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本文(IEEE 1591 1-2012 en Testing and Performance of Hardware for Optical Ground Wire (OPGW)《复合光缆地线(OPGW)用五金件性能测试》.pdf)为本站会员(diecharacter305)主动上传,麦多课文库仅提供信息存储空间,仅对用户上传内容的表现方式做保护处理,对上载内容本身不做任何修改或编辑。 若此文所含内容侵犯了您的版权或隐私,请立即通知麦多课文库(发送邮件至master@mydoc123.com或直接QQ联系客服),我们立即给予删除!

IEEE 1591 1-2012 en Testing and Performance of Hardware for Optical Ground Wire (OPGW)《复合光缆地线(OPGW)用五金件性能测试》.pdf

1、 IEEE Standard for Testing and Performance of Hardware for Optical Ground Wire (OPGW) Sponsored by the Power System Communications Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 29 February 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for edu

2、cational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 1591.1-2012, IEEE Standard for Testing and Performance of Hardware for Optical Ground Wire (OPGW). IEEE Std 1591.1-2012 is the hardware test standard for optical

3、 ground wire (OPGW) applications. Hardware for OPGW is identified as hardware in direct contact with the OPGW in an OPGW and hardware cable system. This test standard provides standardization of terminology, performance, and test requirements for OPGW hardware. This hardware standard compliments IEE

4、E Std 1138 for OPGW, as many of the terms and tests requirements are common for consistency and testing efficiency.aNotice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply complia

5、nce to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these docume

6、nts may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of

7、 engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superse

8、ded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in ef

9、fect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address list

10、ed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. aInformation on references can be found in Clause 2. iv Copyright 2012 IEEE. All rights reserved. Errata Errata, if any, for thi

11、s and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/findstds/interps

12、/index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection

13、therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA website http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or

14、 unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assura

15、nce has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submis

16、sion of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further

17、 information may be obtained from the IEEE Standards Association. v Copyright 2012 IEEE. All rights reserved. vi Copyright 2012 IEEE. All rights reserved. Participants At the time this standard was submitted to the IEEE-SA Standards Board for approval, the Fiber Optics Standards Working Group had th

18、e following membership: William Byrd, Chair Robert Bratton, Vice Chair Thomas Alderton Gregory Bennet Donda Bishop Bhatnagar Chitrangad Corrine Dimnik Robert Emerson Brian Herbst John Jones Delavar Khomarlou Eric Miller Mark Naylor John Olenik Craig Pon Jon Potter James Ryan Lluis-Ramon Sales Tewfik

19、 Schehade Tarlochan Singh John Tillman Monty Tuominen Curt Turner The following members of the individual balloting committee voted on this standard. Balloters may have voted for approval, disapproval, or abstention. William J. Ackerman Gregory Bennett Robert Bratton William Byrd James Chapman Bhatn

20、agar Chitrangad Robert Christman Corrine Dimnik Gary Donner Douglas Dorr Randall Dotson Gary Engmann Denise Frey George Gela David Gilmer Waymon Goch Edwin Goodwin Randall C. Groves Lee Herron Werner Hoelzl Magdi Ishac John Jones Gael Kennedy Yuri Khersonsky Morteza Khodaie Robert Kluge Joseph L. Ko

21、epfinger Jim Kulchisky Chung-Yiu Lam William McBride Adi Mulawarman Michael Newman Charles Ngethe Gary Nissen John Olenik Carl Orde Lorraine Padden Bansi Patel Percy Pool Craig Preuss Jerry Reding Stephen Rodick James Ryan Bartien Sayogo Tarlochan Singh Jerry Smith John Spare Gary Stoedter Monty Tuo

22、minen Curt Turner John Vergis Robert Whatley When the IEEE-SA Standards Board approved this standard on 6 February 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Judith Gorman, Secretary Masayuki Ariyoshi William Bartley Ted Burse C

23、lint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Curtis Siller Phil Winston Howard L. Wolfman Don Wright *Member Emeritus Also incl

24、uded are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Standards Project Manager vii Co

25、pyright 2012 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 3.1 Special terms 3 4. Requirements for optical ground wire hardware 3 4.1 General 3 4.2 Functional requirements 4 4.3 Material requirements 5 4.4 Environmental corro

26、sion . 7 4.5 Installation . 8 5. Tests . 8 5.1 Classification of tests. 8 5.2 General guidelines for optical measurements 8 5.3 Retesting 10 5.4 Sample selection for hardware characteristics tests. 11 5.5 Qualification tests 11 Annex A (informative) Corona considerations for OPGW hardware. 42 Annex

27、B (informative) Bibliography 43 viii Copyright 2012 IEEE. All rights reserved. IEEE Standard for Testing and Performance of Hardware for Optical Ground Wire (OPGW) IMPORTANT NOTICE: This standard is not intended to ensure safety, security, health, or environmental protection. Implementers of the sta

28、ndard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing thi

29、s document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This standard covers the construction, m

30、echanical and electrical performance, test requirements, environmental considerations, and acceptance criteria for qualifying hardware for use with optical ground wire (OPGW). 1.2 Purpose This standard provides standard manufacturing, testing, and procurement specifications for use with OPGW hardwar

31、e in order to simplify procurement, standardize testing, assure product quality, and assist usage. 1 Copyright 2012 IEEE. All rights reserved. IEEE Std 1591.1-2012 IEEE Standard for Testing and Performance of Hardware for Optical Ground Wire (OPGW) 2. Normative references The following referenced do

32、cuments are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition o

33、f the referenced document (including any amendments or corrigenda) applies. ASTM A153/A153M, Standard Specification for Zinc Coating (Hot-Dip) on Iron and Steel Hardware.1ASTM B117, Standard Practice for Operating Salt Spray (Fog) Apparatus. AWS D1.1/D1.1M, Structural Welding CodeSteel.2IEC 61897, O

34、verhead LinesRequirements and Tests for Stockbridge Type Aeolian Vibration Dampers.3IEEE Std 664, IEEE Guide for Laboratory Measurement of the Power Dissipation Characteristics of Aeolian Vibration Dampers for Single Conductors.4,5IEEE Std 1138, IEEE Standard for Testing and Performance for Optical

35、Ground Wire (OPGW) for Use on Electric Utility Power Lines. ISO 1461, Hot dip galvanized coatings on fabricated iron and steel articlesSpecifications and test methods.6ISO 4892, PlasticsMethods of exposure to laboratory light sources. ISO 9227, Corrosion tests in artificial atmospheresSalt spray tes

36、ts. 3. Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary: Glossary of Terms however, it is preferred to test the maximum and minimum of the range for verification. Minimum sample quantities to be used for each size and each range

37、are provided in 5.5.1, Table 3, and within the associated test method subclause of this standard. A line of hardware tested with one type of OPGW may be considered qualified for other types of OPGW product lines after review. The review can include the following considerations for OPGW comparison: O

38、PGW specifications including cable diameter, strand construction, optical unit construction, mechanical characteristics, electrical characteristics. OPGW conformance to IEEE Std 1138. Quality control of materials and processes. History of proposed OPGW design or similarities to an existing design in

39、 the industry. 5.5 Qualification tests 5.5.1 Qualification test summary The listing of the tests to be performed for the specific types of hardware is given in Table 3. Tests can be performed on isolated hardware (I) or as a system (S) (hardware and cable) when appropriate, as shown in Table 3 and d

40、escribed in the identified test subclause. The minimum number of samples for each test is listed as well. More than one test sample may be required to demonstrate repeatability of results. Table 4 classifies the qualification tests for each hardware type. The key classifications drawn from 5.1 inclu

41、de hardware characteristics, installation tests, and in-service tests. Beginning with 5.5.2, qualification tests are organized according to the key classifications for each hardware type within this document. 11 Copyright 2012 IEEE. All rights reserved. IEEE Std 1591.1-2012 IEEE Standard for Testing

42、 and Performance of Hardware for Optical Ground Wire (OPGW) Table 3 Qualification test sequence and sample quantities Hardware type Test Sub-clause Optical evaluation required System (S) or isolated (I) test Minimum quantity of samples per test aTensile 5.5.2.1.1 Yes see 5.2 and Acceptance criteria

43、(a) S 2 Aeolian vibration 5.5.2.3.2 Yes see 5.2 and Acceptance criteria (b) S 1 Fault current 5.5.2.3.3 Yes see 5.2 and Acceptance criteria (b) S or I 1 Crush 5.5.2.2.1 No S 1 Galloping (optional) 5.5.2.3.4 Yes see 5.2 and Acceptance criteria (b) Dead end Corrosion (optional) 5.5.2.3.5 No S or I 1 T

44、urning angle 5.5.3.1.2 Yes see 5.2 and Acceptance criteria (a) S Unbalanced load 5.5.3.3.2 Yes see 5.2 and Acceptance criteria (a) S 3 Vertical load 5.5.3.1.1 No I 2 Aeolian vibration 5.5.3.3.3 Yes see 5.2 and Acceptance criteria (b) S 1 Fault current 5.5.3.3.4 Yes see 5.2 and Acceptance criteria (b

45、) S or I 1 Galloping 5.5.3.3.5 Yes see 5.2 and Acceptance criteria (b) S 1 Corrosion (optional) 5.5.3.3.6 No S or I 1 Suspension Crush 5.5.2.2.1 No S 1 Dampers: Stockbridge type Clamp slip Breakaway bolt Clamp bolt tightening Corona and RIV Damper performance Damper fatigue 5.5.4 No No Yes (see 5.2)

46、 No No No S I S S S or I S Per IEC 61897 Crush 5.5.4.2.1 Yes (see 5.2) S 1 Power dissipation 5.5.4.1.1 No S 3 UVA exposure 5.5.4.1.2 No S 3 Damper: impact type Corrosion (optional) 5.5.4.3.3 No S or I 1 Crush 5.5.5.2.1 No S 1 Come-along Tensile 5.5.5.3.1 No S 1 Crush 5.5.6.2.1 No S 1 Fault current 5

47、.5.6.3.1 Yes (see 5.2) S or I 1 Grounding hardware Corrosion (optional) 5.5.6.3.2 No S or I 1 Crush 5.5.7.2.1 No S 1 Slip test 5.5.7.3.1 No S 2 Downlead clamps Corrosion (optional) 5.5.7.3.2 No S or I 1 aThese are the minimum quantity of hardware samples of each design size and OPGW combination bein

48、g tested. Sample guidelines for product lines and ranges can be found in 5.4. 12 Copyright 2012 IEEE. All rights reserved. IEEE Std 1591.1-2012 IEEE Standard for Testing and Performance of Hardware for Optical Ground Wire (OPGW) Table 4 Classification of tests for hardware type Test classification a

49、nd test clause Hardware type (subclause) Hardware characteristics Installation tests In service Tensile test (ultimate) 5.5.2.1.1 Tensile test (everyday, working) 5.5.2.3.1 Aeolian vibration 5.5.2.3.2 Fault current 5.5.2.3.3 Galloping 5.5.2.3.4 Corrosion 5.5.2.3.5 Dead end (5.5.2) Crush 5.5.2.2.1 Vertical load 5.5.3.1.1 Turning angle 5.5.3.1.2 Turning angle 5.5.3.2.2 Turning angle 5.5.3.3.2 Unbalanced load 5.5.3.3.2 Aeolian vibration 5.5.3.3.3 Fault current 5.5.3.3.4 Galloping 5.5.3.3.5 Corrosi

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