a direct indication of the condition of the insulation system. However, the trend of these parameters over time is frequently most valuable. Care must be taken that the effects of operating and environmental conditions and test procedures are considered. aIEC publications are available from the International Electrotechnical Commission (http:/www.iec.ch/). IEC publications are also available in the United States from the American National S