IEEE 1450 SERIES-1999 en Standard Test Interface Language (STIL) for Digital Test Vector Data (IEEE Computer Society).pdf

1、IEEE Std 1450-1999(R2011) IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data Sponsor Test Technology Standards Committee of the IEEE Computer Society Approved 18 March 1999 Reaffirmed 16 June 2011 IEEE-SA Standards BoardApproved 16 November 1999Reaffirmed 25 July 2012IEEE-SA S

2、tandards Board Abstract: Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern,

3、format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) sup-ports the volume of test vector data generated from structured tests. Keywords: automatic test pattern generator (ATPG), built-in self-test (BIST), computer-aided engineering (CAE), cycl

4、ize, device under test (DUT), digital test vectors, event, functional vectors, pattern, scan vectors, signal, structural vectors, timed event, waveform, waveshape _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 1999 by the Institute

5、 of Electrical and Electronics Engineers, Inc. All rights reserved. Published 1 September 1999. Printed in the United States of America. Print: ISBN 0-7381-1646-7 SH94734 PDF: ISBN 0-7381-1647-5 SS94734 No part of this publication may be reproduced in any form, in an electronic retrieval system or o

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24、 also be obtained through the Copyright Clearance Center. Copyright 1999 IEEE. All rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 1450-1999, IEEE Standard Test Interface Language (STIL) for Digital TestVector Data.)Standard Test Interface Language (STIL) was initially dev

25、eloped by an ad-hoc consortium of test equipmentvendors, computer-aided engineering (CAE) and computer-aided design (CAD) vendors, and integrated cir-cuit (IC) manufacturers, to address the lack of a common solution for transferring digital test data from thegeneration environment to the test equipm

26、ent.The need for a common interchange format for large volumes of digital test data was identified as an overrid-ing priority for the work; as such, the scope of the work was constrained to those aspects of the test environ-ment that contribute significantly to the volume issue, or are necessary to

27、support the comprehension of thatdata. Binary representations of data were a key consideration in these efforts, resulting in a proposal to incor-porate the compression of files as part of this standard.Limiting the scope of any standards project is a difficult thing to do, especially for a room ful

28、l of engineers.However, issues that did not impact the scope as identified were dropped from consideration in this versionof the standard. Subclause 1.1 covers, specifically, the capabilities that are not intended to be part of this firststandard.Early work in this consortium consisted of identifyin

29、g the requirements necessary to address this problemand reviewing existing options and languages in the industry. All options proposed fell short of addressingthe requirements, and the consortium started to define a new language. This work was executed with heavyleverage from some existing languages

30、 and environments, and STIL owes much to the groundwork estab-lished by these other languages.ParticipantsWhen the STIL Working Group approved this standard, it had the following membership:Greg Maston, Co-chairTony Taylor, Co-chairThe technical subgroup consisted of the following members:Other work

31、ing group members were as follows:Dave DowdingBrady HarveyBrad HinckleLarry MoranGary MurrayChris NelsonDon OrganMike PurtellJim WardGregg WilderSrinivas AjjarapuPhil BarchAjit BhaveFred BernecheJoe CarboneDon DenburgGivargis A. DanialyTom MunnsEric ParkerFrank PeytonGary RainesTim WagnerTom William

32、sPeter WohlStefan Zschiegneriv Copyright 1999 IEEE. All rights reserved.The following members of the balloting committee voted on this standard:The Working Group thanks those companies that contributed concepts and ideas to this effort, in addition topeople and time. These contributions helped to de

33、fine the language presented in this standard. In particular,the Working Group would like to thank: LTX Corporation, for providing information about the enVisionenvironment; Motorola, Incorporated, for providing information about the Universal Test Interface Code(UTIC); Test Systems Strategies, Incor

34、porated, for providing information about the Waveform GenerationLanguage (WGL); and Texas Instruments, Incorporated, for providing information about the Test Descrip-tion Language (TDL).When the IEEE-SA Standards Board approved this standard on 18 March 1999, it had the followingmembership:Richard J

35、. Holleman, Chair Donald N. Heirman, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included is the following nonvoting IEEE-SA Standards Board liaison:Robert E. HebnerJanet RutiglianoIEEE Standards Project EditorPhil BarchKenneth M. ButlerJoe CarboneDonald DenburgDave DowdingGrady GilesGary

36、 GinnGary HancockBrady HarveyMitsuaki IshikawaBrion KellerFadi MaamariGregory A. MastonColin MaunderLarry L. MoranTom MunnsWayne NeedhamChris NelsonJim OReillyFrank PeytonMike PurtellHira RangaGordon RobinsonJohn W. SheppardWilliam R. SimpsonTony TaylorJon UdellJim WardGregg WilderPeter WohlStefan Z

37、schiegnerSatish K. AggarwalDennis BodsonMark D. BowmanJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Ruben D. GarzonJames H. GurneyLowell G. JohnsonRobert J. KennellyE. G. “Al” KienerJoseph L. Koepfinger*L. Bruce McClungDaleep C. MohlaRobert F. MunznerLouis-Franois PauRonald C. PetersenGe

38、rald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoHans E. WeinrichDonald W. ZipseCopyright 1999 IEEE. All rights reserved. vContents1. Overview 11.1 Scope 31.2 Purpose. 42. References 43. Definitions, acronyms, and abbreviations 43.1 Definitions 43.2 Acronyms and abbreviations 74. Structure of t

39、his standard . 75. STIL orientation and capabilities tutorial (informative)85.1 Hello Tester 85.2 Basic LS245. 135.3 STIL timing expressions/”Spec” information 175.4 Structural test (scan) 225.5 Advanced scan . 265.6 IEEE Std 1149.1-1990 scan . 325.7 Multiple data elements per test cycle. 375.8 Patt

40、ern reuse/direct access test. 415.9 Event data/non-cyclized STIL information . 456. STIL syntax description. 556.1 Case sensitivity 556.2 Whitespace. 556.3 Reserved words 556.4 Reserved characters . 576.5 Comments 586.6 Token length 586.7 Character strings 586.8 User-defined name characteristics . 5

41、96.9 Domain names . 596.10 Signal and group name characteristics.606.11 Timing name constructs. 606.12 Number characteristics. 606.13 Timing expressions and units (time_expr). 616.14 Signal expressions (sigref_expr) 636.15 WaveformChar characteristics. 646.16 STIL name spaces and name resolution. 65

42、7. Statement structure and organization of STIL information . 677.1 Top-level statements and required ordering 687.2 Optional top-level statements 707.3 STIL files . 70vi Copyright 1999 IEEE. All rights reserved.8. STIL statement. 708.1 STIL syntax 708.2 STIL example. 709. Header block 719.1 Header

43、block syntax. 719.2 Header example . 7110. Include statement . 7110.1 Include statement syntax 7210.2 Include example. 7210.3 File path resolution with absolute path notation 7210.4 File path resolution with relative path notation . 7211. UserKeywords statement . 7311.1 UserKeywords statement syntax

44、 7311.2 UserKeywords example. 7312. UserFunctions statement 7312.1 UserFunctions statement syntax 7412.2 UserFunctions example 7413. Ann statement 7413.1 Annotations statement syntax 7413.2 Annotations example . 7414. Signals block 7414.1 Signals block syntax 7514.2 Signals block example . 7715. Sig

45、nalGroups block 7715.1 SignalGroups block syntax 7715.2 SignalGroups block example . 7815.3 Default attribute values 7815.4 Translation of based data into WaveformChar characters. 7916. PatternExec block 8016.1 PatternExec block syntax. 8116.2 PatternExec block example 8117. PatternBurst block 8117.

46、1 PatternBurst block syntax 8217.2 PatternBurst block example . 83Copyright 1999 IEEE. All rights reserved. vii18. Timing block and WaveformTable block 8318.1 Timing and WaveformTable syntax 8418.2 Waveform event definitions. 8718.3 Timing and WaveformTable example . 8918.4 Rules for timed event ord

47、ering and waveform creation. 9018.5 Rules for waveform inheritance. 9319. Spec and Selector blocks . 9419.1 Spec and Selector block syntax 9419.2 Spec and Selector block example 9620. ScanStructures block 9720.1 ScanStructures block syntax 9820.2 ScanStructures block example . 9921. STIL Pattern dat

48、a . 10021.1 Cyclized data 10021.2 Multiple-bit cyclized data 10121.3 Non-cyclized data 10221.4 Scan data 10221.5 Pattern labels 10322. STIL Pattern statements. 10322.1 Vector (V) statement 10322.2 WaveformTable (W) statement 10422.3 Condition (C) statement. 10422.4 Call statement. 10522.5 Macro stat

49、ement. 10522.6 Loop statement. 10622.7 MatchLoop statement. 10622.8 Goto statement . 10722.9 BreakPoint statements 10722.10 IDDQTestPoint statement 10722.11 Stop statement 10822.12 ScanChain statement 10823. Pattern block 10823.1 Pattern block syntax. 10823.2 Pattern initialization. 10923.3 Pattern examples 10924. Procedures and MacroDefs blocks. 10924.1 Procedures block 11024.2 Procedures example . 11124.3 MacroDefs block 11124.4 Scan testing 11124.5 Procedure and Macro Data substitution. 112viii Copyright 1999 IEEE. All rights reserved.Annex A (informative) Glo