IEEE 1538-2000 en Guide for Determination of Maximum Winding Temperature Rise in Liquid-Filled Transformers《液体填充变压器的最大绕组温度升高的测定指南》.pdf

1、The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2000 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 21 July 2000. Printed in the United States of America.Print: ISBN 0-7381-1968-7 SH94826PDF

2、: ISBN 0-7381-1969-5 SS94826No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std 1538-2000 (R2011)IEEE Guide for Determination of Maximum Winding Temperature Rise in Liquid-Filled Tra

3、nsformersSponsorTransformers Committeeof theIEEE Power Engineering SocietyApproved 21 June 2000Reaffirmed 7 December 2011IEEE-SA Standards BoardAbstract: Provides guidance for determining the hottest-spot temperature in distribution and powertransformers built in accordance with IEEE Std C57.12.00-2

4、000. Describes the important criteria tobe evaluated by an thermal model that can accurately predict the hottest-spot temperatures in atransformer. Provides guidance for performing temperature-rise tests with direct measurement ofthe hottest-spot temperatures, and explains the importance of developi

5、ng an accurate thermal mod-el to properly locate the temperature sensors.Keywords: distribution transformer, hottest-spot temperature, power transformers. temperature-rise test, thermal modelIEEE Standards documents are developed within the IEEE Societies and the Standards Coordinat-ing Committees o

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16、y that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsible for identifying patents forw

17、hich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 2000 IEEE. All rights reserved. iiiIntroduction(This introduction is not part of IEEE Std 1538-2000, IEEE Guide for Determinatio

18、n of Maximum Winding TemperatureRise in Liquid-Filled Transformers.)It is required by IEEE Std C57.12.00-1993 that the hottest-spot temperature rise not exceed 80 C. Thehottest-spot temperature rise at rated load is a necessary parameter for determining the loading capability ofall transformers. Sin

19、ce there was no approved test or calculation method to demonstrate compliance with theIEEE standard, an IEEE Working Group on Hottest-Spot Temperature Rise Determination in Liquid-FilledTransformers was formed to develop this guide.This guide provides information to determine the maximum (hottest-sp

20、ot) temperature rise by calculationand testing. Modern computer technology permits calculation of hottest-spot temperature. Most manufactur-ers use computers for their design calculations, and it is reasonable to incorporate a thermal subroutine intothe programs that would calculate hottest-spot tem

21、perature rises. Current personal computers have capabili-ties that were present only in mainframe computers decades ago. Fiber-optic temperature sensors now per-mit direct measurement of the temperature of a specific point. By prior analysis of the winding, the sensorcan be placed to read the maximu

22、m winding temperature. For distribution transformers, thermal testing maybe conducted using embedded thermocouples.This guide applies to liquid-filled power, network, and distribution transformers manufactured inaccordance with IEEE Std C57.12.00-1993. Although thermal gradients may be low in proper

23、ly designedsmall (1025 kVA) distribution transformers, the thermal gradients may not be low in the wide range oftransformers classified as distribution transformers, which may extend in range to 5000 kVA. IEEE standards documents are classified asa) Standards: documents with mandatory requirements.b

24、) Recommended practices: documents in which procedures and positions preferred by the IEEE arepresented.c) Guides: documents in which alternative approaches to good practice are suggested but no clear-cutrecommendations are made.This document is classified as a guide. Documents with mandatory requir

25、ements such as standards use theverb shall whereas the other documents use the word should. This practice is followed in this guide unlessthe requirements are mandatory in IEEE Std C57.12.00-1993. Mandatory requirements taken fromIEEE Std C57.12.00-1993 are enclosed in quotation marks.iv Copyright 2

26、000 IEEE. All rights reserved.This guide was produced by the IEEE Working Group on Hottest-Spot Temperature Rise Determination forLiquid-Immersed Transformers. At the time the guide was approved, it had the following membership:D. W. Platts, ChairThe following members of the balloting committee vote

27、d on this standard:D. AhoJ. ArtegaR. L. BarkerM. F. BarnesB. L. BeasterP. BisbeeW. E. BoettgerD. J. CashJ. M. ChristiniD. ChuR. M. Del VecchioD. J. FallonP. T. FeghaliS. FossD. L. GallowayA. GhafourianD. F. GoodwinR. L. GrubbA. C. HallE. HaniqueK. R. HightonJ. HuntV. C. JhonsaS. R. LindgrenM. C. Lov

28、elessA. C. McCainS. E. MichaelH. R. MooreD. E. OrtenL. W. PierceR. L. PlasterH. W. ShertukdeH. J. SimJ. W. SmithS. C. TuliF. N. WefferR. J. WheartyC. WickershamS.H. AguirreDennis J. AllanRaymond AllustiartiGlenn AndersenJim AntweilerJacques AubinPeter M. BalmaRon L. BarkerMike BarnesA. BartekWilliam

29、 H. BartleyMartin BaurB. L. BeasterEdward A. BertoliniEnrique BetancourtThomas E. Blackburn, IIIWilliam E BoettgerAlain BolligerJohn D. BorstDonald J. CashB. ChiuPeter W. ClarkeJohn N. DavisBob Del VecchioDieter DohnalJ. C. DuartFred E. ElliottReto H. FauschMichael A. FranchekJ. D. FyvieDudley L. Ga

30、llowayHarry D. GianakourosDonald A. GilliesRichard D. GrahamRobert L. GrunertMichael E. HaasErnst HaniqueN. Wayne HansenKenneth S. HanusJames H. HarlowRobert H. HartgroveR. R. HayesWilliam R. HenningGeorge E. HenryKeith R. HightonR. HollingsworthPhilip J. HopkinsonJames D. Huddleston, IIIJohn O. Hun

31、tRowland I. JamesVirendra JhonsaCharles W. JohnsonLars-Erik JuhlinJoseph J. KellyVladimir KhalinLawrence A. KirchnerBrian KlaponskiNeil J. KranichBarin KumarStephen R. LambertJ. P. LazarSingson LeeMark LovelessLarry A. LowdermilkDonald L. LoweThomas LundquistJoe D. MacDonaldDon MacMillanWilliam A. M

32、aguireJohn W. MatthewsNigel P. McQuinCharles Patrick McShaneJoe MelansonSam MichaelC. Kent MillerGary N. MillerHarold R. MooreDaniel H. MulkeyR. J. MusilShantanu NandiE. T. NortonPaul E. OrehekKlaus PappB. K. PatelDhiru S. PatelWesley F. PattersonJesse M. PattonMark D. PerkinsLinden W. PiercePaul Pi

33、llitteriR. Leon PlasterDonald W. PlattsBertrand PoulinG. PreiningerGeorge J. ReitterJ. C. RiboudJohn R. RossettiVallamkonda SankarSubhas SarkarRick SawyerPat ScullyDilipkumar ShahHyeong Jin SimJames E. SmithJerry W. SmithStephen D. SmithTarkeshwar SinghSteven L. SnyderRonald J. StaharaCraig L. Stieg

34、emeierRon W. StonerRichard E. SullivanJohn C. SullivanThomas P. TraubAl TrautSubhash C. TuliJoseph J. VaschakRobert A. VeitchLoren B. WagenaarBarry H. WardJoe D. WatsonRobert WheartyChristopher WickershamA. L. WilksB. Scott WilsonWilliam G. WimmerCopyright 2000 IEEE. All rights reserved. vWhen the I

35、EEE-SA Standards Board approved this standard on 21 June 2000, it had the followingmembership:Donald N. Heirman, ChairJames T. Carlo, Vice ChairJudith Gorman, Secretary*Member EmeritusAlso included is the following nonvoting IEEE-SA Standards Board liaison:Alan Cookson, NIST RepresentativeDonald R.

36、Volzka, TAB RepresentativeNoelle D. HumenickIEEE Standards Project EditorSatish K. AggarwalMark D. BowmanGary R. EngmannHarold E. EpsteinH. Landis FloydJay Forster*Howard M. FrazierRuben D. GarzonJames H. GurneyRichard J. HollemanLowell G. JohnsonRobert J. KennellyJoseph L. Koepfinger*Peter H. LipsL

37、. Bruce McClungDaleep C. MohlaJames W. MooreRobert F. MunznerRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoDonald W. Zipsevi Copyright 2000 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Purpose. 12. References 23. Definitions 24. Test methods 44.1 Direct m

38、easurement by fiber optic detectors . 44.2 Direct measurement by thermocouples 44.3 Prototype test data 54.4 Test windings. 55. Mathematical models to predict temperature distributions and hottest-spot rises. 55.1 Fundamentals . 55.2 Radiator or heat exchanger heat transfer .65.3 Fluid flow within t

39、he winding 65.4 Fluid flow between heat exchangers and winding. 65.5 Loss distribution. 65.6 Conduction heat transfer 65.7 Considerations for core-form power transformers. 65.8 Considerations for distribution and small power transformers 86. Determination of hottest-spot rise from production thermal

40、 tests without direct measurementof hottest-spot temperature 107. Documentation and acceptance criteria . 11Annex A (informative) Bibliography on experimental testing to predict or confirmtransformer thermal performance 12Annex B (informative) Bibliography on modeling of transformer thermal performa

41、nce . 15Annex C (informative) Determination of hottest-spot rise from tests without direct measurement . 19Copyright 2000 IEEE. All rights reserved. 1IEEE Guide for Determination of Maximum Winding Temperature Rise in Liquid-Filled Transformers1. Overview1.1 ScopeThis guide provides guidance for dev

42、eloping mathematical models and test programs to determine the steadystate maximum (hottest-spot) and average winding temperature rise over ambient for all liquid-immerseddistribution, power, network, and regulating transformers manufactured in accordance withIEEE Std C57.12.00-2000.11.2 PurposeIEEE

43、 Std C57.12.00-2000, subclause 5.11.1.1, states, “the maximum (hottest-spot) winding temperature riseabove ambient temperature shall be determined by eithera) Direct measurement during a thermal test in accordance with IEEE Std C57.12.90-1999. A sufficientnumber of direct reading sensors should be u

44、sed at expected locations of the maximum temperaturerise as indicated by prior testing or loss and heat transfer calculations.b) Direct measurement on an exact duplicate transformer design per a).c) Calculations of the temperatures throughout each active winding and all leads. The calculationmethod

45、shall be based on fundamental loss and heat transfer principles and substantiated by tests onproduction or prototype transformers or windings.”This guide describes recommendations for a manufacturers test program or mathematical model to demon-strate compliance with the above requirements.1Informati

46、on on references can be found in Clause 2.IEEEStd 1538-2000 IEEE GUIDE FOR DETERMINATION OF MAXIMUM WINDING2 Copyright 2000 IEEE. All rights reserved.2. ReferencesThis guide should be used in conjunction with the following publications. When the following publicationsare superseded by an approved re

47、vision, the revision should apply.IEEE Std C57.12.00-2000, IEEE Standard General Requirements for Liquid-Immersed Distribution, Power,and Regulating Transformers.2IEEE Std C57.12.80-1978 (Reaff 1992), IEEE Standard Terminology for Power and DistributionTransformers.IEEE Std C57.12.90-1999, IEEE Stan

48、dard Test Code for Liquid-Immersed Distribution, Power, and Regu-lating Transformers and IEEE Guide for Short-Circuit Testing of Distribution and Power Transformers.3. Definitions3.1 average winding temperature rise: The arithmetic difference between the average winding temperatureand the ambient te

49、mperature as determined from the change in the ohmic resistance measured across the ter-minals of the winding in accordance with the test procedures specified in IEEE Std C57.12.90-1999.3.2 bottom-oil temperature: The temperature of the liquid as measured at an elevation below the bottom ofthe coils or in the oil flowing from the liquid cooling equipment.3.3 bottom-oil temperature rise: The arithmetic difference between the bottom-oil temperature and theambient air temperature.3.4 core form transformer: A transformer in which those parts of the magnetic circuit surrounded by