IEEE 1505 3-2015 en The Universal Test Interface Framework and Pin Configuration for Portable Benchtop Test Requirements Utilizing IEEE 1505 Receiver Fixture In.pdf

1、IEEE Std 1505.3-2015 i IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505 Receiver Fixture Interface Standard Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved

2、 3 September 2015 IEEE-SA Standards Board ii Abstract: Portable/benchtop test equipment applications are supported in this document by defining a mass interconnection scheme and pin configuration based upon IEEE Std 1505-2010 and IEEE Std 1505.1-2008. Particular emphasis has been placed on defining

3、a more specific set of performance requirements than is defined by IEEE Std 1505-2010 and IEEE Std 1505.1-2008. These performance requirements are in the areas of the pin configuration, specific connector modules, and respective contacts. Keywords: ATE, ATS, fixture, IEEE 1505.3, interface, receiver

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33、rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2016 IEEE. All rights reserved. Participants At the time this IEEE standard was completed, the Hardware Interfaces Working Group had the following membership: Stephen M

34、ann, Chair Robert Spinner, Vice Chair W. Larry Adams Jr. Chris Boggs Malcom Brown David Droste William Frank Chris Geiger George Isabella Nathan Hinks Chuck Kolfeldt James Langlois Tom Leddy Adam Ley Scott Misha Ted Ronnenburg Mike Seavey Bill Sartor Richard Spears John Stabler Michael Stora The fol

35、lowing members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. W. Larry Adams Jr. Bill Brown Malcom Brown Keith Chow David Droste Heiko Ehrenberg William Frank Chris Gorringe Randall Groves Werner Hoelzl James Langlois

36、Adam Ley Stephen Mann Michael Newman Leslie Orlidge Ulrich Pohl Mike Seavey Roger Sowada Robert Spinner Joseph Stanco Michael Stora Walter Struppler When the IEEE-SA Standards Board approved this standard on 3 September 2015, it had the following membership: John D. Kulick, Chair Jon Walter Rosdahl,

37、 Vice Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Masayuki Ariyoshi Ted Burse Stephen Dukes Jean-Philippe Faure J. Travis Griffith Gary Hoffman Michael Janezic Joseph L. Koepfinger* David J. Law Hung Ling Andrew Myles T. W. Olsen Glenn Parsons Ronald C. Petersen Annette D

38、. Reilly Stephen J. Shellhamer Adrian P. Stephens Yatin Trivedi Phillip Winston Don Wright Yu Yuan Daidi Zhong *Member Emeritus vii Copyright 2016 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1505.3-2015, IEEE Standard for the Universal Test Interface Framework a

39、nd Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505 Receiver Fixture Interface Standard. Developers, users, and buyers of benchtop and general purpose portable test equipment can benefit from having a standardized mechanical interface and electrical signal input/output (

40、I/O) pin configuration. Implementing a standard interface and pin configuration will permit testing interoperability with other benchtop and portable test equipment that has implemented the same standards. This standard provides the definition of both the mechanical interface and the pin configurati

41、on. viii Copyright 2016 IEEE. All rights reserved. Contents 1. Overview 1 1.1 General 1 1.2 Scope . 1 1.3 Purpose 2 1.4 Application 2 1.5 Conventions used within this document 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 4 3.1 Definitions . 4 3.2 Acronyms and abbreviations

42、 . 4 4. Framework, connector and contact pin configuration 5 4.1 Architecture overview . 5 4.2 Framework specifications 7 4.3 Pin configuration specification 11 4.4 Connector/contact pin configuration specifications . 12 4.5 Contact specifications 12 5. Compliance specification . 16 5.1 Levels of co

43、mpliance . 16 6. Environmental/quality specifications . 17 Annex A (informative) Bibliography . 18 1 Copyright 2016 IEEE. All rights reserved. IEEE Standard for the Universal Test Interface Framework and Pin Configuration for Portable/Benchtop Test Requirements Utilizing IEEE 1505 Receiver Fixture I

44、nterface Standard IMPORTANT NOTICE: IEEE Standards documents are not intended to ensure safety, security, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying

45、 with all appropriate safety, security, environmental, health, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications cont

46、aining this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 General The IEEE Std 1505 family of

47、Standards allows test systems and test system fixtures to be designed, developed, and deployed; the fixtures could then be exchanged with other test systems adhering to the common format of the IEEE Std 1505 family of Standards. The IEEE Std 1505 family of Standards has been developed and are mainta

48、ined under the guidance of the Hardware Interfaces (HI) Subcommittee of IEEE Standards Coordinating Committee 20 (SCC20). 1.2 Scope The scope of this standard is the definition of a universal framework/footprint and pin configuration utilizing IEEE 1505 receiver-fixture interface (RFI) framework and connector specifications for portable and benchtop test applications. The pin configuration defined within this standard shall apply to commercial, aerospace, and military automatic test equipment (ATE) testing applications.