IEEE 1450 2-2002 en IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450 -1999) for DC Level Specification (IEEE Computer Soci.pdf

1、 IEC 62527Edition 1.0 2007-11INTERNATIONAL STANDARD Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification IEC 62527:2007(E)IEEE Std.1450.2-2002IEEE 1450.2THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2007 IEEE All rights reserved. IEEE is a registered trad

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29、 standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. IEC 62527:2007(E)IEEE 1450.2-2002(E) 5 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Standard for Extensions to Standard Test Interface Language

30、(STIL) (IEEE Std 1450TM-1999)for DC Level SpecificationSponsorTest Technology Standards Committeeof theIEEE Computer SocietyApproved 11 December 2002IEEE-SA Standards BoardAbstract: This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels.STIL language constructs are de

31、fined to specify the DC conditions necessary to execute digital vec-tors on automated test equipment (ATE). STIL language extensions include structures for: (a) spec-ifying the DC conditions for a device under test; (b) specifying DC conditions either globally, bypattern burst, by pattern, or by vec

32、tor; (c) specifying alternate DC levels; and (d) selecting DC levelsand alternate levels within a period, much the same as timed format events.Keywords: automated test equipment (ATE), comparator, DC levels, device power supply (DPS),device under test (DUT), driver, driver termination, dynamic load,

33、 functional test, parametric mea-surement unit (PMU), power sequence, slew rate, voltage clampIEC 62527:2007(E)IEEE 1450.2-2002(E) 6 Published by IEC under licence from IEEE. 2002 IEEE. All rights reserved.IEEE Introductiong54g87g68g81g71g68g85g71g3g55g72g86g87g3g44g81g87g72g85g73g68g70g72g3g47g68g8

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